Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2003
03/12/2003CN1402352A Semiconductor device with floating grid and mfg. method thereof
03/12/2003CN1402351A 半导体记忆装置 Semiconductor memory device
03/12/2003CN1402348A Semiconductor device and mfg. method thereof
03/12/2003CN1402347A Semiconductor chip, semiconductor IC and method for selecting semiconductor chip
03/12/2003CN1402344A Semiconductor device with multiple wiring layers and mfg. method thereof
03/12/2003CN1402343A Gate electrode device body of electric power electronic power device
03/12/2003CN1402339A Method for mfg. quick scratch-and-write internal storage tunnel oxide film
03/12/2003CN1402338A Method for forming capacitor with high capacitance and low volt coefficiency
03/12/2003CN1402337A Ferroelectric memory transistor mfg. method
03/12/2003CN1402336A Method for mfg. nonvolatile memory body with closed angle
03/12/2003CN1402335A Method for mfg. wafer memory card
03/12/2003CN1402334A Method for mfg. semiconductor internal storage module with gate stacked dielectric layer
03/12/2003CN1402333A Semiconductor apparatus and mfg. method thereof
03/12/2003CN1402332A Method for generating selection protection layer on copper interconnector
03/12/2003CN1402331A Method for mfg. silicon dioxide capable of improving shallow channel corner thin film growth uniformity
03/12/2003CN1402330A Generation of standard logic unit data-base by merging power line
03/12/2003CN1402329A Semiconductor device mfg. method and semiconductor device thereby
03/12/2003CN1402328A Method for use of capacitor mfg. process in semiconductor mfg. process
03/12/2003CN1402327A Metal capacitor structure and mfg. method
03/12/2003CN1402326A Method for forming metal capacitor by inlaying mfg. process, and product thereby
03/12/2003CN1402325A Method for forming metal capacitor in inlaying mfg. process
03/12/2003CN1402324A Device and method for automatic setting IC wafer operation frequency
03/12/2003CN1402323A Embedded internal storage test platform device and testing method
03/12/2003CN1402322A Monitoring system and method for monitoring process condition change by electron beam
03/12/2003CN1402321A Semiconductor device and mfg. method thereof, circuit substrate and electronic apparatus
03/12/2003CN1402320A Circuit device mfg. method
03/12/2003CN1402318A Method for mfg. memory wafer card
03/12/2003CN1402317A Semiconductor silicon wafer and mfg. method thereof
03/12/2003CN1402316A Method for removing photoresistance layer in ion implantation mfg. process
03/12/2003CN1402315A Method for reinforcing low dielectric constant material layer to resist photoresistance removing liquid damage
03/12/2003CN1402314A Method for monitoring two-carrier transistor emitter window etching mfg process
03/12/2003CN1402313A Grinding pad recovery device structure and use
03/12/2003CN1402312A Method and device for mfg. adhesion bound joint between semiconductor wafer and carrier disk
03/12/2003CN1402311A Method and device for cleaning chip with contact hole or interlayer hole
03/12/2003CN1402310A Cheminomechanical grinding method
03/12/2003CN1402309A Proces for polishing indium phosphide single crystal wafer
03/12/2003CN1402308A Substrate treating system for executing exposure treatment in gas atmosphere
03/12/2003CN1402307A Method for mfg. gate dielectric layer
03/12/2003CN1402306A Nitride semiconductor growing process
03/12/2003CN1402305A Method for mfg. semiconductor/magnet/semicondustor threelayer structure
03/12/2003CN1402303A Method for producing high-resistance resistor for integrating high-voltage element mfg. process
03/12/2003CN1402254A Thin film magnetic storage device with storage unit contg. magnetic tunnel node
03/12/2003CN1402253A Thin film magnet storage device capable of high-speed reading data and working stably
03/12/2003CN1402252A Magnetic storage device
03/12/2003CN1402229A Optic pick-up
03/12/2003CN1402090A Stripping liquor for photoresist and photoresist stripping method therewith
03/12/2003CN1402066A Substrate with embedded structure, display device comprising same, method for mfg. said substrate and method for mfg. display device
03/12/2003CN1402064A Transmission-reflection LCD and mfg. method thereof
03/12/2003CN1402057A Electrooptical device, mfg. method thereof, and projection display device and electronic device
03/12/2003CN1401949A Fan filter unit controlling system and dustless chamber therewith
03/12/2003CN1401817A Metal organic chemical vapor deposition for ferroelectric film and annealing treatment
03/12/2003CN1401560A Array nanotube, mfg. method and use thereof
03/12/2003CN1401461A Machine hand location method and device
03/12/2003CN1103179C Microelectronic connecting element and module contg. same
03/12/2003CN1103123C Split polysilicon CMOS process for multi-megabit dynamic memories with stacked capacitor cells
03/12/2003CN1103122C Non volatile memory device and method for fabricating same
03/12/2003CN1103120C Shallow slot isolating method for avoiding dishing
03/12/2003CN1103119C Process for single mask C4 solder bump fabrication
03/12/2003CN1103118C Method for fabricating self assembling microstructures
03/12/2003CN1103117C Manufacturing process for field effect transistor capable of changing its threshold voltage by hydrion
03/12/2003CN1103116C Process for making electronic devices having low-leakage current and low-polarization fatigue
03/12/2003CN1103115C Integrated microstructures of semiconductor material and method of fabricating same
03/12/2003CN1103113C Electrode assembly and method for assembly and method for treating wafer using same
03/12/2003CN1103052C Probe card having vertical type needles
03/11/2003USRE38029 Wafer polishing and endpoint detection
03/11/2003US6532579 Semiconductor integrated circuit and design method and manufacturing method of the same
03/11/2003US6532438 Method and system for improving a transistor model
03/11/2003US6532428 Method and apparatus for automatic calibration of critical dimension metrology tool
03/11/2003US6532403 Robot alignment system and method
03/11/2003US6532183 Semiconductor device capable of adjusting internal potential
03/11/2003US6532182 Semiconductor memory production system and semiconductor memory production method
03/11/2003US6532173 Nonvolatile semiconductor memory device with mechanism to prevent leak current
03/11/2003US6532172 Steering gate and bit line segmentation in non-volatile memories
03/11/2003US6532167 Voltage generator for semiconductor device
03/11/2003US6532165 Nonvolatile semiconductor memory and driving method thereof
03/11/2003US6532164 Magnetic spin polarization and magnetization rotation device with memory and writing process, using such a device
03/11/2003US6532161 Power supply with flux-controlled transformer
03/11/2003US6532069 Particle-measuring system and particle-measuring method
03/11/2003US6532057 Exposure apparatus and method
03/11/2003US6532056 Alignment system and projection exposure apparatus
03/11/2003US6531942 Method of cooling an induction coil
03/11/2003US6531912 High voltage generating circuit improved in parasitic capacitance of voltage-dividing resistance
03/11/2003US6531861 Movement actuator/sensor systems
03/11/2003US6531793 Displacement device
03/11/2003US6531786 Durable reference marks for use in charged-particle-beam (CPB) microlithography, and CPB microlithography apparatus and methods comprising same
03/11/2003US6531785 Semiconductor device
03/11/2003US6531783 Method of via formation for multilevel interconnect integrated circuits
03/11/2003US6531781 Fabrication of transistor having elevated source-drain and metal silicide
03/11/2003US6531780 Via formation in integrated circuit interconnects
03/11/2003US6531779 Multi-layer interconnection structure in semiconductor device and method for fabricating same
03/11/2003US6531778 Semiconductor device and method of production thereof
03/11/2003US6531777 Barrier metal integrity testing using a dual level line to line leakage testing pattern and partial CMP
03/11/2003US6531776 Semiconductor device having reduced interconnect-line parasitic capacitance
03/11/2003US6531770 Electronic part unit attached to a circuit board and including a cover member covering the electronic part
03/11/2003US6531768 Semiconductor integrated circuit device with optical wave guides
03/11/2003US6531766 Improved moisture resistance and high reliability; solder resist, encapsulating resin
03/11/2003US6531763 Semiconductor component packaging; attaching a semiconductor component to a circuit board
03/11/2003US6531760 Semiconductor device
03/11/2003US6531759 Alpha particle shield for integrated circuit
03/11/2003US6531758 Semiconductor integrated circuit with resistor and method for fabricating thereof
1 ... 4755 4756 4757 4758 4759 4760 4761 4762 4763 4764 4765 4766 4767 4768 4769 4770 4771 4772 4773 4774 4775 ... 6590