Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2006
11/23/2006US20060265632 Chip capable of testing itself and testing method thereof
11/23/2006US20060265156 System and method for analyzing electrical failure data
11/23/2006US20060262795 Reliable multicast communication
11/23/2006US20060262614 Integrated circuit, test system and method for reading out an error datum from the integrated circuit
11/23/2006US20060262238 Liquid crystal panel, apparatus for inspecting the same, and method of fabricating liquid crystal display thereof
11/23/2006US20060261903 Oscillator, frequency multiplier, and test apparatus
11/23/2006US20060261843 Device for a data and energy management in a vehicle
11/23/2006US20060261842 Multiple testing bars for testing liquid crystal display and method thereof
11/23/2006US20060261841 Data signal driver for light emitting display
11/23/2006US20060261840 System and method for determining channel mobility
11/23/2006US20060261839 Motherboard memory slot ribbon cable and apparatus
11/23/2006US20060261838 Switch device
11/23/2006US20060261837 Method and socket assembly for testing ball grid array package in real system
11/23/2006US20060261836 Method and system for stressing semiconductor wafers during burn-in
11/23/2006US20060261835 Method and apparatus for burn-in optimization
11/23/2006US20060261834 Construction and use of dielectric plate for mating test equipment to a load board of a circuit tester
11/23/2006US20060261833 Testing circuits on substrate
11/23/2006US20060261832 Method of holding an electronic component in a controlled orientation during parametric testing
11/23/2006US20060261831 Integral probe and method of transmitting signal therethrough
11/23/2006US20060261830 Inverter thermal protection
11/23/2006US20060261829 Collection optics integrating an objective and a SIL
11/23/2006US20060261828 Resilient contact probe apparatus
11/23/2006US20060261827 Apparatus And Method For Limiting Over Travel In A Probe Card Assembly
11/23/2006US20060261826 Test probe and manufacturing method for test probe
11/23/2006US20060261825 Signal transmission structure, circuit board and connector assembly structure
11/23/2006US20060261824 Semiconductor device test method and semiconductor device tester
11/23/2006US20060261820 Providing power from a power source to a power sink
11/23/2006DE112004002554T5 Active wafer probe Active wafer probe
11/23/2006DE102006021468A1 Schnittstellenaufbau und Trockengas einschließende Vorrichtung, die diesen verwendet Interface structure and dry gas occluding device employing this
11/23/2006DE102006020309A1 Verfahren zur Erkennung des Endes der Lebensdauer eines bestimmten Batterietyps A method for detecting the end of the lifetime of a particular battery type
11/23/2006DE102005023717A1 Verfahren zur Auswertung eines Potentiometers sowie Schaltungsanordnung mit einem Potentiometer Method for evaluating a potentiometer and circuit arrangement having a potentiometer
11/23/2006DE102005023425A1 Tast- oder Meßkopf mit Beleuchtung des Kontaktbereichs Tactile or measuring head with illumination of the contact region
11/23/2006DE102005023365A1 Determining battery parameter for battery management in hybrid vehicles involves estimating future electrical load on battery, computing future trend of parameter based on estimated electrical load
11/23/2006DE102005023358A1 Vorrichtung zur Erfassung der Batteriespannung in Motorsteuergeräten Device for detecting the battery voltage to motor control devices
11/23/2006DE102005022884A1 Verfahren zur Inspektion einer Leiterbahnstruktur A method for inspection of a conductor track structure
11/23/2006DE102005021959A1 Batteriestromsensor für ein Kraftfahrzeug Battery current sensor for a motor vehicle
11/23/2006DE102005014533A1 Unit testing and burning-in lower voltage semiconductors, memory, logic circuits and communications components, converts controller output to suitable voltage
11/23/2006DE102004042072B4 Verfahren zum Testen einer zu testenden Schaltungseinheit und Testvorrichtung zur Durchführung des Verfahrens A method of testing a circuit under test unit and test device for carrying out the method
11/23/2006DE102004033838B4 Batteriesensor und Verfahren zum Betreiben eines Batteriesensors Battery sensor and method of operating a battery sensor
11/23/2006CA2608216A1 Detection, localization and interpretation of partial discharge
11/22/2006EP1724599A1 Test device with test parameter adaptation
11/22/2006EP1724598A1 Semiconductor device test equipment and device interface board
11/22/2006EP1724597A2 System and method for determining location of phase-to-earth fault
11/22/2006EP1724594A1 Probe and probe manufacturing method
11/22/2006EP1723571A2 Methods and apparatus for data analysis
11/22/2006EP1723438A2 Burn-in testing apparatus and method
11/22/2006EP1579229B1 Connecting multiple test access port controllers through a single test access port
11/22/2006EP1538452B1 Stage driving apparatus and probe method
11/22/2006EP1478932B1 Method and circuit arrangement for determining the average current consumption of a battery-operated apparatus
11/22/2006EP1356307B1 Nickel alloy probe card frame laminate
11/22/2006EP1335210B1 High speed interconnect circuit test method and apparatus
11/22/2006EP1004027B1 Magnetic current sensing and short circuit detection in a plate structure
11/22/2006EP0820588B1 Multilayer moisture barrier for electrochemical cell tester
11/22/2006EP0727670B1 Phase difference measuring circuit
11/22/2006CN2840067Y Nickel-hydrogen battery charger additional capacity testing device
11/22/2006CN2840066Y Assembling current signal inductive probe
11/22/2006CN2840065Y Electrical circuit comprehensive fault detecting instrument
11/22/2006CN2840064Y Insulator pollution monitoring collector ring with new connecting structure
11/22/2006CN2840063Y Current-limiting mode providing detection signal A/D converter earth wire hot-line detector
11/22/2006CN2840062Y Full automatic electronic element testing device
11/22/2006CN2840060Y Earth wire alive detector composed of voltage transformer monostable circuit
11/22/2006CN2840058Y Open-loop local magnetic leakage type flashover inductive probe
11/22/2006CN2840048Y Modular probe device and probe
11/22/2006CN2840047Y Probe with structural improvement
11/22/2006CN2840046Y Detecting probe for display panel
11/22/2006CN2840045Y Special adapter for automatic testing equipment
11/22/2006CN1867834A Self-heating burn-in
11/22/2006CN1867212A Load detecting circuit of electromagnetic heating apparatus
11/22/2006CN1866659A Method and apparatus for power supply phase-missing detection and phase sequence correction of triphase AC motor
11/22/2006CN1866607A Electric bicycle battery pack with monitoring device
11/22/2006CN1866599A Fuel cell stack testing device with power generation function
11/22/2006CN1866490A Test probe and manufacturing method for test probe
11/22/2006CN1866045A 半导体集成电路 The semiconductor integrated circuit
11/22/2006CN1866044A Metal halide lamp arc tube performance detection method
11/22/2006CN1866043A System and method for determining location of phase-to-earth fault
11/22/2006CN1866042A Testing circuit of multifunctional cable tester
11/22/2006CN1866041A Apparatus and method for testing component built in circuit board
11/22/2006CN1866040A Production test method for communication equipment
11/22/2006CN1866039A Apparatus and method for testing drive integrated circuit of display panel
11/22/2006CN1866038A Large-scale grounding network detection technology and detection system for power plant and transformer substation
11/22/2006CN1866037A Laser phase noise measurer
11/22/2006CN1866036A Apparatus for measuring read range between RFID tag and reader
11/22/2006CN1866032A Signal transmission method of integrated conductive probe and finished product thereof
11/22/2006CN1865978A Network-enabled intelligent aluminum foil TV characteristics testing system
11/22/2006CN1865950A Automatic aligning method for printed circuit board
11/22/2006CN1286262C Comprehensive measuring method and circuit for electric motor rotating speed and rotor location
11/22/2006CN1285916C Electrical parameter inspection apparatus
11/21/2006US7139991 Automatic method and system for instantiating built-in-test (BIST) modules in ASIC memory designs
11/21/2006US7139957 Automatic self test of an integrated circuit component via AC I/O loopback
11/21/2006US7139956 Semiconductor integrated circuit device and test method thereof
11/21/2006US7139955 Hierarchically-controlled automatic test pattern generation
11/21/2006US7139954 Method and apparatus for testing a computing device with memory using test program code
11/21/2006US7139953 Integrated circuit with test circuit
11/21/2006US7139952 Semiconductor integrated circuit detecting glitch noise and test method of the same
11/21/2006US7139951 Scan enabled storage device
11/21/2006US7139950 Segmented scan chains with dynamic reconfigurations
11/21/2006US7139949 Test apparatus to facilitate building and testing complex computer products with contract manufacturers without proprietary information
11/21/2006US7139948 Method for determining the impact on test coverage of scan chain parallelization by analysis of a test set for independently accessible flip-flops
11/21/2006US7139947 Test access port
11/21/2006US7139929 Generating a test environment for validating a network design