Patents for C30B 33 - After-treatment of single crystals or homogeneous polycrystalline material with defined structure (6,009)
05/2000
05/31/2000CN1255169A Low defect density, ideal oxygen precipitating silicon
05/24/2000EP0914501B1 Forging cylindrical ingots of alkali halides
05/16/2000US6063684 Method for eliminating residual oxygen contaminations from crucible-drawn silicon wafers
05/16/2000US6063301 Crystal display processing method and crystal wafer manufacturing method
05/09/2000US6059879 Method of forming semiconductor wafers, methods of treating semiconductor wafers to alleviate slip generation, ingots of semiconductive material, and wafers of semiconductive material
05/09/2000US6059877 Method for obtaining a wafer in semiconducting material of large dimensions and use of the resulting wafer for producing substrates of the semiconductor on insulator type
05/02/2000US6056931 Silicon wafer for hydrogen heat treatment and method for manufacturing the same
05/02/2000US6056869 Electrolytic deplating of metal from side edges and backside of semiconductors
05/02/2000US6056817 Heat treatment
04/2000
04/20/2000WO2000022198A1 Thermally annealed, low defect density single crystal silicon
04/20/2000WO2000022196A1 Process for preparing defect free silicon crystals which allows for variability in process conditions
04/19/2000EP0993370A1 Eutectic bonding of single crystal components
04/18/2000US6051062 Producing an optical single crystal epitaxial film from a melt containing a transition metal on a single crystal substrate by a liquid phase epitaxial method
04/12/2000EP0993025A2 Closed type semiconductor wet thermal oxidation apparatus
04/12/2000EP0898800A4 ROOM TEMPERATURE STABLE COLOR CENTER LASER, LiF:F 2??+ ** MATERIAL, AND METHOD OF LASING
04/06/2000WO2000018990A1 Method for removing defects of single crystal material and single crystal material from which defects are removed by the method
04/05/2000CN1249533A Epitaxial wafer, its mfg method and method for surficial cleaning of compound semiconductor substrate
04/05/2000CN1249532A Cleaner for large crystal wafer
03/2000
03/30/2000WO2000000674A9 Process for growth of defect free silicon crystals of arbitrarily large diameters
03/29/2000EP0989600A2 Surface cleaning method for manufacturing II-VI compound semiconductor epitaxial wafers
03/28/2000US6043156 Method of making semiconductor wafers
03/25/2000CA2283532A1 An epitaxial wafer, a manufacturing method of the epitaxial wafer, and a surface cleaning method for a compound semiconductor substrate used in the epitaxial wafer
03/23/2000WO2000016478A1 Surface acoustic wave device
03/23/2000WO2000015882A2 Method for switching the properties of perovskite materials
03/21/2000US6040070 Perovskite type ABO3 with surface layer
03/09/2000WO2000012979A1 Sensitive element for an ultraviolet radiation detector and method for making the same
03/09/2000WO2000012786A1 Method for producing silicon single crystal wafer and silicon single crystal wafer
03/09/2000DE19839023A1 Protected epitaxially coated semiconductor wafers are produced using a central clean room chamber for integration of epitaxial layer and protective layer forming operations
02/2000
02/29/2000US6030887 Flattening process for epitaxial semiconductor wafers
02/24/2000WO2000010040A1 Composite photonic crystals
02/24/2000CA2340081A1 Composite photonic crystals
02/15/2000US6025060 Method and apparatus for composite gemstones
02/15/2000US6024306 Device and method for fragmenting semiconductor material
02/10/2000WO2000007231A1 Pattern formation method using light-induced suppression of etching
02/09/2000CN2362871Y Heat treatment apparatus for releasing silicon chip surface residual stress after working
02/02/2000EP0975828A1 Etching method
01/2000
01/26/2000EP0973964A1 Low defect density, self-interstitial dominated silicon
01/26/2000EP0973963A1 Low defect density silicon
01/26/2000EP0973962A1 Low defect density, ideal oxygen precipitating silicon
01/26/2000CN1242440A Method for heat treatment of monomorph of fluoride, and method for mfg. same
01/19/2000EP0972863A1 Method for annealing single crystal fluoride and method for manufacturing the same
01/19/2000EP0972097A1 MECHANO-CHEMICAL POLISHING OF CRYSTALS AND EPITAXIAL LAYERS OF GaN AND Ga 1-x-y?Al x?In y?N
01/19/2000EP0972094A1 Low defect density, vacancy dominated silicon
01/12/2000EP0971055A2 "Method for heat treatment of silicon substrate, substrate treated by the method, and epitaxial wafer utilizing the substrate
01/12/2000EP0971053A1 Method for producing silicon single crystal wafer for particle monitoring and silicon single crystal wafer for particle monitoring
01/11/2000US6013191 Bombarding the surface of the film with ions from oxygen plasma and fluorinated gas mixture at first power density to form reaction sites; reacting film's surface with the ions at second lower power density to smooth surface of diamond film
01/11/2000US6012303 Eutectic bonding of single crystal components
01/06/2000WO2000000674A2 Process for growth of defect free silicon crystals of arbitrarily large diameters
01/05/2000CN1240302A Method for producing semiconductor film and the method for producing solar energy cell using said film
01/04/2000US6010797 Semiconductor substrates with cavities
12/1999
12/29/1999WO1999067171A1 A method of altering the colour of a material
12/29/1999EP0967304A1 Method for manufacturing single crystal of silicon carbide
12/29/1999CN1047871C Furnace for manufacturing semiconductor device and method of forming gate oxide film utilizing the same
12/28/1999US6007916 For drawing copper wire for winding, steel cord, stainless steel wire, welding wire
12/23/1999WO1999066351A1 Method of organic film deposition
12/23/1999WO1999066089A1 Ni-BASED SINGLE CRYSTAL ALLOY HAVING COATING FILM FOR PREVENTING RECRYSTALLIZATION FRACTURE
12/23/1999DE19827202A1 Rapid and reliable nondestructive detection and characterization of crystal defects in single crystal semiconductor material, e.g. silicon rods or wafers
12/23/1999CA2301092A1 Ni-based single crystal alloy having coating film for preventing recrystallization fracture
12/22/1999EP0965664A1 Method of producing semiconductor thin film and method of producing solar cell using same
12/22/1999EP0964943A1 METHOD FOR GROWING MONOCRYSTALS OF HIGH-TEMPERATURE SUPRACONDUCTORS MADE OF RARE EARTH-CUPRATES OF FORM SE 1+x?Ba 2-x?Cu 3?O 7-$g(d)?
12/22/1999CN1239519A Single crystal sic and process for preparing same
12/21/1999US6004405 Wafers with crystal orientation
12/15/1999EP0964084A1 SINGLE CRYSTAL SiC AND PROCESS FOR PREPARING THE SAME
12/14/1999US6001744 Etching semiconductor crystal with aqueous solution of sulfuric acid, saturated with potassium dichromate to obtain mirror surface for epitaxial growth
12/12/1999CA2240507A1 Method for post-poling mobile ion redistribution in lithium niobate
12/09/1999DE19825051A1 Verfahren und Vorrichtung zur Herstellung eines zylinderförmigen Einkristalls und Verfahren zum Abtrennen von Halbleiterscheiben Method and apparatus for producing a cylindrical single crystal and method for separating semiconductor wafers
12/09/1999DE19825050A1 Process for orientating a cylindrical semiconductor single crystal
12/08/1999EP0962557A1 Silicon single crystal wafer and method for producing silicon single crystal wafer
12/08/1999EP0962284A1 Method and apparatus for manufacturing a cylindrical single crystal and method for slicing wafers
12/07/1999US5997757 Method of forming connection hole
12/07/1999US5997641 Seed-crystal holder for single-crystal pulling devices with magnetic field applied thereto
12/01/1999EP0960961A1 Method of making a quartz crystal having a particular resonant frequency
12/01/1999EP0960436A1 Method of preparing silicon carbide wafers for epitaxial growth
11/1999
11/30/1999US5993597 Single-crystal or polycrystalline silicon, which has an electric resistance of 0.0001-40 omega cm, whose crystal faces are (100), which is doped with boron or phosphorus, whose surface has been acid etched & vacuum heat treated
11/30/1999US5993292 Production of notchless wafer
11/24/1999CN1236481A Forming a crystalline semiconductor film on a glass substrate
11/23/1999US5989511 Smooth diamond films as low friction, long wear surfaces
11/23/1999CA2177345C Method for the growth of industrial crystals
11/16/1999US5987088 High temperature and high pressure treatment of nuclear reactor cores
11/16/1999US5986798 Method and arrangement for poling of optical crystals
11/16/1999US5985678 Method of evaluating and thermally processing semiconductor wafer
11/09/1999US5982797 Room temperature stable color center laser, LiF:F2+ ** material, method of lasing
11/09/1999US5981443 A bicrystal substrate is formed by joining end faces of a first single crystal substrate and a second single crystal substrate, the end faces having different crystal orientation
11/09/1999US5981392 Method of manufacturing semiconductor monocrystalline mirror-surface wafers which includes a gas phase etching process, and semiconductor monocrystalline mirror-surface wafers manufactured by the method
11/03/1999EP0954018A1 Method for manufacturing semiconductor silicon epitaxial wafer and semiconductor device
11/02/1999US5975997 Method of double-side lapping a wafer and an apparatus therefor
10/1999
10/26/1999US5972724 Process for reducing the surface recombination speed in silicon
10/19/1999US5970381 Method for fabricating organic thin film
10/19/1999US5968593 Semiconductors with heaters, chemical tube reactors, feeding
10/19/1999US5968266 Apparatus for manufacturing single crystal of silicon
10/12/1999US5966625 Method for making a slant-surface silicon wafer having a reconstructed atomic-level stepped surface structure
10/07/1999WO1999045180A3 Abo3 perovskite with a step
10/06/1999EP0947466A1 Process for producing carbon nanotubes, process for producing carbon nanotube film, and structure provided with carbon nanotube film
10/06/1999EP0946974A1 Forming a crystalline semiconductor film on a glass substrate
10/06/1999EP0871803B1 PEROVSKITE WITH AO*(ABO3)n LAYER
10/06/1999CN1231003A Single crystal SiC and process for preparing the same
10/06/1999CN1230767A Method for manufacturing discrete substrate
10/05/1999US5963821 Method of making semiconductor wafers
10/05/1999US5962915 Single crystal wafers and a method of preparation thereof
10/05/1999US5961713 Method for manufacturing a wafer having a microdefect-free layer of a precisely predetermined depth
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