Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2007
03/28/2007CN1937180A Method of manufacturing silicon rich oxide (sro) and semiconductor device employing sro
03/28/2007CN1937179A Etching method of single wafer
03/28/2007CN1937178A Wet-type chemical washing method
03/28/2007CN1937177A Self-aligning metal silicide technology
03/28/2007CN1937176A Method of forming a low resistance semiconductor contact and structure therefor
03/28/2007CN1937175A Method for depositing material atomic layer for semiconductor device by using atmosphere
03/28/2007CN1937174A Capacitive devices, organic dielectric laminates, multilayer structures incorporating such devices, and methods of making thereof
03/28/2007CN1937173A Method of manufacturing semiconductor device
03/28/2007CN1937172A Method of forming on predetermined area of substrate with grown carbon nanotube, and method of forming semiconductor metal wire and inductor by using the same
03/28/2007CN1937171A Chip washing process and method for forming opening therefor
03/28/2007CN1937170A Channel capacitor and memory unit mfg. method
03/28/2007CN1937166A Faraday system and ion implanter used same
03/28/2007CN1937069A 半导体装置 Semiconductor device
03/28/2007CN1937068A 半导体装置 Semiconductor device
03/28/2007CN1937019A Transistor circuit, display panel and electronic apparatus
03/28/2007CN1936931A Package structure of radio-frequency identifying volume label jointed with microassembly
03/28/2007CN1936878A Individualized factory apparatus control system
03/28/2007CN1936711A Alignment system for photoetching device and stage jointing grating system
03/28/2007CN1936710A Alignment mark and its producing method
03/28/2007CN1936709A Lithographic method
03/28/2007CN1936705A Photoresist composition and method of manufacturing a thin-film transistor substrate using the same
03/28/2007CN1936701A CPL mask and a method and program product for generating the same
03/28/2007CN1936681A 液晶显示器件 Liquid crystal display device
03/28/2007CN1936660A Liquid crystal display device and method of fabricating the same
03/28/2007CN1936594A Probe card transfer assist apparatus, and inspection equipment and method using same
03/28/2007CN1936593A Simple-beam type microelectronic mechanical system detection card and producing method thereof
03/28/2007CN1936564A Gas sensor and its array
03/28/2007CN1936113A Low defect density, ideal oxygen precipitating silicon
03/28/2007CN1936112A 低缺陷浓度的硅 A low defect density silicon
03/28/2007CN1935939A Chip-removing solution for integrated circuit packaging after treatment
03/28/2007CN1935927A Cerium oxide abrasive and method of polishing substrates
03/28/2007CN1935480A Partition device and alignment method for wafer
03/28/2007CN1935461A Water-based polishing pads having improved adhesion properties and methods of manufacture
03/28/2007CN1935459A Cutting apparatus
03/28/2007CN1307797C Overvoltage protection circuit of output MOS transistor
03/28/2007CN1307796C Driving circuit for field effect transistor
03/28/2007CN1307727C Semiconductor device with SOI region and bulk region and method of manufacture thereof
03/28/2007CN1307726C Semiconductor with silicide film and method for producing semiconductor
03/28/2007CN1307724C Method of manufacturing semiconductor device using halo implantation, and system thereof
03/28/2007CN1307723C Low-voltage punch-through bi-directional transient-voltage suppression devices and methods of making same
03/28/2007CN1307722C Dynamic RAM with slit capacitor and its mfg. method
03/28/2007CN1307721C Semiconductor integrated circuit device and method for manufacturing the same
03/28/2007CN1307719C Semi-conductor equipment and its manufacture method
03/28/2007CN1307718C Semiconductor device and mfg. method thereof
03/28/2007CN1307714C Resin-sealed-type semiconductor device, and production process for producing such semiconductor device
03/28/2007CN1307713C Electronic assembly with filled no-flow underfill and methods of manufacture
03/28/2007CN1307711C Semiconductor integrated circuit and its manufacturing method
03/28/2007CN1307710C Method for producing flash memory storing unit
03/28/2007CN1307709C Semiconductor with Si-Ge grid and producing method thereof
03/28/2007CN1307708C Semiconductor device and method for fabricating capacitor of semiconductor device
03/28/2007CN1307707C Metal-isolation layer-semiconductor structure containing magnesiam-zinc-oxygen and preparing process
03/28/2007CN1307706C Port structure in semiconductor processing device
03/28/2007CN1307705C Thin film clamping device for keeping thin film planeness
03/28/2007CN1307704C Method for producing electronic part, electronic part, mounting method for electronic part and electronic device
03/28/2007CN1307703C Lead forming device of semiconductor element, lead forming system and method
03/28/2007CN1307702C Manufacturing method of electron device
03/28/2007CN1307701C Dual cured B-stageable underfill for wafer level
03/28/2007CN1307700C Semiconductor device, its manufacturing method, and radio communication device
03/28/2007CN1307699C Method for making crimping interconnection technology based power electronic integrated module
03/28/2007CN1307698C Device having resin package and method of producing the same
03/28/2007CN1307697C Thin film transistor and manufacturing method of thin film transistor
03/28/2007CN1307696C Method for preparing semiconductor device with super shallow and super steep backward surface groove
03/28/2007CN1307695C Method for making semiconductor device
03/28/2007CN1307694C Method for lowering resistance value of cobalt disilicide layer of semiconductor devices
03/28/2007CN1307693C Upper pipe treating apparatus applied for silicon oxide layer homogenization technology
03/28/2007CN1307692C Method for stabilizing material layer property
03/28/2007CN1307691C Method for making semiconductor
03/28/2007CN1307690C Method for making polysilicon layer
03/28/2007CN1307689C A method of forming differential spacers for individual optimization of N-channel and P-channel transistors
03/28/2007CN1307688C Xe preamorphizing implantation method
03/28/2007CN1307687C Method for catalytic synthetic growth InN nano point using In metal nano point
03/28/2007CN1307686C Batch treatment apparatus and wafer treatment method
03/28/2007CN1307685C Interlocked motion control method
03/28/2007CN1307684C Preparation method of composite dopped tin dioxide nano-crystal material
03/28/2007CN1307683C Small gap non-binding electrostatic sealing process for sensor
03/28/2007CN1307679C Apparatus and method for improving plasma distribution and performance in inductively coupled plasma
03/28/2007CN1307678C Method and appts. for controlling ion implantation during vacuum fluctuation
03/28/2007CN1307653C Current-carrying electronic component and method of manufacturing same
03/28/2007CN1307645C Ferroelectric memory device and its driving method
03/28/2007CN1307644C Film magnetic memory
03/28/2007CN1307643C Reading method for magnet resistance device with soft reference layer
03/28/2007CN1307485C System and method for improving line width control in use of photoetching apparatus
03/28/2007CN1307479C Capacitor arrangement
03/28/2007CN1307470C Device and method for manufacturing joint substrate
03/28/2007CN1307460C Homogenizer
03/28/2007CN1307456C Projection optical system, exposure apparatus, and device manufacturing method
03/28/2007CN1307442C Method of cutting workpiece of film filter
03/28/2007CN1307441C Optical elements, it metal mould and method for processing optical elements
03/28/2007CN1307425C Ageing trolley detecting monitoring improving apparatus
03/28/2007CN1307322C Metal organic chemical vapor deposition for ferroelectric film and annealing treatment
03/28/2007CN1307275C Tungsten polishing solution
03/28/2007CN1307233C Planarized microelectronic substrates
03/28/2007CN1307186C Silyl alkyl esters of anthracene- and phenanthrene carboxylic acids
03/28/2007CN1307082C Containers
03/28/2007CN1307009C Semiconductor wafer cleaning systems
03/28/2007CN1307000C Clean room system
03/27/2007US7197731 Virtual component having a detachable verification-supporting circuit, a method of verifying the same, and a method of manufacturing an integrated circuit
03/27/2007US7197728 Method for setting design margin for LSI
03/27/2007US7197726 Test structures for estimating dishing and erosion effects in copper damascene technology
03/27/2007US7197725 Semiconductor integrated circuit and testing method for the same
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