Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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11/15/2006 | EP1721174A2 Dual channel source measurement unit for semiconductor device testing |
11/15/2006 | EP1425593B1 Built-in self-testing of multilevel signal interfaces |
11/15/2006 | EP1285281B1 Test probe and connector |
11/15/2006 | EP1109629B1 Electronic component handler |
11/15/2006 | EP0919822B1 System for verifying signal voltage level accuracy on a digital testing device |
11/15/2006 | EP0826152B1 Method and apparatus for testing semiconductor dice |
11/15/2006 | CN2838131Y Electric equipment state monitoring system based on grouped measurement through field bus |
11/15/2006 | CN2837946Y RF tester |
11/15/2006 | CN2837878Y LCD panel detector |
11/15/2006 | CN2837860Y Aging clamp for minisize motor aging machine |
11/15/2006 | CN2837859Y Interface circuit employing low-voltage logic tester to test high-voltage IC |
11/15/2006 | CN2837858Y Detection circuit for electric DC system positive and negative bus simultaneous earthing |
11/15/2006 | CN2837857Y Transformer winding tester |
11/15/2006 | CN2837856Y Online fault pre-diagnosis apparatus for electric equipment |
11/15/2006 | CN2837855Y Clamp capable of simultaneously testing multiple LCMs |
11/15/2006 | CN2837818Y Drawer type oven for lifetime testing |
11/15/2006 | CN1864183A Process device with quiescent current diagnostics |
11/15/2006 | CN1864072A Calculation device calculating available capacity of secondary battery and method of calculating the same |
11/15/2006 | CN1864071A Process device with quiescent current diagnostics |
11/15/2006 | CN1864070A Circuit board inspection device |
11/15/2006 | CN1864069A 测试头定位系统 Test head positioning system |
11/15/2006 | CN1863440A Method and system for inspecting substrate for mounting components and method of producing substrate for mounting components |
11/15/2006 | CN1862874A Detaching-proof antenna |
11/15/2006 | CN1862735A Method for detecting key section sensing strong or weak |
11/15/2006 | CN1862733A Apparatus lid opening detecting device and detecting method |
11/15/2006 | CN1862648A Pixel structure, overhauling method and mfg. method thereof |
11/15/2006 | CN1862642A Light emitting display panel and method for inspecting the light emitting display panel |
11/15/2006 | CN1862597A Method of registering and aligning multiple images |
11/15/2006 | CN1862437A Voltage regulator with multiple feedback |
11/15/2006 | CN1862281A Battery management system and apparatus with runtime analysis reporting |
11/15/2006 | CN1862280A Battery management system with predictive failure analysis |
11/15/2006 | CN1862279A Method for estimating aging rate and testing fault of battery and apparatus for managing and monitoring battery |
11/15/2006 | CN1862278A Method and system for predicting remaining life for motors featuring on-line insulation condition monitor |
11/15/2006 | CN1862277A Admittance criterion protection method of field loss of salient pole generator |
11/15/2006 | CN1862276A Impulse current generator |
11/15/2006 | CN1862275A Led turn signal and error detecting method |
11/15/2006 | CN1862274A Multi-scanning chain LSI circuit test data compressing method |
11/15/2006 | CN1862273A System for testing clock signal dither and method thereof |
11/15/2006 | CN1862272A Detecting wavelength adjustable terahertz photoelectric detector |
11/15/2006 | CN1862271A Method for detecting ground wire of power transmission and distribution system |
11/15/2006 | CN1862270A Signal identification method and apparatus for analogue electrical systems |
11/15/2006 | CN1862269A Crimping uniformity checking measure for high voltage IGCT inverse circuit and independent testing method thereof |
11/15/2006 | CN1862268A Power frequency magnetic field generator |
11/15/2006 | CN1862267A Method for checking circuit schematic diagram |
11/15/2006 | CN1862266A Method for testing product fault-tolerant performance and fault inserting device thereof |
11/15/2006 | CN1862265A Apparatus and method for detecting linear index of power amplifier |
11/15/2006 | CN1285111C Integrated circuit chip and wafer and its producing and detecting method |
11/15/2006 | CN1285110C After-package test parametric analysis method |
11/14/2006 | US7137083 Verification of integrated circuit tests using test simulation and integrated circuit simulation with simulated failure |
11/14/2006 | US7137061 Method and device for signaling a transmission fault on a data line |
11/14/2006 | US7137055 Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory |
11/14/2006 | US7137054 System and apparatus for scanning integrated circuits with numerically controlled delay lines |
11/14/2006 | US7137053 Bandwidth matching for scan architectures in an integrated circuit |
11/14/2006 | US7137052 Methods and apparatus for minimizing current surges during integrated circuit testing |
11/14/2006 | US7137051 Testing a multibank memory module |
11/14/2006 | US7137050 Compression circuit for testing a memory device |
11/14/2006 | US7137048 Method and apparatus for evaluating and optimizing a signaling system |
11/14/2006 | US7137046 High speed comparator for 10G SERDES |
11/14/2006 | US7137022 Timing adjustment circuit and semiconductor device including the same |
11/14/2006 | US7136780 Abnormality diagnosis apparatus for automatic activation timer circuit |
11/14/2006 | US7136773 Testing apparatus and testing method |
11/14/2006 | US7136771 Semiconductor device and testing circuit which can carries out a verifying test effectively for non-volatile memory cells |
11/14/2006 | US7136770 Using component-level calibration data to reduce system-level test |
11/14/2006 | US7136762 System for calculating remaining capacity of energy storage device |
11/14/2006 | US7136714 Procedure for determining modifications made to an electronic card and methods of fabricating an electronic card and an item equipment provided with an electronic card |
11/14/2006 | US7136356 Packet data transfer method and packet data transfer apparatus |
11/14/2006 | US7136351 Switched ethernet networks |
11/14/2006 | US7136315 Bank selectable parallel test circuit and parallel test method thereof |
11/14/2006 | US7136266 Leakage current detection interrupter extension cord with cord diagnostics |
11/14/2006 | US7136163 Differential evaluation of adjacent regions for change in reflectivity |
11/14/2006 | US7135885 Dynamically adjustable signal detector |
11/14/2006 | US7135883 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object |
11/14/2006 | US7135882 Semiconductor integrated circuit device and control method for the semiconductor integrated circuit device |
11/14/2006 | US7135881 Method and system for producing signals to test semiconductor devices |
11/14/2006 | US7135880 Test apparatus |
11/14/2006 | US7135879 Test structure and method for failure analysis of small contacts in integrated circuit technology development |
11/14/2006 | US7135878 Burn-in apparatus for burning MAC address |
11/14/2006 | US7135877 Temperature and condensation control system for functional tester |
11/14/2006 | US7135876 Electrical feedback detection system for multi-point probes |
11/14/2006 | US7135875 Apparatus and method for contacting of test objects |
11/14/2006 | US7135873 Digital time domain reflectometer system |
11/14/2006 | US7135867 Method and apparatus for verifying connectivity of an instrumentation system |
11/14/2006 | US7135854 Rear-mounted gimbal for supporting test head |
11/14/2006 | US7135853 Semiconductor test system |
11/14/2006 | US7135852 Integrated process condition sensing wafer and data analysis system |
11/14/2006 | US7135723 Integrated circuit with a test circuit |
11/14/2006 | US7135703 Test tray with carrier modules for a semiconductor device handler |
11/14/2006 | US7134909 Connector circuit board |
11/14/2006 | CA2340633C Memory supervision |
11/13/2006 | CA2507536A1 Accelerated stress testing of pixel circuits for amoled displays |
11/12/2006 | CA2545695A1 Method and system for predicting remaining life for motors featuring on-line insulation condition monitor |
11/11/2006 | CA2545206A1 System and method for dealing with ground fault conditions that can arise in an electrical propulsion system |
11/09/2006 | WO2006119405A1 Probe card assembly with a dielectric structure |
11/09/2006 | WO2006118758A1 Site-aware objects |
11/09/2006 | WO2006118244A1 Fet characteristic measuring system |
11/09/2006 | WO2006118220A1 Conductive contact holder and conductive contact unit |
11/09/2006 | WO2006118012A1 Testing apparatus |
11/09/2006 | WO2006117989A1 Conduction tester for wire harness |
11/09/2006 | WO2006117988A1 Conduction tester for wire harness |
11/09/2006 | WO2006117779A2 Augmenting semiconductor's devices quality and reliability |