Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
08/2003
08/06/2003CN1434983A Halo-free non-rectifying contact on chip with halo source/drain diffusion
08/06/2003CN1434982A Nonvolatile memory and method of driving monvolatile memory
08/06/2003CN1434981A Semiconductor device inspection system
08/06/2003CN1434980A Microparticle arrangement film, electrical connection film, electrical connection stracture and microparticle arrangement method
08/06/2003CN1434979A MDSFEET device system and method
08/06/2003CN1434978A Insitu post etch process to remove remaining photoresist and residual sidewall passivation
08/06/2003CN1434953A Method for implementing physical design for dynamically reconfigurable logic circuit
08/06/2003CN1434931A Photoresist remover composition
08/06/2003CN1434930A Method in connection with the production of template and the template thus produced
08/06/2003CN1434884A Modified susceptor for use in chemical vapor deposition process
08/06/2003CN1434883A Epitaxial silicon wafer free from autodoping and backside halo
08/06/2003CN1434879A Method of depositing IO ITO thin film on polymer substrate
08/06/2003CN1434846A Polishing composition
08/06/2003CN1434519A Multi-terminal MOS varactor
08/06/2003CN1434518A SOI semiconductor device and method for making same
08/06/2003CN1434517A Single transistor adopted high-density semiconductor memory unit and memory array
08/06/2003CN1434516A Ferroelectric semiconductor memory
08/06/2003CN1434515A Semiconductor memory device using vertical-channel transistors
08/06/2003CN1434514A Structure of flash memory element and making method thereof
08/06/2003CN1434513A Programmable gate array based on transistor grid oxidation layr breakdown property
08/06/2003CN1434512A Semiconductor device and photoelectric device including same
08/06/2003CN1434511A Blocking circuit for IC
08/06/2003CN1434510A Semiconductor device and making method thereof
08/06/2003CN1434509A Double embedded metal inner connection wire structure and making method thereof
08/06/2003CN1434508A Semiconductor device
08/06/2003CN1434507A Wire solder free semiconductor device and package method thereof
08/06/2003CN1434506A Wire solder free semiconductor device and package method thereof
08/06/2003CN1434504A Semiconductor device and making method, and printing mask
08/06/2003CN1434503A Method for making memroy element
08/06/2003CN1434502A Method for making flush memory
08/06/2003CN1434501A Method for making partially self-aligned contact window
08/06/2003CN1434500A Method for measuring tellarium cadmium mercury meterial p-n junction depth
08/06/2003CN1434499A Test element for tunnelling oxidl layer of flash memory and method thereof
08/06/2003CN1434498A Flip chip type semiconductor device and making method thereof
08/06/2003CN1434497A Method for fixing chip carrier
08/06/2003CN1434496A Method for assembling QFN type image sensor and structure thereof
08/06/2003CN1434495A Reinforced heat radiation type chip down embedded ball type array carrying board structure and making method thereof
08/06/2003CN1434494A Method for making MOS with raised initial potential stability
08/06/2003CN1434493A Self-growth hydrophobic nano molecular organic diffusion-resisting film and preparation method
08/06/2003CN1434492A Chemical solution treatment apparatus for semiconductor substrate
08/06/2003CN1434491A Chemical mechanical polishing method for semiconductor substrate and water-dispersion solution for chemical mechanical polishing
08/06/2003CN1434490A Substrate drying method and device thereof
08/06/2003CN1434489A Semicondoctor wafer with improved partial planeness and making method thereof
08/06/2003CN1434488A Chip protector
08/06/2003CN1434487A Method for forming superthin grid dielectric layer by using soft nitrogen-contained plasma
08/06/2003CN1434486A Method for reducing oxidation erosion of grid stack layer
08/06/2003CN1434485A Method for removing residual polycrystalline silicon
08/06/2003CN1434484A Method for removing residual polycrystalline silicon
08/06/2003CN1434483A Semiconductor device and making method thereof
08/06/2003CN1434482A Method for making gallium nitride crystal
08/06/2003CN1434481A Substrate treating device and method thereof
08/06/2003CN1434480A 电子器件 Electronic devices
08/06/2003CN1434455A Semiconductor IC device and making method thereof
08/06/2003CN1434374A 半导体装置 Semiconductor device
08/06/2003CN1434351A Photoetch instrument and method for making device fo same
08/06/2003CN1434349A Photo-mechanical characteristic making containing micrometer and submicrometer characteristic for semiconductor device
08/06/2003CN1434338A Active-matrix addressing LCD device using laterial electric field
08/06/2003CN1434337A Reflection electrooptical device and electronic equipment
08/06/2003CN1434319A System and method for laser beam gathering
08/06/2003CN1434153A Method for preparing expitaxial hetero crystal and film material on yield substrate
08/06/2003CN1433940A Method and device for conveying and installing feeding board using executor in end of feeding board of robot
08/06/2003CN1433935A Liner pad for TAB tap
08/06/2003CN1433849A Coating film drying method, coating film forming method and coating film forming apparatus
08/06/2003CN1117398C Three-layer polycrystal silicon inserted non-volatile memory unit and manufacture method thereof
08/06/2003CN1117397C Diffusing buried poalr plate slot DRAM unit array
08/06/2003CN1117395C Semiconductor package manufacturing method and semiconductor package
08/06/2003CN1117393C Active matrix displays and method of making
08/06/2003CN1117392C Buried wiring structure and its mfg. method
08/06/2003CN1117391C Rotary assembly of module integrated circuit processor
08/06/2003CN1117389C Semiconductor layer mixed with chemical vapor deposited rare-earth
08/06/2003CN1117388C Work piece supplying method and apparatus to batch process apparatus for semiconductor chip
08/06/2003CN1117380C Read only memory
08/06/2003CN1117010C System for cleaning carrier by gas from gas source and transporting and supporting carrier
08/05/2003US6604234 Method of designing/manufacturing semiconductor integrated circuit device using combined exposure pattern and semiconductor integrated circuit device
08/05/2003US6604231 Three-dimensional MCM, method for manufacturing the same, and storage medium storing data for the method
08/05/2003US6604229 Method of designing wiring for power sources in a semiconductor chip, and a computer product
08/05/2003US6604066 Method and apparatus for calculating delay for logic circuit and method of calculating delay data for delay library
08/05/2003US6604012 Lots dispatching method for variably arranging processing equipment and/or processing conditions in a succeeding process according to the results of a preceding process and apparatus for the same
08/05/2003US6604011 Reticle chuck in exposure apparatus and semiconductor device manufacturing method using the same
08/05/2003US6604010 System for selectively managing workpieces and a method for controlling the same
08/05/2003US6603877 Method of and apparatus for optical imaging inspection of multi-material objects and the like
08/05/2003US6603875 Pattern inspection with a simple mechanical apparatus following a simple procedure are provided. A recording medium which records a pattern inspection program for carrying out the pattern inspection is also provided.
08/05/2003US6603873 Defect detection using gray level signatures
08/05/2003US6603833 X-ray exposure apparatus
08/05/2003US6603702 Semiconductor integrated circuit
08/05/2003US6603685 Semiconductor integrated circuit device capable of ensuring reliability of transistor driving high voltage
08/05/2003US6603678 Thermally-assisted switching of magnetic memory elements
08/05/2003US6603677 Three-layered stacked magnetic spin polarization device with memory
08/05/2003US6603651 Electrostatic chuck
08/05/2003US6603650 Electrostatic chuck susceptor and method for fabrication
08/05/2003US6603542 High sensitivity optical inspection system and method for detecting flaws on a diffractive surface
08/05/2003US6603532 Illuminance measurement apparatus, exposure apparatus, and exposure method
08/05/2003US6603530 Exposure apparatus that illuminates a mark and causes light from the mark to be incident on a projection optical system
08/05/2003US6603529 Monitoring apparatus and method particularly useful in photolithographically processing substrates
08/05/2003US6603527 Liquid crystal display device
08/05/2003US6603453 Semiconductor device and method for manufacturing the same
08/05/2003US6603345 Semiconductor device with reduced leakage of current
08/05/2003US6603333 Method and apparatus for reduction of noise sensitivity in dynamic logic circuits
08/05/2003US6603325 Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor
08/05/2003US6603322 Probe card for high speed testing