| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/07/2006 | EP1666898A1 Testing apparatus |
| 06/07/2006 | EP1666897A1 Power source device, test device, and power source voltage stabilizing device |
| 06/07/2006 | EP1666896A1 Test apparatus |
| 06/07/2006 | EP1666895A1 Temperature control device and temperature control method |
| 06/07/2006 | EP1666858A1 Pressure-sensitive sensor |
| 06/07/2006 | EP1665489A1 Method and circuit arrangement for the detection of ground faults on electronic trips for low-voltage circuit breakers comprising serially connected measuring amplifiers |
| 06/07/2006 | EP1665487A1 Method for controlling an electronic overcurrent trip for low-voltage circuit breakers |
| 06/07/2006 | EP1665362A2 Technique for evaluating a fabrication of a semiconductor component and wafer |
| 06/07/2006 | EP1665285A2 Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance |
| 06/07/2006 | EP1665050A2 Circuit arrangement for monitoring a processor |
| 06/07/2006 | EP1665049A2 A system and method for testing and configuring semiconductor functional circuits |
| 06/07/2006 | EP1664814A1 Method and device for determining the charge of a battery |
| 06/07/2006 | EP1664813A1 Method and circuit arrangement for determining a charge used during a specific period of time in mobile devices |
| 06/07/2006 | EP1664812A1 Integrated circuit with signature computation |
| 06/07/2006 | EP1664811A1 Electronic switching circuit, switching circuit test arrangement and method for determining the operativeness of an electronic switching circuit |
| 06/07/2006 | EP1664810A1 Method and device for detecting defects of electromagnetic protection for electric harnesses |
| 06/07/2006 | EP1664809A1 Threshold adjustment accuracy for ground fault condition determination |
| 06/07/2006 | EP1664808A2 Integrated circuit with test pad structure and method of testing |
| 06/07/2006 | EP1663721A1 Detection of short circuits in a vehicle |
| 06/07/2006 | EP1611536A4 Field transmitter with diagnostic self-test mode |
| 06/07/2006 | EP1549963B1 Diagnosis method for an antenna connection |
| 06/07/2006 | EP1466184A4 Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit |
| 06/07/2006 | EP1432546A4 Optical testing device |
| 06/07/2006 | EP1374250B1 Memory cell structural test |
| 06/07/2006 | EP1309842B8 Water monitoring system and water monitoring method for high voltage cables |
| 06/07/2006 | EP1065502B1 Method for analyzing the breakdown characteristics of a gaseous dielectric in a highly non-uniform field |
| 06/07/2006 | EP0990167B1 Battery measuring terminal |
| 06/07/2006 | EP0868687B1 Timing signal generator |
| 06/07/2006 | CN2786865Y Combination wave generator |
| 06/07/2006 | CN2786783Y Synchronize adjustable constant-current source piece type refining clamp |
| 06/07/2006 | CN2786639Y Accumulator safety valve pressure detecting equipment |
| 06/07/2006 | CN2786638Y Cable tester |
| 06/07/2006 | CN1784777A Method and apparatus for monitoring a semiconductor wafer during a spin drying operation |
| 06/07/2006 | CN1784609A Method and structure to develop a test program for semiconductor integrated circuits |
| 06/07/2006 | CN1784608A Test device |
| 06/07/2006 | CN1784586A Method and arrangement for estimation of line properties |
| 06/07/2006 | CN1783640A Integrity testing of isolation means in an uninterruptible power supply |
| 06/07/2006 | CN1783629A Distributed type battery managing system and managing method |
| 06/07/2006 | CN1783204A Display panel |
| 06/07/2006 | CN1783055A Automatic designing method for ICT test conversion PCB |
| 06/07/2006 | CN1782729A Apparatus and method for monitoring battery pack |
| 06/07/2006 | CN1782728A Battery power detection device |
| 06/07/2006 | CN1782727A Detecting method for short-circuit point of secondary cell |
| 06/07/2006 | CN1782726A Offset compensation circuit for a monitoring photodiode |
| 06/07/2006 | CN1782725A Light emitting device and method for detecting part of detecting flat panel display detection unit |
| 06/07/2006 | CN1782724A Synthetic insulator on-line detector based on pulse current method |
| 06/07/2006 | CN1782723A Method for detecting chip pin |
| 06/07/2006 | CN1782716A Probe card, testing method using it and semiconductor device tested by the same |
| 06/07/2006 | CN1782715A Detector capable of preventing overpressure |
| 06/07/2006 | CN1782660A Light source for plane display screen detector |
| 06/07/2006 | CN1258956C Gauging point setting method for high-frequency differential signal |
| 06/07/2006 | CN1258842C Electronic interconnecting device for high-speed signal and data transmission |
| 06/07/2006 | CN1258769C Semiconductor storage device reading data according to current passing through storage unit while accessing |
| 06/07/2006 | CN1258682C Single-bit network for detecting multiple sockets |
| 06/07/2006 | CA2529205A1 Testing apparatus and method for vehicle starting and charging system |
| 06/06/2006 | US7058918 Reconfigurable fabric for SoCs using functional I/O leads |
| 06/06/2006 | US7058909 Method of generating an efficient stuck-at fault and transition delay fault truncated scan test pattern for an integrated circuit design |
| 06/06/2006 | US7058872 Method and apparatus for generating jitter test patterns on a high performance serial bus |
| 06/06/2006 | US7058871 Circuit with expected data memory coupled to serial input lead |
| 06/06/2006 | US7058870 Method and apparatus for isolating faulty semiconductor devices in a multiple stream graphics system |
| 06/06/2006 | US7058869 Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits |
| 06/06/2006 | US7058868 Scan testing mode control of gated clock signals for memory devices |
| 06/06/2006 | US7058867 Logic circuit and methods for designing and testing the same |
| 06/06/2006 | US7058866 Method and system for an on-chip AC self-test controller |
| 06/06/2006 | US7058865 Apparatus for testing semiconductor integrated circuit |
| 06/06/2006 | US7058862 Selecting different 1149.1 TAP domains from update-IR state |
| 06/06/2006 | US7058855 Emulation interface system |
| 06/06/2006 | US7058844 System and method for rapid fault isolation in a storage area network |
| 06/06/2006 | US7058557 Method for functional verification of hardware design |
| 06/06/2006 | US7058535 Test system for integrated circuits with serdes ports |
| 06/06/2006 | US7058534 Method and apparatus for application specific test of PLDs |
| 06/06/2006 | US7058526 Method, apparatus and computer program product for implementing enhanced power system with optimized fuse placement and sizing |
| 06/06/2006 | US7058525 Battery test module |
| 06/06/2006 | US7058451 Method and apparatus for determining depleted capacity of a battery |
| 06/06/2006 | US7058020 Hardware time stamping and registration of packetized data method and system |
| 06/06/2006 | US7058019 Method of transmitting data between compact control stations using ethernet |
| 06/06/2006 | US7058016 Method and system for accelerating route calculation in link state routing protocols |
| 06/06/2006 | US7058014 Method and apparatus for generating a large payload file |
| 06/06/2006 | US7058007 Method for a cable modem to rapidly switch to a backup CMTS |
| 06/06/2006 | US7057967 Multi-mode synchronous memory device and methods of operating and testing same |
| 06/06/2006 | US7057948 Semiconductor integrated circuit device having a test function |
| 06/06/2006 | US7057946 Semiconductor integrated circuit having latching means capable of scanning |
| 06/06/2006 | US7057910 Semiconductor device and control method |
| 06/06/2006 | US7057792 Optical sensor unit for measuring current and voltage of high frequency |
| 06/06/2006 | US7057411 Semiconductor integrated circuit including test pins and method for testing thereof |
| 06/06/2006 | US7057410 Interface structure for semiconductor integrated circuit test equipment |
| 06/06/2006 | US7057409 Method and apparatus for non-invasively testing integrated circuits |
| 06/06/2006 | US7057408 Method and prober for contacting a contact area with a contact tip |
| 06/06/2006 | US7057407 Probe holder for testing of a test device |
| 06/06/2006 | US7057406 Integrated type probe card and its fabrication method |
| 06/06/2006 | US7057405 Wafer test method utilizing conductive interposer |
| 06/06/2006 | US7057404 Shielded probe for testing a device under test |
| 06/06/2006 | US7057403 Microcontactor probe having a contact needle |
| 06/06/2006 | US7057401 Electrical wiring inspection system |
| 06/06/2006 | US7057396 Disconnection detecting circuit for sensor apparatus |
| 06/06/2006 | US7057395 Method for diagnosing open defects on non-contacted nodes of an electronic device from measurements of capacitively coupled nodes |
| 06/06/2006 | US7057394 Chassis electrical system tester |
| 06/06/2006 | US7057365 Prober and testing apparatus using same |
| 06/06/2006 | US7057363 Circuit for fan motor |
| 06/06/2006 | US7057182 Method and system for determining distortion in a circuit image |