Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2006
11/15/2006EP1721174A2 Dual channel source measurement unit for semiconductor device testing
11/15/2006EP1425593B1 Built-in self-testing of multilevel signal interfaces
11/15/2006EP1285281B1 Test probe and connector
11/15/2006EP1109629B1 Electronic component handler
11/15/2006EP0919822B1 System for verifying signal voltage level accuracy on a digital testing device
11/15/2006EP0826152B1 Method and apparatus for testing semiconductor dice
11/15/2006CN2838131Y Electric equipment state monitoring system based on grouped measurement through field bus
11/15/2006CN2837946Y RF tester
11/15/2006CN2837878Y LCD panel detector
11/15/2006CN2837860Y Aging clamp for minisize motor aging machine
11/15/2006CN2837859Y Interface circuit employing low-voltage logic tester to test high-voltage IC
11/15/2006CN2837858Y Detection circuit for electric DC system positive and negative bus simultaneous earthing
11/15/2006CN2837857Y Transformer winding tester
11/15/2006CN2837856Y Online fault pre-diagnosis apparatus for electric equipment
11/15/2006CN2837855Y Clamp capable of simultaneously testing multiple LCMs
11/15/2006CN2837818Y Drawer type oven for lifetime testing
11/15/2006CN1864183A Process device with quiescent current diagnostics
11/15/2006CN1864072A Calculation device calculating available capacity of secondary battery and method of calculating the same
11/15/2006CN1864071A Process device with quiescent current diagnostics
11/15/2006CN1864070A Circuit board inspection device
11/15/2006CN1864069A 测试头定位系统 Test head positioning system
11/15/2006CN1863440A Method and system for inspecting substrate for mounting components and method of producing substrate for mounting components
11/15/2006CN1862874A Detaching-proof antenna
11/15/2006CN1862735A Method for detecting key section sensing strong or weak
11/15/2006CN1862733A Apparatus lid opening detecting device and detecting method
11/15/2006CN1862648A Pixel structure, overhauling method and mfg. method thereof
11/15/2006CN1862642A Light emitting display panel and method for inspecting the light emitting display panel
11/15/2006CN1862597A Method of registering and aligning multiple images
11/15/2006CN1862437A Voltage regulator with multiple feedback
11/15/2006CN1862281A Battery management system and apparatus with runtime analysis reporting
11/15/2006CN1862280A Battery management system with predictive failure analysis
11/15/2006CN1862279A Method for estimating aging rate and testing fault of battery and apparatus for managing and monitoring battery
11/15/2006CN1862278A Method and system for predicting remaining life for motors featuring on-line insulation condition monitor
11/15/2006CN1862277A Admittance criterion protection method of field loss of salient pole generator
11/15/2006CN1862276A Impulse current generator
11/15/2006CN1862275A Led turn signal and error detecting method
11/15/2006CN1862274A Multi-scanning chain LSI circuit test data compressing method
11/15/2006CN1862273A System for testing clock signal dither and method thereof
11/15/2006CN1862272A Detecting wavelength adjustable terahertz photoelectric detector
11/15/2006CN1862271A Method for detecting ground wire of power transmission and distribution system
11/15/2006CN1862270A Signal identification method and apparatus for analogue electrical systems
11/15/2006CN1862269A Crimping uniformity checking measure for high voltage IGCT inverse circuit and independent testing method thereof
11/15/2006CN1862268A Power frequency magnetic field generator
11/15/2006CN1862267A Method for checking circuit schematic diagram
11/15/2006CN1862266A Method for testing product fault-tolerant performance and fault inserting device thereof
11/15/2006CN1862265A Apparatus and method for detecting linear index of power amplifier
11/15/2006CN1285111C Integrated circuit chip and wafer and its producing and detecting method
11/15/2006CN1285110C After-package test parametric analysis method
11/14/2006US7137083 Verification of integrated circuit tests using test simulation and integrated circuit simulation with simulated failure
11/14/2006US7137061 Method and device for signaling a transmission fault on a data line
11/14/2006US7137055 Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory
11/14/2006US7137054 System and apparatus for scanning integrated circuits with numerically controlled delay lines
11/14/2006US7137053 Bandwidth matching for scan architectures in an integrated circuit
11/14/2006US7137052 Methods and apparatus for minimizing current surges during integrated circuit testing
11/14/2006US7137051 Testing a multibank memory module
11/14/2006US7137050 Compression circuit for testing a memory device
11/14/2006US7137048 Method and apparatus for evaluating and optimizing a signaling system
11/14/2006US7137046 High speed comparator for 10G SERDES
11/14/2006US7137022 Timing adjustment circuit and semiconductor device including the same
11/14/2006US7136780 Abnormality diagnosis apparatus for automatic activation timer circuit
11/14/2006US7136773 Testing apparatus and testing method
11/14/2006US7136771 Semiconductor device and testing circuit which can carries out a verifying test effectively for non-volatile memory cells
11/14/2006US7136770 Using component-level calibration data to reduce system-level test
11/14/2006US7136762 System for calculating remaining capacity of energy storage device
11/14/2006US7136714 Procedure for determining modifications made to an electronic card and methods of fabricating an electronic card and an item equipment provided with an electronic card
11/14/2006US7136356 Packet data transfer method and packet data transfer apparatus
11/14/2006US7136351 Switched ethernet networks
11/14/2006US7136315 Bank selectable parallel test circuit and parallel test method thereof
11/14/2006US7136266 Leakage current detection interrupter extension cord with cord diagnostics
11/14/2006US7136163 Differential evaluation of adjacent regions for change in reflectivity
11/14/2006US7135885 Dynamically adjustable signal detector
11/14/2006US7135883 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object
11/14/2006US7135882 Semiconductor integrated circuit device and control method for the semiconductor integrated circuit device
11/14/2006US7135881 Method and system for producing signals to test semiconductor devices
11/14/2006US7135880 Test apparatus
11/14/2006US7135879 Test structure and method for failure analysis of small contacts in integrated circuit technology development
11/14/2006US7135878 Burn-in apparatus for burning MAC address
11/14/2006US7135877 Temperature and condensation control system for functional tester
11/14/2006US7135876 Electrical feedback detection system for multi-point probes
11/14/2006US7135875 Apparatus and method for contacting of test objects
11/14/2006US7135873 Digital time domain reflectometer system
11/14/2006US7135867 Method and apparatus for verifying connectivity of an instrumentation system
11/14/2006US7135854 Rear-mounted gimbal for supporting test head
11/14/2006US7135853 Semiconductor test system
11/14/2006US7135852 Integrated process condition sensing wafer and data analysis system
11/14/2006US7135723 Integrated circuit with a test circuit
11/14/2006US7135703 Test tray with carrier modules for a semiconductor device handler
11/14/2006US7134909 Connector circuit board
11/14/2006CA2340633C Memory supervision
11/13/2006CA2507536A1 Accelerated stress testing of pixel circuits for amoled displays
11/12/2006CA2545695A1 Method and system for predicting remaining life for motors featuring on-line insulation condition monitor
11/11/2006CA2545206A1 System and method for dealing with ground fault conditions that can arise in an electrical propulsion system
11/09/2006WO2006119405A1 Probe card assembly with a dielectric structure
11/09/2006WO2006118758A1 Site-aware objects
11/09/2006WO2006118244A1 Fet characteristic measuring system
11/09/2006WO2006118220A1 Conductive contact holder and conductive contact unit
11/09/2006WO2006118012A1 Testing apparatus
11/09/2006WO2006117989A1 Conduction tester for wire harness
11/09/2006WO2006117988A1 Conduction tester for wire harness
11/09/2006WO2006117779A2 Augmenting semiconductor's devices quality and reliability