Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
05/1999
05/06/1999CA2307663A1 Gas panel
05/05/1999CN1216158A Electronic component, semiconductor device, mfg method therefor, circuit board and electronic equipment
05/05/1999CN1216157A Device and method for fixing and protecting semiconductor wafers
05/05/1999CN1216134A Current-driven emissive display device, method for driving same, and method for mfg. same
05/05/1999CN1216059A Composition for cleaning and etching electronic display and substrate
05/05/1999CN1215928A Semiconductor device and method of fabricating the same
05/05/1999CN1215927A Solid state imaging device and manufacturing method thereof
05/05/1999CN1215926A Semiconductor device of high-voltage CMOS structure and method of fabricating same
05/05/1999CN1215925A Semiconductor memory device and manufacturing method thereof
05/05/1999CN1215924A Semiconductor integrated circuit
05/05/1999CN1215920A Electronic package with thermally conductive support member
05/05/1999CN1215918A Wiring layout method for semiconductor device and recording medium on which wiring layout program for semiconductor device is recorded
05/05/1999CN1215917A Fabricating method for semiconductor device
05/05/1999CN1215916A Semiconductor device and process for production thereof
05/05/1999CN1215915A Dual damascene with self aligned via interconnects
05/05/1999CN1215914A Semiconductor device and method for fabricating the same
05/05/1999CN1215913A Method for manufacturing semiconductor device having multiple wiring layer
05/05/1999CN1215912A Plasm processing device and method
05/05/1999CN1215911A Method of fabricating semiconductor device
05/05/1999CN1215910A Semiconductor device and method for manufacturing the same
05/05/1999CN1215894A Method of erasing data in nonvolatile semiconductor memory devices
05/05/1999CN1215893A Space-efficient semiconductor memory having hierarchical column select line architecture
05/05/1999CN1215850A Corrosion inhibitor stripping liquid control device
05/05/1999CN1215764A Chemical vapor deposition apparatus for manufacturing semiconductor devices, its driving method
05/05/1999CN1043278C Process and apparatus for etching semiconductor wafers
05/05/1999CN1043275C 半导体存储装置 The semiconductor memory device
05/05/1999CA2252656A1 Treatment system for removing phosphorus
05/04/1999US5901305 Simulation method and apparatus for semiconductor integrated circuit
05/04/1999US5901271 Process of evaporating a liquid in a cyclone evaporator
05/04/1999US5901154 Method for producing test program for semiconductor device
05/04/1999US5901084 Nonvolatile semiconductor memory device having floating gate electrode
05/04/1999US5901080 Nonvolatile semiconductor memory device
05/04/1999US5901063 System and method for extracting parasitic impedance from an integrated circuit layout
05/04/1999US5901041 Flexible integrated circuit package
05/04/1999US5901023 Semiconductor input/output circuit
05/04/1999US5900980 Apparatus and method for laser radiation
05/04/1999US5900941 High speed pattern inspection method and system
05/04/1999US5900926 Projection exposure apparatus
05/04/1999US5900766 Coupling charge compensation device for VLSI circuits
05/04/1999US5900763 Circuit and method of reducing cross-talk in an integrated circuit substrate
05/04/1999US5900738 Method of testing semiconductor devices
05/04/1999US5900737 Method and apparatus for automated docking of a test head to a device handler
05/04/1999US5900735 Device for evaluating reliability of interconnect wires
05/04/1999US5900707 Stage-drive control apparatus and method, and scan-projection type exposure apparatus
05/04/1999US5900699 Plasma generator with a shield interposing the antenna
05/04/1999US5900676 Semiconductor device package structure having column leads and a method for production thereof
05/04/1999US5900674 Interface structures for electronic devices
05/04/1999US5900672 Electrical connector in an integrated circuit
05/04/1999US5900671 Electronic component including conductor connected to electrode and anodically bonded to insulating coating
05/04/1999US5900670 Stackable heatsink structures for semiconductor devices
05/04/1999US5900666 Ultra-short transistor fabrication scheme for enhanced reliability
05/04/1999US5900665 Semiconductor integrated circuit device operating at high speed with low current consumption
05/04/1999US5900664 Semiconductor device with self-aligned protection diode
05/04/1999US5900663 Quasi-mesh gate structure for lateral RF MOS devices
05/04/1999US5900662 MOS technology power device with low output resistance and low capacitance, and related manufacturing process
05/04/1999US5900661 Semiconductor device
05/04/1999US5900660 Method of forming a bit line over capacitor array of memory cells and an array of bit line over capacitor array of memory calls
05/04/1999US5900659 Buried bit line DRAM cells
05/04/1999US5900658 Logic and single level polysilicon DRAM devices fabricated on the same semiconductor chip
05/04/1999US5900656 Semiconductor memory device and method for fabricating the same
05/04/1999US5900655 Charge coupled device with stripe layers corresponding to CCD regions
05/04/1999US5900654 Radiation hardened charge coupled device
05/04/1999US5900653 High electron mobility transistor having thin, low resistance schottky contact layer
05/04/1999US5900652 Apparatus for the localized reduction of the lifetime of charge carriers, particularly in integrated electronic devices
05/04/1999US5900650 Using a sapphire substrate, easy to manufacture
05/04/1999US5900646 Reacting conductive layer with growth nuclei containing at least one element of group iiib, iv, vb and viib; use in portable computers
05/04/1999US5900645 Semiconductor device and method of testing the same
05/04/1999US5900644 Test site and a method of monitoring via etch depths for semiconductor devices
05/04/1999US5900643 Integrated circuit chip structure for improved packaging
05/04/1999US5900641 Field effect semiconductor device having a reduced leakage current
05/04/1999US5900582 Lead frame including frame-cutting slit for lead-on-chip (LOC) semiconductor device and semiconductor device incorporating the lead frame
05/04/1999US5900581 Resin sealing structure for elements
05/04/1999US5900351 Method for stripping photoresist
05/04/1999US5900349 Forming dummy pattern
05/04/1999US5900337 Phase shift mask and method for fabricating the same
05/04/1999US5900290 Method of making low-k fluorinated amorphous carbon dielectric
05/04/1999US5900288 Method for improving substrate adhesion in fluoropolymer deposition processes
05/04/1999US5900177 Furnace sidewall temperature control system
05/04/1999US5900164 Sliding a planarizing pad made of a polymeric matrix impregnated with hollow flexible polymeric microelements on a semiconductor work surface; work surface of the pad may be continuously regenerated
05/04/1999US5900163 Methods for performing plasma etching operations on microelectronic structures
05/04/1999US5900162 Plasma etching method and apparatus
05/04/1999US5900161 Apparatus and method for detecting end point of post treatment
05/04/1999US5900160 Methods of etching articles via microcontact printing
05/04/1999US5900124 Method and apparatus of concentrating chemicals for semiconductor device manufacturing
05/04/1999US5900106 Bonding apparatus
05/04/1999US5900105 Wafer transfer system and method of using the same
05/04/1999US5900072 Planarized dielectric layer having reduced step coverage, improved mechanical strength and little thermal deformation
05/04/1999US5900064 Plasma process chamber
05/04/1999US5900063 Method and apparatus for coating a substrate
05/04/1999US5900062 Lift pin for dechucking substrates
05/04/1999US5900056 Method for growing epitaxial layers of III-V compound semiconductors
05/04/1999US5900055 Method of manufacturing silicon monocrystal by continuously charged Czochralski method
05/04/1999US5900054 Method of manufacturing oxide single crystal
05/04/1999US5900047 Exhaust system for a semiconductor etcher that utilizes corrosive gas
05/04/1999US5899800 Chemical mechanical polishing apparatus with orbital polishing
05/04/1999US5899792 Of a wafer
05/04/1999US5899752 Method for in-situ cleaning of native oxide from silicon surfaces
05/04/1999US5899751 Method for forming a planarized dielectric layer
05/04/1999US5899750 Fine processing method
05/04/1999US5899749 In situ etch process for insulating and conductive materials
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