Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
10/2002
10/30/2002CN1377460A Method and apparatus for characterization of microelectronic feature quality
10/30/2002CN1377457A Method and apparatus for in-situ monitoring of plasma etch and deposition processes using a pulsed broadband light source
10/30/2002CN1377395A CMP products
10/30/2002CN1377393A Adhesive agent, method for connecting wiring terminals and wiring structure
10/30/2002CN1377323A Method for producing high-purity hydrochloric acid
10/30/2002CN1377311A Silicon carbide epitaxial layers grown on substrates offcut towards
10/30/2002CN1377219A Manufacturing method for circuit device
10/30/2002CN1377216A 线路板 PCB
10/30/2002CN1377215A Manufacturing method for circuit device
10/30/2002CN1377092A 半导体器件 Semiconductor devices
10/30/2002CN1377091A 半导体器件及其制造方法 Semiconductor device and manufacturing method thereof
10/30/2002CN1377090A Multi-order memory unit
10/30/2002CN1377088A Electrostatic protector of integrated circuit
10/30/2002CN1377082A 半导体装置 Semiconductor device
10/30/2002CN1377077A 半导体器件 Semiconductor devices
10/30/2002CN1377076A Method for improving programming efficiency of flash memory unit
10/30/2002CN1377075A Read-only region and welding pad region method for mask programmable ROM
10/30/2002CN1377074A Semiconductor device able to reduce influence of package stress to IC parameter drift and its making technology
10/30/2002CN1377073A Flash memory unit package with self-aligned discrete grid and its preparing process
10/30/2002CN1377072A Process for preparing capacitor on bipolar and CMOS compatible device and its device
10/30/2002CN1377071A Process for preparing semiconductor device containing high-Q inductor and its structure
10/30/2002CN1377070A Locating ring for chip carrier
10/30/2002CN1377069A Jig
10/30/2002CN1377068A Test device and method removing cationic pollution
10/30/2002CN1377067A Manufacturing method for semiconductor device and semiconductor device
10/30/2002CN1377066A Process for preparing power MOSFET
10/30/2002CN1377065A Self-aligned bipolar junction-type transistor and its making method
10/30/2002CN1377064A Method for forming layer of tungsten silicate
10/30/2002CN1377063A Self-aligning method for generating metallic silicide layer of semiconductor element
10/30/2002CN1377062A Process for preparing dielectric layer between metal layers
10/30/2002CN1377061A Method for growing barium titate film
10/30/2002CN1377060A Process for preparing SiO2 medium film on micron-class strip mesa
10/30/2002CN1377059A Etching machine for chip boundary and its etching method
10/30/2002CN1377058A Method or making lower electrode of embedded capacitor
10/30/2002CN1377057A Silicone substrate film, its forming method and photocell
10/30/2002CN1377056A Device for predetermining service life of rotation machine and method for determining maintenance period
10/30/2002CN1377050A Process for preparing composite passive element
10/30/2002CN1376999A Device and method to select manufactures of photomask by received data
10/30/2002CN1376949A Projection optical system, projection exposure device with them thereof and projection exposure method
10/30/2002CN1376932A Automatic test system, device and method for ICs and overall system
10/30/2002CN1376931A Semiconductor test system based on event
10/30/2002CN1376927A Broadband design of detecting analytic system
10/30/2002CN1376740A Silicon composition low dielectric film, semiconductor device and method for producing low dielectric films
10/30/2002CN1376632A Water generating reactor
10/30/2002CN1376623A Equipment and method for loading or unloading operation
10/30/2002CN1376581A Stepped etch process
10/30/2002CN1093688C Method for making dielectric layer window
10/30/2002CN1093687C Transistor and method for forming the same
10/30/2002CN1093680C Electrode modification using unzippable polymer paste
10/30/2002CN1093645C Photoresist material and method for producing semiconductor constituted of corrosion resist picture thereof
10/30/2002CN1093565C Composite material and use thereof
10/29/2002US6473890 Clock circuit and method of designing the same
10/29/2002US6473889 Method of automatically generating repeater blocks in HDL and integrating them into a region constrained chip design
10/29/2002US6473882 Method of layout compaction
10/29/2002US6473702 System and method for integrated singulation and inspection of semiconductor devices
10/29/2002US6473672 Apparatus and method for automatically realigning an end effector of an automated equipment to prevent a crash
10/29/2002US6473665 Defect analysis method and process control method
10/29/2002US6473664 Manufacturing process automation system using a file server and its control method
10/29/2002US6473563 Vaporizer and apparatus for vaporizing and supplying
10/29/2002US6473520 Pellicle, identification system of the same, and method of identifying the same
10/29/2002US6473454 Rake combiner apparatus using charge transfer element
10/29/2002US6473352 Semiconductor integrated circuit device having efficiently arranged link program circuitry
10/29/2002US6473348 Data sensing circuit of semiconductor memory
10/29/2002US6473337 Memory device having memory cells with magnetic tunnel junction and tunnel junction in series
10/29/2002US6473335 MRAM configuration
10/29/2002US6473328 Three-dimensional magnetic memory array with a minimal number of access conductors therein
10/29/2002US6473321 Semiconductor integrated circuit and nonvolatile semiconductor memory
10/29/2002US6473311 Gate area relief strip for a molded I/C package
10/29/2002US6473310 Insulated power multichip package
10/29/2002US6473303 Cooling device for a high-power semiconductor module
10/29/2002US6473288 Adhesive sheet and electrostatic chucking device
10/29/2002US6473227 Silica glass optical material for projection lens to be utilized in vacuum ultraviolet radiation lithography, method for producing the same, and projection lens
10/29/2002US6473226 Silica glass member
10/29/2002US6473163 Fluorescence radiation filter
10/29/2002US6473162 Method of computing defocus amount in lithography and lithographic process using the method
10/29/2002US6473161 Lithographic projection apparatus, supporting assembly and device manufacturing method
10/29/2002US6473158 Exposure method and exposure apparatus
10/29/2002US6473157 Method of manufacturing exposure apparatus and method for exposing a pattern on a mask onto a substrate
10/29/2002US6473156 Scanning exposure apparatus and device manufacturing method
10/29/2002US6473151 Substrate processing apparatus
10/29/2002US6472929 Semiconductor device
10/29/2002US6472926 Internal voltage generation circuit
10/29/2002US6472924 Integrated semiconductor circuit having analog and logic circuits
10/29/2002US6472923 Semiconductor device
10/29/2002US6472904 Double data rate input and output in a programmable logic device
10/29/2002US6472902 Semiconductor device
10/29/2002US6472890 Method for producing a contact structure
10/29/2002US6472822 Pulsed RF power delivery for plasma processing
10/29/2002US6472767 Static random access memory (SRAM)
10/29/2002US6472763 Semiconductor device with bumps for pads
10/29/2002US6472761 Solid-state image pickup apparatus and manufacturing method thereof
10/29/2002US6472760 Nanomachining of integrated circuits
10/29/2002US6472759 Ball grid array type semiconductor device
10/29/2002US6472757 Conductor reservoir volume for integrated circuit interconnects
10/29/2002US6472756 Method of forming titanium silicide and titanium by chemical vapor deposition and resulting apparatus
10/29/2002US6472755 Semiconductor device comprising copper interconnects with reduced in-line copper diffusion
10/29/2002US6472754 Semiconductor device with improved arrangements to avoid breakage of tungsten interconnector
10/29/2002US6472753 BICMOS semiconductor integrated circuit device and fabrication process thereof
10/29/2002US6472752 Flash memory device
10/29/2002US6472751 H2 diffusion barrier formation by nitrogen incorporation in oxide layer