Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
08/2003
08/13/2003EP1335039A1 Device and method for plating
08/13/2003EP1335038A1 Device and method for electroless plating
08/13/2003EP1335037A2 Plasma cvd apparatus
08/13/2003EP1335016A1 Cleaning composition
08/13/2003EP1335011A1 Cerium based abrasive material, method of quality examination therefor and method for production thereof
08/13/2003EP1335009A1 Dispersion for chemical mechanical polishing
08/13/2003EP1334802A1 Polisher
08/13/2003EP1334522A1 Semiconductor device with reduced line-to-line capacitance and cross talk noise
08/13/2003EP1334520A2 Film material comprising metal spikes and method for the production thereof
08/13/2003EP1334519A2 Ball limiting metallurgy for input/outputs and methods of fabrication
08/13/2003EP1334518A2 Nitrogen implantation using a shadow effect to control gate oxide thickness in sti dram semiconductors
08/13/2003EP1334517A2 Gate process for dram array and logic devices on same chip
08/13/2003EP1334516A2 Slurry and method for chemical mechanical polishing of copper
08/13/2003EP1334515A2 Method for producing an integrated semiconductor component
08/13/2003EP1334514A2 Dielectric etch chamber with expanded process window
08/13/2003EP1334513A2 Wafer applied fluxing and underfill material, and layered electronic assemblies manufactured therewith
08/13/2003EP1334512A1 Fet with notched gate and method of manufacturing the same
08/13/2003EP1334511A2 Amorphous carbon layer for improved adhesion of photoresist
08/13/2003EP1334416A2 Circuit arrangement and a method for detecting an undesired attack on an integrated circuit
08/13/2003EP1334413A1 Voltage supply circuit
08/13/2003EP1334408A1 Photoresist stripper/cleaner compositions containing aromatic acid inhibitors
08/13/2003EP1334407A2 A method for monitoring line width of electronic circuit patterns
08/13/2003EP1334406A2 Photolithographic mask
08/13/2003EP1334370A2 Method for locating defects and measuring resistance in a test structure
08/13/2003EP1334330A1 Position measuring device and method for determining a position
08/13/2003EP1334222A1 Cvd reactor with graphite-foam insulated, tubular susceptor
08/13/2003EP1334051A2 Integrated roller transport pod and asynchronous conveyor
08/13/2003EP1333936A2 Porous layers and method for production thereof by means of spin-coating
08/13/2003EP1285221A4 In-situ mirror characterization
08/13/2003EP1242647B1 Method of depositing transition metal nitride thin films
08/13/2003EP1206704B1 Test needle for a raster-matching adapter and a device for testing printed circuit boards
08/13/2003EP1196947A4 Surface planarization of thin silicon films during and after processing by the sequential lateral solidification method
08/13/2003EP1192292B1 Plasma treatment of thermal cvd tan films from tantalum halide precursors
08/13/2003EP1152964A4 Port door retention and evacuation system
08/13/2003EP1147605B1 Improved voltage translator circuit
08/13/2003EP1094470B1 Data line disturbance free memory block divided flash memory and microcomputer having flash memory therein
08/13/2003EP1078391B1 Method and device for changing a semiconductor wafer position
08/13/2003EP1071913A4 Compact external torch assembly for semiconductor processing
08/13/2003EP1021747B1 Optical lithography beyond conventional resolution limits
08/13/2003EP0933166B1 Abrasive and method for polishing semiconductor substrate
08/13/2003EP0929935A4 Coplanar waveguide amplifier
08/13/2003EP0879902B1 Treating method and apparatus utilizing chemical reaction
08/13/2003EP0847311B1 Wafer scrubbing device
08/13/2003EP0708987B1 Semiconductor device provided with an organic semiconductor material
08/13/2003CN2566453Y Arrangement machine for crystal chip passive element before sintering
08/13/2003CN2566452Y Crystal chip tester
08/13/2003CN2566451Y Crystal chip tester
08/13/2003CN2566450Y Crystal chip element electrode sticking automatic implant machine
08/13/2003CN2566449Y Single chip coating-welding tin plaster flattening and positioning regulating mechanism
08/13/2003CN2566448Y Base structure of semiconductor crystal chip working machine
08/13/2003CN2566426Y Crystal chip resistance strip stripping arrangement machine
08/13/2003CN1436375A Group Ôàó nitride compound semiconductor device
08/13/2003CN1436372A Semiconductor device and method of mfg. same
08/13/2003CN1436371A Trench MOSFET with double-diffused body profile
08/13/2003CN1436370A Semiconductor chip and semiconductor device using said semiconductor chip
08/13/2003CN1436369A Method for making substrates and resulting substrates
08/13/2003CN1436368A Electronic parts packaging method and electronic parts package
08/13/2003CN1436367A Method for mfg. semiconductor device and semiconductor device thereby
08/13/2003CN1436366A Silicon bipolar transistor, circuit arrangement and method for production of silicon bipolar transistor
08/13/2003CN1436365A Preparation method of coating of gallium nitride
08/13/2003CN1436364A Methods for forming and integrated circuit structures contg. ruthenium and tungsten contg. layers
08/13/2003CN1436363A Method for forming and IC structures contg. enhanced-surface-area conductive layers
08/13/2003CN1436360A Method for fault identification in plasma process
08/13/2003CN1436359A Highly efficent compact capacitance coupled plasma reactor/generator and method
08/13/2003CN1436324A Negative-acting chemically amplified photoresist composition
08/13/2003CN1436323A Method of reducing metal ion content of film-forming resin using liquid/liquid centrifuge
08/13/2003CN1436307A Method and apparatus for testing signal paths between integrated circuit wafer and wafer tester
08/13/2003CN1436306A Microcontactor probe and electric probe unit
08/13/2003CN1436302A Optical inspection method and apparatus using collection angutar design
08/13/2003CN1436225A Polishing composition for metal CMP
08/13/2003CN1436117A Encapsulation using microcellular foamed materials
08/13/2003CN1435966A Delay control circuit device, delay control method and semiconductor integrated circuit device
08/13/2003CN1435947A Logical circuit and semiconductor device
08/13/2003CN1435915A Spherical grid array connection device
08/13/2003CN1435911A Signal transmission system
08/13/2003CN1435898A Semiconductor light-emitting component and mfg. method thereof
08/13/2003CN1435897A Semiconductor device and method for mfg. same
08/13/2003CN1435896A Semiconductor device and mthod for mfg. same
08/13/2003CN1435894A Organic LED device and mfg. method thereof
08/13/2003CN1435892A Semiconductor device and mfg. method thereof
08/13/2003CN1435891A Optical semiconductor integrated circuit device and mfg. method thereof
08/13/2003CN1435889A Screen read-only memory testing element and method
08/13/2003CN1435888A 半导体存储装置 The semiconductor memory device
08/13/2003CN1435887A Non-volatile semiconductor memory capable of enhancing bit line voltage resistance
08/13/2003CN1435886A 半导体装置 Semiconductor device
08/13/2003CN1435885A Circuit arrangement for reducing chemico-mechanical grinding process defect and method for mfg. same
08/13/2003CN1435883A Non-gate-comtrolled diode element electrostatic discharge protection circuit and mfg. method thereof
08/13/2003CN1435882A Semiconductor device and mfg. method thereof
08/13/2003CN1435881A Connecting pad structure and mfg. method thereof
08/13/2003CN1435879A Method for mfg. non-volatile internal memory
08/13/2003CN1435878A Strong inductor film element and making method, film capacitor and piezoelectric regulator
08/13/2003CN1435877A Semiconductor device mfg. method
08/13/2003CN1435876A Method for mfg. image sensor
08/13/2003CN1435875A Method for mfg. selective local self-aligned silicide
08/13/2003CN1435874A Non-volatile internal memory structure and mfg. method thereof
08/13/2003CN1435873A Lsi系统设计方法 Lsi system design approach
08/13/2003CN1435872A Wafer grade testing and salient point process and chip struture with testing pad
08/13/2003CN1435871A Method for determining optimal bonding parameter during bonding using lead bonding device
08/13/2003CN1435869A Method for mfg. shallow junction MOS transistor
08/13/2003CN1435868A Method for mfg. MOS transistor with low grid depletion phenomenon
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