Patents for C23C 16 - Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition (cvd) processes (71,892)
03/2004
03/04/2004US20040043630 Systems and methods for forming metal oxides using metal organo-amines and metal organo-oxides
03/04/2004US20040043626 Method of forming a film on a semiconductor substrate
03/04/2004US20040043625 Systems and methods for forming metal oxides using metal compounds containing aminosilane ligands
03/04/2004US20040043604 Systems and methods for forming refractory metal nitride layers using disilazanes
03/04/2004US20040043600 Systems and methods for forming refractory metal nitride layers using organic amines
03/04/2004US20040043583 Method of forming nanocrystals in a memory device
03/04/2004US20040043569 Atomic layer deposited HfSiON dielectric films
03/04/2004US20040043557 Methods for making a dielectric stack in an integrated circuit
03/04/2004US20040043555 Carbon doped oxide deposition
03/04/2004US20040043544 Manufacturing method of semiconductor device and substrate processing apparatus
03/04/2004US20040043541 Atomic layer deposited lanthanide doped TiOx dielectric films
03/04/2004US20040043245 Method to control silver concentration in a resistance variable memory element
03/04/2004US20040043218 Low-temperature plasma deposited hydrogenated amorphous germanium carbon abrasion-resistant coatings
03/04/2004US20040043151 Vapor deposition; diffusion barrier
03/04/2004US20040043149 Vapor deposition of metal oxides, silicates and phosphates, and silicon dioxide
03/04/2004US20040043148 Vapor deposition; connecting tubes with metal strips
03/04/2004US20040041286 Method and apparatus for supplying a source gas
03/04/2004US20040041194 Metal plating using seed film
03/04/2004US20040040933 Wafer processing apparatus and a wafer stage and a wafer processing method
03/04/2004US20040040661 Load port capable of coping with different types of cassette containing substrates to be processed
03/04/2004US20040040508 Segmented cold plate for rapid thermal processing (RTP) tool for conduction cooling
03/04/2004US20040040507 Plasma processing apparatus
03/04/2004US20040040506 High throughput deposition apparatus
03/04/2004US20040040505 Delivery of liquid precursors to semiconductor processing reactors
03/04/2004US20040040503 Micromachines for delivering precursors and gases for film deposition
03/04/2004US20040040502 Micromachines for delivering precursors and gases for film deposition
03/04/2004US20040040501 Systems and methods for forming zirconium and/or hafnium-containing layers
03/04/2004US20040040496 Excimer uv photo reactor
03/04/2004US20040040494 Systems and methods for forming strontium- and/or barium-containing layers
03/04/2004DE19839996B4 Verfahren und Vorrichtung zum Reduzieren der Reibung an polymeren Oberflächen sowie entsprechend modifiziertes Schlauchmaterial Method and apparatus for reducing the friction of polymeric surfaces and appropriately modified tubing
03/04/2004DE19717825B4 Verfahren zur Aluminiumnitrid-Beschichtung der Zylinderlauffläche eines Kurbelgehäuses aus einer Al-Basislegierung und entsprechendes Kurbelgehäuse A process for the aluminum nitride coating on the cylinder surface of a crank case of an Al-base alloy and crankcase corresponding
03/03/2004EP1394844A1 Method of fabricating semiconductor device
03/03/2004EP1394842A1 Thin film forming apparatus cleaning method
03/03/2004EP1394290A2 Process for the production of precision tubes
03/03/2004EP1394287A2 Glass coating reactor cleaning with a reactive gas
03/03/2004EP1394286A1 Pretreatment of an organic layer for ALD thereof
03/03/2004EP1394285A1 Substrate with functional layer
03/03/2004EP1394283A1 Process and apparatus for coating of large area of substrates under atmospheric pressure
03/03/2004EP1394164A1 Precursor containing a nitrogen compound bound to HfCl4 for hafnium oxide layer and method for forming hafnium oxide film using the precursor
03/03/2004EP1393361A2 Low temperature load and bake
03/03/2004EP1393359A1 Rector having a movable shuter
03/03/2004EP1393358A1 Doped silicon deposition process in resistively heated single wafer chamber
03/03/2004EP1393354A1 Method and device for the thermal treatment of substrates
03/03/2004EP1393350A2 Assembly comprising heat distributing plate and edge support
03/03/2004EP1392885A1 Gas port sealing for cvd/cvi furnace hearth plates
03/03/2004EP1392478A2 Ultrasonic cutting tool coated by diamond cvd
03/03/2004EP1392462A2 SOURCE REAGENT COMPOSITION FOR CVD FORMATION OF Zr/Hf DOPED GATE DIELECTRIC AND HIGH DIELECTRIC CONSTANT METAL OXIDE THIN FILMS AND METHOD OF USING SAME
03/03/2004EP1166324B1 Apparatus for improving plasma distribution and performance in an inductively coupled plasma
03/03/2004EP0909343B1 Method for refurbishing brakes
03/03/2004CN1479805A Thin film forming method and film forming device
03/03/2004CN1479804A Ultralow dielectric constant material as intralevel or interlevel dielectric in semiconductor device, method for fabricating the same, and electronic device containing the same
03/03/2004CN1479801A Method for regenerating container for plasma treatement, member inside container for plasma treatment, method for preparing member inside container for plasma treatment, and apparatus for plasma ...
03/03/2004CN1479796A Coated cutting tool insert with iron-nickel based binder phase
03/03/2004CN1479683A Production device for DLC film-coated plastic container and production method therefor
03/03/2004CN1140933C Photoelectric element and method of producing same
03/03/2004CN1140651C Chemical gas-phase deposition and osmosis process precursor supply and monitoring and equipment
03/03/2004CN1140650C Drive circuit of pulse power supply for plasma aided chemical gas-phase deposition apparatus
03/02/2004US6701202 Performance evaluation method for plasma processing apparatus
03/02/2004US6701066 Delivery of solid chemical precursors
03/02/2004US6700202 Reducing the oxidized interface with a hydrogen containing plasma and introducing second-layer-forming compounds
03/02/2004US6700099 Wafer chuck having thermal plate with interleaved heating and cooling elements, interchangeable top surface assemblies and hard coated layer surfaces
03/02/2004US6699786 Method for forming a semiconductor device that uses a low resistance tungsten silicide layer with a strong adherence to an underlayer
03/02/2004US6699784 Method for depositing a low k dielectric film (K>3.5) for hard mask application
03/02/2004US6699783 Method for controlling conformality with alternating layer deposition
03/02/2004US6699768 Method for forming capacitor of semiconductor device
03/02/2004US6699752 Formation of conductive rugged silicon
03/02/2004US6699531 Enhancing the thermostability of a fluorine containing carbon film capable of being used as, e.g., an interlayer dielectric by reacting fluorine within film with hydrogen plasma
03/02/2004US6699530 Method for constructing a film on a semiconductor wafer
03/02/2004US6699525 Method of forming carbon nanotubes and apparatus therefor
03/02/2004US6699524 Method and apparatus for feeding gas phase reactant into a reaction chamber
03/02/2004US6699375 Method of extending process kit consumable recycling life
03/02/2004US6699022 Vacuum exhaust apparatuses and vacuum exhaust methods
03/02/2004US6698728 Method and apparatus for delivering precursors to a plurality of epitaxial reactor sites
03/02/2004CA2323255C Gas shower unit for semiconductor manufacturing apparatus and semiconductor manufacturing apparatus
02/2004
02/26/2004WO2004017394A1 Method for the vertical structuring of substrates in semiconductor process technology by means of non-conforming deposition
02/26/2004WO2004017383A2 Low termperature deposition of silicon oxides and oxynitrides
02/26/2004WO2004017378A2 Atomic layer deposition of high k metal silicates
02/26/2004WO2004017377A2 Atomic layer deposition of high k metal oxides
02/26/2004WO2003078874A3 Coated microfluidic delivery system
02/26/2004WO2003064059A3 Integration of titanium and titanium nitride layers
02/26/2004WO2003054247A3 Cleaning gas composition for semiconductor production equipment and cleaning method using the gas
02/26/2004WO2003038892A3 Atomic-layer-deposited tantalum nitride and alpha-phase tantalum as barrier layers for copper metallization
02/26/2004WO2002082530A3 In-situ thickness measurement for use in semiconductor processing
02/26/2004WO2002067319A8 Copper interconnect structure having diffusion barrier
02/26/2004US20040039219 Chemical vapor deposition by dosing with a stabilizer of free-radical inhibitors, end-capping agents and mixtures; forming low-dielectric constant thin films which lower power consumption, reduces cross-talk, and shortens signal delay
02/26/2004US20040038554 Composite dielectric forming methods and composite dielectrics
02/26/2004US20040038551 Method for controlling the temperature of a gas distribution plate in a process reactor
02/26/2004US20040038550 Thin interface layer to improve copper etch stop
02/26/2004US20040038545 Plasma processes for depositing low dielectric constant films
02/26/2004US20040038525 Enhanced atomic layer deposition
02/26/2004US20040038514 Method for forming low-k hard film
02/26/2004US20040038494 Manufacturing method of semiconductor integrated circuit device
02/26/2004US20040038477 Haze-free BST films
02/26/2004US20040038069 CVD codeposition of Al and one or more reactive (gettering) elements to form protective aluminide coating
02/26/2004US20040038051 Total area of a base surface of projections >/= 250 nm high occupies >/= 5% of an area of a surface on which the conductive film is formed; increasing the adhesion strength between conductive film-crystalline silicon thin film
02/26/2004US20040038033 Dlc layer system and method for producing said layer system
02/26/2004US20040037973 Deposition and chamber treatment methods
02/26/2004US20040037972 Patterned granulized catalyst layer suitable for electron-emitting device, and associated fabrication method
02/26/2004US20040037971 Supplies plasma processing gas into chamber, sets pressure to preset value, generates plasma by capacitatively coupled discharge, emission of electromagnetic wave by radio frequency displacement current and forming magnetic field
02/26/2004US20040037970 Method for forming gas cluster and method for forming thin film