| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 09/24/2003 | CN1444275A Double mosaic process |
| 09/24/2003 | CN1444274A Semiconductor device with punctured wiring and its production method |
| 09/24/2003 | CN1444272A Semiconductor device and method for making the same |
| 09/24/2003 | CN1444268A Method for defining processing parameter and defining processing parameter and design rule for at least one side |
| 09/24/2003 | CN1444267A Method for mfg. semiconductor device |
| 09/24/2003 | CN1444266A Photoetching programmed integrated circuit |
| 09/24/2003 | CN1444265A Device for depositing insulating layer in grooved channel |
| 09/24/2003 | CN1444264A Microshallow insulating groove structure preparation method |
| 09/24/2003 | CN1444263A Method for isolating element on semiconductor substrate |
| 09/24/2003 | CN1444262A Equipment for identifying working height of device conveying system and its method |
| 09/24/2003 | CN1444261A Soldered ball embedding device |
| 09/24/2003 | CN1444260A Production method of radiating plate with grounded reference potential function for radiating type chip plastic package |
| 09/24/2003 | CN1444259A Method for mfg. semiconductor device |
| 09/24/2003 | CN1444258A Reducing defect in electrodeposited copper used in semiconductor |
| 09/24/2003 | CN1444257A Method and system for processing radio-frequency plasma |
| 09/24/2003 | CN1444256A Method and device for washing base plate |
| 09/24/2003 | CN1444255A Method for mfg. semiconductor device |
| 09/24/2003 | CN1444254A Nitride semiconductor, semiconductor device and mfg. method thereof |
| 09/24/2003 | CN1444253A Method for producing relaxed SiGe Substrate |
| 09/24/2003 | CN1444252A Method and device for separating combined element using fluid |
| 09/24/2003 | CN1444231A Programming for reducing nonvolatile memory and operation technique for fetching interference |
| 09/24/2003 | CN1444229A Ferro-electric memory capable of having maximum bit line capacitance |
| 09/24/2003 | CN1444228A Method for spanning memory array, executing equipotential reading out and eliminating leakage current and its system |
| 09/24/2003 | CN1444192A Distributing structure, it mfg. method and optical equipment |
| 09/24/2003 | CN1444176A System for providing package for opening hollow cavity low-profile packaged semiconductor |
| 09/24/2003 | CN1444101A Exosure method and device |
| 09/24/2003 | CN1444100A Background exposure method and equipment using said method |
| 09/24/2003 | CN1444099A Light source element, illuminating device, exposure device and method |
| 09/24/2003 | CN1444073A Liquid display deivce and mfg. method thereof |
| 09/24/2003 | CN1444072A Electrooptical device and mfg. method electronic apparatus |
| 09/24/2003 | CN1443625A Soldering flux |
| 09/24/2003 | CN1122317C Process for producing semiconductor substrate |
| 09/24/2003 | CN1122316C Vertical type metal insulator semiconductor field effect transistor and method of its production |
| 09/24/2003 | CN1122315C MOSFET structure and fabrication method thereof |
| 09/24/2003 | CN1122313C Fast memory and manufacturing method therefor |
| 09/24/2003 | CN1122312C Semiconductor device production method |
| 09/24/2003 | CN1122311C Semiconductor device having metal silicide film and manufacturing method thereof |
| 09/24/2003 | CN1122309C 半导体装置 Semiconductor device |
| 09/24/2003 | CN1122308C Method for forming buried plate in silicon substrate |
| 09/24/2003 | CN1122307C Complementary metal oxide semiconductor device and formation method thereof |
| 09/24/2003 | CN1122306C Method for manufacturing of semiconductor capacitor |
| 09/24/2003 | CN1122305C Process of forming semiconductor device |
| 09/24/2003 | CN1122304C Resin sealed semiconductor device and method for manufacturing the same |
| 09/24/2003 | CN1122303C Method for fabricating semiconductor device |
| 09/24/2003 | CN1122302C Process for patterning conductive line without after corrosion |
| 09/24/2003 | CN1122301C Method for manufacturing semiconductor device using planarization technique |
| 09/24/2003 | CN1122300C Lead member for electronic part and process of producing the same |
| 09/24/2003 | CN1122299C Method of forming microcrystalline silicon film, photoelectric element and method of producing same |
| 09/24/2003 | CN1122279C Input buffer circuit for semiconductor IC circuit |
| 09/24/2003 | CN1122218C Logical check apparatus for semiconductor circuits |
| 09/24/2003 | CN1122186C Polymer optical waveguide and method for fabricating the same |
| 09/24/2003 | CN1122117C Plasma reactor with a deposition shield plate |
| 09/24/2003 | CN1122116C Single body injector and deposition chamber |
| 09/24/2003 | CN1122083C Thermally reworkable binders for flip chip devices |
| 09/24/2003 | CN1121891C Semiconductor mfg. system with getter safety device |
| 09/23/2003 | US6625793 Optimized emulation and prototyping architecture |
| 09/23/2003 | US6625792 Semiconductor design system, semiconductor integrated circuit, semiconductor design method and storage medium storing semiconductor design program |
| 09/23/2003 | US6625785 Method for diagnosing process parameter variations from measurements in analog circuits |
| 09/23/2003 | US6625556 Determining angle of rotation of wafer entering processing stages, recording angle and corresponding processing location as wafer moves through each stage, analyzing wafer for deviations, correlating to processing parameter and location |
| 09/23/2003 | US6625514 Performing process steps on first set of semiconductor wafers, performing manufacturing tracking of trench features using optical data, performing feedback corrective process on second set of wafers and feed-forward corrective process on first set |
| 09/23/2003 | US6625513 Minimizing variations by comparing output from most recent processing run to desired goal, calculating difference between goal and output, adding to create mirror image of output, using as target to predict tool behavior in subsequent run |
| 09/23/2003 | US6625512 Method and apparatus for performing final critical dimension control |
| 09/23/2003 | US6625497 Semiconductor processing module with integrated feedback/feed forward metrology |
| 09/23/2003 | US6625357 Method for fabricating fiducials for passive alignment of opto-electronic devices |
| 09/23/2003 | US6625082 Test circuit for testing semiconductor memory |
| 09/23/2003 | US6625070 Semiconductor memory device |
| 09/23/2003 | US6625058 Method for magnetic characteristics modulation and magnetically functioning apparatus |
| 09/23/2003 | US6625057 Magnetoresistive memory device |
| 09/23/2003 | US6625053 Nonvolatile semiconductor memory device having ferroelectric capacitors |
| 09/23/2003 | US6625051 Semiconductor integrated circuit |
| 09/23/2003 | US6625050 Semiconductor memory device adaptable to various types of packages |
| 09/23/2003 | US6625037 Printed circuit board and method manufacturing the same |
| 09/23/2003 | US6625026 Heat-activated self-aligning heat sink |
| 09/23/2003 | US6625005 Semiconductor circuit device having power and ground lines adapted for high-frequency operation |
| 09/23/2003 | US6625003 Method and apparatus for balancing an electrostatic force produced by an electrostatic chuck |
| 09/23/2003 | US6624898 Wafer supporting plate |
| 09/23/2003 | US6624897 Apparatus and method for feature edge detection in semiconductor processing |
| 09/23/2003 | US6624879 Exposure apparatus and method for photolithography |
| 09/23/2003 | US6624869 In-plane switching type liquid crystal display device with central common feed line and a method for manufacturing the same |
| 09/23/2003 | US6624649 Prober and low-temperature test equipment having same incorporated therein |
| 09/23/2003 | US6624648 Probe card assembly |
| 09/23/2003 | US6624646 Modular interface between test and application equipment |
| 09/23/2003 | US6624645 Semiconductor device testing method, using a spring-biased transformable conductive member electrode connection |
| 09/23/2003 | US6624642 Metal bridging monitor for etch and CMP endpoint detection |
| 09/23/2003 | US6624625 Test equipment |
| 09/23/2003 | US6624582 Method of an apparatus for performing circuit-processing, method of and apparatus for controlling the motion of the circuit-processing performance apparatus, and information storage medium |
| 09/23/2003 | US6624526 Compact SRAM cell incorporating refractory metal-silicon-nitrogen resistive elements and method for fabricating |
| 09/23/2003 | US6624525 Contact plug in capacitor device |
| 09/23/2003 | US6624522 Chip scale surface mounted device and process of manufacture |
| 09/23/2003 | US6624521 Flip chip design on a coplanar waveguide with a pseudo-coaxial ground bump configuration |
| 09/23/2003 | US6624520 Tape carrier, manufacturing method of tape carrier and package manufacturing method |
| 09/23/2003 | US6624517 Low-resistance contact to silicon having a titanium silicide interface and an amorphous titanium carbonitride barrier layer |
| 09/23/2003 | US6624516 Structure for connecting interconnect lines with interposed layer including metal layers and metallic compound layer |
| 09/23/2003 | US6624515 Microelectronic die including low RC under-layer interconnects |
| 09/23/2003 | US6624514 Semiconductor device and manufacturing method thereof |
| 09/23/2003 | US6624513 Semiconductor device with multilayer conductive structure formed on a semiconductor substrate |
| 09/23/2003 | US6624512 Semiconductor integrated circuit device and printed wired board for mounting the same |
| 09/23/2003 | US6624511 Hybrid integrated circuit device |
| 09/23/2003 | US6624507 Miniature semiconductor package for opto-electronic devices |
| 09/23/2003 | US6624504 Semiconductor device and method for manufacturing the same |