Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
02/2003
02/12/2003EP1282482A2 Multilayer retaining ring for chemical mechanical polishing
02/12/2003EP1070157A4 Method for removing photoresist and plasma etch residues
02/12/2003EP1019959B1 Interconnect structure with a low permittivity dielectric layer
02/12/2003EP0975015B1 Wafer cleaning device comprising a cleaning tank and a tray
02/12/2003EP0853136B1 Aluminum or aluminum alloy sputtering target
02/12/2003EP0717749B1 Self-addressable self-assembling microelectronic systems and devices for molecular biological analysis and diagnostics
02/12/2003CN1397154A Method of manufacturing ceramic multi-layer substrate, and unbaked composite laminated body
02/12/2003CN1397095A 发光二极管及半导体激光 Light-emitting diodes and semiconductor laser
02/12/2003CN1397094A 双极型晶体管 Bipolar transistor
02/12/2003CN1397092A Passive alignment using slanted wall pedestal
02/12/2003CN1397091A Process for wafer level treatment to reduce stiction and passivate micromachined surfaces and compound used therefor
02/12/2003CN1397090A Wet-etching agent composition
02/12/2003CN1397089A Non-single crystal film, substrate with non-single crystal film, method and apparatus for producing the same, method and apparatus for inspecting the same, thin film transistor, thin film transistor
02/12/2003CN1397034A Random number generator
02/12/2003CN1397027A Method of forming electrodes or fixel electrodes and liquid crystal display device
02/12/2003CN1396709A Surface acoustic wave component and its manufacturing method
02/12/2003CN1396684A Method for welding unit on connection supporting seat without addition material
02/12/2003CN1396666A Process for preparing optical filter plate
02/12/2003CN1396665A Process for preparing optical filter plate
02/12/2003CN1396664A Manufacturing method of semiconductor device
02/12/2003CN1396663A Bipolar insulated-gate transistor device, its preparing process and method for controlling its switching speed
02/12/2003CN1396661A Nonvolatile semiconductor device and its making method
02/12/2003CN1396660A Semiconductor integrated circuit device and its manufacturing method
02/12/2003CN1396658A 半导体集成电路 The semiconductor integrated circuit
02/12/2003CN1396656A Electrostatic discharge protective circuit and method of thin film transistor liquid crystal display
02/12/2003CN1396655A Circuit board and its making method and high output module
02/12/2003CN1396654A Circuit board and its making method and high-output module
02/12/2003CN1396653A 半导体装置 Semiconductor device
02/12/2003CN1396652A Process for preparing silicon nitride ROM
02/12/2003CN1396651A Process for preparing NMOS and PMOS with symmetrical threshold voltages
02/12/2003CN1396650A Method for suppressing leakage between bit lines of memory array
02/12/2003CN1396649A Method for making semiconductor device
02/12/2003CN1396648A Immersion method of minute hole
02/12/2003CN1396647A Process for preparing barrier layer with ligh tension strength
02/12/2003CN1396646A Technology manufacturing contact plug of embedded memory
02/12/2003CN1396645A Dual-mask CMP technology for eliminating influence of silicon cone phenomenon
02/12/2003CN1396644A Process for preparing shallow-channel isolating structure
02/12/2003CN1396643A Process for preparing shallow-channel isolating structure
02/12/2003CN1396642A Method for measuring dislocation density of gallium nitride crystal grown by heteroepitaxy
02/12/2003CN1396641A Overlapped chip binding structure and generating method
02/12/2003CN1396640A Method for packaging thin semiconductor device with reversely mounted chip
02/12/2003CN1396639A Process for prevent grid depletion of MOS transistor
02/12/2003CN1396638A Method for dipositing high-dielectric constant material on chip using atomic layer diposition method
02/12/2003CN1396637A Process for preparing silicon-oxygen layer
02/12/2003CN1396636A Process for depositing film on surface of semiconductor chip
02/12/2003CN1396635A Dry process for removing excessive metal in silicide generating procedure
02/12/2003CN1396634A Operating method of wafer etching machine
02/12/2003CN1396633A Making method of compound semiconductor
02/12/2003CN1396632A Method for cutting material on two-sided of semiconductor piece
02/12/2003CN1396631A Process for preparing lightly doped drain with different resistor values
02/12/2003CN1396630A Process for preparing Ge crystal film on non-crystal material by magnetically controlled sputtering
02/12/2003CN1396629A Polysilicon crystallization method, thin film transistor and manufacture method of liquid crystal display thereof
02/12/2003CN1396628A Method for making compound semiconductor device
02/12/2003CN1396627A Method for smaller pattern by thermal constraction of water-soluble resin coating on photoresist
02/12/2003CN1396626A Semiconductor device and making method thereof
02/12/2003CN1396625A Substrate processing system for managing device information of substrate processing device
02/12/2003CN1396624A High-speed picking-up and holding equipment
02/12/2003CN1396494A Measuring method and correction method for illumination irregularity of exposure device
02/12/2003CN1396487A Pattern forming method and method for producing liquid crystal display using the method
02/12/2003CN1396317A Amorphous silicon crystallizing method
02/12/2003CN1396034A Resonator for ultrosonic silk weld
02/12/2003CN1396007A Chemical applying method and its applying device
02/12/2003CN1101642C Method and apparatus for producing electronic circuit device
02/12/2003CN1101599C SRAM cell andm ethod of manufacturing the same
02/12/2003CN1101597C Lead-on-chip type semiconductor chip package and method for manufacturing the same
02/12/2003CN1101596C Method for manufacturing semiconductor device
02/12/2003CN1101595C Method for mfg. semiconductor device field oxide film
02/12/2003CN1101594C Semiconductor unit package, method and encapsulant for the packaging thereof
02/12/2003CN1101593C Method and apparatus for ion beam formation in ion implanter
02/12/2003CN1101438C Die attach adhesive compositions
02/11/2003US6519760 Method and apparatus for minimizing optical proximity effects
02/11/2003US6519758 Method of checking exposure patterns formed over photo-mask
02/11/2003US6519750 Method of designing layout for integrated circuit
02/11/2003US6519749 Integrated circuit partitioning placement and routing system
02/11/2003US6519748 Signal delay time calculation method of semiconductor integrated circuit and computer program product for executing the method
02/11/2003US6519726 Semiconductor device and testing method of the same
02/11/2003US6519708 Chip set comprising only graphic interface reference voltage pin
02/11/2003US6519504 Vacuum processing apparatus and semiconductor manufacturing line using the same
02/11/2003US6519502 Apparatus and method for positioning a cassette pod onto a loadport by an overhead hoist transport system
02/11/2003US6519501 Method of determining optimum exposure threshold for a given photolithographic model
02/11/2003US6519498 Method and apparatus for managing scheduling in a multiple cluster tool
02/11/2003US6519417 Heating plate, a wafer guide, and an exhaust heat compensator. The heating plate is loaded with a wafer and the wafer guide arranges the wafer on the heating plate. The exhaust heat compensator is placed on the wafer guide and compensates
02/11/2003US6519357 Appearance inspection machine and method for concurrently performing defect detection and classification
02/11/2003US6519195 Semiconductor integrated circuit
02/11/2003US6519191 Semiconductor integrated circuit device having an internal voltage generation circuit layout easily adaptable to change in specification
02/11/2003US6519179 Magnetic tunnel junction device, magnetic memory adopting the same, magnetic memory cell and access method of the same
02/11/2003US6519161 Molded electronic package, method of preparation and method of shielding-II
02/11/2003US6519132 Ultra-small capacitor array
02/11/2003US6519045 Method and apparatus for measuring very thin dielectric film thickness and creating a stable measurement environment
02/11/2003US6519036 System for processing semiconductor products
02/11/2003US6519024 Exposure apparatus and device manufacturing apparatus and method
02/11/2003US6518835 Semiconductor integrated circuit device having an optimal circuit layout to ensure stabilization of internal source voltages without lowering circuit functions and/or operating performance
02/11/2003US6518825 Semiconductor integrated circuit device
02/11/2003US6518814 High-voltage capacitor voltage divider circuit having a high-voltage silicon-on-insulation (SOI) capacitor
02/11/2003US6518785 Method for monitoring an amount of heavy metal contamination in a wafer
02/11/2003US6518784 Test method using semiconductor test apparatus
02/11/2003US6518781 Probe structure and manufacturing method thereof
02/11/2003US6518721 Oscillation isolator
02/11/2003US6518705 An antenna arrangement for generating an electric field inside a process chamber is provided. Generally, the antenna arrangement comprises a first loop disposed around an antenna axis. The first loop with a gap and the second turn is
02/11/2003US6518679 Capacitive alignment structure and method for chip stacking