Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
11/2003
11/20/2003US20030216019 Method for forming wiring structure
11/20/2003US20030216018 Manufacturing method of semiconductor device
11/20/2003US20030216017 Electrode for thin film capacitor devices
11/20/2003US20030216016 Method for fabricating semiconductor device with triple well structure
11/20/2003US20030216015 Method of manufacturing semiconductor device
11/20/2003US20030216014 Monatomic boron ion source and method
11/20/2003US20030216013 Method of controlling grain size in a polysilicon layer and in semiconductor devices having polysilicone structures
11/20/2003US20030216012 Method and apparatus for crystallizing semiconductor with laser beams
11/20/2003US20030216011 Light-emitting gallium nitride-based compound semiconductor device
11/20/2003US20030216010 Forming a multi segment integrated circuit with isolated substrates
11/20/2003US20030216009 Semiconductor device and manufacturing the same
11/20/2003US20030216008 Process for dataching layers of material
11/20/2003US20030216007 Method for shallow trench isolation fabrication and partial oxide layer removal
11/20/2003US20030216006 Method of improving HDP fill process
11/20/2003US20030216005 Method for forming transistor of semiconductor device
11/20/2003US20030216004 Method for manufacturing semiconductor device having increased effective channel length
11/20/2003US20030216003 Method of forming flash memory device
11/20/2003US20030216002 Method of manufacturing flash memory device
11/20/2003US20030216001 Non-volatile memory device having a bit line contact pad and method for manufacturing the same
11/20/2003US20030216000 Methods of forming programmable memory devices
11/20/2003US20030215999 Self aligned method of forming a semiconductor array of non-volatile memory cells
11/20/2003US20030215998 Double-sided capacitor structure for a semiconductor device and a method for forming the structure
11/20/2003US20030215997 Method of manufacturing semiconductor device
11/20/2003US20030215996 Process for producing oxide thin films
11/20/2003US20030215995 Chemical vapor deposition of silicate high dielectric constant materials
11/20/2003US20030215994 Method for forming ruthenium film of a semiconductor device
11/20/2003US20030215993 Electronic component and fabricating method
11/20/2003US20030215992 Method for forming transistor of semiconductor device
11/20/2003US20030215991 Method for fabricating semiconductor device with ultra-shallow super-steep-retrograde epi-channel by decaborane doping
11/20/2003US20030215990 Methods for fabricating strained layers on semiconductor substrates
11/20/2003US20030215989 Semiconductor device having gate all around type transistor and method of forming the same
11/20/2003US20030215988 Self-aligned dual-gate transistor device and method of forming self-aligned dual-gate transistor device
11/20/2003US20030215987 Simple process for fabricating semiconductor devices
11/20/2003US20030215986 Gate structure for a transistor and method for fabricating a transistor with the gate structure
11/20/2003US20030215985 Semiconductor wafer and manufacturing method of semiconductor device
11/20/2003US20030215984 Chip and wafer integration process using vertical connections
11/20/2003US20030215983 Forming mold layer on semiconductor substrate, forming mold frame for storage node by introducing photomask having array of separated light transmitting patterns defining region to be occupied by node, forming node, patterning mold layer
11/20/2003US20030215982 Semiconductor device with a staggered pad arrangement
11/20/2003US20030215981 Solder compositions for attaching a die to a substrate
11/20/2003US20030215980 Method of manufacturing a semiconductor device
11/20/2003US20030215979 Methods and apparatus for microelectronic component manufacture
11/20/2003US20030215978 Method for making tapered opening for programmable resistance memory element
11/20/2003US20030215975 Methods of coating contact holes in MEMS and similar applications
11/20/2003US20030215973 Manufacturing method of semiconductor device
11/20/2003US20030215971 Metamorphic long wavelength high-speed photodiode
11/20/2003US20030215970 Deposition method of insulating layers having low dielectric constant of semiconductor device
11/20/2003US20030215967 Solid-state imaging device and manufacturing method for solid-state imaging device
11/20/2003US20030215963 Plasma etch resistant coating and process
11/20/2003US20030215962 Integration of multiple processes within a single chamber
11/20/2003US20030215961 Self-aligned, trenchless mangetoresitive random-access memory (MRAM) structure with sidewall containment of MRAM structure
11/20/2003US20030215960 Method of fabricating ferroelectric capacitor
11/20/2003US20030215758 Photosensitive polymer and chemically amplified resist composition comprising the same
11/20/2003US20030215754 Residue reducing stable concentrate
11/20/2003US20030215753 Forming semiconductors by applying multilayer photoresists and antireflective coatings on substrates, then controlling exposure intensity for development
11/20/2003US20030215752 Masking dielectric and photoresist films on semiconductor substrates, then forming patterns, for miniaturized electrical and electronic apparatus
11/20/2003US20030215751 Rinsing etching by-products from substrates by irradiating using excimer lamps, then applying ozonized, alkaline or acidic water
11/20/2003US20030215749 Pattern forming method and method for manufacturing semiconductor device
11/20/2003US20030215742 Novel copolymers and photoresist compositions comprising same
11/20/2003US20030215736 Negative-working photoimageable bottom antireflective coating
11/20/2003US20030215725 Method for determining depth of focus
11/20/2003US20030215724 Monitoring method, exposure method, a manufacturing method for a semiconductor device, including an etching method and exposure processing unit
11/20/2003US20030215722 Photomask repair method and apparatus
11/20/2003US20030215643 Plasma-resistant articles and production method thereof
11/20/2003US20030215639 Aqueous dispersion containing cerium oxide-coated silicon powder, process for the production thereof and use thereof
11/20/2003US20030215578 Plasma processing method and apparatus and tray for plasma processing
11/20/2003US20030215573 Film forming apparatus and film forming method
11/20/2003US20030215570 Nitriding with each pulse of the silicon precursor and the nitrogen precursor at a time cycle between about 0.01 seconds and about 2.0 seconds
11/20/2003US20030215568 Positioning an extruder in line with the hole, extruding and depositing balls of molten electroconductive material into the apertures; materials handling
11/20/2003US20030215311 Mobile adjustment device for standard mechanical interface (SMIF) arm
11/20/2003US20030214911 Data based node penalties
11/20/2003US20030214872 Method for making auto-self-aligned top electrodes for dram capacitors with improved capacitor-to-bit-line-contact overlay margin
11/20/2003US20030214864 Split gate memory device and fabricating method thereof
11/20/2003US20030214862 Magnetic random access memory
11/20/2003US20030214856 Contact structure, phase change memory cell, and manufacturing method thereof with elimination of double contacts
11/20/2003US20030214843 Clamping Circuit and nonvolatile memory device using the same
11/20/2003US20030214840 Computer systems, processes for forming a SRAM cell, processes for turning a SRAM cell off, processes for writing a SRAM cell and processes for reading data from a SRAM cell
11/20/2003US20030214839 Magnetic random access memory
11/20/2003US20030214838 Small area magnetic memory devices
11/20/2003US20030214837 Magnetic random access memory with reduced parasitic currents
11/20/2003US20030214835 Stacked 1t-nmtj mram structure
11/20/2003US20030214795 Electronic component with bump electrodes, and manufacturing method thereof
11/20/2003US20030214773 Protection circuit section for semiconductor circuit system
11/20/2003US20030214769 Over-voltage protection circuit
11/20/2003US20030214767 Method and apparatus for providing ESD protection and/or noise reduction in an integrated circuit
11/20/2003US20030214735 Optical element, and light source unit and exposure apparatus having the same
11/20/2003US20030214654 Spatial averaging technique for ellipsometry and reflectometry
11/20/2003US20030214644 Pattern writing apparatus and pattern writing method
11/20/2003US20030214643 Illuminator for a lithography apparatus, a lithography apparatus comprising such an illuminator, and a manufacturing method employing such a lithography apparatus
11/20/2003US20030214642 Method for detecting flare noise of semiconductor device
11/20/2003US20030214614 Panel receiving device
11/20/2003US20030214348 Method and apparatus for providing noise suppression in an integrated circuit
11/20/2003US20030214345 Semiconductor device having internal voltage generated stably
11/20/2003US20030214344 Semiconductor circuit device adaptable to plurality of types of packages
11/20/2003US20030214343 Analog switching circuit and gradation selector circuit
11/20/2003US20030214337 Latch circuit
11/20/2003US20030214323 General-purpose logic cell, general-purpose logic cell array using the same, and ASIC using general-purpose logic cell array
11/20/2003US20030214320 Semiconductor device and manufacturing method for the same
11/20/2003US20030214278 Internal power supply voltage control apparatus having two internal power supply reference voltage generating circuits
11/20/2003US20030214231 Electroluminescent display device
11/20/2003US20030214074 Mold with compensating base
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