G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2006
10/05/2006	WO2006104708A1 Active diagnostic interface for wafer probe applications
10/05/2006	WO2006104361A1 Apparatus and method for measuring the amount of the current in battery cells using a plurality of sensing resistors
10/05/2006	WO2006104019A1 Semiconductor device, manufacturing method thereof, and measuring method thereof
10/05/2006	WO2006103617A1 Test prepared rf integrated circuit
10/05/2006	WO2006014377A3 Electrical arcing protection circuit
10/05/2006	WO2006012211B1 A system and method for adaptive rate selection for wireless networks
10/05/2006	WO2006007141A3 Lead solder indicator and method
10/05/2006	WO2005079211A8 Television data management system
10/05/2006	US20060224347 Semiconductor device test method using an evaluation LSI
10/05/2006	US20060224343 Calibration of tester and testboard by golden sample
10/05/2006	US20060223204 System and method for detecting flow in a mass flow controller
10/05/2006	US20060222370 Methods and apparatus for optical modulation amplitude measurement
10/05/2006	US20060221989 Method and system for accommodating several ethernet ports and a wrap transmitted flow handled by a simplifed frame-by-frame upper structure
10/05/2006	US20060221967 Methods for performing packet classification
10/05/2006	US20060221948 Interconnecting network for switching data packets and method for switching data packets
10/05/2006	US20060221855 Method and system for real-time detection of hidden traffic patterns
10/05/2006	US20060221849 Method of selecting a profile of a broadband communication line
10/05/2006	US20060221840 Communication device and logical link abnormality detection method
10/05/2006	US20060221824 Storage system and data processing method
10/05/2006	US20060221823 Assigning resources to items such as processing contexts for processing packets
10/05/2006	US20060221725 Semiconductor integrated circuit device
10/05/2006	US20060221531 Circuit for detecting and measuring noise in semiconductor integrated circuit
10/05/2006	US20060220858 Tag testing device, tag testing method, and tag testing program
10/05/2006	US20060220672 Boundary scan controller, semiconductor device, method for identifying semiconductor circuit chip of semiconductor device, and method for controlling semiconductor circuit chip of semiconductor device
10/05/2006	US20060220671 Power supply assembly for a semiconductor circuit tester
10/05/2006	US20060220670 Method for measuring cell gap variation of liquid crystal panel and apparatus thereof
10/05/2006	US20060220669 Semiconductor integrated circuit device
10/05/2006	US20060220668 Method for manufacturing semiconductor device
10/05/2006	US20060220667 Testing device and testing method of a semiconductor device
10/05/2006	US20060220666 Microcontactor probe assembly
10/05/2006	US20060220665 Alignment fences and devices and assemblies including the same
10/05/2006	US20060220664 Optical trigger for PICA technique
10/05/2006	US20060220655 Method and system for multi-frequency inductive ratio measurement
10/05/2006	US20060220653 Measuring low dielectric constant film properties during processing
10/05/2006	US20060220636 Highly stable piezoelectric oscillator
10/05/2006	US20060220092 Titanium oxide extended gate field effect transistor
10/05/2006	US20060219921 Laminated core testing device
10/05/2006	US20060219658 Method of measuring semiconductor wafers with an oxide enhanced probe
10/05/2006	DE60118089T2 Abtastschnittstelle mit Zeitmultiplexmerkmal zur Signalüberlagerung Scan interface with time-division multiplexing feature to signal superposition
10/05/2006	DE112004002407T5 Oszillator, Frequenzvervielfacher und Prüfvorrichtung Oscillator, frequency multipliers and Tester
10/05/2006	DE10307561B4 Meßanordnung zur kombinierten Abtastung und Untersuchung von mikrotechnischen, elektrische Kontakte aufweisenden Bauelementen Measuring arrangement for combined sampling and analysis of micro-technical, electrical contacts having components
10/05/2006	DE102006006203A1 Positioning device for chuck of substrate tester has transfer element with inner and outer parts opposite each other on closed tester housing wall with magnetic force connection between the parts
10/05/2006	DE102006003501A1 Tag test apparatus for testing radio frequency identification tags based on heat generated by defective tags
10/05/2006	DE102006001476A1 Electric circuit for improving the accuracy of electrical equipment using compensation for environmental conditions
10/05/2006	DE102005036977A1 Handler zum Testen von Halbleitervorrichtungen Handler for the testing of semiconductor devices
10/05/2006	DE102005015334A1 Prober for testing substrate of e.g. semiconductor chip, has chuck with retaining surface to retain and cool substrate and fixed on carrier such that it is thermally uncoupled from another chuck and connected to cold head by connecting unit
10/05/2006	DE102005015311A1 Semiconductor unit e.g. integrated electrical circuit, testing device, has adding blocks, where sine and cosine values lie for current time to sine and cosine inputs, and number of periods and increment are adjusted by input signals
10/05/2006	DE102005014210A1 Electrical coupling condition examining method for inductive load in motor vehicles involves detecting characteristic voltage pulse to determine if error condition is or is not present
10/05/2006	DE102005013323A1 Kontaktierungsvorrichtung zum Kontaktieren einer integrierten Schaltung, insbesondere eines Chips oder eines Wafers, mit einer Testervorrichtung, entsprechendes Testverfahren und entsprechendes Herstellungsverfahren A contacting device for contacting an integrated circuit, in particular a chip or a wafer having a tester apparatus corresponding test method and corresponding production method
10/05/2006	CA2602910A1 Apparatus and method for managing battery performance of a wireless device
10/04/2006	EP1707974A1 Remaining capacity calculating device and method for electric power storage
10/04/2006	EP1707973A1 Semiconductor device and method for testing semiconductor device
10/04/2006	EP1707972A1 Method and apparatus for functionally verifying a physical device under test
10/04/2006	EP1707971A1 Probing apparatus and positional deviation acquiring method
10/04/2006	EP1707970A1 Method for detecting the position of a wave front in a signal received by a detector
10/04/2006	EP1707969A1 Power line parameter analysis method and system
10/04/2006	EP1707967A1 Electric connecting device and contactor
10/04/2006	EP1706929A2 Method and apparatus for monitoring energy storage devices
10/04/2006	EP1706801A1 System and method for diagnosing a controller in a limited rotation motor system
10/04/2006	EP1706776A1 System and method for virtual laser marking
10/04/2006	EP1706775A1 System and method for optimizing character marking performance
10/04/2006	EP1706753A1 Fuel cell voltage monitoring system and associated electrical connectors
10/04/2006	EP1706752A1 Jtag test architecture for multi-chip pack
10/04/2006	EP1706751A2 High sensitivity magnetic built-in current sensor
10/04/2006	EP1706750A2 Thermal protection for electronic components during processing
10/04/2006	EP1567759B1 Monitoring method for an actuator and corresponding driver circuit
10/04/2006	EP1523686B1 Compensation for test signal degradation due to dut fault
10/04/2006	EP1495486B1 Method and device for conditioning semiconductor wafers and/or hybrids
10/04/2006	EP1156342B1 Air cooled power load test apparatus
10/04/2006	EP1084418B1 Turning center with integrated non-contact inspection system
10/04/2006	CN2824057Y Photoelectric meter tester for electrooptic source
10/04/2006	CN2824056Y Double power supply monitoring recording apparatus
10/04/2006	CN2824055Y Battery detector
10/04/2006	CN2824054Y Universal four line type switch measurer
10/04/2006	CN2824053Y Feed sensor for mine
10/04/2006	CN2824052Y Indicator for short circuit and earth fault
10/04/2006	CN2824051Y Electricity use acceptance tester
10/04/2006	CN2824050Y Blocking exterior line tester
10/04/2006	CN2824049Y Split-type on line mointor for lightning arrester
10/04/2006	CN2824048Y Three-terminal voltage stabilizer tester
10/04/2006	CN2824047Y Apparatus for cancelling common-frequency interference under field environment
10/04/2006	CN2824040Y Anti-rotating clamp test needle
10/04/2006	CN2824039Y Testing platform structure for display panel
10/04/2006	CN2824038Y Measuring clamp with positioning self-straightening structure
10/04/2006	CN1842964A High frequency divider state correction
10/04/2006	CN1842951A Method and safety device for ground fault protection circuit
10/04/2006	CN1842719A Method and device for monitoring deterioration of battery
10/04/2006	CN1842718A Device for monitoring and charging of a selected group of battery cells
10/04/2006	CN1842717A Integrated circuit with signature computation
10/04/2006	CN1842716A Tester and testing method
10/04/2006	CN1842715A Test apparatus
10/04/2006	CN1842714A Integrated circuit with JTAG port, TAP linking module, and off-chip TAP interface port
10/04/2006	CN1842713A Body capacitance electric field powered device for high voltage lines
10/04/2006	CN1842697A Thermal protection for a VLSI through reduced C4 usage
10/04/2006	CN1841693A Testing device and testing method of a semiconductor device
10/04/2006	CN1841413A Tag testing device, tag testing method, and tag testing program
10/04/2006	CN1841080A Safety and precise fuel cell voltage monitoring apparatus
10/04/2006	CN1841079A Detection method for configuration of programmable logic device
10/04/2006	CN1841078A Fault diagnosing apparatus for vehicle and fault diagnosing method for vehicle
10/04/2006	CN1841077A Compilation of calibration information for plural testflows

1 ... 934 935 936 937 938 939 940 941 942 943 944 945 946 947 948 949 950 951 952 953 954 ... 1523