Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
09/2003
09/30/2003US6628852 Isolation device
09/30/2003US6628818 Wafers with scan area of image recognition in the second and later wafers is determined. For example, in an appearance inspection process of semiconductor pellets, the first wafer is scanned over for image recognition to determine a contour
09/30/2003US6628817 Inspection data analyzing system
09/30/2003US6628681 Laser apparatus
09/30/2003US6628559 Semiconductor memory device having refreshing function
09/30/2003US6628555 Semiconductor circuit having a detection circuit for controlling a power boosting circuit
09/30/2003US6628551 Reducing leakage current in memory cells
09/30/2003US6628550 Structure, fabrication and operation method of flash memory device
09/30/2003US6628549 Semiconductor device
09/30/2003US6628547 Fast program to program verify method
09/30/2003US6628546 Fast program to program verify method
09/30/2003US6628542 Magnetoresistive device and magnetic memory using the same
09/30/2003US6628541 Memory architecture with refresh and sense amplifiers
09/30/2003US6628536 Semiconductor memory device
09/30/2003US6628526 Electronic device manufacturing method, electronic device and resin filling method
09/30/2003US6628503 Gas cooled electrostatic pin chuck for vacuum applications
09/30/2003US6628500 Method and apparatus for dechucking a substrate from an electrostatic chuck
09/30/2003US6628493 System and method for electrostatic discharge protection using lateral PNP or PMOS or both for substrate biasing
09/30/2003US6628490 Circuit arrangement
09/30/2003US6628410 Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers and other microelectronic substrates
09/30/2003US6628406 Self referencing mark independent alignment sensor
09/30/2003US6628397 Apparatus and methods for performing self-clearing optical measurements
09/30/2003US6628392 Optical and electro-optical apparatus comprising nanostructure apertures, in layouts for controlling intensity from light sources, used as switches or shutters
09/30/2003US6628381 Optical inspection method and apparatus utilizing a collection angle design
09/30/2003US6628372 Use of multiple reticles in lithographic printing tools
09/30/2003US6628371 Controlling times and light intensity when transferring patterns onto photosensitive substrates such as wafers during photolithography
09/30/2003US6628370 Illumination system with spatially controllable partial coherence compensating for line width variances in a photolithographic system
09/30/2003US6628363 Thin film transistor having a covered channel and display unit using the same
09/30/2003US6628358 Method for processing conductive layer structures and devices including such conductive layer structures
09/30/2003US6628349 Thin film transistors (TFTs) comprising current passageways patterns made of semiconductors on dielectric surfaces having pixel electrodes and doped junctions; switches
09/30/2003US6628178 Radio frequency module parts including surface acoustic wave elements and manufacturing method thereof
09/30/2003US6628161 Reference voltage circuit
09/30/2003US6628140 Programmable logic devices with function-specific blocks
09/30/2003US6628127 Probe card for testing semiconductor integrated circuit and method of manufacturing the same
09/30/2003US6628078 Dielectric barrier discharge lamp and dry cleaning device using the same
09/30/2003US6628053 Carbon nanotube device, manufacturing method of carbon nanotube device, and electron emitting device
09/30/2003US6628043 Electronic component and method of production thereof
09/30/2003US6627998 Wafer scale thin film package
09/30/2003US6627997 Semiconductor module and method of mounting
09/30/2003US6627996 Semiconductor device having fluorine containing silicon oxide layer as dielectric for wiring pattern having anti-reflective layer and insulating layer thereon
09/30/2003US6627995 Microelectronic interconnect material with adhesion promotion layer and fabrication method
09/30/2003US6627994 Semiconductor device and film carrier tape
09/30/2003US6627993 Semiconductor device having an electrical contact and a dielectric lining in a contact region
09/30/2003US6627989 Semiconductor device and method for manufacturing same
09/30/2003US6627988 Semiconductor device and method for manufacturing the same
09/30/2003US6627981 Resin-packaged semiconductor device
09/30/2003US6627976 Leadframe for semiconductor package and mold for molding the same
09/30/2003US6627974 Nitride semiconductor substrate and method for manufacturing the same, and nitride semiconductor device using nitride semiconductor substrate
09/30/2003US6627973 Void-free interlayer dielectric (ILD0) for 0.18-micron flash memory semiconductor device
09/30/2003US6627972 Vertical bipolar transistor
09/30/2003US6627971 Polysilicon structures with different resistance values for gate electrodes, resistors, and capacitor plates
09/30/2003US6627968 Integrated capacitor and fuse
09/30/2003US6627967 Schottky barrier diode
09/30/2003US6627966 To protect chip component within ceramic main body, first and second sealing are carried out between a metal case and ceramic main body so as to prevent contamination, toimprove shielding effect against external electromagnetic fields
09/30/2003US6627963 Method for fabricating a merged integrated circuit device
09/30/2003US6627962 Semiconductor memory
09/30/2003US6627960 Semiconductor data storage apparatus
09/30/2003US6627957 Semiconductor device and fabrication method thereof
09/30/2003US6627956 Electrical and electronic apparatus comprising transistors having terminals formed on channel layers, joined to resistors; computers
09/30/2003US6627955 Structure and method of MOS transistor having increased substrate resistance
09/30/2003US6627953 High density electronic circuit modules
09/30/2003US6627952 Silicon oxide insulator (SOI) semiconductor having selectively linked body
09/30/2003US6627951 High speed trench DMOS
09/30/2003US6627950 Trench DMOS power transistor with field-shaping body profile and three-dimensional geometry
09/30/2003US6627949 High voltage power MOSFET having low on-resistance
09/30/2003US6627947 Compact single-poly two transistor EEPROM cell
09/30/2003US6627946 Forming spaced apart isolation regions on the substrate; forming trenches across active and isolation regions; forming a second layer of insulation material in active regions; filling trenches with a second conductive material
09/30/2003US6627945 Memory device and method of making
09/30/2003US6627944 Electrical and electronic apparatus comprising multilayer insulation on substrates and matrices having transistion metal complexes, phthalocyanines, porphyrins or intermetallics; discharging by controlling electrical resistance
09/30/2003US6627943 Flash memory device and method for fabricating the same
09/30/2003US6627942 Self-aligned floating gate poly for a flash E2PROM cell
09/30/2003US6627941 Capacitor for semiconductor device and method for manufacturing the same
09/30/2003US6627940 Memory cell arrangement
09/30/2003US6627939 Semiconductor device provided with a capacitor having a high-permittivity insulator film
09/30/2003US6627938 Capacitor constructions
09/30/2003US6627937 Semiconductor memory device
09/30/2003US6627936 Semiconductor device and method of producing the same
09/30/2003US6627935 Resistive ferroelectric memory cell
09/30/2003US6627934 Integrated semiconductor memory configuration with a buried plate electrode and method for its fabrication
09/30/2003US6627933 Method of forming minimally spaced word lines
09/30/2003US6627932 Magnetic random access memory comprising substrates, magnetic and nonmagnetic multilayers; semiconductors
09/30/2003US6627931 Ferroelectric memory cell and corresponding manufacturing method
09/30/2003US6627930 Ferroelectric thin film capacitors having multi-layered crystallographic textures
09/30/2003US6627929 Solid state CCD image sensor having a light shielding layer
09/30/2003US6627928 Method of manufacturing an integrated circuit, for integrating an electrically programmable, non-volatile memory and high-performance logic circuitry in the same semiconductor chip
09/30/2003US6627927 Dual-bit flash memory cells for forming high-density memory arrays
09/30/2003US6627924 Memory system capable of operating at high temperatures and method for fabricating the same
09/30/2003US6627922 Chip-type semiconductor light emitting device
09/30/2003US6627921 Structure and method for separation and transfer of semiconductor thin films onto dissimilar substrate materials
09/30/2003US6627919 Thermally stable nickel germanosilicide formed on SiGe
09/30/2003US6627918 Spacer elements for interactive information devices and method for making same
09/30/2003US6627913 Insulation of an MRAM device through a self-aligned spacer
09/30/2003US6627906 Controller calculates the beam-current density on the wafer stage
09/30/2003US6627905 Charged-particle-beam mask-based exposure apparatus employing a variable mask-illumination field and alignment and calibration methods therefor
09/30/2003US6627904 Ion implantation apparatus
09/30/2003US6627900 Methods, based on a genetic algorithm, for configuring parameters of an array of multiple components for cooperative operation to achieve a desired performance result
09/30/2003US6627889 Apparatus and method for observing sample using electron beam
09/30/2003US6627888 Scanning electron microscope
09/30/2003US6627886 Secondary electron spectroscopy method and system
09/30/2003US6627866 Tungsten or titanium-tungsten intermetallic is patterned using photolithography; light shielding layer forms dark pixel
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