Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
05/2001
05/16/2001EP1099719A1 Diyne-containing (co) polymer, processes for producing the same, and cured film
05/16/2001EP1099511A2 Rotary tool including a cutting blade and cutting apparatus comprising the same
05/16/2001EP1099505A1 Thermocompression assembling device used to connect together a wire with an IC
05/16/2001EP1099471A1 Apparatus and method for precise mixing, delivery and transfer of chemicals
05/16/2001EP1099256A2 Silicon thin-film, integrated solar cell, module, and methods of manufacturing the same
05/16/2001EP1099255A1 Method for producing and separating semiconductor light-emitting diodes
05/16/2001EP1099251A2 Method for producing semiconductor components
05/16/2001EP1099250A2 Method and apparatus for forming improved metal interconnects
05/16/2001EP1099249A1 Integrated circuit interconnect lines having sidewall layers
05/16/2001EP1099248A1 Misalignment tolerant techniques for dual damascene fabrication
05/16/2001EP1099247A1 Method for transferring solder to a device and/or testing the device
05/16/2001EP1099246A1 Method for producing a ceramic body having an integrated passive electronic component, such a body and use of same
05/16/2001EP1099245A1 Moisture repellant integrated circuit dielectric material combination
05/16/2001EP1099244A2 Method and apparatus for anisotropic etching
05/16/2001EP1099243A1 Method for patterning cavities and enhanced cavity shapes for semiconductor devices
05/16/2001EP1099242A1 Dc sputtering process for making smooth electrodes and thin film ferroelectric capacitors having improved memory retention
05/16/2001EP1099241A2 Gas flow control in a substrate processing system
05/16/2001EP1099240A2 Wafer cleaning apparatus
05/16/2001EP1099239A2 Multi-function chamber for a substrate processing system
05/16/2001EP1099223A1 Storage assembly comprised of a plurality of resistive ferroelectric storage cells
05/16/2001EP1099221A2 Magnetoresistive memory with low current density
05/16/2001EP1099192A1 Clocked integrated semiconductor circuit and method for operating the same
05/16/2001EP1099140A1 Maskless photolithography system
05/16/2001EP1099012A1 Method and apparatus for copper plating using electroless plating and electroplating
05/16/2001EP1099008A1 Cvd apparatus
05/16/2001EP1099007A1 Susceptor for barrel reactor
05/16/2001EP1098948A1 Chemical mechanical polishing slurry useful for copper/tantalum substrate
05/16/2001EP1098928A1 Method of producing porous calcined polyimide
05/16/2001EP1098859A1 Alkaline water-based solution for cleaning metallized microelectronic workpieces and methods of using same
05/16/2001EP1098830A2 Wafer carrier and method for handling of wafers with minimal contact
05/16/2001EP1098718A1 Chemical vapor deposition of a copolymer of p-xylylene and a multivinyl silicon/oxygen comonomer
05/16/2001EP0985059A4 Composition and method for polishing a composite comprising titanium
05/16/2001EP0797863B1 Magnetic transmission couplings
05/16/2001CN2430407Y Structure improved gasket suction device
05/16/2001CN1295722A X-Y addressable electric microswitch arrays and sensor matrices employing them
05/16/2001CN1295719A Method for generation of electrical conducting or semicnducting structures in three dimensionsand methods for earasure of the same structures
05/16/2001CN1295504A Apparatus and method for cleaning semiconductor wafers
05/16/2001CN1295365A Semiconductor device and semoconductor base board and their manufacture
05/16/2001CN1295349A Electrooptical device
05/16/2001CN1295348A Semiconductor device and its manufacture
05/16/2001CN1295346A Semiconductor device
05/16/2001CN1295344A Flip-chip semiconductor device with stress absorption layer made of resin and its manufacture
05/16/2001CN1295343A Electrooptical device, its manufacture and electronic machine
05/16/2001CN1295342A Manufacture of capacitor for semiconductor device
05/16/2001CN1295341A Method for manufacture of Ta2O5 capacitor using Ta2O5 film as dielectric film
05/16/2001CN1295340A Tin ball producing process
05/16/2001CN1295339A Dielectric material having intrinsic copper ion migration barrier low dielectric constant
05/16/2001CN1295333A Semiconductor integrated circuit device capable of inhibiting noise and supplying power potential
05/16/2001CN1295332A MRAM device having digital detection amplifier
05/16/2001CN1295320A IC chip mounting method and manufacture of magnet head suspended component with IC chip thereof
05/16/2001CN1295319A IC chip, magnetic head suspended component with IC chip and their manufacture
05/16/2001CN1295265A Component installation method and manufacture of electro-optical device thereof
05/16/2001CN1295262A Device for generating several laser beams
05/16/2001CN1295255A Image signal processing device and picture element flaw detecting method
05/16/2001CN1065788C Wire bonding apparatus
05/15/2001USRE37179 Radiation sensitive resin composition
05/15/2001US6233494 Method of measuring overlay offset
05/15/2001US6233492 Process control system and method for transferring process data therefor
05/15/2001US6233487 Apparatus and method for setting the parameters of an alert window used for timing the delivery of ETC signals to a heart under varying cardiac conditions
05/15/2001US6233388 Polymer optical waveguide and method for fabricating the same
05/15/2001US6233368 CMOS digital optical navigation chip
05/15/2001US6233265 AlGaInN LED and laser diode structures for pure blue or green emission
05/15/2001US6233196 Multi-bank integrated circuit memory devices with diagonal pairs of sub-banks
05/15/2001US6233189 Semiconductor memory device
05/15/2001US6233187 Semiconductor memory device
05/15/2001US6233184 Structures for wafer level test and burn-in
05/15/2001US6233172 Magnetic element with dual magnetic states and fabrication method thereof
05/15/2001US6233042 Projection exposure apparatus and device manufacturing method using the same
05/15/2001US6233041 Exposure method utilizing diffracted light having different orders of diffraction
05/15/2001US6233040 Exposure apparatus with setting of stage driving in accordance with type of motion of stage and device manufacturing method
05/15/2001US6232823 Voltage setting circuit in a semiconductor integrated circuit
05/15/2001US6232791 Testing Board
05/15/2001US6232789 Probe holder for low current measurements
05/15/2001US6232788 Wafer probe station for low-current measurements
05/15/2001US6232787 Microstructure defect detection
05/15/2001US6232756 Band gap reference circuit
05/15/2001US6232669 Contact structure having silicon finger contactors and total stack-up structure using same
05/15/2001US6232667 Technique for underfilling stacked chips on a cavity MLC module
05/15/2001US6232666 Interconnect for packaging semiconductor dice and fabricating BGA packages
05/15/2001US6232665 Filling narrow, high aspect ratio holes; semiconductors, integrated circuits
05/15/2001US6232664 Semiconductor device having A1 alloy wiring
05/15/2001US6232663 Semiconductor device having interlayer insulator and method for fabricating thereof
05/15/2001US6232662 System and method for bonding over active integrated circuits
05/15/2001US6232661 Semiconductor device in BGA package and manufacturing method thereof
05/15/2001US6232659 Thin multichip module
05/15/2001US6232658 Process to prevent stress cracking of dielectric films on semiconductor wafers
05/15/2001US6232656 Semiconductor interconnect formed over an insulation and having moisture resistant material
05/15/2001US6232655 Semiconductor element having external connection terminals, method of manufacturing the semiconductor element, and semiconductor device equipped with the semiconductor element
05/15/2001US6232650 Semiconductor device having a chip mounted on a flexible substrate with separated insulation layers to prevent short-circuiting
05/15/2001US6232649 Bipolar silicon-on-insulator structure and process
05/15/2001US6232648 Extended self-aligned crown-shaped rugged capacitor for high density DRAM cells
05/15/2001US6232647 Air gap with borderless contact
05/15/2001US6232646 Shallow trench isolation filled with thermal oxide
05/15/2001US6232645 Noise decoupling for semiconductor device with BiCMOS-type substrate
05/15/2001US6232644 Oxide profile modification by reactant shunting
05/15/2001US6232642 Semiconductor device having impurity region locally at an end of channel formation region
05/15/2001US6232641 Semiconductor apparatus having elevated source and drain structure and manufacturing method therefor
05/15/2001US6232640 Semiconductor device provided with a field-effect transistor and method of manufacturing the same
05/15/2001US6232639 Method and structure to reduce latch-up using edge implants
05/15/2001US6232638 Semiconductor device and manufacturing method for same