Patents for C09G 1 - Polishing compositions (7,846)
05/2005
05/25/2005EP1532222A1 Method and apparatus for chemically, mechanically, and/or electrolytically removing material from microelectronic substrates
05/25/2005DE202005004076U1 Polishing composition, especially for motor vehicle paintwork, contains UV-crosslinkable wax, polyethylene wax, paraffin, polysiloxane, silicone wax, hydrocarbon, terpene, abrasive and polytetrafluoroethylene
05/25/2005CN1620488A Cmp systems and methods utilizing amine-containing polymers
05/25/2005CN1618909A Novel slurry for chemical mechanical polishing of metals
05/25/2005CN1618821A Latex used for phospho lipid modified floor polishing agent
05/25/2005CN1203529C Polishing compound for chemimachanical polishing and method for polishing substrate
05/24/2005US6896825 Oxidizing agent for a metal and a dissolving agent, first and second film forming agents
05/24/2005US6896710 Abrasives for CMP applications
05/24/2005US6896591 Mixed-abrasive polishing composition and method for using the same
05/24/2005US6896590 CMP slurry and method for manufacturing a semiconductor device
05/19/2005US20050106874 Method of manufacturing a semiconductor device
05/19/2005US20050104048 Compositions and methods for polishing copper
05/19/2005US20050103743 Slurry and use thereof for polishing
05/18/2005CN1616575A 抛光组合物 The polishing composition
05/18/2005CN1616574A High-rate barrier polishing composition
05/18/2005CN1616573A Slurry for CMP, polishing method and method of manufacturing semiconductor device
05/18/2005CN1616572A Nano polishing liquid for sulfuric compound phase changing material chemical mechanical polishing and its use
05/18/2005CN1616571A Barrier polishing fluid
05/18/2005CN1616503A Emulsoid for water base floor polishing agent
05/18/2005CN1202197C Cerium based abrasive material and method for evaluating cerium based abrasive material
05/17/2005US6893477 Cerium-based abrasive material slurry and method for producing cerium-based abrasive material slurry
05/17/2005US6893476 Composition and associated methods for chemical mechanical planarization having high selectivity for metal removal
05/12/2005WO2005042828A2 Stabilized body care products, household products, textiles and fabrics
05/12/2005WO2005042658A1 Abrasive-free che.mical mechanical polishing composition and polishing process containing same
05/12/2005US20050100666 Aerosol method and apparatus, coated particulate products, and electronic devices made therefrom
05/12/2005US20050098764 Small particle size, narrow particle size distribution, spherical morphology and good crystallinity
05/12/2005US20050098758 applying slurries comprising carrier fluids, particles, etchants and surfactants, to the surfaces of glass, ceramic, metal or alloy substrates use in data storage, then rubbing with pads
05/12/2005US20050097988 Generating an aerosol including a nickel metal precursor and moving the droplets through a heating zone to form nickel particles; while in the aerosol stream forming a coating on the particles, the coating comprising a material is different than the nickel-containing material; flat panel displays
05/12/2005US20050097825 For polishing semiconductor wafers comprising tantalum barrier material in presence of dielectric and interconnect metal; comprises triazole and/or tetrazole compounds as promoters
05/12/2005DE10342826B3 Dispersion von pyrogen hergestelltem Ceroxid Dispersion of fumed ceria
05/11/2005EP1530232A2 Process solutions containing surfactants used as post-chemical mechanical planarization treatment
05/11/2005CN1613941A Polishing composition
05/11/2005CN1613607A Polishing kit for magnetic disk
05/11/2005CN1200984C Slurry material for polishing
05/10/2005US6890643 Floor polishing composition
05/05/2005US20050095860 Abrasive liquid for metal and method for polishing
05/05/2005US20050092962 Abrasives for copper CMP and methods for making
05/04/2005CN1200066C Polishing composition
05/03/2005US6887566 Ceria composition and process for preparing same
05/03/2005US6887289 Hydroxylation of cerium, lanthanum and neodymium salts, then oxidizing in air to form metal oxides used in chemical mechanical polishing of substrates
05/03/2005US6887137 Chemical mechanical polishing slurry and chemical mechanical polishing method using the same
04/2005
04/28/2005US20050090109 CMP method for copper, tungsten, titanium, polysilicon, and other substrates using organosulfonic acids as oxidizers
04/28/2005US20050090106 Method of second step polishing in copper CMP with a polishing fluid containing no oxidizing agent
04/28/2005US20050090104 Slurry compositions for chemical mechanical polishing of copper and barrier films
04/27/2005EP1526163A1 Method of second step polishing in copper CMP with a polishing fluid containing no oxidizing agent
04/27/2005EP1525280A1 Aqueous resin dispersion for floors, and floor polish using same
04/27/2005CN1610963A Polishing fluid and polishing method
04/27/2005CN1610730A Alkali metal-containing polishing system and method
04/27/2005CN1610578A Viscosity modification of petroleum distillates
04/27/2005CN1610072A Method of second step polishing in copper CMP with a polishing fluid containing no oxidizing agent
04/27/2005CN1609156A Composition for polishing semiconductor layers
04/27/2005CN1609155A Polishing composition for semiconductor wafers
04/26/2005US6884338 Etching by using a bis(perfluoroalkanesulfonyl) imide acids or a tris(perfluoroalkanesulfonyl) methide, having acidity properties, providing smooth surface
04/26/2005US6884144 Methods and systems for planarizing microelectronic devices with Ge-Se-Ag layers
04/21/2005WO2005035688A1 Abrasive for chemical mechanical polishing and method for producing the same
04/21/2005WO2005035678A1 Chemical-mechanical polishing (cmp) slurry and method of planarizing surfaces
04/21/2005WO2005035677A1 Chemical-mechanical polishing (cmp) slurry and method of planarizing computer memory disk surfaces
04/21/2005US20050085168 Cerium oxide abrasive and method of polishing substrates
04/21/2005US20050085166 Process for chemical-mechanical polishing of metal substrates
04/21/2005US20050081998 Chemical-mechanical planarization slurries and powders and methods for using same
04/21/2005US20050081885 Contacting the substrate with a process solution of surfactants; reducing the number of defects in the manufacture of semiconductor devices; reducting dynamic surface tension while minimizing foaming
04/20/2005CN1608116A Methods for planarization of metal-containing surfaces using halogens and halides salts
04/20/2005CN1607067A Planarization system and method using a carbonate containing fluid
04/20/2005CN1197930C Polishing fluid composition
04/19/2005US6881757 Aerosol biliquid foam
04/19/2005US6881674 Abrasives for chemical mechanical polishing
04/14/2005WO2005034226A1 Metal polishing composition
04/14/2005WO2005033234A2 Novel slurry for chemical mechanical polishing of metals
04/14/2005US20050079804 Planarizing solutions including abrasive elements, and methods for manufacturing and using such planarizing solutions
04/14/2005US20050079803 Chemical-mechanical planarization composition having PVNO and associated method for use
04/14/2005US20050079718 Chemical-mechanical planarization composition with nitrogen containing polymer and method for use
04/14/2005US20050079709 Planarization system and method using a carbonate containing fluid
04/14/2005US20050079349 Producing large quantities of a high quality, dense aerosol for spray pyrolysis operations; multi-phase particles for use in manufacturing electrically-conductive metallic films for electronic products
04/14/2005US20050076582 water-insoluble abrasive polishing agents suspended in an aqueous medium in combination, which avoids the need and cost of dry milling; use in dentifrices
04/14/2005US20050076581 Particulate or particle-bound chelating agents
04/14/2005US20050076580 Acidic aqueous slurry comprising silica abrasive particles, oxidizer (hydrogen peroxide), quaternary ammonium hydroxide, phosphoric acid, and water; semiconductors; integrated circuits; photolithography; chemical mechanical polishing
04/14/2005US20050076579 Bicine/tricine containing composition and method for chemical-mechanical planarization
04/14/2005US20050076578 Tunable composition and method for chemical-mechanical planarization with aspartic acid/tolyltriazole
04/13/2005EP1522565A2 Polishing composition and use thereof
04/13/2005CN1196760C Method for polishing or planarizing substrate
04/13/2005CN1196759C Process for preparation of metal oxide slurry adaptable to chemical-mechanical polishing of semiconductor
04/07/2005WO2005031836A1 Polishing composition and polishing method
04/07/2005WO2005031226A1 Method and apparatus for combining food particles and ice cream
04/07/2005US20050075052 Method and system for planarizing integrated circuit material
04/07/2005US20050074975 Chemical-mechanical polishing (CMP) slurry and method of planarizing surfaces
04/07/2005US20050074967 Polishing method
04/07/2005US20050074610 Hydrocarbon feedstock is mixed with water; heated in presence of a catalyst to form a methane-enriched pre-reformate product
04/07/2005US20050072524 System for the preferential removal of silicon oxide
04/07/2005US20050072054 Safe for nickel phosphide, glass and/or ceramic materials; polishing efficiency, uniformity, removal rate; minimizing defects; includes purified sodium containing clays
04/07/2005CA2526160A1 Method and apparatus for combining food particles and ice cream
04/06/2005EP1520894A1 Barrier polishing fluid
04/06/2005EP1520893A1 High-rate barrier polishing composition
04/06/2005EP1520892A2 Polishing composition
04/06/2005CN1603377A Composition for decontaminating and glazing automobile housing and method for preparing same
04/06/2005CN1603063A Method for preparing anode copper ball and apparatus thereof
04/06/2005CN1195896C Chemical mechanical polishing (CMP) slurry for copper and method of use in integrated circuit manufacture
04/05/2005US6875834 Two-component coating composition and method of preparation
04/05/2005US6875372 Fine particle size; monodispersion; crystal structure
03/2005
03/31/2005WO2005029563A1 Polishing composition for silicon wafer and polishing method
03/31/2005US20050070211 Barrier polishing fluid
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