G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2006
12/05/2006	US7145760 Tap changer monitoring
12/05/2006	US7145533 Electro-optical device, method of checking the same, and electronic apparatus
12/05/2006	US7145358 Display apparatus and inspection method
12/05/2006	US7145357 Mother substrate, substrate for display panel and method of manufacturing display panel
12/05/2006	US7145356 Circuits for transistor testing
12/05/2006	US7145355 Selectively configurable probe structures, e.g., for testing microelectronic components
12/05/2006	US7145354 Resilient probes for electrical testing
12/05/2006	US7145353 Double side probing of semiconductor devices
12/05/2006	US7145352 Apparatus, method, and kit for probing a pattern of points on a printed circuit board
12/05/2006	US7145351 Electrical inspection apparatus
12/05/2006	US7145349 Method for increasing the interference resistance of a time frame reflectometer and a circuit device of implementing said method
12/05/2006	US7145346 On-chip resistance monitor and diagnoses for electrical fuses
12/05/2006	US7145345 Current transformers for partial discharge detection on aircraft cables and wires
12/05/2006	US7145344 Method and circuits for localizing defective interconnect resources in programmable logic devices
12/05/2006	US7145343 Repair device for decorative light shunt
12/05/2006	US7145323 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
12/05/2006	US7145250 LSI package, LSI element testing method, and semiconductor device manufacturing method
12/05/2006	US7145219 Vertical integrated circuits
12/05/2006	US7145156 Image processing method, image processing apparatus and semiconductor manufacturing method
12/05/2006	US7144788 Method for manufacturing a transmitting optical sub-assembly with a thermo-electric cooler therein
12/05/2006	US7144265 Socket for electric component
12/05/2006	US7143818 Heat pipe evaporator with porous valve
11/2006
11/30/2006	WO2006127912A1 Eccentric offset kelvin probe
11/30/2006	WO2006127232A1 Rfid device variable test systems and methods
11/30/2006	WO2006127112A1 Brushed motor position control based upon back current detection
11/30/2006	WO2006126866A1 Method and apparatus of detecting voltage for battery pack
11/30/2006	WO2006126130A2 Device, system and method for testing and analysing integrated circuits
11/30/2006	WO2006126022A1 Battery monitor
11/30/2006	WO2005098460B1 Double side probing of semiconductor devices
11/30/2006	US20060271832 Pattern generator and test apparatus
11/30/2006	US20060271828 Semiconductor device mounting chip having tracing function
11/30/2006	US20060271326 Power short circuit testing of an electronics assembly employing pre-characterized power off resistance of an electronic component thereof from a power boundary
11/30/2006	US20060271325 Smart component-based management techniques in a substrate processing system
11/30/2006	US20060271316 Method for determining battery capacity
11/30/2006	US20060271315 Method and apparatus for monitoring battery discharge state
11/30/2006	US20060270265 Insert and electronic component handling apparatus provided with the same
11/30/2006	US20060270073 Manufacturing method of semiconductor device, evaluation method of semiconductor device, and semiconductor device
11/30/2006	US20060268724 Using Open Vera Assertions to verify designs
11/30/2006	US20060268711 Network selection terminal
11/30/2006	US20060268696 Data packets scrambling module and method
11/30/2006	US20060268695 System and method for dynamically adjusting a RSVP reservation
11/30/2006	US20060268692 Transmission of electronic packets of information of varying priorities over network transports while accounting for transmission delays
11/30/2006	US20060268467 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system
11/30/2006	US20060268466 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system
11/30/2006	US20060267656 Delay circuit, and testing apparatus
11/30/2006	US20060267637 Calibration comparator circuit
11/30/2006	US20060267626 System and method for testing an led and a connector thereof
11/30/2006	US20060267625 Active matrix display circuit substrate, display panel including the same, inspection method thereof, and inspection device thereof
11/30/2006	US20060267624 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
11/30/2006	US20060267623 Semiconductor devices and methods of testing the same
11/30/2006	US20060267622 Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers
11/30/2006	US20060267621 On-chip apparatus and method for determining integrated circuit stress conditions
11/30/2006	US20060267620 Interconnecting apparatus and a contact element therefor
11/30/2006	US20060267619 Transfer device
11/30/2006	US20060267618 Characterizing circuit performance by separating device and interconnect impact on signal delay
11/30/2006	US20060267617 First die indicator for integrated circuit wafer
11/30/2006	US20060267616 Systems and methods for controlling of electro-migration
11/30/2006	US20060267615 Zero ATE insertion force interposer daughter card
11/30/2006	US20060267614 Ceramic heater
11/30/2006	US20060267613 Movement amount operation correction method for prober, movement amount operation correction processing program, and prober
11/30/2006	US20060267612 Automatic design method for semiconductor device
11/30/2006	US20060267611 Test system
11/30/2006	US20060267610 Probe station having multiple enclosures
11/30/2006	US20060267609 Epoxy Bump for Overhang Die
11/30/2006	US20060267608 Adaptive test meter probe system and method of operation
11/30/2006	US20060267607 Method for fabricating a plurality of elastic probes in a row
11/30/2006	US20060267606 Signal probe and probe assembly
11/30/2006	US20060267605 Differential measurement probe having a ground clip system for the probing tips
11/30/2006	US20060267604 Differential measurement probe having retractable double cushioned variable spacing probing tips with EOS/ESD protection capabilities
11/30/2006	US20060267603 Signal acquisition probe having a retractable double cushioned probing tip with EOS/ESD protection capabilities
11/30/2006	US20060267602 Signal acquisition probe having a retractable double cushioned probing tip assembly
11/30/2006	US20060267601 Eccentric offset Kelvin probe
11/30/2006	US20060267594 Power generation unit condition monitor using frequency profile analysis
11/30/2006	US20060267593 Potential measuring device and image forming apparatus using the same
11/30/2006	US20060267578 Potential measuring apparatus
11/30/2006	US20060267577 Augmenting semiconductor's devices quality and reliability
11/30/2006	US20060267559 Device and method for driving electric actuator
11/30/2006	US20060267010 Semiconductor device, semiconductor device manufacturing method, and semiconductor device test method
11/30/2006	DE10244131B4 Verfahren zur Unterstützung einer Identifizierung einer defekten Funktionseinheit in einer technischen Anlage A method for supporting an identification of a defective functional unit in an industrial plant
11/30/2006	DE10235788B4 Elektrisches Verbindungssystem für ein Kraftfahrzeug An electrical interconnect system for a motor vehicle
11/30/2006	DE102006024932A1 Test device for examining electronic device, compares expected value and output signals of electronic device, when output header instructing start of comparison of expected and output signals provided by controller is detected
11/30/2006	DE102006024931A1 Mustergenerator und Prüfvorrichtung Pattern generator and tester
11/30/2006	DE102006024721A1 Verfahren zum Prüfen einer elektronischen Schaltung A method of testing an electronic circuit
11/30/2006	DE102006007273A1 Kanalumschaltung Channel switching
11/30/2006	DE102006006314A1 Vorrichtung zur Messung der Stromstärke A device for measuring the current intensity
11/30/2006	DE102005042114B3 Process and device to detect a current-weakening arc in a mains-supplied unit obtain time-dependent signals from current measurement and compare with unit-specific criteria from arc-free and simulation data
11/30/2006	DE102005024648A1 Elektrische Schaltung zum Messen von Zeiten und Verfahren zum Messen von Zeiten Electric circuit for measuring time and method for measuring times
11/30/2006	DE102005024483A1 Verfahren und Vorrichtung zum Ermitteln des Ortes eines Kurzschlusses in einer Leitung eines Energieversorgungsnetzes Method and apparatus for determining the location of a short circuit in a line of an energy supply network
11/30/2006	DE102005024075A1 Verfahren und Vorrichtung zur Messung eines in einem elektrischen Leiter fließenden Stroms Method and device for measuring a current flowing in an electrical conductor
11/30/2006	DE102005023511A1 Motor vehicle`s electronic unit operating method, involves incrementing and decrementing digital counter for long time, until input signals are definitely debounced, and representing condition of debounced input signals
11/30/2006	DE10006144B4 Zeitgeberschaltung und Verfahren zur Erzeugung einer Zeitsteuerung für ein Halbleiterprüfsystem Timer circuit and method for generating a time control for a semiconductor test system
11/30/2006	CA2609547A1 Brushed motor position control based upon back current detection
11/29/2006	EP1727157A1 Safety protective instrumentation system and its handling method
11/29/2006	EP1727040A1 Method, graphical user interface and computer program product for the creations of graphics differentiating from each other for the modification of one or more parameters
11/29/2006	EP1726968A2 A method for local wafer thinning and reinforcement
11/29/2006	EP1725883A1 Diagnostic method for monitoring a plug-in connection
11/29/2006	EP1725882A1 System and method for high voltage testing of twisted insulated conductors
11/29/2006	EP1595156B1 Testing of integrated circuits
11/29/2006	EP1425594B1 Multilevel signal interface testing with binary test apparatus by emulation of multilevel signals
11/29/2006	EP1286168B1 Member exchanger, method of controlling member exchanger, ic inspection method, ic handler, and ic inspector

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