Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
06/2001
06/26/2001US6251470 Depositing polysilicon proximate a substrate, forming cavities within the polysilicon to enhance porosity of the polysilicon, and transforming the polysilicon into porous silicon dioxide
06/26/2001US6251469 Method of rendering a substrate selectively non-wettable chip carrier with enhanced wire bondability
06/26/2001US6251242 Magnetron and target producing an extended plasma region in a sputter reactor
06/26/2001US6251241 Inductive-coupled plasma apparatus employing shield and method for manufacturing the shield
06/26/2001US6251238 Anode having separately excitable sections to compensate for non-uniform plating deposition across the surface of a wafer due to seed layer resistance
06/26/2001US6251235 Apparatus for forming an electrical contact with a semiconductor substrate
06/26/2001US6251219 Method and apparatus for use in assembling electronic devices
06/26/2001US6251218 Ion beam processing apparatus
06/26/2001US6251217 Reticle adapter for a reactive ion etch system
06/26/2001US6251215 Carrier head with a multilayer retaining ring for chemical mechanical polishing
06/26/2001US6251211 Circuitry interconnection method
06/26/2001US6251195 Processing a semiconductor wafer under evacuated conditions that is capable of transfer of the wafer from the processing chamber under conditions that are substantially equal to the pressure of an adjacent environment.
06/26/2001US6251192 Vacuum exhaust system
06/26/2001US6251191 Processing apparatus and processing system
06/26/2001US6251190 Gate electrode connection structure by in situ chemical vapor deposition of tungsten and tungsten nitride
06/26/2001US6251189 Substrate processing apparatus and substrate processing method
06/26/2001US6251188 Apparatus for forming laminated thin films or layers
06/26/2001US6251187 Gas distribution in deposition chambers
06/26/2001US6251184 Insulating-containing ring-shaped heat shields for czochralski pullers
06/26/2001US6251182 Susceptor for float-zone apparatus
06/26/2001US6251150 Provide the desired level of planarization and selectivity for both metal and oxide surfaces without causing undesirable scratching of the surface.
06/26/2001US6251000 Substrate holder, method for polishing substrate, and method for fabricating semiconductor device
06/26/2001US6250998 Hand-held cutting tool for cutting fiber
06/26/2001US6250995 Apparatus for polishing outer periphery of workpiece
06/26/2001US6250994 Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads
06/26/2001US6250990 CSP plate cutting apparatus
06/26/2001US6250933 Contact structure and production method thereof
06/26/2001US6250914 Wafer heating device and method of controlling the same
06/26/2001US6250870 Apparatus for handling and processing microelectronic-device substrate assemblies
06/26/2001US6250869 Three chamber load lock apparatus
06/26/2001US6250852 Spherical object supplying apparatus
06/26/2001US6250822 Semiconductor wafer manufacturing method and apparatus for an improved heat exchanger for a photoresist developer
06/26/2001US6250606 Substrate for semiconductor device, semiconductor device and manufacturing method thereof
06/26/2001US6250541 Method of forming interconnections on electronic modules
06/26/2001US6250539 Wire bonding method
06/26/2001US6250534 Wire bonding method
06/26/2001US6250374 Apparatus and method for treating substrates
06/26/2001US6250318 Method and apparatus for washing and drying semi-conductor devices
06/26/2001US6250251 Vacuum processing apparatus and vacuum processing method
06/26/2001US6250192 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions
06/26/2001US6250189 Rotary die cutter
06/26/2001US6250188 Ultrasonic vibration cutting method and apparatus
06/26/2001US6250153 Continuous, non-metallic, media sensors for corrosive environments
06/26/2001US6250143 Method of mapping a surface using a probe for stylus nanoprofilometry having a non-circular cross-section
06/26/2001US6250141 Scanning device
06/26/2001US6250127 Light-weight for microelectronic or automotive components; metal matrix formed into extruded thin ribbon, then stamping/coining formation into the structure; flip-chip covers or lids; microelectronic heat-dissipating structures
06/26/2001US6249990 Method and apparatus for transporting articles
06/26/2001US6249943 Automatic semiconductor wafer applying apparatus
06/26/2001US6249932 Apparatus and method for removing fine particles
06/23/2001CA2328395A1 Single inlet and multiple outlet electronic switching machine and its application to a switching matrix
06/21/2001WO2001045260A1 Electronic component with reduced inductive coupling
06/21/2001WO2001045258A2 Method for implementing a physical design for a dynamically reconfigurable logic circuit
06/21/2001WO2001045178A1 Intermediate suction support and use thereof for making a thin-layered structure
06/21/2001WO2001045177A1 Capacitor for analog circuit, and manufacturing method thereof
06/21/2001WO2001045175A2 Self-aligned ldd formation with one-step implantation for transistor formation
06/21/2001WO2001045174A1 Bi-directional esd diode structure
06/21/2001WO2001045173A1 Improved esd diode structure
06/21/2001WO2001045172A1 Method and device for interconnecting electronic components in three dimensions
06/21/2001WO2001045170A1 An integrated circuit with a serpentine conductor track for circuit selection
06/21/2001WO2001045162A1 Trench capacitor
06/21/2001WO2001045161A1 Nonvolatile memory and method of driving nonvolatile memory
06/21/2001WO2001045160A1 Ceramic heater and support pin
06/21/2001WO2001045159A1 System and method for contacting switching circuits
06/21/2001WO2001045158A1 Apparatus and concept for minimizing parasitic chemical vapor deposition during atomic layer deposition
06/21/2001WO2001045157A1 Mosfet device system and method
06/21/2001WO2001045156A1 A method of manufacturing a semiconductor device
06/21/2001WO2001045155A1 Manufacture of semiconductor material and devices using that material
06/21/2001WO2001045154A1 Method for a tungsten silicide etch
06/21/2001WO2001045153A1 Method for removal of hard mask used to define noble metal electrode
06/21/2001WO2001045152A1 Plasma processing of tungsten using a gas mixture comprising a fluorinated gas and oxygen
06/21/2001WO2001045151A2 Thin-film resistor with high temperature coefficient for use as passive semiconductor component for integrated circuits, and method for producing the same
06/21/2001WO2001045150A1 Pressure control method
06/21/2001WO2001045149A1 Method of forming copper interconnections and thin films using chemical vapor deposition with catalyst
06/21/2001WO2001045148A1 Method of achieving higher inversion layer mobility in silicon carbide semiconductor devices
06/21/2001WO2001045147A1 Method of manufacturing a transistor
06/21/2001WO2001045146A1 Superior silicon carbide integrated circuits and method of fabricating
06/21/2001WO2001045144A1 A vertically configured chamber used for multiple processes
06/21/2001WO2001045143A1 Device and method for treating substrates
06/21/2001WO2001045141A2 Method and apparatus for smoothing thin conductive films by gas cluster ion beam
06/21/2001WO2001045136A1 Method and system for the examination of specimen using a charged particle beam
06/21/2001WO2001045135A2 Plasma reactor cooled ceiling with an array of thermally isolated plasma heated mini-gas distribution plates
06/21/2001WO2001045134A2 Method and apparatus for producing uniform process rates
06/21/2001WO2001045113A1 Method to provide a reduced constant e-field during erase of eeproms for reliability improvement
06/21/2001WO2001044913A1 Interface device and information processing system
06/21/2001WO2001044802A1 Method for the determination of gaseous chemical components in a process reactor for treating electrical components, in particular wafers
06/21/2001WO2001044794A1 Detection of voids in semiconductor wafer processing
06/21/2001WO2001044540A2 Method and device for monitoring etching chambers
06/21/2001WO2001044402A1 Method of polishing or planarizing a substrate
06/21/2001WO2001044396A1 Polishing compositions for noble metals
06/21/2001WO2001044395A1 Polishing compositions for semiconductor substrates
06/21/2001WO2001043938A1 Microreaction systems and molding methods
06/21/2001WO2001043920A1 Method of manufacturing a polymer or polymer composite polishing pad
06/21/2001WO2001009925B1 Apparatus and method for texture analysis on semiconductor wafers
06/21/2001WO2000073531A3 Copper sputtering target assembly and method of making same
06/21/2001WO1998005807A8 CaTiO3 INTERFACIAL TEMPLATE STRUCTURE ON SUPERCONDUCTOR
06/21/2001US20010004765 Method of checking exposure patterns formed over photo-mask
06/21/2001US20010004763 Layout and wiring system, wiring method for use in automatic layout and wiring system, and recording medium recording the wiring method
06/21/2001US20010004762 Computer-aided design supporting system in which cells can be arranged independently
06/21/2001US20010004651 Comprising an epoxy resin, a curing agent, and an inorganic filler in the form of porous silica having a specific surface area of 6 to 200 m2/g, a true specific gravity of 2.0 to 2.2, and a mean particle size of 2-50 micro m
06/21/2001US20010004633 Post chemical-mechanical planarization (CMP) cleaning composition