G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2006
11/07/2006	US7134059 Pad connection structure of embedded memory devices and related memory testing method
11/07/2006	US7133818 Method and apparatus for accelerated post-silicon testing and random number generation
11/07/2006	US7133798 Monitoring signals between two integrated circuit devices within a single package
11/07/2006	US7133797 Method, apparatus, system, program and medium for inspecting a circuit board and an apparatus incorporating the circuit board
11/07/2006	US7133795 Techniques for testing an electronic system using in-line signal distortion
11/07/2006	US7133794 Simulator cart
11/07/2006	US7133751 Method and apparatus for detecting on-die voltage variations
11/07/2006	US7133703 Small electronic device having battery level detection unit
11/07/2006	US7133550 Pattern inspection method and apparatus
11/07/2006	US7133364 Apparatus and method for internet telephone communication
11/07/2006	US7133362 Intelligent buffering process for network conference video
11/07/2006	US7133360 Conditional bandwidth subscriptions for multiprotocol label switching (MPLS) label switched paths (LSPs)
11/07/2006	US7133128 System and method for measuring properties of a semiconductor substrate in a non-destructive way
11/07/2006	US7132868 Semiconductor device
11/07/2006	US7132846 Method and apparatus for testing liquid crystal display
11/07/2006	US7132845 FA tool using conductor model
11/07/2006	US7132844 Testing device and testing method for testing an electronic device
11/07/2006	US7132843 Method and apparatus for positioning a test head on a printed circuit board
11/07/2006	US7132842 Semiconductor device, driving method and inspection method thereof
11/07/2006	US7132841 Carrier for test, burn-in, and first level packaging
11/07/2006	US7132840 Method of electrical testing
11/07/2006	US7132839 Ultra-short low-force vertical probe test head and method
11/07/2006	US7132835 PLL with built-in filter-capacitor leakage-tester with current pump and comparator
11/07/2006	US7132834 Capacitive sensor measurement method for discrete time sampled system for in-circuit test
11/07/2006	US7132832 Self-diagnosis system for an energy storage device
11/07/2006	US7132823 Design for test for a high speed serial interface
11/07/2006	US7132822 Multi-processor restart stabilization system and method
11/07/2006	US7132671 Substrate testing device and substrate testing method
11/07/2006	US7131851 Anisotropic conductivity connector, conductive paste composition, probe member, and wafer inspection device, and wafer inspecting method
11/07/2006	US7131848 Helical microelectronic contact and method for fabricating same
11/07/2006	CA2323104C Apparatus and method for testing an ignition coil and spark plug
11/07/2006	CA2220002C Detection of fluids with metal-insulator-semiconductor sensors
11/02/2006	WO2006116767A1 Apparatus for testing electronic devices
11/02/2006	WO2006116446A2 High-speed level sensitive scan design test scheme with pipelined test clocks
11/02/2006	WO2006115812A2 Method and system for debugging using replicated logic and trigger logic
11/02/2006	WO2006115779A1 Technique for testing interconnections between electronic components
11/02/2006	WO2006115756A1 Rfid tag sensitivity
11/02/2006	WO2006115725A2 Method and apparatus for determining the location of a node in a wireless system
11/02/2006	WO2006115667A1 Lithium sulfur rechargeable battery fuel gauge systems and methods
11/02/2006	WO2006115175A2 Test instrument, program and recording medium
11/02/2006	WO2006114944A1 Current variation measuring apparatus
11/02/2006	WO2006114885A1 Electrically connecting device
11/02/2006	WO2006114836A1 Pick-and-place mechanism for electronic part, elctronic part handling device, and method of sucking electronic part
11/02/2006	WO2006114828A1 Socket and electronic component testing apparatus using such socket
11/02/2006	WO2006114727A1 Supply voltage monitoring
11/02/2006	US20060248426 Test access port
11/02/2006	US20060248425 Delayed processing of site-aware objects
11/02/2006	US20060248424 Methods and apparatus for incorporating IDDQ testing into logic BIST
11/02/2006	US20060248423 Method and apparatus to disable compaction of test responses in deterministic test-set embedding-based BIST
11/02/2006	US20060248422 Sequential Scan Based Techniques to Test Interface Between Modules Designed to Operate at Different Frequencies
11/02/2006	US20060248421 Scan driver, organic light emitting display using the same, and method of driving the organic light emitting display
11/02/2006	US20060248420 Pixel circuit, organic light emitting display using the pixel circuit and driving method for the display
11/02/2006	US20060248419 Methods and apparatus for extending semiconductor chip testing with boundary scan registers
11/02/2006	US20060248418 Scan test expansion module
11/02/2006	US20060248417 Clock control circuit for test that facilitates an at speed structural test
11/02/2006	US20060248413 Voltage monitoring test mode and test adapter
11/02/2006	US20060247884 Sensor signal processor
11/02/2006	US20060247880 Testable digital delay line
11/02/2006	US20060247871 State detecting system and device employing the same
11/02/2006	US20060246611 Method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment
11/02/2006	US20060246609 Dynamic metal fill for correcting non-planar region
11/02/2006	US20060245487 High-speed decoder for a multi-pair gigabit transceiver
11/02/2006	US20060245443 Systems and methods for rate-limited weighted best effort scheduling
11/02/2006	US20060245123 Load drive apparatus
11/02/2006	US20060244743 Display Device Driving Apparatus, Display Device, and Method for Testing Driving Apparatus or Display Device
11/02/2006	US20060244542 Startup/yank circuit for self-biased phase-locked loops
11/02/2006	US20060244476 Defect mitigation in display panels
11/02/2006	US20060244475 Compliant contact pin test assembly and methods thereof
11/02/2006	US20060244474 Site-aware objects
11/02/2006	US20060244473 Device and method for testing integrated circuit dice in an integrated circuit module
11/02/2006	US20060244472 Temperature control apparatus
11/02/2006	US20060244471 Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment
11/02/2006	US20060244470 Probe card configuration for low mechanical flexural strength electrical routing substrates
11/02/2006	US20060244469 Segmented Contactor
11/02/2006	US20060244468 Micro-electromechanical probe circuit substrate
11/02/2006	US20060244467 In-line electron beam test system
11/02/2006	US20060244463 Inspection method and semiconductor device
11/02/2006	US20060244462 System and method for characterizing power on a local area network
11/02/2006	US20060244461 Intelligent portable personal communication device
11/02/2006	US20060244438 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture
11/02/2006	US20060244433 Voltage-impressed current measuring apparatus and current buffers with switches used therefor
11/02/2006	US20060243908 Method of inspecting a circuit pattern and inspecting instrument
11/02/2006	EP1717711A1 Signal generator provided with license control function and license control method thereof
11/02/2006	EP1717591A1 Needle-like member, conductive contact, and conductive contact unit
11/02/2006	EP1716425A1 Method for creating hdl description files of digital systems, and systems obtained
11/02/2006	EP1716424A1 Integrated circuit chip with communication means enabling remote control of testing means of ip cores of the integrated circuit
11/02/2006	EP1716423A1 Method and device for testing a phase locked loop
11/02/2006	EP1716422A1 Probing a device
11/02/2006	EP1716421A2 Probe card configuration for low mechanical flexural strength electrical routing substrates
11/02/2006	EP1716396A1 Radiometric level gauge
11/02/2006	EP1642142B1 Method and circuit arrangement for the self-testing of a reference voltage in electronic components
11/02/2006	EP1540359B1 Method and test adapter for testing an appliance having a smart card reader
11/02/2006	EP1393497B1 Dual mode service platform within network communication system
11/02/2006	EP0975025B1 Photoelectric conversion integrated circuit device
11/02/2006	DE102006018208A1 Verfahren und Vorrichtung zum Detektieren eines geladenen Zustandes einer sekundären Batterie basierend auf einer Berechnung eines neuronalen Netzwerks Method and apparatus for detecting a charged state of a secondary battery based on a calculation of a neural network
11/02/2006	DE102005031795B3 Test method for active electrotechnical components used in heater, involves using charging and discharging capability of capacitor, connected in parallel to electrotechnical component, to detect abnormality in electrotechnical component
11/02/2006	DE102004014493B4 Verfahren zur Bestimmung der Stromdichteverteilung in Brennstoffzellen A method for determining the current density distribution in the fuel cell
11/02/2006	DE10002848B4 Vorrichtung und Verfahren zum Erfassen der Restladung einer Batterie Apparatus and method for detecting the residual capacity of a battery
11/02/2006	CA2606265A1 Rfid tag sensitivity
11/01/2006	CN2834027Y Battery-backed infrared inductive control circuit

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