Patents for C23C 16 - Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition (cvd) processes (71,892) |
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11/28/2000 | US6152977 Surface functionalized diamond crystals and methods for producing same |
11/28/2000 | US6152166 Apparatus for dividing a gas stream into several partial gas streams |
11/28/2000 | US6152075 Method and system for heating semiconductor wafers |
11/28/2000 | US6152072 Chemical vapor deposition coating of fibers using microwave application |
11/28/2000 | US6152071 High-frequency introducing means, plasma treatment apparatus, and plasma treatment method |
11/28/2000 | US6152070 Tandem process chamber |
11/28/2000 | CA2210599C Process for depositing barrier film on three-dimensional articles |
11/28/2000 | CA2038220C Process for depositing hard coating in a nozzle orifice |
11/28/2000 | CA2001009C Infrared window |
11/23/2000 | WO2000070673A1 Tungsten-filled deep trenches |
11/23/2000 | WO2000070662A1 Device for film deposition |
11/23/2000 | WO2000070661A1 Apparatus for manufacturing semiconductor device and method of manufacture thereof |
11/23/2000 | WO2000070658A1 Multi-zone resistive heater |
11/23/2000 | WO2000070657A1 Chuck having pressurized zones of heat transfer gas |
11/23/2000 | WO2000070129A1 Method and apparatus for epitaxially growing a material on a substrate |
11/23/2000 | WO2000070121A1 UTILIZATION OF SiH4, SOAK AND PURGE IN DEPOSITION PROCESSES |
11/23/2000 | WO2000070120A1 Al2O3 COATED CUTTING TOOL |
11/23/2000 | WO2000070119A1 Mocvd processes using precursors based on organometalloid ligands |
11/23/2000 | WO2000070118A1 Tantalum and tantalum-based films formed using fluorine-containing source precursors and methods of making the same |
11/23/2000 | WO2000070117A1 Low-temperature compatible wide-pressure-range plasma flow device |
11/23/2000 | WO2000070116A1 Low pressure stagnation flow reactors with a flow barrier |
11/23/2000 | WO2000042236A3 Processing system and method for chemical vapor deposition |
11/23/2000 | DE19922665A1 Three-dimensional base body used in the production of a bearing or sealing component has a fine crystalline diamond structure with a specified surface roughness |
11/22/2000 | EP1054444A1 Process for depositing a porous, low dielectric constant silicon oxide film |
11/22/2000 | EP1054438A2 System and method for cleaning silicon-coated surfaces in an ion implanter |
11/22/2000 | EP1054311A1 Gas delivery metering tube |
11/22/2000 | EP1054076A2 Gas distribution system |
11/22/2000 | EP1054075A1 Sliding part covered with lubrication promoting oxides stabilized by trace elements |
11/22/2000 | EP1053442A1 Wafer carrier and semiconductor apparatus for processing a semiconductor substrate |
11/22/2000 | EP0821799A4 Fabrication of silica-based optical devices and opto-electronic devices |
11/22/2000 | CN1274395A Dual frequency excitation of plasma for film deposition |
11/22/2000 | CN1274020A Cold cathode structure of diamond film and its preparing process |
11/21/2000 | USRE36957 Method and apparatus for cold wall chemical vapor deposition |
11/21/2000 | US6151532 Method and apparatus for predicting plasma-process surface profiles |
11/21/2000 | US6151447 Rapid thermal processing apparatus for processing semiconductor wafers |
11/21/2000 | US6150549 As monomers(starting material) of polysilane eligible for precursor of electroconductive- and photoconductive-materials such as phtoresists as well as polymerization initiators and and which is useful for chemical vapor deposition |
11/21/2000 | US6150283 Thin film transistor fabrication method, active matrix substrate fabrication method, and liquid crystal display device |
11/21/2000 | US6150265 Apparatus for forming materials |
11/21/2000 | US6150226 Nitrogen exposure |
11/21/2000 | US6149987 Enhancing the surface sensitivity of a pecvd liner layer with activated oxygen. |
11/21/2000 | US6149984 Laser irradiation processing on a film that is sensitive to impurities, such as a semiconductor film that has been subjected to laser light irradiation. another object of the invention is to facilitate cleaning irradiation apparatus. |
11/21/2000 | US6149982 Method of forming a coating on an inner surface |
11/21/2000 | US6149975 Potassium-containing thin film and process for producing the same |
11/21/2000 | US6149974 Deposits a ramp layer while ramping pressure to a target deposition pressure and deposits an sacvd layer over the ramp layer. in one |
11/21/2000 | US6149783 Vacuum treatment apparatus |
11/21/2000 | US6149779 Filling gaps during integrated circuit production using gas mixture consisting of silicon-containing, oxygen-containing and boron-containing components to deposit film over said gaps by simultaneous chemical vapor deposition and sputter etching |
11/21/2000 | US6149730 Apparatus for forming films of a semiconductor device, a method of manufacturing a semiconductor device, and a method of forming thin films of a semiconductor |
11/21/2000 | US6149729 Film forming apparatus and method |
11/21/2000 | US6149728 Semiconductor manufacturing device |
11/21/2000 | US6149365 Support frame for substrates |
11/21/2000 | US6149162 Sliding member |
11/21/2000 | US6148847 Low vapor pressure gas distribution system and method |
11/21/2000 | US6148764 Multiple micro inlet silane injection system for the jet vapor deposition of silicon nitride with a microwave discharge jet source |
11/21/2000 | US6148763 Deposited film forming apparatus |
11/21/2000 | US6148762 Plasma processing apparatus |
11/21/2000 | US6148761 Dual channel gas distribution plate |
11/21/2000 | CA2308758A1 Gas delivery metering tube |
11/17/2000 | CA2308832A1 Gas distribution system |
11/16/2000 | WO2000068472A1 Truncated susceptor for vapor-phase deposition |
11/16/2000 | WO2000068471A1 Sequential hydride vapor-phase epitaxy |
11/16/2000 | WO2000068470A1 Magnesium-doped iii-v nitrides & methods |
11/16/2000 | WO2000068457A1 Inserts for metal cutting purposes |
11/16/2000 | WO2000067879A1 Effluent gas stream treatment system having utility for oxidation treatment of semiconductor manufacturing effluent gases |
11/16/2000 | WO2000045422A3 Inflatable slit/gate valve |
11/16/2000 | WO2000026974A3 Semiconductor processing chamber calibration tool |
11/16/2000 | DE19921744A1 Process for transporting vaporous substances through the wall of a vacuum chamber into the chamber comprises inserting the substance through an inner tube of a double casing tube into the vacuum chamber from the outside |
11/15/2000 | EP1052694A1 Semiconductor device having insulating film of fluorine-added carbon film and method of producing the same |
11/15/2000 | EP1052309A2 Apparatus for fabrication of thin films |
11/15/2000 | EP1052308A2 Process for coating of a heat exchanger |
11/15/2000 | EP1052307A2 Heat transfer surface |
11/15/2000 | EP1051536A1 Method and apparatus for deposition of three- dimensional object |
11/15/2000 | CN1273280A RF film-plating technology by siliconization |
11/15/2000 | CN1058534C Method for forming diamond film |
11/14/2000 | US6147033 Apparatus and method for forming a film on a tape substrate |
11/14/2000 | US6147020 Light-impermeable, high purity silicon carbide material, a light shielding member for a semiconductor-treating apparatus, and a semiconductor-treating apparatus |
11/14/2000 | US6147013 Method of LPCVD silicon nitride deposition |
11/14/2000 | US6147012 Process for forming low k silicon oxide dielectric material while suppressing pressure spiking and inhibiting increase in dielectric constant |
11/14/2000 | US6147011 In the presence of activated fluorine, a dielectric layer is chemical vapor deposited over the substrate |
11/14/2000 | US6147009 Hydrogenated oxidized silicon carbon material |
11/14/2000 | US6147006 Cleaning gas |
11/14/2000 | US6146724 A laminate comprising a silicon oxide barrier layer, forming a container, such that the barrier layer is on the interior of the container; gas impermeability, resists impact, and resists abrasion |
11/14/2000 | US6146697 Introducing into reaction chamber a deposition process gas comprising a hydrogen halide and a carbon/nitrogen source, a metal-halogen compound, hydrogen, and nitrogen so that a carbonitride-containing coating is deposited on substrate |
11/14/2000 | US6146692 Caustic process for replacing a thermal barrier coating |
11/14/2000 | US6146608 Stable hydride source compositions for manufacture of semiconductor devices and structures |
11/14/2000 | US6146463 Apparatus and method for aligning a substrate on a support member |
11/14/2000 | US6146461 Chemical vapor deposition apparatus having a gas diffusing nozzle designed to diffuse gas equally at all levels |
11/14/2000 | US6146135 Oxide film forming method |
11/14/2000 | US6145763 Fluorine-coating amorphous hydronated carbon film is made in part from trifluoromethyltrimethylsilane; coating helps improve fuel economy and engine performance |
11/14/2000 | US6145469 Plasma processing apparatus and processing method |
11/09/2000 | WO2000067311A2 Method for producing a wafer support in a high-temperature cvd reactor |
11/09/2000 | WO2000066806A1 Use of a method for the plasma-supported reactive deposition of a material |
11/09/2000 | WO2000066805A1 Chamber for chemical vapour deposition |
11/09/2000 | WO2000066804A1 Device for treating a container with microwave plasma |
11/09/2000 | WO2000066506A1 Highly tetrahedral amorphous carbon coating on glass |
11/09/2000 | WO2000066353A1 Wear-resistant polymeric articles and methods of making the same |
11/09/2000 | CA2370153A1 Chamber for chemical vapour deposition |
11/08/2000 | EP1050602A2 Process chamber with inner support |
11/08/2000 | EP1050601A1 Thermal CVD process for depositing a low dielectric constant carbon-doped silicon oxide film |
11/08/2000 | EP1050600A1 Thermal CVD process for depositing a low dielectric constant carbon-doped silicon oxide film |
11/08/2000 | EP1050599A2 Method of forming interlayer insulating film |