G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2006
12/14/2006	WO2006132113A1 Load calculation control method and apparatus
12/14/2006	WO2006132064A1 Adapter, interface device with the adapter, and electronic component test apparatus
12/14/2006	WO2006131883A1 Visual inspection system and process for electronic modules
12/14/2006	WO2006131678A1 Module for testing electromagnetic compatibility of a high-speed ethernet interface onboard an aircraft
12/14/2006	WO2006131164A1 Method and apparatus for determining the state of charge and/or state of ageing of an energy store
12/14/2006	WO2006110414A3 Rfid device test thresholds systems and methods
12/14/2006	WO2006091652A3 Method and apparatus for constructing a repair path around a non-available component in a data communications network
12/14/2006	WO2006073766A3 Method and apparatus for modulating radio link control (rlc) ack/nak persistence to improve performance of data traffic
12/14/2006	WO2006051550A3 Electrical measurements in samples
12/14/2006	WO2006025870A3 Method of precisely determining the location, and validity of a fault on an electrical transmission system
12/14/2006	WO2006017249A3 Evanescent microwave probe with enhanced resolution and sensitivity
12/14/2006	WO2005109666A3 System and method for generating a jittered test signal
12/14/2006	WO2005106510A3 Apparatus for high speed probing of flat panel displays
12/14/2006	US20060282804 Novel test structure for automatic dynamic negative-bias temperature instability testing
12/14/2006	US20060282736 Test device with test parameter adaptation
12/14/2006	US20060282735 Fasttest module
12/14/2006	US20060282734 Test access control for secure integrated circuits
12/14/2006	US20060282733 Method and apparatus for processor emulation
12/14/2006	US20060282732 Multi-test method for using compare MISR
12/14/2006	US20060282731 Semiconductor integrated circuit and method of testing same
12/14/2006	US20060282730 Semiconductor integrated circuit incorporating test configuration and test method for the same
12/14/2006	US20060282729 Pipelined scan structures for testing embedded cores
12/14/2006	US20060282728 Methods for using checksums in X-tolerant test response compaction in scan-based testing of integrated circuits
12/14/2006	US20060282727 Scan test design method, scan test circuit, scan test circuit insertion cad program, large-scale integrated circuit and mobile digital equipment
12/14/2006	US20060282726 Semiconductor device, and apparatus and method for supporting design of semiconductor device
12/14/2006	US20060282725 Electronic switching circuit, switching circuit test arrangement and method for determining the operativiness of an electronic switching circuit
12/14/2006	US20060282724 Programmatically switched hot-plug PCI slots
12/14/2006	US20060282723 Topology-independent calibration system
12/14/2006	US20060282722 Loop-Back Memory-Module Extender Card for Self-Testing Fully-Buffered Memory Modules
12/14/2006	US20060282721 Semiconductor integrated circuit, and semiconductor system including that semiconductor integrated circuit
12/14/2006	US20060282717 Memory device
12/14/2006	US20060282227 Electronic battery tester with network communication
12/14/2006	US20060282226 Electronic battery tester with relative test output
12/14/2006	US20060281342 Methods Of Making A Interconnect
12/14/2006	US20060281201 Damage evaluation method of compound semiconductor member, production method of compound semiconductor member, gallium nitride compound semiconductor member, and gallium nitride compound semiconductor membrane
12/14/2006	US20060281199 Abnormality cause specifying method, abnormality cause specifying system, and semiconductor device fabrication method
12/14/2006	US20060280224 LED junction temperature tester
12/14/2006	US20060280197 Method and apparatus for transmitting and receiving data over a shared access carrier network
12/14/2006	US20060280119 Weighted proportional-share scheduler that maintains fairness in allocating shares of a resource to competing consumers when weights assigned to the consumers change
12/14/2006	US20060279637 Method and apparatus for inspecting solid-state image pickup device
12/14/2006	US20060279417 Safety device
12/14/2006	US20060279323 Power apparatus for dividing high voltage
12/14/2006	US20060279322 Testing circuit and testing method for liquid crystal display device
12/14/2006	US20060279321 Control system and control method for checking the function of liquid crystal displays
12/14/2006	US20060279320 Non-Abrasive Electrical Test Contact
12/14/2006	US20060279319 Electronic component test system
12/14/2006	US20060279318 Semiconductor device for reducing soft error rate with reduced power consumption
12/14/2006	US20060279317 Test apparatus capable of accurately connecting a test object to a substrate
12/14/2006	US20060279316 Surface-mounted electrical connector
12/14/2006	US20060279315 Semiconductor device and method for manufacturing semiconductor device
12/14/2006	US20060279314 Test supporting device and method of testing using the same
12/14/2006	US20060279313 Test circuit, electro-optical device, and electronic apparatus
12/14/2006	US20060279312 Mini wave soldering system and method for soldering wires and pin configurations
12/14/2006	US20060279311 Semiconductor wafer metrology apparatus and methods
12/14/2006	US20060279310 Method and system for monitoring test signals for semiconductor devices
12/14/2006	US20060279309 Method and storage device for testing A V-Chip
12/14/2006	US20060279308 Electronic device having an interface supported testing mode
12/14/2006	US20060279307 Automatic testing apparatus and method
12/14/2006	US20060279306 Test equipment of semiconductor devices
12/14/2006	US20060279305 Semiconductor test interface
12/14/2006	US20060279304 Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus
12/14/2006	US20060279303 Manufacturing method for semiconductor device
12/14/2006	US20060279302 Probe card and method for using probe card, wafer prober utilizing same
12/14/2006	US20060279301 Electrical contact probe with compliant internal interconnect
12/14/2006	US20060279300 Probe Card Assembly And Kit
12/14/2006	US20060279299 High frequency probe
12/14/2006	US20060279298 Measurement method for compensation and verification
12/14/2006	US20060279297 Contactless area testing apparatus and method utilizing device switching
12/14/2006	US20060279291 Mobile testing device
12/14/2006	US20060279289 Battery Gas Gauge
12/14/2006	US20060279287 Query based electronic battery tester
12/14/2006	US20060279286 Safety-protective changeover switch of a high voltage tester
12/14/2006	US20060279275 Signal measurement systems and methods
12/14/2006	US20060279274 Sampling apparatus, and testing apparatus
12/14/2006	US20060279273 Measuring method for electromagnetic field intensity and apparatus therefor, measuring method for electromagnetic field intensity distribution and apparatus therefor, measuring method for current and voltage distributions and apparatus therefor
12/14/2006	US20060279272 Method for determining the frequency response of an electrooptical component
12/14/2006	US20060279003 Semiconductor device having an alignment mark formed by the same material with a metal post
12/14/2006	DE112005000275T5 Messgerät, Verfahren, Programm und Speichermedium Instrument, method, program, and storage medium
12/14/2006	DE10246111B4 Vorrichtung und Verfahren zur Diagnose eines Schwingkreises Apparatus and method for diagnosing a resonant circuit
12/14/2006	DE102006003584A1 Halbleiter-Testschnittstelle A semiconductor test interface
12/14/2006	DE102006002472A1 Signalsonde und Sondenanordnung Signal probe and probe assembly
12/14/2006	DE102005026077A1 Verfahren und Vorrichtung zum Bestimmen des Ladungs- und/oder Alterungszustands eines Energiespeichers Method and device for determining the charge and / or aging state of an energy store
12/14/2006	CA2611177A1 Device forming a logic gate for detecting a logic error
12/14/2006	CA2610968A1 Module for testing electromagnetic compatibility of a high-speed ethernet interface onboard an aircraft
12/14/2006	CA2610426A1 Load calculation control method and apparatus
12/13/2006	EP1732120A1 Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method
12/13/2006	EP1732083A1 Reducing false positives in configuration error detection for programmable devices
12/13/2006	EP1731915A1 Arc fault circuit interrupter test circuit
12/13/2006	EP1731899A1 System and apparatus for optical control of electronic modules
12/13/2006	EP1730940A1 Electrical wire joint fault detection
12/13/2006	EP1730541A2 Method of testing an electrochemical device
12/13/2006	EP1730540A2 Cooling devices and methods of using them
12/13/2006	EP1730539A2 Built-in self test method and apparatus for jitter transfer, jitter tolerance, and fifo data buffer
12/13/2006	EP1629447A4 Input voltage sense circuit in a line powered network element
12/13/2006	EP1613970A4 Method of restoring encapsulated integrated circuit devices
12/13/2006	EP1546739B1 Rf chip testing method and system
12/13/2006	EP1446675B1 Determining electrical faults on undergrounded power systems using directional element
12/13/2006	EP0969289B1 Testing the functional blocks in a semiconductor integrated circuit
12/13/2006	CN2847399Y Chargeable position lamp caller for helf
12/13/2006	CN2847309Y Flat plate semiconductor device steady-state thermal resistance detector

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