Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
11/2003
11/26/2003CN1458694A Silicon nitride film semiconductor device and its producing method
11/26/2003CN1458693A Semiconductor storage device and its producing method
11/26/2003CN1458689A 半导体器件 Semiconductor devices
11/26/2003CN1458685A Method for producing non-volatile storage with p-type floating grid
11/26/2003CN1458684A Method for producing storage element
11/26/2003CN1458683A Method for producing semiconductor device with increased effective groove length
11/26/2003CN1458682A Metal Wiring forming method and method for producing display device
11/26/2003CN1458681A Method for forming copper wire on semiconductor module
11/26/2003CN1458680A Method for producing low resistance barrier layer of copper metallization production process
11/26/2003CN1458679A Method for producing contact plug
11/26/2003CN1458678A Integrated circuit chip and wafer and its producing and detecting method
11/26/2003CN1458677A Parallel two-coordinate moving platform
11/26/2003CN1458676A Semiconductor device and its producing method
11/26/2003CN1458675A Method for preparing semiconductor device with super shallow and super steep backword surface groove
11/26/2003CN1458674A Groove etching process for low k insulation material
11/26/2003CN1458673A Terminal detection system for chemical and mechanical polisher
11/26/2003CN1458672A Method for reducing defect of chemical and mechanical grinding to produce coppor and grinding slurry residual
11/26/2003CN1458671A Conductive polishing article for electrochemical mechanical polishing
11/26/2003CN1458670A Method for producing semiconductor element
11/26/2003CN1458669A Gasifier and gasifying supply device
11/26/2003CN1458668A Batched atom layer depositing device
11/26/2003CN1458667A Method for producing alignment mark
11/26/2003CN1458666A Producing device
11/26/2003CN1458665A Laminate layer transfer method and method for producing semiconductor device
11/26/2003CN1458640A Light emitting device and its producing method
11/26/2003CN1458256A Cleaning liquid composition after chemical and mechanical grinding
11/26/2003CN1129349C Zone heating system with feedback control
11/26/2003CN1129229C Electrical impedance matching system and method
11/26/2003CN1129190C FEMFET device and method for producing same
11/26/2003CN1129189C Non-volatile semiconductor memory device and process for producing same
11/26/2003CN1129187C Method for producing blowable fuses on integrated circuit
11/26/2003CN1129186C LOC semiconductor package and fabricating method thereof
11/26/2003CN1129185C Semiconductor device, semiconductor equipment, and method for mfg. same
11/26/2003CN1129182C Method for reducing peripheral contacted window height-width ratio of random access memory unit
11/26/2003CN1129180C Semiconductor device and manufacturing method of same
11/26/2003CN1129179C Shallow trench isolation method
11/26/2003CN1129178C Recessed shallow trench isolation structure nitride liner and method for making same
11/26/2003CN1129177C Method for fabricating semiconductor device
11/26/2003CN1129176C Manufacture of dielectric layer
11/26/2003CN1129175C Semiconductor processing apparatus having linear conveyor system
11/26/2003CN1129174C Method for manufacturing bipolar transistor capable of suppressing deterioration of transistor characteristics
11/26/2003CN1129173C Process for forming plain medium substrate surface and treating semiconductor substrate surface
11/26/2003CN1129172C Aperture apparatus used for photo litho-graphy and munafacturing method thereof
11/26/2003CN1129171C Method for forming capacitor of semiconductor device
11/26/2003CN1129170C Method for producing active matrix device
11/26/2003CN1129169C Epitaxial chip
11/26/2003CN1129168C Process for preparing carbon nano tube film cathode by forming catalyst particles
11/26/2003CN1129167C On-line equipment system and its control method
11/26/2003CN1129086C Computer simulation method of silicon oxidation
11/26/2003CN1129084C Manufacturing process change control apparatus and its manufacturing process change control method
11/26/2003CN1129079C Programming method for mask-type ROM
11/26/2003CN1129037C Light-receiving member, image forming apparatus and image forming method
11/26/2003CN1129025C Improved active matrix ESD protection and testing scheme
11/26/2003CN1128893C Corrosion apparatus
11/25/2003US6654939 Method of designing logic circuit, and computer product
11/25/2003US6654700 Testing method of semiconductor integrated circuit and equipment thereof
11/25/2003US6654698 Systems and methods for calibrating integrated inspection tools
11/25/2003US6654668 Processing apparatus, processing system, distinguishing method, and detecting method
11/25/2003US6654659 Feedback-driven, closed-loop system; pieoelectric detector; data processing; semiconductors
11/25/2003US6654604 Equipment for communication system
11/25/2003US6654489 Apparatus and methods for collecting global data during a reticle inspection
11/25/2003US6654305 System LSI having a substrate-bias generation circuit with a substrate-bias control-value storage unit
11/25/2003US6654297 Device and method for using complementary bits in a memory array
11/25/2003US6654295 Reduced topography DRAM cell fabricated using a modified logic process and method for operating same
11/25/2003US6654284 Channel write/erase flash memory cell and its manufacturing method
11/25/2003US6654282 Nonvolatile semiconductor memory device
11/25/2003US6654279 Magnetic thin film element, memory element using the same, and method for recording and reproducing using the memory element
11/25/2003US6654278 Magnetoresistance random access memory
11/25/2003US6654248 Top gated heat dissipation
11/25/2003US6654226 Thermal low k dielectrics
11/25/2003US6654210 Solid-state inductor and method for same
11/25/2003US6654122 Semiconductor processing apparatus having lift and tilt mechanism
11/25/2003US6654113 Surface inspection apparatus
11/25/2003US6654112 Apparatus and method for inspecting defects
11/25/2003US6654111 Surface inspection apparatus and method
11/25/2003US6654110 Image pickup apparatus and defect inspection apparatus for photomask
11/25/2003US6654108 Test structure for metal CMP process control
11/25/2003US6654107 Stepper lens aberration measurement pattern and stepper lens aberration characteristics evaluating method
11/25/2003US6654106 Methods and apparatus for determining blur of an optical system
11/25/2003US6654100 Movable stage to hold object, reference member having movement reference surface supporting movable stage and used as reference when stage moves, second reference member having different movement reference surface, switching device
11/25/2003US6654099 Scanning exposure apparatus, scanning exposure method and mask
11/25/2003US6654098 Stage apparatus, exposure apparatus, and device production method
11/25/2003US6654096 Exposure apparatus, and device manufacturing method
11/25/2003US6653890 Well bias control circuit
11/25/2003US6653880 Semiconductor integrated circuit device forming power sources having different voltages for operating circuit blocks
11/25/2003US6653877 Semiconductor device capable of internally adjusting delayed amount of a clock signal
11/25/2003US6653868 Semiconductor integrated circuit, method and program for designing the semiconductor integrated circuit
11/25/2003US6653854 Test pin unit
11/25/2003US6653850 Surface passivation method and arrangement for measuring the lifetime of minority carriers in semiconductors
11/25/2003US6653792 Ion implanting system
11/25/2003US6653791 Method and apparatus for producing uniform process rates
11/25/2003US6653788 Magnetron having a lowered oscillation frequency and processing equipment employing the same
11/25/2003US6653743 Electronic component mounted on a flat substrate and padded with a fluid filler
11/25/2003US6653742 Assembly including semiconductor chip, conductive pad, conductive trace, connection joint, and insulative adhesive; conductive trace includes routing line and pillar; connection joint contacts and electrically connects routing line and pad
11/25/2003US6653740 Vertical conduction flip-chip device with bump contacts on single surface
11/25/2003US6653739 Semiconductor device
11/25/2003US6653738 Semiconductor device
11/25/2003US6653737 Interconnection structure and method for fabricating same
11/25/2003US6653736 Multilayer flexible wiring boards
11/25/2003US6653735 CVD silicon carbide layer as a BARC and hard mask for gate patterning