Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2006
06/13/2006US7061222 Automated testing of frequency converter device
06/13/2006US7060679 having a building unit containing one nitrogen atom of the peptide backbone connected to a bridging group comprising an amide, thioether, thioester, or disulfide; used to treat cancers, diabetes, diabetic-associated complications, endocrine disorders, gastrointestinal disorders, and pancreatitis
06/13/2006US7060514 Process for fabricating films of uniform properties on semiconductor devices
06/13/2006US7060513 Method of testing FPC bonding yield and FPC having testing pads thereon
06/13/2006US7060512 Patching methods and apparatus for fabricating memory modules
06/13/2006US7060511 Evaluation method of a field effect transistor
06/13/2006US7059866 integrated circuit contact to test apparatus
06/13/2006US7059769 Apparatus for enabling multiple modes of operation among a plurality of devices
06/13/2006US7059046 Method for producing a captive wired test fixture and fixture therefor
06/08/2006WO2006060467A2 Probe card with segmented substrate
06/08/2006WO2006060080A1 Signal generator with display
06/08/2006WO2006059614A1 Da converter test method, da converter test device, and da converter
06/08/2006WO2006059585A1 Testing apparatus and electric source circuit
06/08/2006WO2006059553A1 Electronic component handling device and defective component determination method
06/08/2006WO2006059548A1 Test equipment
06/08/2006WO2006059360A1 Electronic component handling apparatus
06/08/2006WO2006059259A1 Wireless probe system
06/08/2006WO2006058970A1 Method for assessing the state of charge of an electric battery
06/08/2006WO2006058394A1 System and method for measuring fuel cell voltage
06/08/2006WO2006044905A3 It equipment simulation
06/08/2006WO2006041807A3 Contact for electronic devices
06/08/2006WO2005098461A3 Estimator for end-to-end throughput of wireless networks
06/08/2006WO2005091962A3 Dual channel source measurement unit for semiconductor device testing
06/08/2006WO2005050765A3 Dynamic fuel cell system management controller
06/08/2006US20060123375 Integrated circuit capable of locating failure process layers
06/08/2006US20060123306 Two pin serial bus communication interface and process
06/08/2006US20060123305 Method and apparatus for an embedded time domain reflectometry test
06/08/2006US20060123304 Enhanced loopback testing of serial devices
06/08/2006US20060123303 Integrating time measurement circuit for a channel of a test card
06/08/2006US20060123302 Remote diagnosis device, remote diagnosis system and program product
06/08/2006US20060123301 Transconductance stage operating as an active load for pin electronics
06/08/2006US20060123300 Acyclic modeling of combinational loops
06/08/2006US20060123299 Semiconductor integrated circuit and a method of testing the same
06/08/2006US20060123298 PCI Express Physical Layer Built-In Self Test Architecture
06/08/2006US20060123297 Automatic test system with synchronized instruments
06/08/2006US20060123296 Instrument with interface for synchronization in automatic test equipment
06/08/2006US20060123295 Register file and its storage device
06/08/2006US20060123294 Method and test apparatus for testing integrated circuits using both valid and invalid test data
06/08/2006US20060123293 Organic light emitting display
06/08/2006US20060123292 Method and apparatus for multiplexing an integrated circuit pin
06/08/2006US20060123291 Parallel compression test circuit of memory device
06/08/2006US20060123290 Serial data preservation method
06/08/2006US20060123289 Method and apparatus for testing a transmission path
06/08/2006US20060123288 Generation of test vectors for testing electronic circuits taking into account of defect probability
06/08/2006US20060123287 Curve tracing device and method
06/08/2006US20060123278 Method and apparatus for generating diagnoses of network problems
06/08/2006US20060123275 Apparatus and method for adapting a level sensitive device to produce edge-triggered behavior
06/08/2006US20060123272 Scoring mechanism for automatically generated test programs
06/08/2006US20060122803 Dynamically adaptable semiconductor parametric testing
06/08/2006US20060122796 Method and apparatus for determining faults in an electric assist steering system
06/08/2006US20060122290 Multifunctional polymeric tissue coatings
06/08/2006US20060121752 Socket and test apparatus
06/08/2006US20060120294 Method and system for providing time offset to minislot clock and count in headend devices
06/08/2006US20060120292 Method and apparatus for adaptive monitoring and management of distributed systems
06/08/2006US20060120154 Structure for testing nand flash memory and method of testing nand flash memory
06/08/2006US20060120135 Semiconductor memory device
06/08/2006US20060120049 Temperature control system which sprays liquid coolant droplets against an IC-module at a sub-atmospheric pressure
06/08/2006US20060119377 Massively parallel interface for electronic circuit
06/08/2006US20060119376 Method of shaping lithographically-produced probe elements
06/08/2006US20060119375 Apparatus and method for testing semiconductor chip
06/08/2006US20060119374 Contactor having conductive particles in a hole as a contact electrode
06/08/2006US20060119373 Scanning probe inspection apparatus
06/08/2006US20060119368 System, apparatus and method for detection of electrical faults
06/08/2006US20060119367 Apparatus for Inspecting the front side and backside of a disk-shaped object
06/08/2006US20060119347 Conveyor device, electronic device handling apparatus and conveying method in electronic device handling apparatus
06/08/2006US20060119346 Testing circuits on substrates
06/08/2006US20060119345 Transfer device of handler for testing semiconductor device
06/08/2006US20060119342 Device for measuring electric current intensity
06/08/2006DE202006005361U1 Device for charging/discharging electrical energy storage device has optical signaling device for storage device operating state parameter(s), further optical signaling device for operating state parameter(s) as external signaling indicator
06/08/2006DE202006005360U1 Device for charging and discharging of an electrical energy storage e.g. accumulator has signaling device which is formed cylindrically and arranged at the upper side of housing
06/08/2006DE202006005358U1 Device for charging and/or discharging of electric energy accumulator has operating unit and/or indicating unit rotatably and/or displaceably installed in housing
06/08/2006DE19922786B4 Halbleiterspeicher mit Testeinrichtung A semiconductor memory device with test
06/08/2006DE10237283B4 Vorrichtung und Verfahren zum Reinigen von Sondennadeln einer Testsondenvorrichtung Apparatus and method for cleaning probe needles of a test probe device
06/08/2006DE10217535B4 Sensorvorrichtung und Verfahren zur Bestimmung der Schichtdicke einer dünnen Schicht sowie Verwendung eines induktiven Näherungssensors Sensor apparatus and method for determining the thickness of a thin layer and use an inductive proximity sensor
06/08/2006DE102005057091A1 Vorrichtung und Verfahren zur Spannungsmessung Apparatus and method for voltage measurement
06/08/2006DE102005055229A1 Hard wired electronic digital circuit e.g. field programmable gate array, for motor vehicle`s brushless motor, has embedded system with register, where data from register and/or I/O access is logged by measuring circuit by using interface
06/08/2006DE102005052986A1 Wieder verwendbarer elektrischer Anschlusskasten für Kraftfahrzeuge Reusable electrical connection box for motor vehicles
06/08/2006DE102005051317A1 Verfahren zum Kontrollieren der Leistung einer wiederaufladbaren Batterie und ein Stromversorgungsgerät A method for controlling the performance of a rechargeable battery and a power supply
06/08/2006DE102005036978A1 Überführungsvorrichtung eines Handlers zum Testen einer Halbleitervorrichtung Transferring device of a handler for testing a semiconductor device
06/08/2006DE102005025216A1 Testing method for dual in-line memory module, involves comparing data stored in address of memory, with expected data provided to hub of memory module
06/08/2006DE102004059694B3 Method for testing of antenna assembly of motor vehicle, involves test antenna assembly for sending test signals with signal generator along with switching mechanism provided to connect signal generator and test antennae
06/08/2006DE102004057819A1 Input circuit for an integrated circuit esp. a circuit operating in burn in mode to preage the circuit so that it can operate normally after the burn in process
06/08/2006DE102004057215A1 Verfahren und Vorrichtung zum Testen von Halbleiterwafern mittels einer Sondenkarte Method and apparatus for testing semiconductor wafers by means of a probe card
06/08/2006DE102004055847A1 Method for manufacture of battery sensor device involves mounting device connected to the carrier element and measuring shunt along with carrier element is connected to cable braids of ground connection cable
06/08/2006DE10152427B4 Vorrichtung und Verfahren zum Erfassen von Anomalie in einer Positionserfassungsvorrichtung Apparatus and method for detecting abnormality in a position sensing device
06/08/2006DE10034851B4 Schaltungsanordnung zur Erzeugung von Steuersignalen zum Test hochfrequenter synchroner Digitalschaltungen Circuit arrangement for generating control signals for testing digital circuits of high-frequency synchronous
06/08/2006DE10034850B4 System zum Test integrierter digitaler Halbleiterbauelemente A system for testing integrated digital semiconductor devices
06/08/2006DE10001384B4 Verfahren zur Frequenzkalibrierung einer Testeinrichtung, Testeinrichtung sowie Verwendung einer Funkeinrichtung zur Frequenzkalibrierung Method for frequency calibration of test equipment, test equipment, and using a radio frequency device for calibration
06/08/2006CA2591971A1 System and method for measuring fuel cell voltage
06/07/2006EP1667441A1 Intermediate frequency circuit for television tuner
06/07/2006EP1667389A1 Testing method, communication device and testing system
06/07/2006EP1667308A2 Operation method for secondary battery and secondary battery device
06/07/2006EP1667222A1 Object-to-be-treated carrying system and object-to-be-treated carrying method
06/07/2006EP1666905A2 Electric tightening device
06/07/2006EP1666904A1 Test apparatus and test module
06/07/2006EP1666903A1 Test apparatus
06/07/2006EP1666902A1 Test apparatus and write control circuit
06/07/2006EP1666901A1 Test apparatus and test method
06/07/2006EP1666900A1 Semiconductor test system
06/07/2006EP1666899A1 Semiconductor test device