| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 04/28/1999 | EP0911870A2 Method for creating via hole in chip |
| 04/28/1999 | EP0911869A2 Low temperature method for forming a uniform thin oxide layer |
| 04/28/1999 | EP0911868A2 Device for gripping magazines |
| 04/28/1999 | EP0911867A2 Processing apparatus with a robot |
| 04/28/1999 | EP0911796A1 Matrix substrate, liquid crystal display device and projection type liquid crystal display apparatus employing the same with reduced field-through effect between subsequent scan lines |
| 04/28/1999 | EP0911697A2 A fluorinated hard mask for micropatterning of polymers |
| 04/28/1999 | EP0911641A1 Test pad having an automatic positioning microprobe and method for realisation therefor |
| 04/28/1999 | EP0911606A1 Integrated angular speed sensor device and production method thereof |
| 04/28/1999 | EP0911431A1 Single crystal silicon wafer with increased mechanical resistance |
| 04/28/1999 | EP0911117A2 Hand tool for manipulating recticle plate |
| 04/28/1999 | EP0911115A1 Polishing apparatus |
| 04/28/1999 | EP0911088A2 Process for coating a surface |
| 04/28/1999 | EP0910870A2 Power semiconductor devices with a temperature sensor circuit |
| 04/28/1999 | EP0910869A1 A METHOD FOR PRODUCING A CHANNEL REGION LAYER IN A SiC-LAYER FOR A VOLTAGE CONTROLLED SEMICONDUCTOR DEVICE |
| 04/28/1999 | EP0910868A1 Method and apparatus for contactless treatment of a semiconductor substrate in wafer form |
| 04/28/1999 | EP0910686A1 Temperature controlling method and apparatus for a plasma processing chamber |
| 04/28/1999 | EP0910498A1 Robot handling apparatus |
| 04/28/1999 | EP0839390B1 Electrically erasable and programmable non-volatile storage location |
| 04/28/1999 | EP0683922B1 Method of bonding semiconductor chips to a substrate |
| 04/28/1999 | CN1215503A Light emitting element, semiconductor light emitting device, and method for manufacturing them |
| 04/28/1999 | CN1215501A Semiconductor device and method for manufacturing the same |
| 04/28/1999 | CN1215231A Integrated circuit device with at least one electric capacitor and making method thereof |
| 04/28/1999 | CN1215230A Metal wire transversal displacement control in semiconductor device |
| 04/28/1999 | CN1215229A Method for making semiconductor device |
| 04/28/1999 | CN1215228A Method for making semiconductor device |
| 04/28/1999 | CN1215227A Method for making semiconductor device |
| 04/28/1999 | CN1215226A Crystal wafer fixing device and method |
| 04/28/1999 | CN1215225A Raise of anti-mechanical force single crystal wafer |
| 04/28/1999 | CN1215224A Transistor and making method thereof |
| 04/28/1999 | CN1215223A Transistor, semiconductor circuit and making method thereof |
| 04/28/1999 | CN1215222A Etchant and method using same to making semiconductor device |
| 04/28/1999 | CN1215221A Figure working position alignment method |
| 04/28/1999 | CN1215214A Coated thin metal wire and method for making semiconductor device using same |
| 04/28/1999 | CN1215212A Method and device for reducing bias current in reference voltage circuit |
| 04/28/1999 | CN1215211A Dynamic type semiconductor memory device with valve value compensation function |
| 04/28/1999 | CN1215093A Film coating device for roughly flat sheet shaped substrate |
| 04/28/1999 | CN1214988A Method for processing through-hole on crystal chip with transparent cover |
| 04/28/1999 | CN1214987A Method for processing through-hole on crystal chip with protective layer |
| 04/28/1999 | CN1043173C Semiconductor diode consisting of groove shape casing component and packaging method |
| 04/27/1999 | US5898727 High-temperature high-pressure gas processing apparatus |
| 04/27/1999 | US5898725 Excimer laser with greater spectral bandwidth and beam stability |
| 04/27/1999 | US5898703 Device and method for testing integrated circuit including bi-directional test pin for receiving control data and outputting observation data |
| 04/27/1999 | US5898700 Test signal generator and method for testing a semiconductor wafer having a plurality of memory chips |
| 04/27/1999 | US5898633 Circuit and method of limiting leakage current in a memory circuit |
| 04/27/1999 | US5898619 Memory cell having a plural transistor transmission gate and method of formation |
| 04/27/1999 | US5898616 Semiconductor nonvolatile memory and source circuit for this memory |
| 04/27/1999 | US5898615 Semiconductor memory device having non-volatile memory cells connected in series |
| 04/27/1999 | US5898611 SRAM with high speed read/write operation |
| 04/27/1999 | US5898606 Electrically programmable and erasable nonvolatile semiconductor memory device and operating method therefor |
| 04/27/1999 | US5898595 Automated generation of megacells in an integrated circuit design system |
| 04/27/1999 | US5898500 Device and method for three-dimensional measurements and observation in situ of a surface layer deposited on a thin-film stack |
| 04/27/1999 | US5898491 Surface defect test method and surface defect tester |
| 04/27/1999 | US5898480 Exposure method |
| 04/27/1999 | US5898477 Exposure apparatus and method of manufacturing a device using the same |
| 04/27/1999 | US5898228 On-chip misalignment indication |
| 04/27/1999 | US5898227 Alignment targets having enhanced contrast |
| 04/27/1999 | US5898226 Semiconductor chip having a bonding window smaller than a wire ball |
| 04/27/1999 | US5898225 Lead frame bonding power distribution systems |
| 04/27/1999 | US5898224 Apparatus for packaging flip chip bare die on printed circuit boards |
| 04/27/1999 | US5898221 Semiconductor device having upper and lower wiring layers |
| 04/27/1999 | US5898216 Micromodule with protection barriers and a method for manufacturing the same |
| 04/27/1999 | US5898215 Microelectronic assembly with connection to a buried electrical element, and method for forming same |
| 04/27/1999 | US5898214 Wire bonding device |
| 04/27/1999 | US5898213 Semiconductor package bond post configuration |
| 04/27/1999 | US5898212 Lead frame and semiconductor package |
| 04/27/1999 | US5898210 Semiconductor diode with high turn on and breakdown voltages |
| 04/27/1999 | US5898207 Method for making a semiconductor device |
| 04/27/1999 | US5898206 Semiconductor device |
| 04/27/1999 | US5898203 Semiconductor device having solid phase diffusion sources |
| 04/27/1999 | US5898202 Selective spacer formation for optimized silicon area reduction |
| 04/27/1999 | US5898201 Low resistance, high breakdown voltage, power mosfet |
| 04/27/1999 | US5898200 Microwave integrated circuit |
| 04/27/1999 | US5898197 Non-volatile semiconductor memory devices |
| 04/27/1999 | US5898190 P-type electrode structure and a semiconductor light emitting element using the same structure |
| 04/27/1999 | US5898189 Integrated circuit including an oxide-isolated localized substrate and a standard silicon substrate and fabrication method |
| 04/27/1999 | US5898188 Semiconductor device and method for its fabrication |
| 04/27/1999 | US5898187 Thin film transistor |
| 04/27/1999 | US5898186 Reduced terminal testing system |
| 04/27/1999 | US5898182 Exposure mask contamination inspect method and system therefor |
| 04/27/1999 | US5898179 Method and apparatus for controlling a workpiece in a vacuum chamber |
| 04/27/1999 | US5898007 Implanting impurity ions sequentially four times on a substrate, forming well and channel stop, two step rapid annealing |
| 04/27/1999 | US5898006 Method of manufacturing a semiconductor device having various types of MOSFETS |
| 04/27/1999 | US5897983 Simplified process including single formation of silicon film, single anisotropic dry etching, single wet etching |
| 04/27/1999 | US5897982 Resist develop process having a post develop dispense step |
| 04/27/1999 | US5897978 Mask data generating method and mask for an electron beam exposure system |
| 04/27/1999 | US5897977 Attenuating embedded phase shift photomask blanks |
| 04/27/1999 | US5897976 Physical vapor depositing atleast one layer of aluminum compound and atleast one component that is more optically absorbing than aluminum compound at selected lithographic wavelength on a substrate |
| 04/27/1999 | US5897975 Phase shift mask for formation of contact holes having micro dimension |
| 04/27/1999 | US5897939 Substrate of the silicon on insulator type for the production of transistors and preparation process for such a substrate |
| 04/27/1999 | US5897923 Plasma treatment device |
| 04/27/1999 | US5897883 Mold having projections for inhibiting the formation of air pockets |
| 04/27/1999 | US5897799 Laser processing apparatus |
| 04/27/1999 | US5897753 Continuous deposition of insulating material using multiple anodes alternated between positive and negative voltages |
| 04/27/1999 | US5897752 Vacuum chamber containing a ring surrounding the wafer substrate clamped to pedestal so that the ring rises up toward target and its electrical bias controls plasma potential |
| 04/27/1999 | US5897743 Jig for peeling a bonded wafer |
| 04/27/1999 | US5897740 Plasma processing system |
| 04/27/1999 | US5897728 Integrated circuit test structure and test process |
| 04/27/1999 | US5897724 Plating copper directly on a portion of a porous conductive material on a sintered substrate so that the copper extends to the substrate surface, preventing exposure of the conductive material; forming conductor terminal |
| 04/27/1999 | US5897713 Plasma generating apparatus |
| 04/27/1999 | US5897712 Plasma uniformity control for an inductive plasma source |