Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
01/2004
01/15/2004US20040009433 Pattern formation method
01/15/2004US20040009432 Substrate oscillating system oscillates substrate in one-dimensional direction paralleled with a main surface of substrate by means of oscillating whole of substrate rotating system in one dimensional direaction; uniform pattern
01/15/2004US20040009431 Method of exposing semiconductor device
01/15/2004US20040009427 A sulfonium compound which generates an acid upon exposure to radiation, and a resin component (acrylic monomer containing a lactone group which becomes insoluble in alkali under the action of an acid generated from sulfonium compound)
01/15/2004US20040009415 Optical apparatus comprising lenses and light sources positioned such that image distortion is suppressed, used to form lelctronics such as semiconductors or liquid crystal displays
01/15/2004US20040009412 Method of manufacturing chromeless phase shift mask
01/15/2004US20040009411 In-situ pellicle monitor
01/15/2004US20040009336 Titanium silicon nitride (TISIN) barrier layer for copper diffusion
01/15/2004US20040009307 Vapor depositing a metal oxide layer on a substrate, by oxidation with a generated plasma of metal compounds and oxygen; plasma enhanced chemical vapor deposition
01/15/2004US20040009295 Spin-coating method, determination method for spin-coating condition and mask blank
01/15/2004US20040008981 In-line fluid heater
01/15/2004US20040008980 Light heating apparatus and method therefor
01/15/2004US20040008880 Device and method for inspecting photomasks and products fabricated using the same
01/15/2004US20040008879 Method for detecting wafer level defect
01/15/2004US20040008812 Ball grid array x-ray orientation mark
01/15/2004US20040008747 Surface emitting semiconductor laser, and method and apparatus for fabricating the same
01/15/2004US20040008561 Stacked gate flash memory cell with reduced distrub conditions
01/15/2004US20040008556 Memory device reading data according to difference in electrical resistance between selected memory cell and reference cell
01/15/2004US20040008551 Non-volatile semiconductor memory device
01/15/2004US20040008542 Shared volatile and non-volatile memory
01/15/2004US20040008541 Multiple use memory chip
01/15/2004US20040008538 Semiconductor memory cell and memory array using a breakdown phenomena in an ultra-thin dielectric
01/15/2004US20040008537 Magnetic memory device and method
01/15/2004US20040008534 Embedded ROM device using substrate leakage
01/15/2004US20040008453 Magnetic layer system and a component comprising such a layer system
01/15/2004US20040008433 Wavefront aberration correction system
01/15/2004US20040008408 Relay lens used in an illumination system of a lithography system
01/15/2004US20040008402 Micromirrors with mechanisms for enhancing coupling of the micromirrors with electrostatic fields
01/15/2004US20040008341 Lighting optical machine and defect inspection system
01/15/2004US20040008336 Method and system of determining chamber seasoning condition by optical emission
01/15/2004US20040008334 Step and repeat imprint lithography systems
01/15/2004US20040008331 Lithographic apparatus and device manufacturing method
01/15/2004US20040008330 Electrostatically driven lithography
01/15/2004US20040008329 Exposure condition determination system
01/15/2004US20040008294 Liquid crystal display device and method for manufacturing the same
01/15/2004US20040008076 Semiconductor device having substrate potential detection circuit less influenced by change in manufacturing conditions
01/15/2004US20040008075 Semiconductor integrated circuit with stabilizing capacity
01/15/2004US20040008073 Output circuit, input circuit, electronic circuit, multiplexer, demultiplexer, wired-or circuit, wired-and circuit, pulse-processing circuit, multiphase-clock processing circuit, and clock-multiplier circuit
01/15/2004US20040008072 Semiconductor integrated circuit and method of driving the same
01/15/2004US20040008070 Clamp circuit
01/15/2004US20040008051 Semiconductor characteristic evaluation apparatus
01/15/2004US20040008037 Capacity measuring device and capacity measuring method
01/15/2004US20040008033 Apparatus for determining doping concentration of a semiconductor wafer
01/15/2004US20040007990 Light generation apparatus, exposure apparatus, and device manufacturing method
01/15/2004US20040007985 Apparatus for producing and sustaining a glow discharge plasma under atmospheric conditions
01/15/2004US20040007984 Multirate processing for metrology of plasma rf source
01/15/2004US20040007945 Matching circuit for megasonic transducer device
01/15/2004US20040007799 Formation of discontinuous films during an imprint lithography process
01/15/2004US20040007786 Semiconductor led device and producing method
01/15/2004US20040007785 Semiconductor memory having access transistors formed in a single well and driver transistors formed in wells different from the single well
01/15/2004US20040007784 Self-healing polymer compositions
01/15/2004US20040007783 Semiconductor device with terminals, and method of manufacturing the same
01/15/2004US20040007782 Connecting circuit devices and assemblies thereof
01/15/2004US20040007781 Single sided adhesive tape for compound diversion on BOC substrates
01/15/2004US20040007780 Particle-filled semiconductor attachment material
01/15/2004US20040007779 Wafer-level method for fine-pitch, high aspect ratio chip interconnect
01/15/2004US20040007778 Semiconductor integrated circuit device
01/15/2004US20040007777 Semiconductor integrated circuit
01/15/2004US20040007776 Multi-substrate layer semiconductor packages and method for making same
01/15/2004US20040007773 Ceramic substrate for semiconductor fabricating device
01/15/2004US20040007769 Solvent-free thermosetting resin composition, process for producing the same, and product therefrom
01/15/2004US20040007767 Semiconductor device and liquid jetting device using the same
01/15/2004US20040007766 Semiconductor device and method for manufacturing the same
01/15/2004US20040007765 Semiconductor device and method of fabricating the same
01/15/2004US20040007764 Semiconductor memory devices including different thickness dielectric layers for the cell transistors and refresh transistors thereof, and methods for fabricating same
01/15/2004US20040007763 Method and resulting structure for manufacturing semiconductor substrates
01/15/2004US20040007762 Method for fabricating adaptor for aligning and electrically coupling circuit devices having dissimilar connectivity patterns
01/15/2004US20040007761 Implementation of Si-Ge HBT with CMOS process
01/15/2004US20040007760 Inductor device with patterned ground shield and ribbing
01/15/2004US20040007757 Semiconductor device and manufacturing method thereof
01/15/2004US20040007756 Semiconductor device and fabrication method therefor
01/15/2004US20040007755 Field oxide profile of an isolation region associated with a contact structure of a semiconductor device
01/15/2004US20040007753 Photoelectric conversion device and manufacturing process thereof
01/15/2004US20040007752 Active matrix substrate having column spacers integral with protective layer and process for fabrication thereof
01/15/2004US20040007751 Magnetoresistive memory devices
01/15/2004US20040007748 Insulating layer is a first layer of silicon oxynitride film formed by using silane (SiH4), nitrous oxide (N2O), and hydrogen (H2), and a second film of silicon oxynitride formed by using SiH4 and N2O; thin film transistors
01/15/2004US20040007747 Gate structure and method
01/15/2004US20040007745 Semiconductor device haivng silicide film formed in a part of source-drain diffusion layers and method of manufacturing the same
01/15/2004US20040007744 Semiconductor device having a merged region and method of fabrication
01/15/2004US20040007743 Inverter, semiconductor logic circuit, static random access memory and data latch circuit
01/15/2004US20040007741 Semiconductor substrate, seminconductor device, and manufacturing method thereof
01/15/2004US20040007739 For forming a circuit pattern of a semiconductor chip; an insulating film on a substrate, and a semiconductor layer formed on said insulating film, which is isolated by the insulating film for every region of formation of a circuit
01/15/2004US20040007738 Self-aligned dog-bone structure for FinFET applications and methods to fabricate the same
01/15/2004US20040007736 High-voltage semiconductor component
01/15/2004US20040007735 High-voltage semiconductor component
01/15/2004US20040007734 Nonvolatile semiconductor memory device
01/15/2004US20040007733 Floating gate memory cell and forming method
01/15/2004US20040007732 Compact nonvolatile memory using substrate hot carrier injection
01/15/2004US20040007731 Semiconductor memory device and fabrication method thereof using damascene gate and epitaxial growth
01/15/2004US20040007730 Plasma damage protection circuit for a semiconductor device
01/15/2004US20040007729 Semiconductor device and manufacturing method thereof
01/15/2004US20040007728 Memory cell with vertical transistor and trench capacitor
01/15/2004US20040007727 Semiconductor memory device and fabrication method thereof using damascene bitline process
01/15/2004US20040007726 DRAM cell and space-optimized memory array
01/15/2004US20040007725 Method forms a storage capacitor that has a structure of a double cylinder that is extended by a constant depth from an upper part of a contact plug to a lower part; electrostatic capacity
01/15/2004US20040007724 Silicon on oxide (SOI); a transistor that includes an ultra-thin body epitaxial layer that forms an embedded junction with a channel that has a length dictated by an undercut under the gate stack for the transistor
01/15/2004US20040007723 Trench schottky barrier diode
01/15/2004US20040007721 Improved memory densities while avoiding undesirable short-channel effects such as drain-induced barrier lowering; threshold voltage roll off, and sub-threshold conduction, increased leakage and reduced carrier mobility
01/15/2004US20040007720 Compact SRAM cell incorporating refractory metal-silicon-nitrogen resistive elements and method for fabricating
01/15/2004US20040007717 Memory device having a transistor and one resistant element as a storing means and method for driving the memory device