Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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05/11/1999 | US5902117 PN-diode of SiC and a method for production thereof |
05/11/1999 | US5902103 Vertical furnace of a semiconductor manufacturing apparatus and a boat cover thereof |
05/11/1999 | US5902102 Diffusion furnace used for semiconductor device manufacturing process |
05/11/1999 | US5902088 Single loadlock chamber with wafer cooling function |
05/11/1999 | US5901901 Semiconductor assembly with solder material layer and method for soldering the semiconductor assemly |
05/11/1999 | US5901896 Balanced low mass miniature wire clamp |
05/11/1999 | US5901829 Method of positioning an I.C. and IC handler utilizing said method |
05/11/1999 | US5901751 Restrictor shield having a variable effective throughout area |
05/11/1999 | US5901716 Wafer cleaning apparatus with rotating cleaning solution injection nozzles |
05/11/1999 | US5901436 Method of manufacturing lead frame |
05/11/1999 | US5901403 Scrubber brush |
05/11/1999 | US5901399 Flexible-leaf substrate edge cleaning apparatus |
05/11/1999 | CA2131044C Waterborne photoresists having associate thickeners |
05/11/1999 | CA2079696C Semiconductor integrated circuit device with fault detecting function |
05/06/1999 | WO1999022409A2 Semiconductor device comprising a half-bridge circuit |
05/06/1999 | WO1999022408A1 Vertical mos transistor and method for the production thereof |
05/06/1999 | WO1999022407A1 Lateral silicon carbide semiconductor device having a drift region with a varying doping level |
05/06/1999 | WO1999022406A1 Trench ic and method of making |
05/06/1999 | WO1999022403A1 Process and apparatus for preparation of epitaxial silicon layers free of grown-in defects |
05/06/1999 | WO1999022402A2 Rapid thermal processing (rtp) system with rotating substrate |
05/06/1999 | WO1999022401A1 Device for applying a viscous fluid |
05/06/1999 | WO1999022396A2 Enhanced macroparticle filter and cathode arc source |
05/06/1999 | WO1999022320A1 Method for calculating propagation delay time of logic circuit |
05/06/1999 | WO1999022311A1 Software system and method for graphically building customized recipe flowcharts |
05/06/1999 | WO1999022310A1 Software system and method for extending classifications and attributes in production analysis |
05/06/1999 | WO1999022279A2 Process for determining possible configurations of machining plants |
05/06/1999 | WO1999022272A1 Lithographic pneumatic support device with controlled gas supply |
05/06/1999 | WO1999022212A1 Structure equipped with electric contacts formed through said structure substrate and method for obtaining said structure |
05/06/1999 | WO1999022165A1 Gas panel |
05/06/1999 | WO1999022043A1 New deposition systems and processes for transport polymerization and chemical vapor deposition |
05/06/1999 | WO1999021924A1 Precursors for making low dielectric constant materials with improved thermal stability |
05/06/1999 | WO1999021706A1 Low dielectric constant materials prepared from photon or plasma assisted cvd |
05/06/1999 | WO1999021652A2 Nanostructures |
05/06/1999 | WO1999014787A3 Method for producing plasma by microwave irradiation |
05/06/1999 | WO1999014706A3 Visual inspection and verification system |
05/06/1999 | WO1999013499A3 In-situ acceptor activation in group iii-v nitride compound semiconductors |
05/06/1999 | WO1999013495A3 Sealed cabinet for storage of semiconductor wafers |
05/06/1999 | WO1999013489A3 Apparatus for improving etch uniformity and methods therefor |
05/06/1999 | WO1999012189A3 Method of making two-component nanospheres and their use as a low dielectric constant material for semiconductor devices |
05/06/1999 | WO1999012170A3 A ferroelectric data processing device |
05/06/1999 | WO1999010566A3 Process chamber and method for depositing and/or removing material on a substrate |
05/06/1999 | WO1999008328A9 Integrated electric circuit with capacitor |
05/06/1999 | WO1998038701A9 Connecting structure, liquid crystal device, electronic equipment, anisotropic conductive adhesive, and method for manufacturing the adhesive |
05/06/1999 | EP0914027A1 Film-like adhesive for connecting circuit and circuit board |
05/06/1999 | EP0913871A1 Nonvolatile memory point |
05/06/1999 | EP0913864A1 Mounting structure of semiconductor bare chip |
05/06/1999 | EP0913863A2 Method of manufacturing semiconductor device with copper wiring film |
05/06/1999 | EP0913862A1 Floating gate memory with high and low voltage transistors |
05/06/1999 | EP0913860A2 Method of manufacturing a thin film transistor |
05/06/1999 | EP0913859A1 Semiconductor device and method for manufacturing the same |
05/06/1999 | EP0913858A1 Method for thinning a semoiconductor wafer |
05/06/1999 | EP0913857A1 Method and device for positioning the bonding head of a bonder, in particular a die bonder |
05/06/1999 | EP0913850A1 Narrow titanium-containing wire, process for producing narrow titanium-containing wire, structure, and electron-emitting device |
05/06/1999 | EP0913833A2 Non-volatile semiconductor memory device |
05/06/1999 | EP0913831A2 Space-efficient master data line (MDQ) switch placement |
05/06/1999 | EP0913755A2 Voltage converter |
05/06/1999 | EP0913719A2 Connection terminal structure for liquid crystal display and semiconductor device, and method of producing the same |
05/06/1999 | EP0913508A2 Carbon nanotube device, manufacturing method of carbon nanotube device, and electron emitting device |
05/06/1999 | EP0913442A2 Polishing method |
05/06/1999 | EP0913429A2 Siloxane-modified polyamideimide resin composition adhesive film, adhesive sheet and semiconductor device |
05/06/1999 | EP0913372A1 Aluminum nitride substrate and process for producing the same |
05/06/1999 | EP0913237A1 Robot for handling |
05/06/1999 | EP0913236A2 Articulated robot |
05/06/1999 | EP0913233A2 Polishing solution supply system |
05/06/1999 | EP0913074A1 Plasma etch reactor and method for emerging films |
05/06/1999 | EP0913001A1 Multi-layer film capacitor structures and method |
05/06/1999 | EP0912999A2 SiC SEMICONDUCTOR DEVICE COMPRISING A pn JUNCTION WITH A VOLTAGE ABSORBING EDGE |
05/06/1999 | EP0912998A1 Method for cmos latch-up improvement by mev billi (buried implanted layer for lateral isolation) plus buried layer implantation |
05/06/1999 | EP0912996A1 Integrated circuit which uses an etch stop for producing staggered interconnect lines |
05/06/1999 | EP0912995A1 Semiconductor component with low contact resistance to highly doped regions |
05/06/1999 | EP0912994A1 Modular semiconductor workpiece processing tool |
05/06/1999 | EP0912649A1 Heat-setting single-component lva (low-viscosity adhesive) system for bonding in the micro-range |
05/06/1999 | EP0912351A1 Rigid thin windows for vacuum applications |
05/06/1999 | EP0912259A1 Wet processing methods for the manufacture of electronic components using sequential chemical processing |
05/06/1999 | EP0815595A4 UNCOOLED YBaCuO THIN FILM INFRARED DETECTOR |
05/06/1999 | EP0745235B1 Photomask blanks |
05/06/1999 | EP0674798B1 Memory device |
05/06/1999 | EP0462209B1 Electron cyclotron resonance plasma source and method of operation |
05/06/1999 | DE19844710A1 Integrated semiconductor circuit with lateral bipolar transistor |
05/06/1999 | DE19837016A1 Integrated semiconductor device with multi-bank memory for e.g. microprocessor |
05/06/1999 | DE19835429A1 CMOS SRAM cell has a symmetrical arrangement of active regions and gate lines |
05/06/1999 | DE19829863A1 Dry etching reaction products are removed in a semiconductor device production process |
05/06/1999 | DE19829472A1 Semiconductor device has a fusible link portion which can be severed by low energy laser light |
05/06/1999 | DE19824242A1 Semiconductor manufacture process |
05/06/1999 | DE19822763A1 Power semiconductor device has a doped, oxygen-containing semiconductor substrate |
05/06/1999 | DE19810003A1 Semiconductor device production process involves etching a doped polysilicon layer in the presence of carbon-containing and oxygen-containing gases |
05/06/1999 | DE19755051C1 Method of applying quantum points to surfaces for manufacturing semiconductors |
05/06/1999 | DE19749962A1 Misfit dislocation density is quantitatively determined in silicon-germanium HBT layer stacks |
05/06/1999 | DE19748709A1 Semiconductor chip mounting frame for chip encapsulation |
05/06/1999 | DE19748666A1 Semiconductor component is produced with high circuit complexity to hinder piracy and manipulation |
05/06/1999 | DE19747846A1 Bauelement und Verfahren zum Herstellen des Bauelements Device and method for manufacturing the component |
05/06/1999 | DE19747816A1 Production of surface-structured substrates used in the manufacture of electronic components |
05/06/1999 | DE19747815A1 Production of surface-structured substrates used in the manufacture of electronic components |
05/06/1999 | DE19747574A1 Verfahren zur Ermittlung realisierbarer Konfigurationen von Bearbeitungsanlagen Procedure for the determination of feasible configurations of processing plants |
05/06/1999 | DE19747559A1 Multilevel interconnect structure for high density integrated circuit devices, integrated circuit memories |
05/06/1999 | DE19747376A1 Capacitively measuring the distance from a semiconducting surface, e.g. for measuring the flatness and thickness of semiconducting surfaces |
05/06/1999 | DE19747164A1 Substrate disc processing apparatus for simulation of silicon micro process |
05/06/1999 | DE19746901A1 Vertical MOS transistor manufacture method for nano-electronics |
05/06/1999 | DE19746900A1 Vertikaler MOS-Transistor und Verfahren zu dessen Herstellung Vertical MOS transistor and method of producing the |
05/06/1999 | CA2308302A1 Nanometric structures |