Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
11/2003
11/19/2003CN1128469C Method for connecting electronic device with flexible circuit carrier and flexible electronic carrier
11/19/2003CN1128468C Chip packaging device
11/19/2003CN1128467C Method for packaging integrated circuit
11/19/2003CN1128466C Method for forming gate having polyside structure
11/19/2003CN1128465C Method for forming conductive layer using atomic layer deposition process
11/19/2003CN1128464C Step-by-step analysis method and system
11/19/2003CN1128450C Nonvolatile memory cell and method for programming method
11/19/2003CN1128394C Manufacture of heat radiator with super-thin ribs
11/19/2003CN1128247C Selective chemical plating process of preparing nanometer gap electrode
11/19/2003CN1128195C Abrasive, method of polishing wafer, and method of producing semiconductor device
11/18/2003USRE38320 Projection exposure apparatus wherein focusing of the apparatus is changed by controlling the temperature of a lens element of the projection optical system
11/18/2003US6651237 System and method for H-Tree clocking layout
11/18/2003US6651023 Semiconductor test apparatus, and method of testing semiconductor device
11/18/2003US6650769 Review station and appearance inspection device for checking semiconductor wafers
11/18/2003US6650678 Laser oscillating apparatus
11/18/2003US6650666 Laser wavelength control unit with piezoelectric driver
11/18/2003US6650591 Nonvolatile semiconductor memory device
11/18/2003US6650589 Low voltage operation of static random access memory
11/18/2003US6650579 Semiconductor device having test and read modes and protection such that ROM data reading is prevented in the test mode
11/18/2003US6650577 Integrated semiconductor memory having memory cells in a plurality of memory cell arrays and method for repairing such a memory
11/18/2003US6650576 Semiconductor memory and memory board therewith
11/18/2003US6650574 Semiconductor device preventing signal delay among wirings
11/18/2003US6650567 Nonvolatile semiconductor memories with a NAND logic cell structure
11/18/2003US6650565 Semiconductor memory device
11/18/2003US6650461 Method of manufacturing spatial light modulator and electronic device employing it
11/18/2003US6650426 Endpoint determination for recess etching to a precise depth
11/18/2003US6650419 Interferometric apparatus for precision measurement of altitude to a surface
11/18/2003US6650409 Dust particle detector
11/18/2003US6650408 Method for inspecting a polishing pad in a semiconductor manufacturing process, an apparatus for performing the method, and a polishing device adopting the apparatus
11/18/2003US6650399 Lithographic projection apparatus, a grating module, a sensor module, a method of measuring wave front aberrations
11/18/2003US6650398 Wavefront aberration measurement method and projection exposure apparatus
11/18/2003US6650379 Thin film transistor array panel
11/18/2003US6650312 Liquid crystal display module capable of avoiding generation of rib-like patterns
11/18/2003US6650220 Parallel spiral stacked inductor on semiconductor material
11/18/2003US6650215 Finned heat sinks
11/18/2003US6650158 Ferroelectric non-volatile logic elements
11/18/2003US6650141 High speed interface for a programmable interconnect circuit
11/18/2003US6650135 Measurement chuck having piezoelectric elements and method
11/18/2003US6650132 Method and apparatus for temperature control of a device during testing
11/18/2003US6650129 Method of testing semiconductor device
11/18/2003US6650022 Semiconductor device exhibiting enhanced pattern recognition when illuminated in a machine vision system
11/18/2003US6650020 Resin-sealed semiconductor device
11/18/2003US6650017 Electrical wiring of semiconductor device enabling increase in electromigration (EM) lifetime
11/18/2003US6650016 Flip chips
11/18/2003US6650014 Semiconductor device
11/18/2003US6650013 Method of manufacturing wire bonded microelectronic device assemblies
11/18/2003US6650012 Semiconductor device
11/18/2003US6650011 Porous ceramic work stations for wire and die bonders
11/18/2003US6650010 Unique feature design enabling structural integrity for advanced low K semiconductor chips
11/18/2003US6650009 Structure of a multi chip module having stacked chips
11/18/2003US6650002 Semiconductor device having active element connected to an electrode metal pad via a barrier metal layer and interlayer insulating film
11/18/2003US6650000 For providing voltage to low-current electronic devices that exist within the integrated circuit.
11/18/2003US6649999 Semiconductor chip configuration with a layer sequence with functional elements contacted by contact pads
11/18/2003US6649998 Passive devices and modules for transceiver
11/18/2003US6649997 Semiconductor device having fuses or anti-fuses
11/18/2003US6649996 In situ and ex situ hardmask process for STI with oxide collar application
11/18/2003US6649995 Semiconductor device and method of manufacturing the same
11/18/2003US6649993 Simplified upper electrode contact structure for PIN diode active pixel sensor
11/18/2003US6649983 Bipolar device may have a significant relative gain and is constructed with no additional mask steps.
11/18/2003US6649982 Integration of bipolar and CMOS devices for sub-0.1 micrometer transistors
11/18/2003US6649981 High breakdown voltage semiconductor device
11/18/2003US6649980 Semiconductor device with MOS transistors sharing electrode
11/18/2003US6649979 Method of manufacturing MOSFET and structure thereof
11/18/2003US6649977 Silicon on insulator self-aligned transistors
11/18/2003US6649976 Semiconductor device having metal silicide film and manufacturing method thereof
11/18/2003US6649975 Vertical power devices having trench-based electrodes therein
11/18/2003US6649974 Field-effect controlled semiconductor device having a non-overlapping gate electrode and drift region and its manufacturing method
11/18/2003US6649973 Semiconductor device and method for manufacturing the same
11/18/2003US6649972 Two bit non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping
11/18/2003US6649969 Nonvolatile semiconductor device
11/18/2003US6649968 Flash memory cells
11/18/2003US6649967 Non-volatile memory device with a floating gate having a tapered protrusion
11/18/2003US6649966 Quantum dot of single electron memory device and method for fabricating thereof
11/18/2003US6649965 Semiconductor device and method of manufacturing the same
11/18/2003US6649964 Body-to-substrate contact structure for SOI device and method for fabricating same
11/18/2003US6649963 Ferroelectric memory cell for VLSI RAM
11/18/2003US6649962 Selective polysilicon stud growth
11/18/2003US6649961 Supporting gate contacts over source region on MOSFET devices
11/18/2003US6649959 Method for increasing a very-large-scale-integrated (VLSI) capacitor size on bulk silicon and silicon-on-insulator (SOI) wafers and structure formed thereby
11/18/2003US6649957 Thin film polycrystalline memory structure
11/18/2003US6649956 Semiconductor integrated circuit device and manufacturing method thereof
11/18/2003US6649955 Ferroelectric memory device and method of fabricating the same
11/18/2003US6649954 Ferroelectric capacitor having upper electrode lamination
11/18/2003US6649953 Magnetic random access memory having a transistor of vertical structure with writing line formed on an upper portion of the magnetic tunnel junction cell
11/18/2003US6649941 Flip-chip device
11/18/2003US6649937 Semiconductor device with components embedded in backside diamond layer
11/18/2003US6649936 Thin-film transistor substrate and liquid crystal display
11/18/2003US6649935 Self-aligned, planarized thin-film transistors, devices employing the same
11/18/2003US6649934 Thin film transistor array panel for a liquid crystal display and methods for manufacturing the same
11/18/2003US6649933 Method of manufacturing thin film transistor liquid crystal display
11/18/2003US6649932 Electrical print resolution test die
11/18/2003US6649931 Semiconductor wafer, semiconductor chip, semiconductor device and method for manufacturing semiconductor device
11/18/2003US6649923 Positional deviation detecting method and device manufacturing method using the same
11/18/2003US6649920 Cell projection using an electron beam
11/18/2003US6649915 Ionizing radiation detector
11/18/2003US6649885 Whereby temperature of wafer can be accurately measured at all times, so that epitaxial growth processing and etching can be conducted on wafer kept at prescribed temperature
11/18/2003US6649883 Method of calibrating a semiconductor wafer drying apparatus
11/18/2003US6649833 Negative volume expansion lead-free electrical connection
11/18/2003US6649545 Photo-assisted remote plasma apparatus and method
11/18/2003US6649544 Thermal treatment equipment and method for heat-treating
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