Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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10/05/2000 | WO2000058188A1 Wafer handling robot having x-y stage for wafer handling and positioning |
10/05/2000 | WO2000058054A1 A method and apparatus for stabilizing the process temperature during chemical mechanical polishing |
10/05/2000 | WO2000058053A1 Apparatus and process for reconditioning polishing pads |
10/05/2000 | WO2000058048A1 Hybrid heater with ceramic foil serrated plate and gas assist |
10/05/2000 | WO2000057980A1 Efg crystal growth apparatus |
10/05/2000 | WO2000046859A8 High-voltage transistor with multi-layer conduction region |
10/05/2000 | WO2000029906A3 Antireflective composition for a deep ultraviolet photoresist |
10/05/2000 | WO2000025625A3 Method and apparatus for insertion and retainment of pomade within a dispenser |
10/05/2000 | WO2000025178A3 Photoresists and processes for microlithography |
10/05/2000 | DE19959938A1 Semiconductor device manufacturing method for e.g. GaAs FET involves sticking chips to substrate, sticking lid to substrate and separating chips along adjoining areas |
10/05/2000 | DE19955034A1 Chip set with just one pilot pin for using a graphics interface reference voltage installs on a carrier printed circuit board to control an accelerated graphics interface. |
10/05/2000 | DE19932735A1 Microelectronics manufacturing system cleaning method |
10/05/2000 | DE19915247A1 Spannungsabhängiger Dünnschichtkondensator Voltage-dependent thin film capacitor |
10/05/2000 | DE19915245A1 Electronic component with strip conductor, e.g. coil or coupler for high frequency application and high speed digital circuits, is produced by conductive layer deposition on metal base layer regions exposed by structured photolacquer layer |
10/05/2000 | DE19915034A1 Gas scrubber for semiconductor manufacturing facility includes piston and valve to regulate gas flow in gas pipes based on pressure differential between pressure gauges at inlet and outlet |
10/05/2000 | DE19914905A1 Electrochemical etching cell for etching silicon wafers uses electrode materials that do not contaminate and/or damage the etching body after etching |
10/05/2000 | DE19914815A1 Halbleitermodul Semiconductor module |
10/05/2000 | DE19914718A1 Semiconductor diode surface contact manufacturing method |
10/05/2000 | DE19914496A1 Memory cell structure, especially for a DRAM, has a contact within a substrate for connecting a capacitor and a MOS transistor on opposite substrate surfaces |
10/05/2000 | DE19914338A1 Contact bump for an aluminum connection pad of a semiconductor substrate is produced by electrodepositing zinc and palladium seeds before autocatalytic deposition of a contact metallization |
10/05/2000 | DE19914243A1 Verfahren zur Herstellung hochreiner Lösungen unter Verwendung von gasförmigem Fluorwasserstoff A method for producing high purity solutions using gaseous hydrogen fluoride |
10/05/2000 | DE19913628A1 Anlage zur Fertigung von Halbleiterprodukten Plant for the manufacture of semiconductor products |
10/05/2000 | DE19913375A1 MOS-Transistorstruktur mit einer Trench-Gate-Elektrode und einem verringerten spezifischen Einschaltwiderstand und Verfahren zur Herstellung einer MOS-Transistorstruktur MOS transistor structure with a trench gate electrode and a reduced specific on-resistance and process for producing a MOS transistor structure |
10/05/2000 | DE19910816A1 Dotierpasten zur Erzeugung von p,p+ und n,n+ Bereichen in Halbleitern Dopant pastes for the production of p, p + and n, n + regions in semiconductors |
10/05/2000 | DE19907858C1 Vorrichtung zur elektrostatischen Ablenkung eines Korpuskularstrahles Apparatus for electrostatic deflection of a particle beam |
10/05/2000 | DE10015742A1 Photoresist composition used for processing semiconductors contains mixture of benzophenone and poly(phenylene-alkylene) naphthoquinone-diazide-sulfonates, resin and solvent |
10/05/2000 | DE10014799A1 Exposure device e.g. for reproducing digital image, has light source in the form of several arrays of LEDs |
10/05/2000 | DE10014315A1 Semiconductor memory, especially with a ferroelectric capacitor, has a barrier metal covered at its side by an oxygen penetration preventing film and at its top by a lower capacitor electrode |
10/05/2000 | DE10014195A1 Semiconductor memory component with numerous word lines and individual or paired bit lines and two types of earth voltage lines |
10/05/2000 | DE10012141A1 Single electron transistor having a quantum dot size of a few tens of nanometers is produced by forming the upper gate on trench side walls in an insulation film |
10/05/2000 | DE10011008A1 Method to apply sealant to electronic component uses contact part positioned in liquid sealant film and pressed against component |
10/05/2000 | DE10004436A1 Gripper arrangement of picking apparatus in module IC handler, has shock absorber and sensor which senses module IC during movement of jaws |
10/05/2000 | CA2368441A1 Method for producing high-purity solutions using gaseous hydrogen fluoride |
10/04/2000 | EP1041652A2 Process for fabricating organic circuits |
10/04/2000 | EP1041644A2 Transparent and conductive zinc oxide film with low growth temperature |
10/04/2000 | EP1041643A1 Semiconductor device, a method of manufacturing the same, and a semiconductor device protective circuit |
10/04/2000 | EP1041642A1 A method to fabricate a floating gate with a sloping sidewall for a flash memory |
10/04/2000 | EP1041641A2 A method for manufacturing an electrooptical device |
10/04/2000 | EP1041640A2 Power trench MOS-gated device and method of manufacturing it |
10/04/2000 | EP1041639A1 Process for fabrication of a planar heterostructure |
10/04/2000 | EP1041638A1 High density mos-gated power device and process for forming same |
10/04/2000 | EP1041637A1 High-speed imaging device |
10/04/2000 | EP1041635A2 Semiconductor memory device and method of making the same |
10/04/2000 | EP1041634A1 Power MOSFET having voltage-clamped gate |
10/04/2000 | EP1041633A1 Semiconductor device, method of manufacture thereof, circuit board, and electronic device |
10/04/2000 | EP1041632A1 A compensation structure for a bond wire at high frequency operation |
10/04/2000 | EP1041630A2 Method of accurately performing alignment of patterning in the manufaturing of a semiconductor device, and mask for exposure |
10/04/2000 | EP1041629A1 Manufacturing of cavity fuses on gate conductor level |
10/04/2000 | EP1041628A2 An image sensor ball grid array package and the fabrication thereof |
10/04/2000 | EP1041626A2 Semiconductor Module |
10/04/2000 | EP1041624A1 Method of transferring ultra-thin substrates and application of the method to the manufacture of a multilayer thin film device |
10/04/2000 | EP1041623A2 An isolation collar nitride liner for DRAM process improvement |
10/04/2000 | EP1041622A1 Interconnect structure between conductor layers and fabricating method thereof |
10/04/2000 | EP1041621A2 Multilayered wafer with thrick sacrificial layer using porous silicon or porous silicon oxide and fabrication method thereof |
10/04/2000 | EP1041620A2 Method of transferring ultrathin substrates and application of the method to the manufacture of a multi-layer thin film device |
10/04/2000 | EP1041619A2 System and method for the real time determination of the in situ emissivity of a workpiece during processing |
10/04/2000 | EP1041618A1 Semiconductor device and manufacturing method thereof, circuit board and electronic equipment |
10/04/2000 | EP1041616A1 Stress relaxation electronic part, stress relaxation wiring board, and stress relaxation electronic part mounted body |
10/04/2000 | EP1041615A2 Method for enhancing plasma processing performance by irradiating with light |
10/04/2000 | EP1041614A1 Plasma cleaning process for openings formed in one or more low dielectric constant insulation layers over copper metallization integrated circuit structures |
10/04/2000 | EP1041613A1 Etching process |
10/04/2000 | EP1041612A1 Method for heat-treating silicon wafer and silicon wafer |
10/04/2000 | EP1041611A1 Fine protuberance structure and method of production thereof |
10/04/2000 | EP1041610A1 GaN SINGLE CRYSTALLINE SUBSTRATE AND METHOD OF PRODUCING THE SAME |
10/04/2000 | EP1041609A1 Group III nitride compound semiconductor device and method of producing the same |
10/04/2000 | EP1041604A2 Pneumatically actuated flexure gripper for wafer handling robots |
10/04/2000 | EP1041534A1 Semiconductor device with internal power supply circuit, together with liquid crystal device and electronic equipment using the same |
10/04/2000 | EP1041445A2 Method of improving the etch resistance of photoresists |
10/04/2000 | EP1041444A2 Apparatus and method for manufacturing a semiconductor device |
10/04/2000 | EP1041443A2 Lithographic process for device fabrication using dark-field illumination and apparatus therefor |
10/04/2000 | EP1041441A2 Device manufacturing method |
10/04/2000 | EP1041440A2 System and method for reducing corner rounding in mask fabrication |
10/04/2000 | EP1041379A2 Apparatus and method for detecting defects in the surface of a workpiece |
10/04/2000 | EP1041172A2 Method for reducing topography dependent charging effects in a plasma enhanced semiconductor wafer processing system |
10/04/2000 | EP1041171A1 CVD processing chamber |
10/04/2000 | EP1041170A2 Nickel/vanadium sputtering target with ultra-low alpha emission |
10/04/2000 | EP1040523A1 Power component bearing interconnections |
10/04/2000 | EP1040521A2 Silicon oxide insulator (soi) semiconductor having selectively linked body |
10/04/2000 | EP1040519A1 Plastic composite body |
10/04/2000 | EP1040518A1 CHEMICAL MECHANICAL POLISHING OF FeRAM CAPACITORS |
10/04/2000 | EP1040517A2 Semiconductor component and manufacturing method for semiconductor component |
10/04/2000 | EP1040516A1 Apparatus and method for determining depth profile characteristics of a dopant material in a semiconductor device |
10/04/2000 | EP1040515A1 Method for forming a uniform network of semiconductor islands on an insulating substrate |
10/04/2000 | EP1040514A2 LONG RANGE ORDERED AND EPITAXIAL OXIDES INCLUDING SiO 2?, ON Si, Si x?Ge 1-x?, GaAs AND OTHER SEMICONDUCTORS, MATERIAL SYNTHESIS, AND APPLICATIONS THEREOF |
10/04/2000 | EP1040513A1 High integrity borderless vias with hsq gap filled patterned conductive layers |
10/04/2000 | EP1040512A1 Method of forming a laterally-varying charge profile in a silicon carbide substrate |
10/04/2000 | EP1040511A2 Integrated material management module |
10/04/2000 | EP1040506A1 Device for producing excited/ionized particles in a plasma |
10/04/2000 | EP1040500A1 A plasma generating apparatus having an electrostatic shield |
10/04/2000 | EP1040486A1 Biasing method and structure for reducing band-to-band and/or avalanche currents during the erase of flash memory devices |
10/04/2000 | EP1040485A1 Static memory cell with load circuit using a tunnel diode |
10/04/2000 | EP1040435A1 Timing closure methodology |
10/04/2000 | EP1040292A1 Gas panel |
10/04/2000 | EP1040212A1 Charge for vertical boat growth process and use thereof |
10/04/2000 | EP1038593B1 Device for applying two or several fluids from nozzles |
10/04/2000 | EP1025587A4 Semiconductor flip-chip package and method for the fabrication thereof |
10/04/2000 | EP0839386B1 Method of producing an mos transistor |
10/04/2000 | EP0727098B1 High-voltage ldd-mosfet with increased breakdown voltage and method of fabrication |
10/04/2000 | EP0724773B1 Grid array inspection system |
10/04/2000 | EP0711455B1 Shadow clamp |