Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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01/05/2000 | EP0968527A1 Method for producing a vertical mos-transistor |
01/05/2000 | EP0968526A2 Method of forming etched structures comprising implantation steps |
01/05/2000 | EP0968525A1 Uv/halogen metals removal process |
01/05/2000 | EP0968524A1 Atmospheric-pressure plasma jet |
01/05/2000 | EP0968523A1 Method for forming a structured metallization on a semiconductor wafer |
01/05/2000 | EP0968522A1 Method of checking for the presence of connection balls |
01/05/2000 | EP0968458A1 Optical proximity correction method for intermediate-pitch features using sub-resolution scattering bars |
01/05/2000 | EP0968142A1 Reactive ion etching of silica structures |
01/05/2000 | EP0968081A1 Flattening process for bonded semiconductor substrates |
01/05/2000 | EP0958595A4 A new non-thermal process for annealing crystalline materials |
01/05/2000 | EP0761015B1 Semiconductor device of the type sealed in glass comprising a semiconductor body connected to slugs by means of a silver-aluminium bonding layer |
01/05/2000 | EP0752159B1 Semiconductor device provided with a microcomponent having a fixed and a movable electrode |
01/05/2000 | DE19929656A1 Non-volatile ferromagnetic memory achieves high access speed without danger of damaging a reference cell |
01/05/2000 | DE19929239A1 MOSFET integrated circuit manufacture lithography masking technique |
01/05/2000 | DE19918932A1 Dynamic RAM (DRAM) type semiconductor memory with numerous memory cells |
01/05/2000 | DE19912628A1 Elektrisch leitfähige, thermoplastische und hitzeaktivierbare Klebstoffolie Electrically conductive, thermoplastic and heat-activatable adhesive film |
01/05/2000 | DE19831216A1 Verfahren und Vorrichtung zur Bestimmung der Abhängigkeit einer ersten Meßgröße von einer zweiten Meßgröße Method and device for determining the function of a first measured quantity of a second measured variable |
01/05/2000 | DE19829612A1 Beleuchtungssystem der Mikrolithographie mit Depolarisator Lighting system for microlithography with depolarizer |
01/05/2000 | DE19828970A1 Verfahren zur Herstellung und Vereinzelung von Halbleiter-Lichtemissionsdioden Process for the preparation and separation of semiconductor light emitting diodes |
01/05/2000 | DE19828664A1 Semiconductor arrangement e.g. power semiconductor based on chip-on-chip (COC) technology |
01/05/2000 | DE19826971A1 Mechanical and electric coupling integrated circuits |
01/05/2000 | CN2357414Y Improved semiconductor element lead wire frame |
01/05/2000 | CN1240537A Patterns of electrically conducting polymers and their application as electrodes or electrical contacts |
01/05/2000 | CN1240536A Memory cell arrangement and process for manufacturing the same |
01/05/2000 | CN1240535A Chip module and manufacture of same |
01/05/2000 | CN1240470A Die attach adhesive compositions |
01/05/2000 | CN1240465A Thermally reworkable binders for flip-chip devices |
01/05/2000 | CN1240464A Thermosetting encapsulants for electronics packaging |
01/05/2000 | CN1240304A GaN monocrystal substrate and making method thereof |
01/05/2000 | CN1240303A Channel capacitor with insulating axle ring |
01/05/2000 | CN1240302A Method for producing semiconductor film and the method for producing solar energy cell using said film |
01/05/2000 | CN1240236A Dry method preparing copperous sulfide film |
01/05/2000 | CN1240223A Polishing composition and surface treating composition |
01/05/2000 | CN1048127C Architecture and interconnect scheme for programmable logic circuit |
01/05/2000 | CN1048118C Method of rough polishing semiconductor wafes to reduce surface roughness |
01/05/2000 | CN1048044C Improved method for growing silicon crystal |
01/04/2000 | US6011914 Method for simulating diffusion of impurity materials in semiconductor devices |
01/04/2000 | US6011912 Automatic routing method with net ordering for facilitated collision evasion |
01/04/2000 | US6011746 Word line driver for semiconductor memories |
01/04/2000 | US6011725 Two bit non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping |
01/04/2000 | US6011723 Nonvolatile semiconductor memory device including a circuit for providing a boosted potential |
01/04/2000 | US6011714 Semiconductor circuit capable of storing a plurality of analog or multi-valued data |
01/04/2000 | US6011713 Static random access memory including potential control means for writing data in memory cell and write method for memory cell |
01/04/2000 | US6011712 Interconnection structures for integrated circuits including recessed conductive layers |
01/04/2000 | US6011627 Universal mapping tool |
01/04/2000 | US6011622 Particle monitoring system |
01/04/2000 | US6011612 Processing apparatus using a laser light source |
01/04/2000 | US6011611 Method of measuring aberration of projection optics |
01/04/2000 | US6011426 Substrate voltage generation circuit for semiconductor device |
01/04/2000 | US6011404 System and method for determining near--surface lifetimes and the tunneling field of a dielectric in a semiconductor |
01/04/2000 | US6011315 Semiconductor device and film carrier tape and respective manufacturing methods thereof |
01/04/2000 | US6011313 Flip chip interconnections on electronic modules |
01/04/2000 | US6011312 Flip-chip semiconductor package |
01/04/2000 | US6011310 Film carrier and semiconductor device using the same |
01/04/2000 | US6011309 Wiring structure of thin film transistor array and method of manufacturing the same |
01/04/2000 | US6011308 Semiconductor device having a barrier film formed to prevent the entry of moisture and method of manufacturing the same |
01/04/2000 | US6011307 Anisotropic conductive interconnect material for electronic devices, method of use and resulting product |
01/04/2000 | US6011306 Semiconductor device and method for fabricating same |
01/04/2000 | US6011305 Semiconductor device having metal alloy for electrodes |
01/04/2000 | US6011301 Stress reduction for flip chip package |
01/04/2000 | US6011300 Semiconductor integrated circuit device |
01/04/2000 | US6011298 High voltage termination with buried field-shaping region |
01/04/2000 | US6011293 Semiconductor device having a structure for detecting a boosted potential |
01/04/2000 | US6011292 Semiconductor device having an alignment mark |
01/04/2000 | US6011290 Short channel length MOSFET transistor |
01/04/2000 | US6011289 Metal oxide stack for flash memory application |
01/04/2000 | US6011288 Flash memory cell with vertical channels, and source/drain bus lines |
01/04/2000 | US6011286 Double stair-like capacitor structure for a DRAM cell |
01/04/2000 | US6011285 C-axis oriented thin film ferroelectric transistor memory cell and method of making the same |
01/04/2000 | US6011284 Comprising oxides of noble metal selected from platinum, iridium, ruthenium, rhodium, palladium, and transition metal selected from hafnium, tantalum, zirconium, niobium, vanadium, molybdenum, tungsten |
01/04/2000 | US6011282 Charge coupled device with a buried channel two-phase driven two-layer electrode structure |
01/04/2000 | US6011281 Semiconductor device having an ohmic contact and a Schottky contact, with a barrier layer interposed between the ohmic contact and the Schottky contact |
01/04/2000 | US6011279 Silicon carbide field controlled bipolar switch |
01/04/2000 | US6011278 Lateral silicon carbide semiconductor device having a drift region with a varying doping level |
01/04/2000 | US6011277 Gate insulated field effect transistors and method of manufacturing the same |
01/04/2000 | US6011276 Thin film transistor and fabrication method thereof |
01/04/2000 | US6011275 Semiconductor device and method of manufacturing the same |
01/04/2000 | US6011272 Silicided shallow junction formation and structure with high and low breakdown voltages |
01/04/2000 | US6011271 Semiconductor device and method of fabricating the same |
01/04/2000 | US6011269 Shaped shadow projection for an electron beam column |
01/04/2000 | US6011268 Demagnifying projection-optical system for electron beam lithography with aberration control |
01/04/2000 | US6011261 Probe formed of mono-crystalline SI, the manufacturing method thereof, and an information processing device using the probe |
01/04/2000 | US6011123 Organosilane compound; polyamic acids having a hydrolyzable silyl group or carboxylic acid anhydride group, or both, and polyimides having a hydrolyzable silyl group or carboxylic acid anhydride group, or both. |
01/04/2000 | US6010969 Method of depositing films on semiconductor devices by using carboxylate complexes |
01/04/2000 | US6010968 Method for forming a contact opening with multilevel etching |
01/04/2000 | US6010967 Plasma etching methods |
01/04/2000 | US6010966 Hydrocarbon gases for anisotropic etching of metal-containing layers |
01/04/2000 | US6010965 Method of forming high integrity vias |
01/04/2000 | US6010964 Wafer surface treatment methods and systems using electrocapillarity |
01/04/2000 | US6010963 Global planarization using SOG and CMP |
01/04/2000 | US6010962 Copper chemical-mechanical-polishing (CMP) dishing |
01/04/2000 | US6010961 Methods of establishing electrical communication with substrate node locations, semiconductor processing methods of forming dynamic random access memory (DRAM) circuitry, and semiconductor assemblies |
01/04/2000 | US6010960 Method and system for providing an interconnect having reduced failure rates due to voids |
01/04/2000 | US6010958 Method for improving the planarization of dielectric layer in the fabrication of metallic interconnects |
01/04/2000 | US6010957 Semiconductor device having tapered conductive lines and fabrication thereof |
01/04/2000 | US6010955 Electrical connection forming process for semiconductor devices |
01/04/2000 | US6010954 Cmos gate architecture for integration of salicide process in sub 0.1 . .muM devices |
01/04/2000 | US6010953 Method for forming a semiconductor buried contact with a removable spacer |
01/04/2000 | US6010952 Process for forming metal silicide contacts using amorphization of exposed silicon while minimizing device degradation |
01/04/2000 | US6010951 Dual side fabricated semiconductor wafer |