Patents for C30B 33 - After-treatment of single crystals or homogeneous polycrystalline material with defined structure (6,009)
02/2004
02/26/2004US20040035353 Manufacturing of organized molecular monolayers and adapted substrate
02/25/2004CN1477239A Method for growing compound laser crystal
02/19/2004WO2004014607A1 A method of polishing a wafer of material
02/19/2004US20040031440 Forming thin films of silicon oxide on silicon wafers, by heating in furnaces having gas flow passageways, then purging with inert gases to remove impurities; oxidation
02/19/2004DE20220258U1 Production of a semiconductor component used in the production of substrate-less luminescent diodes comprises separating a semiconductor layer from a substrate by irradiating with a laser beam having a plateau-shaped spatial beam profile
02/18/2004CN1476047A Preparation method of gamma-LiAl0*/alpha-Al*0*composite base material
02/17/2004US6693033 Method of removing an amorphous oxide from a monocrystalline surface
02/17/2004US6692714 Placing a colored type ii natural diamond in a pressure-transmitting medium; consolidating pressure-transmitting medium into a pill; exposing pill to elevated pressure and temperature to change color of diamond
02/12/2004US20040025983 Method of manufacturing silicon
02/12/2004US20040025782 Process for producing low defect density, ideal oxygen precipitating silicon
02/11/2004EP1388891A1 System and method for heat treating semiconductor
02/10/2004US6689694 Micromechanical system fabrication method using (111) single crystalline silicon
02/05/2004WO2003089925A3 Device based on partially oxidized porous silicon and method for the production thereof
02/04/2004CN1472371A Method for modifying planar mono-crystal silicon surface
02/04/2004CN1472368A Post-treating method and apparatus for rareearth barium-copper superconductive blocks under high pressure oxygen condition
02/03/2004US6685779 Method and a system for sealing an epitaxial silicon layer on a substrate
01/2004
01/29/2004WO2004010075A1 Method for the production of nanometer scale step height reference specimens
01/29/2004WO2003078699A3 Synthesis of stable colloidal nanocrystals using organic dendrons
01/29/2004WO2003050598A3 Integrated crystal mounting and alignment system for high-throughput biological crystallography
01/29/2004US20040018749 Method of decreasing brittleness of single crystals, semiconductor wafers, and solid-state devices
01/29/2004US20040016743 Substantially-uniform-temperature annealing
01/28/2004EP1383944A1 Method for treating the surface of a semiconductor material
01/22/2004WO2004008521A1 High-resistance silicon wafer and process for producing the same
01/22/2004WO2004007816A1 Method of fabricating substrates, in particular for optics, electronics or optoelectronics________________________________________
01/21/2004EP1382723A2 Method of organic film deposition
01/21/2004EP1382722A2 Optical Lithography Fluoride Crystal Annealing Furnace
01/21/2004EP0923438B1 Method for obtaining a wafer in semiconducting material of large dimensions
01/21/2004CN1469942A Method and device for cutting single crystals, in addition to an adjusting device and a test method for determining a crystal orientation
01/15/2004WO2004005593A2 Metal nano-objects, formed on semiconductor surfaces, and method for making said nano-objects
01/15/2004WO2003067637A3 Methods of treating a silicon carbide substrate for improved epitaxial deposition
01/15/2004CA2491514A1 Metal nano-objects, formed on semiconductor surfaces, and method for making said nano-objects
01/14/2004EP1380676A1 Method for flattening surface of oxide crystal to ultra high degree
01/14/2004EP1380675A1 Method for reducing oxygen component and carbon component in fluoride
01/14/2004CN1467863A Semiconductor chip, semiconductor device and method for manufacturing same
01/14/2004CN1467801A Method for low temperature oxidation of silicon and used apparatus
01/13/2004US6676764 Method for cleaning a substrate in selective epitaxial growth process
01/13/2004US6676753 Czochralski pullers for manufacturing monocrystalline silicon ingots, including heat shield having sloped portions
01/08/2004US20040005777 High resistivity and high gettering ability; DZ-IG wafer that can serve as an alternative of SOI wafer for mobile communications
01/08/2004US20040005266 Optical member, process for producing the same, and projection aligner
01/08/2004US20040003770 Process for cooling a silicon ingot having a vacancy dominated region to produce defect free silicon
01/08/2004US20040003769 Method of producing silicon wafer and silicon wafer
01/07/2004EP1378591A1 Method for removing defects in crystals
01/07/2004CN1466557A Method for joining
01/07/2004CN1133761C Open pipe tellurium cadmium mercury epitaxial material heat treatment method
01/06/2004US6673439 Coated diamond, manufacturing method and composite material thereof
01/06/2004US6673220 System and method for fabricating silicon targets
01/06/2004US6673146 Having square hysteresis loop, rotator being formed of bismuth substituted rare earth iron garnet single crystal that has compensation temperature in range of 10 to 40 degrees c and is grown on non-magnetic garnet substrate by liquid phase epitaxy
01/01/2004US20040000267 Method of determining nitrogen concentration within a wafer
01/01/2004US20040000266 Method for reducing defect concentrations in crystals
12/2003
12/31/2003WO2004001836A1 Method for producing semi-insulating resistivity in high purity silicon carbide crystals
12/31/2003CN1464920A Method for preparing tungstate single crystal
12/31/2003CN1464916A Process for production of ultrathin protective overcoats
12/31/2003CA2485594A1 Method for producing semi-insulating resistivity in high purity silicon carbide crystals
12/30/2003US6670280 Methods of microstructuring ferroelectric materials
12/30/2003US6670242 Method for making an integrated circuit device including a graded, grown, high quality gate oxide layer and a nitride layer
12/30/2003US6669536 Method of making optical fluoride laser crystal components
12/25/2003US20030235957 Method and structure for graded gate oxides on vertical and non-planar surfaces
12/25/2003US20030233975 Method for producing semi-insulating resistivity in high purity silicon carbide crystals
12/24/2003CN1463305A Silicon single crystal wafer having void denuded zone on surface and diameter of above 300mm and its production method
12/23/2003US6667522 Silicon wafers for CMOS and other integrated circuits
12/23/2003US6667252 Method of manufacturing compound semiconductor substrate
12/18/2003US20030231416 Method for manufacturing optical element
12/18/2003US20030230232 Method of making enhanced CVD diamond
12/17/2003EP1372010A2 Method for manufacturing optical element
12/16/2003US6663736 Method for making a bonded sapphire structure
12/16/2003US6663708 Silicon wafer, and manufacturing method and heat treatment method of the same
12/11/2003WO2003103026A1 Methods for transferring a layer onto a substrate
12/10/2003CN2591536Y Valve apparatus and thermal processing apparatus
12/10/2003CN1460573A Surface processing method for titanium-doped sapphire crystal laser rod
12/04/2003US20030224619 Method for low temperature oxidation of silicon
12/03/2003EP1366827A1 Substrate adapted for the fabrication of organised molecular monolayers and structures thus obtained
12/03/2003CN1130016C Surface acoustic wave device
11/2003
11/27/2003WO2003097532A1 Process for manufacturing a gallium rich gallium nitride film
11/27/2003CA2486178A1 Process for manufacturing a gallium rich gallium nitride film
11/26/2003EP1118880B1 Method of organic film deposition
11/25/2003US6652780 Used for recording and reading holographic information; sensitivity
11/25/2003US6652763 Method and apparatus for large-scale diamond polishing
11/25/2003US6652646 Process for growing a silicon crystal segment substantially free from agglomerated intrinsic point defects which allows for variability in the process conditions
11/25/2003US6652644 Adjusting lithium oxide concentration in wafers using a two-phase lithium-rich source
11/20/2003US20030213964 III-V Nitride homoepitaxial material of improved MOVPE epitaxial quality (surface texture and defect density) formed on free-standing (Al,In,Ga)N substrates, and opto-electronic and electronic devices comprising same
11/18/2003US6649885 Whereby temperature of wafer can be accurately measured at all times, so that epitaxial growth processing and etching can be conducted on wafer kept at prescribed temperature
11/18/2003US6649326 Photolithographic method and UV transmitting fluoride crystals with minimized spatial dispersion
11/18/2003US6648966 Wafer produced thereby, and associated methods and devices using the wafer
11/13/2003WO2003072284A3 Method of removing casting defects
11/13/2003WO2003062908A3 Three-dimensional photonic crystal waveguide structure
11/13/2003WO2003038873A3 Removing an amorphous oxide from a monocrystalline surface
11/13/2003US20030209327 Temperature control for single substrate semiconductor processing reactor
11/13/2003US20030209200 Temperature control for single substrate semiconductor processing reactor
11/13/2003US20030209190 Method for making an oriented optical fluoride crystal blank
11/11/2003US6645836 Method of forming a semiconductor wafer having a crystalline layer thereon containing silicon, germanium and carbon
11/11/2003US6645834 Method for manufacturing annealed wafer and annealed wafer
11/11/2003US6645639 Epitaxial oxide films via nitride conversion
11/06/2003US20030207132 The present invention relates to oxides on suitable substrates, as converted from nitride precursors. Oxidation of compounds for fabrication of a ferro-electric device.
11/04/2003US6642123 Method of fabricating a silicon wafer including steps of different temperature ramp-up rates and cool-down rates
11/04/2003US6641662 Method for fabricating ultra thin single-crystal metal oxide wave retarder plates and waveguide polarization mode converter using the same
10/2003
10/30/2003WO2003089925A2 Device based on partially oxidized porous silicon and method for the production thereof
10/30/2003WO2003089698A1 Single crystal material having high density dislocations arranged one-dimensionally in straight line form, functional device using said single crystal material, and method for their preparation
10/30/2003WO2003089690A1 Selectively aligning nanometer-scale components using ac fields
10/30/2003US20030203599 Semiconductor wafer and method for fabricating the same
10/29/2003EP1356139A2 Low defect density silicon substantially free of oxidation induced stacking faults having a vacancy-dominated core
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