G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2006
12/27/2006	EP1147648B1 A portable multi-band communication device, and a method for determining a charge consumption thereof
12/27/2006	CN2852416Y Single battery monitoring device inside battery pack
12/27/2006	CN2852213Y Current type electricity-proof wall detection chip with switching tube zero ground wire detection interface
12/27/2006	CN2852148Y Checking apparatus for circuit breaker
12/27/2006	CN2852147Y Power line breakage alarm device
12/27/2006	CN2852146Y Transmission line aeolian-vibration monitoring device utilizing solar energy power supply
12/27/2006	CN2852138Y Magnetic field probe for electromagnetism compatibility diagnosis testing
12/27/2006	CN2852137Y Carrier for testing
12/27/2006	CN1886943A Internet endpoint system
12/27/2006	CN1886668A Identifying process and temperature of silicon chips
12/27/2006	CN1886667A Reliable multicast communication
12/27/2006	CN1886665A A ground-signal-ground (GSG) test structure
12/27/2006	CN1886664A Apparatus for testing a device with a high frequency signal
12/27/2006	CN1885684A Asynchronous AC motor rotor broken-bar detecting method and its device
12/27/2006	CN1885662A Integration protection system based on distance algorithm
12/27/2006	CN1885518A Manufacturing method of semiconductor integrated circuit device
12/27/2006	CN1885055A Battery check device
12/27/2006	CN1885054A Apparatus and method for testing photoelectric characteristic of thermo-optic switch array
12/27/2006	CN1885053A Built-in waveform edge deskew using digital-locked loops and coincidence detectors in an automated test equipment system
12/27/2006	CN1885052A Logic resource testing technology for in-system programmable device
12/27/2006	CN1885051A Multi-sample Hall effect testing apparatus
12/27/2006	CN1885050A Strong magnetic filed Hall effect testing apparatus and testing method thereof
12/27/2006	CN1885049A Metrology tool error log analysis methodology and system
12/27/2006	CN1885048A High voltage automatic accessing device for unmanned testing
12/27/2006	CN1885047A Piezoresistance type microwave power sensor and microwave power sensing method thereof
12/27/2006	CN1885014A Board inspecting apparatus, its parameter setting method and parameter setting apparatus
12/27/2006	CN1884990A Vibrating detection method for detecting looseness of large-scale generator rotor slot wedge and apparatus therefor
12/27/2006	CN1292527C Method and apparatus for detecting internal resistance of a rechargeable battery and rechargeable battery pack containing the same
12/27/2006	CN1292512C Method, apparatus and application for detecting information of chargable cell
12/27/2006	CN1292481C System combined semiconductor device
12/27/2006	CN1292260C Device and method for inspection
12/27/2006	CN1292258C Test probe for a finger tester and corresponding finger tester
12/27/2006	CN1292257C Automatic testing system for electronic plug-in unit of road maintenance machinery
12/27/2006	CN1292232C Data access method and device for vehicle carried information equipment access data
12/26/2006	US7155690 Method for co-verifying hardware and software for a semiconductor device
12/26/2006	US7155687 Methods and apparatus for scan insertion
12/26/2006	US7155651 Clock controller for at-speed testing of scan circuits
12/26/2006	US7155650 IC with separate scan paths and shift states
12/26/2006	US7155649 Scan test control method and scan test circuit
12/26/2006	US7155648 Linear feedback shift register reseeding
12/26/2006	US7155647 Scan of chip state from a hierarchical design
12/26/2006	US7155646 Tap and test controller with separate enable inputs
12/26/2006	US7155643 Semiconductor integrated circuit and test method thereof
12/26/2006	US7155637 Method and apparatus for testing embedded memory on devices with multiple processor cores
12/26/2006	US7155379 Simulation of a PCI device's memory-mapped I/O registers
12/26/2006	US7155370 Reusable, built-in self-test methodology for computer systems
12/26/2006	US7155362 Test device for signaling and waveform generation and monitoring
12/26/2006	US7155361 Semiconductor test management system and method
12/26/2006	US7155357 Method and apparatus for detecting an unused state in a semiconductor circuit
12/26/2006	US7155353 Method for determining charging capacitance of capacitor
12/26/2006	US7155075 Optical battery temperature monitoring system and method
12/26/2006	US7155003 Networks, systems and methods for routing data traffic within a telephone network based on available resources
12/26/2006	US7154856 Multiplexing apparatus and cell discard method
12/26/2006	US7154853 Rate policing algorithm for packet flows
12/26/2006	US7154605 Method for characterizing defects on semiconductor wafers
12/26/2006	US7154568 Liquid crystal display panel with static electricity prevention circuit
12/26/2006	US7154292 Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same
12/26/2006	US7154291 Measuring bi-directional current through a field-effect transistor by virtue of drain-to-source voltage measurement
12/26/2006	US7154289 Input buffer with automatic switching point adjustment circuitry, and synchronous dram device including same
12/26/2006	US7154288 Method and an apparatus for testing transmitter and receiver
12/26/2006	US7154287 Method and apparatus for light-controlled circuit characterization
12/26/2006	US7154286 Dual tapered spring probe
12/26/2006	US7154285 Method and apparatus for providing PCB layout for probe card
12/26/2006	US7154284 Integrated circuit probe card
12/26/2006	US7154283 Method of determining performance of RFID devices
12/26/2006	US7154281 Apparatus and method for determining the status of an electric power cable
12/26/2006	US7154280 Apparatus and method for communications testing
12/26/2006	US7154279 Partial discharge detection test link, partial discharge detection system and methods for detecting partial discharge on a power cable
12/26/2006	US7154278 Arrangement for detecting a leakage current or defect current
12/26/2006	US7154277 Method and apparatus for detecting faults in AC to AC, or DC to AC power conversion equipments when the equipment is in a high impedance mode
12/26/2006	US7154276 Method and apparatus for measuring a parameter of a vehicle electrical system
12/26/2006	US7154261 Tester device, inspection device, and interconnection board receiving unit for the tester device and inspection device
12/26/2006	US7154260 Precision measurement unit having voltage and/or current clamp power down upon setting reversal
12/26/2006	US7154259 Isolation buffers with controlled equal time delays
12/26/2006	US7154258 IC transfer device
12/26/2006	US7154257 Universal automated circuit board tester
12/26/2006	US7154256 Integrated VI probe
12/26/2006	US7154247 Secondary battery state-of-charge estimating apparatus and method using polarization voltages, and recording medium usable thereby
12/26/2006	US7153444 Apparatus and method for radio frequency de-coupling and bias voltage control in a plasma reactor
12/26/2006	US7153142 Retrofit kit for interconnect cabling system
12/21/2006	WO2006135680A2 Electrical contact probe with compliant internal interconnect
12/21/2006	WO2006134994A1 Fet characteristic measuring method
12/21/2006	WO2006134901A1 Coaxial cable unit, device interface apparatus and electronic component testing apparatus
12/21/2006	WO2006134888A1 Tft substrate inspecting apparatus
12/21/2006	WO2006134837A1 Delay circuit, testing apparatus, timing generator, test module and electronic device
12/21/2006	WO2006134678A1 System and method for detecting leak current
12/21/2006	WO2006134076A1 Loss-free high current test station
12/21/2006	WO2006134068A1 Assembly and method for monitoring the shaft current of an electric motor
12/21/2006	WO2006133865A1 Dynamic prioritisation of test steps in workshop diagnostics
12/21/2006	WO2006133808A1 Method of testing unloaded, large-area printed circuit boards with a finger tester
12/21/2006	WO2006109050A3 Monitoring system
12/21/2006	WO2006091708A3 Method and apparatus for pinpointing common path distortion sources
12/21/2006	WO2005076885A3 Contactless interfacing of test signals with a device under test
12/21/2006	US20060288324 Semiconductor device, and design method, inspection method, and design program therefor
12/21/2006	US20060287742 Distributed processing architecture with scalable processing layers
12/21/2006	US20060286828 Contact Structures Comprising A Core Structure And An Overcoat
12/21/2006	US20060286807 Use of active temperature control to provide emmisivity independent wafer temperature
12/21/2006	US20060285557 Synchronizing a modem and vocoder of a mobile station
12/21/2006	US20060285544 Cable modem termination system having a gateway for transporting out-of-band messaging signals
12/21/2006	US20060285489 Method and apparatus for providing end-to-end high quality services based on performance characterizations of network conditions

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