Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2006
11/21/2006US7139847 Semiconductor memory device having externally controllable data input and output mode
11/21/2006US7139676 Revising a test suite using diagnostic efficacy evaluation
11/21/2006US7139672 Dynamically adaptable semiconductor parametric testing
11/21/2006US7139671 Semiconductor device fabrication method
11/21/2006US7139668 Wire event detection
11/21/2006US7139630 Allocating manufactured devices according to customer specifications
11/21/2006US7139246 Method and apparatus for adjusting a mobile communication inactivity timer
11/21/2006US7139244 System and method for remotely inventorying multiplexing element switching fabric
11/21/2006US7139243 Data transmission method, data transmission system, transmitter and receiver
11/21/2006US7139239 Self-healing control network for building automation systems
11/21/2006US7138878 Semiconductor integrated circuit
11/21/2006US7138820 System monitor in a programmable logic device
11/21/2006US7138819 Differential voltage measuring apparatus and semiconductor testing apparatus
11/21/2006US7138818 Massively parallel interface for electronic circuit
11/21/2006US7138817 Method and apparatus for testing defective portion of semiconductor device
11/21/2006US7138816 On-die monitoring device power grid
11/21/2006US7138815 Power distribution system built-in self test using on-chip data converter
11/21/2006US7138814 Integrated circuit with controllable test access to internal analog signal pads of an area array
11/21/2006US7138813 Probe station thermal chuck with shielding for capacitive current
11/21/2006US7138812 Probe card
11/21/2006US7138811 Seals used for testing on an integrated circuit tester
11/21/2006US7138810 Probe station with low noise characteristics
11/21/2006US7138805 Device and method for inspection
11/21/2006US7138804 Automatic transmission line pulse system
11/21/2006US7138792 Programmable power personality card
11/21/2006US7138653 Structures for stabilizing semiconductor devices relative to test substrates and methods for fabricating the stabilizers
11/21/2006US7138284 Method and apparatus for performing whole wafer burn-in
11/21/2006US7138283 Method for analyzing fail bit maps of wafers
11/21/2006US7137557 Semiconductor device and an information management system therefore
11/21/2006CA2184770C Method and apparatus for correcting drift in the response of analog receiver components in induction well logging instruments
11/20/2006CA2508428A1 Detection, locating and interpretation of partial discharge
11/16/2006WO2006122096A2 Method and structures for measuring gate tunneling leakage parameters of field effect transistors
11/16/2006WO2006122008A1 Rfid communication systems and methods
11/16/2006WO2006121882A2 Parallel input/output self-test circuit and method
11/16/2006WO2006121790A1 Method and power feed for electrical inspections
11/16/2006WO2006121707A1 Method of determining transit costs across autonomous systems
11/16/2006WO2006121694A2 Electronic overload relay for mains-fed induction motors
11/16/2006WO2006121496A1 Method and apparatus for generalized arc fault detection
11/16/2006WO2006120951A1 Test device
11/16/2006WO2006120861A1 Tft array substrate inspecting apparatus
11/16/2006WO2006120853A1 Test apparatus, test method and semiconductor device
11/16/2006WO2006120852A1 Testing device, diagnostic program, and diagnostic method
11/16/2006WO2006120315A1 Integrated circuit comprising a secure test mode using integrated circuit configurable cell chain status detection
11/16/2006WO2006120112A2 Method for determining the condition of a long body
11/16/2006WO2006119634A1 Current sensor
11/16/2006WO2005124652A3 Localizing a temperature of a device for testing
11/16/2006WO2005109020A3 System and method for characterizing a signal path using a sub-chip sampler
11/16/2006US20060259842 Automatic test pattern generation
11/16/2006US20060259841 Relocatable built-in self test (BIST) elements for relocatable mixed-signal elements
11/16/2006US20060259840 Self-test circuitry to determine minimum operating voltage
11/16/2006US20060259839 Method and system for evaluating a constraint of a sequential cell
11/16/2006US20060259838 Scan Sequenced Power-On Initialization
11/16/2006US20060259837 Safety device
11/16/2006US20060259836 Method for validating an integrated circuit and related semiconductor product thereof
11/16/2006US20060259835 Automatic test pattern generation
11/16/2006US20060259834 Method and system for debug and test using replicated logic
11/16/2006US20060259620 Statistical information collecting method and apparatus
11/16/2006US20060259280 Method and apparatus for the continuous performance monitoring of a lead acid battery system
11/16/2006US20060259264 Test apparatus, diagnosing program and diagnosing method therefor
11/16/2006US20060258135 Semiconductor integrated circuit
11/16/2006US20060258124 Low temperature epitaxial growth of silicon-containing films using close proximity UV radiation
11/16/2006US20060258055 Wiring board and method of manufacturing the same
11/16/2006US20060257093 Test apparatus and cable guide unit
11/16/2006US20060256810 Dynamically selecting CODECS for managing an audio message
11/16/2006US20060256725 Mobile testing system and method providing a data relay between a testing application and internal diagnostics
11/16/2006US20060256052 Semiconductor device and liquid crystal panel driver device
11/16/2006US20060255828 Testing apparatus, and testing method
11/16/2006US20060255827 Inspection method and inspection device for display device and active matrix substrate used for display device
11/16/2006US20060255826 Systems and methods for testing microelectronic imagers and microfeature devices
11/16/2006US20060255825 Method and apparatus for characterizing features formed on a substrate
11/16/2006US20060255824 Method of Automatically Creating a Semiconductor Processing Prober Device File
11/16/2006US20060255823 Semiconductor device, method for testing the same and IC card
11/16/2006US20060255822 Cooling fin connected to a cooling unit and a pusher of the testing apparatus
11/16/2006US20060255821 Interface assembly and dry gas enclosing apparatus using same
11/16/2006US20060255820 Self-aligning docking system for electronic device testing
11/16/2006US20060255819 Compliant pad wafer chuck
11/16/2006US20060255818 Multiple local probe measuring device and method
11/16/2006US20060255817 Probe card and testing method of semiconductor chip, capacitor and manufacturing method thereof
11/16/2006US20060255816 Probe card and testing method of semiconductor chip, capacitor and manufacturing method thereof
11/16/2006US20060255815 Contact probe and method of manufacturing the same and test apparatus and test method
11/16/2006US20060255814 Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly
11/16/2006US20060255769 Battery cell monitoring and balancing circuit
11/16/2006US20060255222 Wrist joint for positioning a test head
11/16/2006DE60026186T2 Verfahren zur Prüfung einer integrierten Schaltung mit vertraulichen Software- oder Hardware-elementen A method for testing an integrated circuit containing confidential software or hardware elements
11/16/2006DE202006011447U1 Measuring and test device for detecting device specific data has transponder for equalizing or storing data
11/16/2006DE19528972B4 Serielle digitale Signalquelle mit einem Kabeldämpfungssimulator Serial digital signal source with a cable loss simulator
11/16/2006DE112004002642T5 Plausibilitätsprüfung eines elektrischen Drei-Phasen-Systems The plausibility check of an electric three-phase system
11/16/2006DE102005021730A1 Cordless power tool, has solar cell for enabling permanent operation of charging-state indicator
11/16/2006DE102005021297A1 Beurteilung des Zustands einer Heizwendel Assessing the condition of a heating coil
11/16/2006DE10136548B4 Verfahren zum Prüfen interner Steuersignale in Halbleitervorrichtungen A method for testing internal control signals in semiconductor devices
11/16/2006DE10007427B4 Ereignisgestütztes Prüfsystem Event-assisted testing system
11/16/2006CA2608145A1 Electronic overload relay for mains-fed induction motors
11/15/2006EP1722249A1 A relay test device
11/15/2006EP1722248A1 A relay test device
11/15/2006EP1722247A2 Compensation for test signal degradation due to dut fault
11/15/2006EP1722246A2 Method and apparatus for selectively compacting test responses
11/15/2006EP1722245A1 Measurement of output voltage characeristics on dynamic logic signals
11/15/2006EP1722244A1 Fault simulation system and a method for fault simulation
11/15/2006EP1721182A1 Method of estimating the state-of-charge and of the use time left of a rechargeable battery, and apparatus for executing such a method
11/15/2006EP1721181A2 Test system and method for reduced index time