Patents for C23C 16 - Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition (cvd) processes (71,892)
04/2003
04/10/2003WO2003030207A1 Method and device for producing a plasma
04/10/2003WO2003029517A1 Process for controlling thin film uniformity and products produced thereby
04/10/2003WO2003029516A1 Apparatus for inverted cvd
04/10/2003WO2003029515A2 Formation of composite tungsten films
04/10/2003WO2003029514A2 Method of depositing cvd and ald films onto low-dielectric-constant dielectrics
04/10/2003WO2003019624A3 Dielectric barrier discharge process for depositing silicon nitride film on substrates
04/10/2003WO2003009318A8 Support with getter-material for microelectronic, microoptoelectronic or micromechanical device
04/10/2003WO2003006933A3 System and method for detecting occlusions in a semiconductor manufacturing device
04/10/2003WO2003005396A3 Method and apparatus for scanned instrument calibration
04/10/2003WO2002097870A3 Diffuser and rapid cycle chamber
04/10/2003WO2002085809A8 Photo-induced hydrophilic article and method of making same
04/10/2003WO2002084729A3 Method for producing a chalcogenide-semiconductor layer of the abc2 type with optical process monitoring
04/10/2003US20030068881 Method of depositing low k barrier layers
04/10/2003US20030068869 Dopant precursors and processes
04/10/2003US20030068853 Method for low temperature chemical vapor deposition of low-k films using selected cyclosiloxane and ozone gases for semiconductor applications
04/10/2003US20030068851 Dopant precursors and processes
04/10/2003US20030068848 MFOS memory transistor
04/10/2003US20030068534 Formed by annealing vapor deposited film of aluminum oxide and/or silicon oxide; for manufacturing packaging container which prevents permeation of oxygen gas or steam; shelf-life; storage stability
04/10/2003US20030068533 For use in moisture sensitive electronic and microelectronic devices such as screens containing electroluminescent materials
04/10/2003US20030068448 Method for reducing contaminants in a CVD chamber
04/10/2003US20030068444 Method to solve particle performance of FSG layer by using UFU season film for FSG process
04/10/2003US20030068437 Method and apparatus for forming insulating film containing silicon oxy-nitride
04/10/2003US20030066746 Plasma polymerization enhancement of surface of metal for use in refrigerating and air conditioning
04/10/2003US20030066607 Flexibly suspended gas distribution manifold for plasma chamber
04/10/2003US20030066605 Air exhaust system of a chamber for manufacturing semiconductor device
04/10/2003US20030066587 Susceptor for semiconductor manufacturing equipment and process for producing the same
04/10/2003US20030066541 Etching; cleaning gas mixture containing fluoropolymer
04/10/2003US20030066487 Plasma processing system and surface processing method
04/10/2003US20030066486 Microwave heat shield for plasma chamber
04/10/2003US20030066485 Plasma CVD apparatus
04/10/2003US20030066484 Electrode cover, plasma apparatus utilizing the cover, and method of fitting the cover onto the plasma electrode
04/10/2003US20030066483 Atomic layer deposition apparatus and method for operating the same
04/10/2003US20030066482 Lid cooling mechanism and method for optimized deposition of low-K dielectric using TRI methylsilane-ozone based processes
04/10/2003CA2462102A1 Apparatus for inverted cvd
04/09/2003EP1300878A1 Device and method for plasma processing, and slow-wave plate
04/09/2003EP1300877A1 Plasma processing device
04/09/2003EP1300875A1 Plasma processing device
04/09/2003EP1300380A1 Adhesive composite coating for diamond and diamond-containing materials and method for producing said coating.
04/09/2003EP1299900A2 METHOD FOR ACHIEVING IMPROVED EPITAXY QUALITY (SURFACE TEXTURE AND DEFECT DENSITY) ON FREE-STANDING (ALUMINUM, INDIUM, GALLIUM) NITRIDE ((Al,In,Ga)N) SUBSTRATES FOR OPTO-ELECTRONIC AND ELECTRONIC DEVICES
04/09/2003EP1299573A2 Method to isolate multi zone heater from atmosphere
04/09/2003EP1299572A2 Method for vapour deposition of a film onto a substrate
04/09/2003EP1299571A1 Apparatus for performing at least one process on a substrate
04/09/2003EP1299461A2 Barrier layer for polymers and containers
04/09/2003EP1299404A1 Organometallic compounds and their use as precursors for forming films and powders of metal or metal derivatives
04/09/2003EP1177156B1 Highly tetrahedral amorphous carbon coating on glass
04/09/2003EP0959148B1 Method for producing diamond films using a vapour-phase synthesis system
04/09/2003EP0858579B1 Modification of metal surfaces
04/09/2003CN1409778A Magnesium-doped III-V nitrides & Methods
04/09/2003CN1408717A Ruthenium complex, its producing method and method for producing film
04/09/2003CN1105256C Gas panel
04/08/2003US6545809 Color shifting carbon-containing interference pigments
04/08/2003US6545420 Plasma reactor using inductive RF coupling, and processes
04/08/2003US6545245 Method for dry cleaning metal etching chamber
04/08/2003US6544901 Plasma thin-film deposition method
04/08/2003US6544900 In situ dielectric stacks
04/08/2003US6544889 Method for tungsten chemical vapor deposition on a semiconductor substrate
04/08/2003US6544875 Chemical vapor deposition of silicate high dielectric constant materials
04/08/2003US6544869 Method and apparatus for depositing semiconductor film and method for fabricating semiconductor device
04/08/2003US6544857 Dielectric capacitor manufacturing method and semiconductor storage device manufacturing method
04/08/2003US6544835 Method of forming a ruthenium film by CVD
04/08/2003US6544599 Providing dry particles with electrostatic charges to form dry charged particles and substrate with an electrostatic potential; contacting dry charged particles with substrate to form particle coated substrate; growing polycrystalline layer
04/08/2003US6544488 Gas, which differs from a cleaning gas and is not required to be decomposed for evacuation, is introduced upstream
04/08/2003US6544482 Reducing effluents; cleaning gases
04/08/2003US6544380 Plasma treatment method and apparatus
04/08/2003US6544345 Etching, removal deposits
04/08/2003US6544341 System for fabricating a device on a substrate with a process gas
04/08/2003US6544340 Heater with detachable ceramic top plate
04/08/2003US6544339 Rectilinear wedge geometry for optimal process control in chemical vapor deposition and rapid thermal processing
04/08/2003US6544333 Chemical vapor deposition system for polycrystalline silicon rod production
04/08/2003US6543459 Vapor deposition; cleaning; measuring capacitance; calibration
04/08/2003CA2264317C Susceptor for semiconductor manufacturing equipment and process for producing the same
04/03/2003WO2003028069A2 Method for cyclic cvd
04/03/2003WO2003027350A1 Amorphous hydrogenated carbon film
04/03/2003WO2003026796A2 A nano-supported sponge catalyst for nanotube growth
04/03/2003US20030064610 Oxidizing silicon compounds with oxygen containing compound at a constant RF power level; electrodeposition
04/03/2003US20030064607 Method for improving nucleation and adhesion of CVD and ALD films deposited onto low-dielectric-constant dielectrics
04/03/2003US20030064556 Methods and apparatus for producing stable low k FSG film for HDP-CVD
04/03/2003US20030064292 Solid-state thin-film batteries for example; creating multilayer materials by means of shadow masking a vacuum coating process on a fibrous substrate
04/03/2003US20030064231 Glass having a photocatalytically active titanium oxide coating and has a visible light reflection measured on the coated side of </= 35%
04/03/2003US20030064225 Diamond-coated member
04/03/2003US20030064198 Method of manufacturing window using ion beam milling of glass substrate(s)
04/03/2003US20030064169 Having a grid for enabling a deposition to be implemented at a low temperature
04/03/2003US20030064154 Low-K dielectric thin films and chemical vapor deposition method of making same
04/03/2003US20030063284 Chamber effluent monitoring system and semiconductor processing system comprising absorption spectroscopy measurement system, and methods of use
04/03/2003US20030062554 Oriented ferroelectric thin-film device and method for manufacturing the same
04/03/2003US20030062128 Apparatus and method for plasma treatment
04/03/2003US20030062064 Method of removing PECVD residues of fluorinated plasma using in-situ H2 plasma
04/03/2003US20030061991 Protective shield and system for gas distribution
04/03/2003US20030061989 Semiconductor manufacturing system
04/03/2003CA2458299A1 Amorphous hydrogenated carbon film
04/02/2003EP1298234A2 Method of manufacturing a single crystal substrate
04/02/2003EP1298182A2 Coating particles in a fluidized bed by vapor deposition
04/02/2003EP1297396A2 Flow control of process gas in semiconductor manufacturing
04/02/2003EP1296933A1 Self-reducible copper(ii) source reagents for chemical vapor deposition of copper metal
04/02/2003EP1189676A4 Organic acid scrubber & methods
04/02/2003EP1105356B1 Process for coating glass
04/02/2003EP1068214B1 Lewis base adducts of anhydrous mononuclear tris(beta-diketonate) bismuth compositions for deposition of bismuth-containing films, and method of making the same
04/02/2003EP1044291B1 In situ growth of oxide and silicon layers
04/02/2003EP1036406B1 Improved low mass wafer support system
04/02/2003CN1408030A Machine for coating hollow bodies