| Patents for B24B 49 - Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation (8,827) |
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| 06/06/2002 | WO2002043920A1 Hand tool comprising a sensor for emitting a signal when the tool attachment is replaced |
| 06/06/2002 | US20020066197 Method for measuring work portion and machining method |
| 06/06/2002 | CA2430377A1 Abrasive article having a window system for polishing wafers, and methods |
| 06/05/2002 | EP1211028A2 Quick change system for touch probe assembly |
| 06/05/2002 | CN2494250Y Rear fork measurer |
| 06/05/2002 | CN1352588A Abrasive processing apparatu sand method for employing encoded abrasive product |
| 06/05/2002 | CN1352587A Apparatus and process for reconditioning polishing pads |
| 06/04/2002 | US6400114 Numerical control apparatus for roll grinding machine |
| 06/04/2002 | US6399501 Method and apparatus for detecting polishing endpoint with optical monitoring |
| 06/04/2002 | US6399498 Method and apparatus for polishing work |
| 06/04/2002 | US6399148 Multilayer structure; metallic layer, dielectric, resistor and connector |
| 06/04/2002 | US6398625 Apparatus and method of polishing with slurry delivery through a polishing pad |
| 06/04/2002 | US6398622 Polishing mechanism for vehicle bumper |
| 06/04/2002 | US6398621 Carrier head with a substrate sensor |
| 06/04/2002 | US6398077 Package with multiple chambers and valves |
| 05/30/2002 | WO2002043129A2 Method for determinating an endpoint during cmp of a semiconductor wafer |
| 05/30/2002 | WO2002043128A1 Polishing device and method of manufacturing semiconductor device |
| 05/30/2002 | WO2002042033A1 Semiconductor wafer, polishing apparatus and method |
| 05/30/2002 | US20020065028 Bathless wafer measurement apparatus and method |
| 05/30/2002 | US20020065024 Sound enhanced lapping process |
| 05/30/2002 | US20020064971 Chemical Mechanical Polishing(CMP); Copper(Cu); performing CMP at low temperatures by adding a slurry that functions as a corrosion inhibitor; polishing apparatus with coolant |
| 05/30/2002 | US20020063860 Method for inspecting a polishing pad in a semiconductor manufacturing process, an apparatus for performing the method, and a polishing device adopting the apparatus |
| 05/29/2002 | EP1207981A1 Spindle assembly for force controlled polishing |
| 05/29/2002 | EP1207980A1 Method and device for treating spectacle glasses by means of a cnc-controlled spectacle glass treatment machine |
| 05/29/2002 | DE10054509A1 Continuous measurement of the amount of material removed from the inner wall of a round bored recess during a material removal process by use of a laser interferometer |
| 05/29/2002 | CN1351532A Rotary abrasive tool |
| 05/28/2002 | US6395130 Hydrophobic optical endpoint light pipes for chemical mechanical polishing |
| 05/28/2002 | US6394882 CMP method and substrate carrier head for polishing with improved uniformity |
| 05/23/2002 | WO2001046684A9 In-situ metalization monitoring using eddy current measurements and optical measurements |
| 05/23/2002 | US20020061720 Carrier head with controllable pressure and loading area for chemical mechanical polishing |
| 05/23/2002 | US20020061717 Lap having a layer conformable to curvatures of optical surfaces on lenses and a method for finishing optical surfaces |
| 05/23/2002 | US20020061716 Workpiece carrier with adjustable pressure zones and barriers |
| 05/23/2002 | US20020061713 End-point detection system for chemical mechanical polishing applications |
| 05/21/2002 | US6390908 Determining when to replace a retaining ring used in substrate polishing operations |
| 05/21/2002 | US6390905 Workpiece carrier with adjustable pressure zones and barriers |
| 05/21/2002 | US6390903 Precise polishing apparatus and method |
| 05/21/2002 | US6390887 Pre-cutter and edger machine |
| 05/21/2002 | CA2118568C Tool grinding machine |
| 05/16/2002 | WO2002038336A1 A method and apparatus for controlled polishing |
| 05/16/2002 | WO2002018100A3 Method and apparatus for measuring a polishing condition |
| 05/16/2002 | WO2002002277A3 A conditioning mechanism in a chemical mechanical polishing apparatus for semiconductor wafers |
| 05/16/2002 | US20020058465 Method of abrading both faces of work piece |
| 05/16/2002 | US20020058461 Method and apparatus for polishing |
| 05/16/2002 | US20020058460 Method of controlling wafer polishing time using sample-skip algorithm and wafer polishing using the same |
| 05/14/2002 | US6387809 A small amount of single-side lapping is repeated alternately on the two surfaces of a semiconductor silicon single crystal wafer to get to a predetermined total lapping stock removal |
| 05/14/2002 | US6386955 Carrier head with a flexible membrane for a chemical mechanical polishing system |
| 05/14/2002 | US6386948 Magnet member cutting method and magnet member cutting |
| 05/14/2002 | US6386947 Method and apparatus for detecting wafer slipouts |
| 05/14/2002 | US6386945 Method of correcting conicity in a tire with a feedback loop |
| 05/14/2002 | US6386024 Apparatus for monitoring tread thickness during tire buffing |
| 05/10/2002 | WO2001030534A3 Constant spindle power grinding method |
| 05/09/2002 | US20020055192 Chemical mechanical polishing of a metal layer with polishing rate monitoring |
| 05/08/2002 | DE10052753A1 Gerät zum Festwalzen von Kurbelwellen Device for the deep rolling crankshafts |
| 05/07/2002 | US6383332 For semiconductors |
| 05/07/2002 | US6383059 Polishing chucks, semiconductor wafer polishing chucks, abrading methods, polishing methods, semiconductor wafer polishing methods, and methods of forming polishing chucks |
| 05/07/2002 | US6383058 Adaptive endpoint detection for chemical mechanical polishing |
| 05/07/2002 | US6383057 Environmental conditioning of workpieces |
| 05/02/2002 | WO2002015261A3 Bathless wafer measurement apparatus and method |
| 05/02/2002 | US20020052166 Polishing system |
| 05/02/2002 | US20020052052 Chemical-mechanical planarization machine and method for uniformly planarizing semiconductor wafers |
| 05/02/2002 | US20020051135 Apparatus for optical inspection of wafers during polishing |
| 05/02/2002 | US20020050154 Method for manufacturing glass base material and glass base material grinding apparatus |
| 05/02/2002 | EP1201365A2 Frequency measuring device, polishing device using the same and eddy current sensor |
| 05/02/2002 | EP1201364A1 Apparatus for rolling of crankshafts |
| 05/02/2002 | EP1201358A2 A sanding machine |
| 05/02/2002 | EP1201356A1 Method and apparatus for grinding a glass base material |
| 05/02/2002 | EP1200228A1 Improvement in and relating to edge grinding |
| 05/02/2002 | DE10150443A1 Verfahren und Vorrichtung zur Herstellung eines Endlosmetallriemens und nach dem Verfahren hergestellter Endlosmetallriemen Method and apparatus for manufacturing an endless metal belt and prepared according to the procedure endless metal belt |
| 05/02/2002 | DE10051002A1 Removed material and diameter measuring method during internal fine machining of bore, involves continuously measuring capacitance between electrode in tool and workpiece |
| 04/30/2002 | US6379235 Wafer support for chemical mechanical planarization |
| 04/30/2002 | US6379223 Method and apparatus for electrochemical-mechanical planarization |
| 04/30/2002 | US6379222 Methods and apparatus for chemical mechanical planarization (CMP) of a semiconductor wafer |
| 04/30/2002 | US6379219 Chemical mechanical polishing machine and chemical mechanical polishing method |
| 04/30/2002 | US6379218 Machine for machining workpieces with cutting teeth, especially saw blades |
| 04/30/2002 | US6379215 Eyeglass lens processing system |
| 04/25/2002 | WO2002033737A2 Multiprobe detection system for chemical-mechanical planarization tool |
| 04/25/2002 | US20020049033 Polishing pad comprising a filled translucent region |
| 04/25/2002 | US20020049029 System and method for chemical mechanical polishing |
| 04/25/2002 | US20020049024 Carrier head with a substrate sensor |
| 04/25/2002 | US20020047705 Frequency measuring device, polishing device using the same and eddy current sensor |
| 04/25/2002 | DE10134808A1 Grinding unit for a tire truing machine comprises a linearly supported axially movable arm with a grinding disc and motor for rotation |
| 04/25/2002 | DE10051253A1 Machine to grind to size esp. bricks and brick molds has working stations with associated optical measuring devices on either side of brick conveyor to determine distance to bricks |
| 04/24/2002 | EP1199135A1 Work holding panel for polishing, and device and method for polishing |
| 04/24/2002 | EP1113902A4 Grinding machine, computer software to operate such a machine, and their uses therefor |
| 04/24/2002 | CN1346300A Modular controlled platen preparation system and method |
| 04/24/2002 | CN1345649A Double abrasive wheel |
| 04/23/2002 | US6375791 Method and apparatus for detecting presence of residual polishing slurry subsequent to polishing of a semiconductor wafer |
| 04/23/2002 | US6375553 Polishing chucks, semiconductor wafer polishing chucks, abrading methods, polishing methods, semiconductor wafer polishing methods, and methods of forming polishing chucks |
| 04/23/2002 | US6375551 Angstrom polishing of calcium fluoride optical VUV microlithography lens elements and preforms |
| 04/23/2002 | US6375550 Method and apparatus for enhancing uniformity during polishing of a semiconductor wafer |
| 04/23/2002 | US6375549 Polishing head for wafer, and method for polishing |
| 04/23/2002 | US6375540 End-point detection system for chemical mechanical posing applications |
| 04/18/2002 | WO2002031874A1 Abrasive cloth, polishing device and method for manufacturing semiconductor device |
| 04/18/2002 | WO2002031866A2 Infrared end-point system for cmp |
| 04/18/2002 | WO2002030617A1 Polishing pad comprising a filled translucent region |
| 04/18/2002 | US20020045404 Method of taking up wear of a grinding wheel on a machine for grinding sheets of glass, and grinding machine implementing such a method |
| 04/18/2002 | US20020042977 Method and apparatus for manufacturing endless metallic belt, and the endless metallic belt manufactured by the method |
| 04/17/2002 | EP1197295A2 Method of taking up wear of a grinding wheel on a machine for grinding sheets of glass, and grinding machine implementing such a method |
| 04/17/2002 | EP1197294A1 Centerless grinder with measuring device |
| 04/17/2002 | EP1197293A1 Polishing device and method |