Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
05/2003
05/28/2003EP1314201A1 Method for producing an antifuse and antifuse for allowing selective electrical connection of neighbouring conductive zones
05/28/2003EP1314198A1 Overlay marks, methods of overlay mark design and methods of overlay measurements
05/28/2003EP1314197A1 High reliability non-conductive adhesives for non-solder flip chip bondings and flip chip bonding method using the same
05/28/2003EP1314196A1 Method for making an integrated circuit capable of being surface-mounted and resulting circuit
05/28/2003EP1314195A2 Method of manufacturing a trench-gate semiconductor device and corresponding device
05/28/2003EP1314194A2 Slurry for use with fixed-abrasive polishing pads in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods
05/28/2003EP1314193A2 Organosilicate resins as hardmasks for organic polymer dielectrics in fabrication of microelectronic devices
05/28/2003EP1314192A2 Method for selective etching of oxides
05/28/2003EP1314191A1 Composite structure for electronic microsystems and method for production of said composite structure
05/28/2003EP1314190A2 Semiconductor device having passive elements and method of making same
05/28/2003EP1314189A2 Doped elongated semiconductors, their growth and applications
05/28/2003EP1314188A2 Process for cleaning ceramic articles
05/28/2003EP1314183A1 Plasma processing
05/28/2003EP1314182A2 System and method for removing particles entrained in an ion beam
05/28/2003EP1314181A2 Electrostatic trap for particles entrained in an ion beam
05/28/2003EP1314180A2 System and method for removing contaminant particles relative to an ion beam
05/28/2003EP1314179A2 Methods and apparatus for adjusting beam parallelism in ion implanters
05/28/2003EP1314165A1 Memory cell arrangement and method for the production thereof
05/28/2003EP1314152A1 Circuit selection of magnetic memory cells and related cell structures
05/28/2003EP1314087A1 Nonvolatile fuse in redundancy circuit for low-voltage flash memories
05/28/2003EP1313897A1 Device and method for the deposition of, in particular, crystalline layers on, in particular, crystalline substrates
05/28/2003EP1313896A2 Apparatus and method for flow of process gas in an ultra-clean environment
05/28/2003EP1313891A1 Cvd coating device
05/28/2003EP1313890A2 Barrier coating for vitreous materials
05/28/2003EP1313785A2 Polymers with high internal free volume
05/28/2003EP1313662A2 Edge gripping end effector wafer handling apparatus
05/28/2003EP1313581A2 Method for producing composite components by powder injection molding and composite powder appropriate for use in said method
05/28/2003EP1313573A2 Semiconductor wafer container cleaning apparatus
05/28/2003EP1313540A1 Fluid media particle isolating system
05/28/2003EP1222662B1 Polyvalent, magnetoresistive write/read memory and method for writing and reading a memory of this type
05/28/2003EP1165288B1 A method and apparatus for stabilizing the process temperature during chemical mechanical polishing
05/28/2003EP1138075A4 A method and device for improved salicide resistance on polysilicon gates
05/28/2003EP1125007A4 Submicron metallization using electrochemical deposition
05/28/2003EP0932874B1 A method and apparatus for routing of nets in an electronic device
05/28/2003DE10205026C1 Semiconductor substrate used for vertical integration of integrated circuits comprises a first conductor strip on its front side, and a region formed by insulating trenches and electrically insulated from the substrate
05/28/2003DE10163835C1 Semiconductor element used as a DRAM element comprises a semiconductor substrate, a dielectric layer, a silicon-germanium layer formed in an opening on the substrate, a cobalt silicide layer, a conformal cobalt layer, and a metal connection
05/28/2003DE10054161C2 Verpackung für Halbleiterscheiben und Verfahren zu ihrer Herstellung Packaging for semiconductor wafers, and methods for their preparation
05/28/2003CN1421054A 燃料电池和电源片技术 Fuel cells and power chip technology
05/28/2003CN1421047A Method and apparatus for measuring parameters of electronic device
05/28/2003CN1421046A Dual spacer process for non-volatile memory devices
05/28/2003CN1421045A Methods and apparatuses for trench depth detection and control
05/28/2003CN1421044A Housing assembly for electronic component
05/28/2003CN1421043A Plasma processing system and method therefor
05/28/2003CN1420978A Hot wall rapid thermal processor
05/28/2003CN1420944A Method for metal plating, pretreating agent, and semiconductor wafer and semiconductor device using same
05/28/2003CN1420917A Polishing agent and method for producing planar layers
05/28/2003CN1420899A Low dielectric constant organic dielectrics based on cage-like structures
05/28/2003CN1420806A Drip manifold for uniform chemical delivery
05/28/2003CN1420716A Method for forming induction and through-hole in single chip circuit
05/28/2003CN1420637A Passive device and module of transceiver
05/28/2003CN1420571A Method for mfg. semiconductor luminescent device, and semiconductor luminescent device made thereby
05/28/2003CN1420567A Nitride read-only memory structure and mfg. method threrof
05/28/2003CN1420566A Non-volatile semiconductor storage unit structure and mfg. method thereof
05/28/2003CN1420563A 半导体装置 Semiconductor device
05/28/2003CN1420562A Semiconductor device, robot, method for running lottery ticket and recording medium
05/28/2003CN1420561A Semiconductor IC and mfg. method thereof
05/28/2003CN1420560A Semiconductor device and mfg. method thereof
05/28/2003CN1420559A 半导体装置 Semiconductor device
05/28/2003CN1420556A Contactor for semiconductor device, and contacting method
05/28/2003CN1420555A Semiconductor device and method for mfg. same
05/28/2003CN1420554A Thin film transistor array substrate mfg. method and structure
05/28/2003CN1420553A Method for mfg. imbedded storage
05/28/2003CN1420552A Silicon nitride read-only memory structure and mfg. method thereof
05/28/2003CN1420551A Method for mfg. vertical nitride read-only memory unit
05/28/2003CN1420550A Method for mfg. static random memory
05/28/2003CN1420549A Double bit location rapid storage structure and mfg. method thereof
05/28/2003CN1420548A Method for mfg. semiconductor IC device
05/28/2003CN1420547A Method for mfg. semiconductor IC device
05/28/2003CN1420546A Method for mfg. semiconductor IC device
05/28/2003CN1420545A Method for design of semconductor device, and semiconductor device
05/28/2003CN1420544A Process flow for mfg. chip capable of pretesting efficiency, and testing method thereof
05/28/2003CN1420543A Double MONOS unit mfg. method and module structure
05/28/2003CN1420542A Method for mfg. semiconductor devcie used in system chip
05/28/2003CN1420541A Method for mfg. system integrated chip
05/28/2003CN1420540A Method for mfg. double inlaid structure
05/28/2003CN1420539A Wafer and method for estimating carrier concentration thereof
05/28/2003CN1420538A Method for mfg. semiconductor device, semiconductor device and assembling method trereof
05/28/2003CN1420537A Method and device for mfg. parts after installation of electronic element
05/28/2003CN1420536A Method for mfg. thin film transistor
05/28/2003CN1420535A Method for mfg. low-resistance transistor element
05/28/2003CN1420534A Method for mfg. automatically aligned field oxidation layer by oxygen atom implantation
05/28/2003CN1420533A System and method for enhancing dielectric film
05/28/2003CN1420532A Process for improving DxZ silicon oxide adhesion to silk
05/28/2003CN1420531A Wet resist removing process after silk etching
05/28/2003CN1420530A Oxygen doped Si-C compound etching stop layer
05/28/2003CN1420529A Cutter
05/28/2003CN1420528A High dielectric grid medium Al2O3/BaO/Al2O3 structure and preparing method thereof
05/28/2003CN1420527A Method for mfg. semiconductor device
05/28/2003CN1420526A Device and method for regulating pressure at expulsion in vacuum system of semiconductor reaction chamber
05/28/2003CN1420525A Read-only code mask and use method thereof
05/28/2003CN1420524A Method for mfg. semiconductor substrate
05/28/2003CN1420499A 保护电路 Protection circuit
05/28/2003CN1420391A Double-layer photoetching process
05/28/2003CN1420362A Cell voltage detecting circuit
05/28/2003CN1420203A Method for mfg. thin film and feedstock for chemical vapor growth
05/28/2003CN1420161A Substrate surface cleaning liquid and cleaning method
05/28/2003CN1110232C Apparatus and method for stability enhancement of molten solder droplets as ejected
05/28/2003CN1110100C Triple-trap flash memory cell and fabrication process thereof
05/28/2003CN1110099C Semiconductor IC device and method for mfg. same
05/28/2003CN1110097C Clock skew minimization system and method for IC
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