Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2007
03/21/2007CN1932645A Method for fabricating semiconductor device including resist flow process and film coating process
03/21/2007CN1932627A Liquid crystal display, method for fabricating same and electrical apparatus
03/21/2007CN1932623A 液晶显示器 LCD Monitor
03/21/2007CN1932622A Transflective liquid crystal display device and method of fabricating the same
03/21/2007CN1932529A Module detecting card
03/21/2007CN1932527A Probe card clamp mechanism and probe apparatus
03/21/2007CN1932496A Silicon wafer surface defect evaluation method
03/21/2007CN1932075A Substrate processing device, cor processing modular and substrate lifting device
03/21/2007CN1932074A Electrostatic chuck, thin film manufacturing apparatus having the same, thin film manufacturing method, and substrate surface treatment method
03/21/2007CN1931981A Demolding material for integrated circuit packaging
03/21/2007CN1931947A Adhesive composition for circuit connection
03/21/2007CN1931551A Cutting apparatus and processing method
03/21/2007CN1931523A Chemomechanical grinder and its grinding pad regulating method
03/21/2007CN1931519A Wafer grinding and cutting process
03/21/2007CN1306706C Digital logic analog method
03/21/2007CN1306619C Methods of fabricating nanostructures and nanowires and devices fabricated therefrom
03/21/2007CN1306618C Thin film circuit device, manufacturing method thereof, electro-optical apparatus, and electronic instrument
03/21/2007CN1306617C Flash memory storing unit and method for making same
03/21/2007CN1306616C Semiconductor memory containing MOS transistor therewith floating grid and controlling grid
03/21/2007CN1306615C Semiconductor device and method of manufacturing the same
03/21/2007CN1306614C Semiconductor integrated circuit having connection down-lead for bit line interconnection
03/21/2007CN1306613C Semiconductor device and manufacturing method
03/21/2007CN1306605C Film carried belt for mounting electronic components thereon
03/21/2007CN1306604C Semiconductor device, its mfg. method and thin sheet interconnecting line parts
03/21/2007CN1306602C Circuit board capable of preventing heat deformation and mfg method thereof
03/21/2007CN1306601C Semiconductor package and its manufacture
03/21/2007CN1306599C Semiconductor device and production method therefor
03/21/2007CN1306598C Method for manufacturing high ultraviolet-critical potential EEPROM
03/21/2007CN1306597C Method for operating storage cells and components
03/21/2007CN1306596C Self-alignment process for flash memory
03/21/2007CN1306595C Automatic-aligning method silicide mfg. method
03/21/2007CN1306594C Graphic engine chip and its using method
03/21/2007CN1306593C Read/program potential generating circuit
03/21/2007CN1306592C Laying-out designing device and method for semiconductor elements
03/21/2007CN1306591C Semiconductor device
03/21/2007CN1306590C Method of forming dual damascene metal interconnection employing sacrificial metal oxide layer
03/21/2007CN1306589C Fuse structure forming method
03/21/2007CN1306588C Metal Wiring forming method and method for producing display device
03/21/2007CN1306587C Semiconductor device with shallow trench isolation and its manufacture method
03/21/2007CN1306586C Semiconductor device, method of manufacturing semiconductor device, and method of evaluating manufacturing process of semiconductor device
03/21/2007CN1306585C Stress leading space layer and its producing method
03/21/2007CN1306584C Method for manufacturing capacitor
03/21/2007CN1306583C Substrate protecting device and exposure device therewith
03/21/2007CN1306582C Ball-grating array semiconductor device quality detecting system based on dual-eye machine vision
03/21/2007CN1306581C Sorting handler for burn-in tester
03/21/2007CN1306580C Mechanism and method for inspecting batch nos. and etched nos. on wafers in casing
03/21/2007CN1306579C Device for seating semiconductor device in semiconductor test handler
03/21/2007CN1306578C Method for measuring semiconductor product reliability
03/21/2007CN1306577C Method for determining optimal bonding parameter during bonding using lead bonding device
03/21/2007CN1306576C Semiconductor chip mounting substrate and two-dimensional display
03/21/2007CN1306575C Method for packaging image sensor by injection moulding
03/21/2007CN1306574C Manufacturing process of conducting hole
03/21/2007CN1306573C Method for fabricating a self-aligned emitter in a bipolar transistor
03/21/2007CN1306572C Apparatus for electropolishing metal interconnections on semiconductor devices
03/21/2007CN1306571C Fabricating method of metallic silicide film and metal-oxide semiconductor
03/21/2007CN1306570C Method for oxidizing a silicon chip at low temperatures and apparatus using the same
03/21/2007CN1306569C Method for uniform polish microelectronic device
03/21/2007CN1306568C Terminal testing method and device
03/21/2007CN1306567C Plasma processing apparatus and control method thereof
03/21/2007CN1306566C Plasma Processing device
03/21/2007CN1306565C An apparatus and method for controlling galvanic corrosion effects on a single-wafer cleaning system
03/21/2007CN1306564C Method of manufacturing semiconductor device
03/21/2007CN1306563C Simulator
03/21/2007CN1306562C Polishing compound, method for production thereof, and polishing method
03/21/2007CN1306561C Transistor metal gate structure that minimizes non-planarity effects and method of formation
03/21/2007CN1306560C n-electrode for III group nitride based compound semiconductor element
03/21/2007CN1306559C Semiconductor device including semiconductor thin films having different crystallinity, substrate of the same, and manufacturing method of the same, and liquid crystal display and manufacturing method
03/21/2007CN1306558C Device and method for transporting products
03/21/2007CN1306557C Thin film transistor array base plate and its repairing method
03/21/2007CN1306556C Method of producing thin-film device
03/21/2007CN1306526C Method for forming noble metal film pattern
03/21/2007CN1306522C Composition, solution and method for forming transparent conductive film
03/21/2007CN1306341C Digital photoetching system and method on object
03/21/2007CN1306340C Photoresist composition and method for forming photoresist image
03/21/2007CN1306336C Photoresist composite and pattern forming process with it
03/21/2007CN1306321C Conductive element and liquid crystal display with said conductive element
03/21/2007CN1306277C Manipulator for a test head with active compliance
03/21/2007CN1306241C System and method of using a side-mounted interferometer to acquire position information
03/21/2007CN1306062C Atomic layer deposition apparatus and process
03/21/2007CN1305985C Slurry for CMP, and method of manufacturing semiconductor device
03/21/2007CN1305984C Method for chemical mechanical polishing (cmp) of low-k dielectric materials
03/21/2007CN1305807C Aluminum nitride sintered body and method of preparing the same
03/21/2007CN1305763C Process of producing multicrystalline silicon substrate and solar cell
03/21/2007CN1305751C Micromachine and method of fabricating the same
03/21/2007CN1305655C Machining apparatus and methods
03/21/2007CN1305654C Bi-directional singulation saw system and method
03/21/2007CN1305633C Laser separated die with tapered sidewalls for improved light extraction
03/21/2007CN1305586C Base board coating device and base board coating method
03/21/2007CN1305547C Filter and using method thereof
03/21/2007CN1305546C Chemical liquid supplying device and method for venting air
03/20/2007US7194719 Basic cell, edge cell, wiring shape, wiring method, and shield wiring structure
03/20/2007US7194718 Layout design apparatus, layout design method, and computer product
03/20/2007US7194704 Design layout preparing method
03/20/2007US7194366 System and method for estimating reliability of components for testing and quality optimization
03/20/2007US7194332 Data based node penalties
03/20/2007US7194177 Stress-induced control of polarization dependent properties in photonic devices
03/20/2007US7193912 Semiconductor integrated circuit device
03/20/2007US7193902 Method of erasing a flash memory cell
03/20/2007US7193882 Semiconductor memory device
03/20/2007US7193852 Control unit and method for producing the same
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