| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 01/02/2007 | US7158902 Process parameter based I/O timing programmability using electrical fuse elements |
| 01/02/2007 | US7158355 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system |
| 01/02/2007 | US7158284 Apparatus and methods of using second harmonic generation as a non-invasive optical probe for interface properties in layered structures |
| 01/02/2007 | US7158036 RFID tag inspection system |
| 01/02/2007 | US7157930 Scan flip flop, semiconductor device, and production method of semiconductor device |
| 01/02/2007 | US7157929 System for testing flat panel display devices |
| 01/02/2007 | US7157928 Determining leakage in matrix-structured electronic devices |
| 01/02/2007 | US7157927 Test pattern for testing resistance of pattern of semiconductor substrate |
| 01/02/2007 | US7157926 Universal padset concept for high-frequency probing |
| 01/02/2007 | US7157925 Test structure for speeding a stress-induced voiding test and method of using same |
| 01/02/2007 | US7157924 Method and apparatus for on-die voltage fluctuation detection |
| 01/02/2007 | US7157923 Method for full wafer contact probing, wafer design and probe card device with reduced probe contacts |
| 01/02/2007 | US7157922 Planar electroconductive contact probe holder |
| 01/02/2007 | US7157921 TFT array inspection apparatus |
| 01/02/2007 | US7157920 Non-destructive monitoring of material integrity |
| 01/02/2007 | US7157917 Sensor cable having easily changeable entire length and allowing accurate and high speed signal transmission even when entire length is made longer, and amplifier-separated type sensor with the cable |
| 01/02/2007 | US7157916 Test apparatus for testing an electronic device |
| 01/02/2007 | US7157900 Removable breaking calibration connector for toroidal conductivity sensor and method of calibration |
| 01/02/2007 | US7157883 Method and system for battery protection employing averaging of measurements |
| 01/02/2007 | US7157882 Method and system for battery protection employing a selectively-actuated switch |
| 01/02/2007 | US7157880 Battery monitoring system |
| 01/02/2007 | US7157858 Self light emitting display module, electronic equipment into which the same module is loaded, and inspection method of defect state in the same module |
| 01/02/2007 | US7157793 Direct contact semiconductor cooling |
| 01/02/2007 | US7157710 Corona discharge detection |
| 01/02/2007 | US7157368 Method of accelerating test of semiconductor device |
| 01/02/2007 | US7157131 Prevention of counterfeit markings on semiconductor devices |
| 01/02/2007 | US7156680 Insert and electronic component handling apparatus provided with the same |
| 01/02/2007 | US7156525 System and method for managing projector bulb life |
| 01/02/2007 | US7156057 Electromagnetic actuator for controlling a valve of an internal combustion engine and internal combustion engine equipped with such an actuator |
| 01/02/2007 | CA2386188C Contactless smart card test/encoding machine |
| 01/02/2007 | CA2292341C Method of testing rotor bars in a squirrel cage electric motor |
| 12/28/2006 | WO2006138583A2 Sequential scan test of interface between ic modules that operate at different frequencies |
| 12/28/2006 | WO2006138488A2 Reduced-pin-count-testing architectures for applying test patterns |
| 12/28/2006 | WO2006137553A1 Method for nondestructive testing of shielded signal wire |
| 12/28/2006 | WO2006137415A1 Semiconductor failure analyzing apparatus, semiconductor failure analyzing method, semiconductor failure analyzing program and semiconductor failure analyzing system |
| 12/28/2006 | WO2006137391A1 Semiconductor defect analyzing device, defect analyzing method, and defect analyzing program |
| 12/28/2006 | WO2006137197A1 Semiconductor integrated circuit device and regulator using the same |
| 12/28/2006 | WO2006136505A1 Control and diagnostic unit for electrical tool |
| 12/28/2006 | WO2006136497A1 Method for recognising errors in signal processing circuit components, im particular for a measuring transducer |
| 12/28/2006 | WO2006136494A1 Method and device for determining a leak resistance for at least one wire of a subscriber connection line comprising several wires in a communications network |
| 12/28/2006 | WO2006136475A1 Battery state recognition for kfz-accumulators |
| 12/28/2006 | WO2006136139A1 Device for transmitting electrical signals between a tester and a test adapter |
| 12/28/2006 | WO2006121694A3 Electronic overload relay for mains-fed induction motors |
| 12/28/2006 | WO2006090947A8 Probe and method for manufacturing the same |
| 12/28/2006 | WO2006068939A3 Remote test facility with wireless interface to local test facilities |
| 12/28/2006 | WO2005106817A3 Method and apparatus for dynamically determining when to use quality of service reservation in internet media applications |
| 12/28/2006 | WO2004082180A3 Method for optimizing high frequency performance of via structures |
| 12/28/2006 | US20060294444 Apparatus and method for testing PS/2 interface |
| 12/28/2006 | US20060294443 On-chip address generation |
| 12/28/2006 | US20060294442 BIST to provide phase interpolator data and associated methods of operation |
| 12/28/2006 | US20060294441 Logic analyzer data retrieving circuit and its retrieving method |
| 12/28/2006 | US20060292855 Current-aligned auto-generated non-equiaxial hole shape for wiring |
| 12/28/2006 | US20060292711 Mechanical integrity evaluation of low-k devices with bump shear |
| 12/28/2006 | US20060291485 Link state advertisements specifying dynamic routing metrics and associated variation metrics and selective distribution thereof |
| 12/28/2006 | US20060291437 System and method to provide dynamic call models for users in an IMS network |
| 12/28/2006 | US20060291400 Efficient load balancing and heartbeat mechanism for telecommunication endpoints |
| 12/28/2006 | US20060291399 Signal routing error reporting |
| 12/28/2006 | US20060291383 Methods for quality of service reverse link admission and overload control in a wireless system |
| 12/28/2006 | US20060291113 System and method for determining location of phase-to-earth fault |
| 12/28/2006 | US20060290374 Ultra-thin alphanumeric display |
| 12/28/2006 | US20060290373 Semiconductor integrated circuit apparatus, measurement result management system, and management server |
| 12/28/2006 | US20060290372 Packaging reliability super chips |
| 12/28/2006 | US20060290371 Testing apparatus and testing method using the same |
| 12/28/2006 | US20060290370 Temperature control in ic sockets |
| 12/28/2006 | US20060290369 Electronic part test device |
| 12/28/2006 | US20060290368 Circuit board test device comprising contact needles which are driven in diagonally protruding manner |
| 12/28/2006 | US20060290367 Method and apparatus for adjusting a multi-substrate probe structure |
| 12/28/2006 | US20060290366 Monitoring multiple electronic devices under test |
| 12/28/2006 | US20060290365 System and method for testing a processor |
| 12/28/2006 | US20060290364 Cable terminal with flexible contacts |
| 12/28/2006 | US20060290363 Micro Kelvin Probes and Micro Kelvin Probe Methodology |
| 12/28/2006 | US20060290362 Probe for use in determining an attribute of a coating on a substrate |
| 12/28/2006 | US20060290356 Cable diagnostics using time domain reflectometry and application using the same |
| 12/28/2006 | US20060290345 Measuring cell holding mechanism and biosensor |
| 12/28/2006 | US20060290344 Measurement method using solar simulator |
| 12/28/2006 | US20060290343 Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures |
| 12/28/2006 | US20060290342 Multi-mode switch for plasma display panel |
| 12/28/2006 | US20060290338 Device for determining constant of rotating machine |
| 12/28/2006 | US20060290323 Method of measuring the battery level in a mobile telephone |
| 12/28/2006 | US20060289751 Charged particle beam apparatus and automatic astigmatism adjustment method |
| 12/28/2006 | DE10237112B4 Verfahren zur Überwachung einer Lötstrecke auf thermische Integrität A method of monitoring a thermal integrity to Lötstrecke |
| 12/28/2006 | DE102006026229A1 Probe for e.g. integrated circuit, has contact tips located within periphery of coaxial cable and shielded by ground conductor of coaxial cable, where coaxial cable terminates in oblique terminal section |
| 12/28/2006 | DE102005028513A1 Verfahren zum Bestimmen einer Zusammenschaltungsart von mindestens zwei elektrischen Einrichtungen und System mit mehreren elektrischen Einrichtungen A method for determining a Zusammenschaltungsart of at least two electrical devices and system having a plurality of electrical devices |
| 12/28/2006 | DE102005028461A1 Verfahren zum Testen eines Wafers, insbesondere Hall-Magnetfeld-Sensors und Wafer bzw. Hallsensor A method of testing a wafer, in particular Hall-effect sensor and the Hall sensor wafer or |
| 12/28/2006 | DE102005028270A1 Verlustfreie Hochstromprüfanlage Lossless Hochstromprüfanlage |
| 12/28/2006 | DE102005028191A1 Verfahren zum Testen von unbestückten, großflächigen Leiterplatten mit einem Fingertester A method for testing of non, large printed circuit with a finger tester |
| 12/28/2006 | DE102005027446A1 Treiber- und Empfängerschaltung Schaltung und Verfahren zur Überwachung einer an eine Treiber- und Empfängerschaltung angschlossenen Leitungsverbindung Driver and receiver circuit and method for monitoring a circuit all attached to a driver and receiver circuit line connection |
| 12/28/2006 | DE102005026583A1 Battery status display system for a rechargeable vehicle battery having a scale divided into three regions for showing different information |
| 12/28/2006 | DE10119869B4 Schaltungsanordnung und Verfahren zum selektiven Übertragen von Informationen zu Chips auf einem Wafer Circuit arrangement and method for selectively transferring information to chips on a wafer |
| 12/27/2006 | EP1737041A1 Parameter adjuster |
| 12/27/2006 | EP1736841A1 Method for the automated testing of an actuator |
| 12/27/2006 | EP1736791A1 Battery pack, method for charging/discharging counting and method for setting residual capacity of the battery pack |
| 12/27/2006 | EP1736790A1 Battery pack, method for charging/discharging counting and method for setting residual capacity of the battery pack |
| 12/27/2006 | EP1736789A1 Method and equipment for estimating residual capacity of storage battery |
| 12/27/2006 | EP1736788A2 Method and apparatus for searching electromagnetic disturbing source and non-contact voltage probe apparatus therefor |
| 12/27/2006 | EP1736787A1 Probe device capable of being used for plural kinds of testers |
| 12/27/2006 | EP1736785A1 Battery voltage monitoring |
| 12/27/2006 | EP1735628A2 Wireless test cassette |
| 12/27/2006 | EP1642142B8 Method and circuit arrangement for the self-testing of a reference voltage in electronic components |
| 12/27/2006 | EP1163354B1 Compositions and methods for helper-free production of recombinant adeno-associated viruses |