G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2006
10/17/2006	US7124347 Cyclic redundancy checking of a field programmable gate array having an SRAM memory architecture
10/17/2006	US7124342 Smart capture for ATPG (automatic test pattern generation) and fault simulation of scan-based integrated circuits
10/17/2006	US7124341 Integrated circuit having electrically isolatable test circuitry
10/17/2006	US7124340 Low pin count, high-speed boundary scan testing
10/17/2006	US7124339 Scan path circuit and semiconductor integrated circuit comprising the scan path circuit
10/17/2006	US7124338 Methods of testing interconnect lines in programmable logic devices using partial reconfiguration
10/17/2006	US7124336 Method for the defect analysis of memory modules
10/17/2006	US7124335 Apparatus and method for testing MEGACO protocol
10/17/2006	US7124334 Test circuit and test method for communication system
10/17/2006	US7124274 Virtual to physical memory address mapping within a system having a secure domain and a non-secure domain
10/17/2006	US7124187 Routing of bandwidth guaranteed paths with restoration in an information network
10/17/2006	US7124070 Method of and apparatus for, and program for verifying equivalence between behavioral description and register transfer level description
10/17/2006	US7124050 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture
10/17/2006	US7124040 Method of monitoring a fuel cell unit
10/17/2006	US7124003 Diagnostics device for testing electrical circuits of a recreational vehicle
10/17/2006	US7123587 System, device and method for limiting tunnel traffic in an information communication network
10/17/2006	US7123586 Bandwidth sharing between devices in a communication system
10/17/2006	US7123585 Cross-bar switch with bandwidth allocation
10/17/2006	US7123584 Digital subscriber line user capacity estimation
10/17/2006	US7123581 Method and apparatus to switch data flows using parallel switch fabrics
10/17/2006	US7123527 Redundancy fuse circuit
10/17/2006	US7123155 Operational mode-based battery monitoring for a battery-powered electronic device
10/17/2006	US7123136 Indicator system having multiple LEDs
10/17/2006	US7123104 System and method for measuring current
10/17/2006	US7123058 Signal detecting circuit and method therefor
10/17/2006	US7123044 Testing method, semiconductor device, and display apparatus
10/17/2006	US7123043 Method and apparatus for testing driver circuits of AMOLED
10/17/2006	US7123042 Methods, apparatus and systems for wafer-level burn-in stressing of semiconductor devices
10/17/2006	US7123041 LSI inspection method and defect inspection data analysis apparatus
10/17/2006	US7123040 System and method for check-in control in wafer testing
10/17/2006	US7123039 Testing input/output voltages in integrated circuits
10/17/2006	US7123038 Method and apparatus for performing on-chip sampling over an extended voltage range
10/17/2006	US7123037 Integrated circuit temperature sensing device and method
10/17/2006	US7123036 Test method for electronic modules
10/17/2006	US7123035 Optics landing system and method therefor
10/17/2006	US7123034 Contactor assembly for common grid array devices
10/17/2006	US7123022 Method and apparatus for non-contact testing and diagnosing electrical paths through connectors on circuit assemblies
10/17/2006	US7123021 Method and device for diagnosis of a sensor
10/17/2006	US7123020 System and method of fault detection in a warm air furnace
10/17/2006	US7123018 Switching status determination device and method for determining switching status
10/17/2006	US7122970 Method for testing OLED substrate and OLED display
10/17/2006	US7122888 Semiconductor device, electrical inspection method thereof, and electronic apparatus including the semiconductor device
10/17/2006	US7122829 Probe look ahead: testing parts not currently under a probehead
10/17/2006	US7122389 Method for processing semiconductor devices in a singulated form
10/17/2006	US7121721 Apparatus and method for measuring operating temperatures of an electrical component
10/17/2006	US7121132 Method for calibrating semiconductor test instruments
10/17/2006	CA2433633C Apparatus and method for testing and charging a power source with ethernet
10/17/2006	CA2338207C Mobile communication unit with bone conduction speaker
10/17/2006	CA2257920C Differential touch sensors and control circuit therefor
10/12/2006	WO2006107885A2 Method and apparatus for admission control and resource tracking in a wireless communication system
10/12/2006	WO2006107574A2 Assigning resources to items such as processing contexts for processing packets
10/12/2006	WO2006107544A1 Method for determining capacity of lead-acid batteries of various specific gravities
10/12/2006	WO2006107395A2 Method of selecting a profile of a broadband communication line
10/12/2006	WO2006107247A1 Method and apparatus for determining a replacement time of an electric battery
10/12/2006	WO2006106681A1 Device for managing vehicle-mounted battery
10/12/2006	WO2006106626A1 Semiconductor logic circuit device test method and test program
10/12/2006	WO2006106618A1 Contact probe
10/12/2006	WO2006106163A1 Low-voltage dip generator device
10/12/2006	WO2006106111A1 Sensor system
10/12/2006	WO2006065701A3 Interleaved mems-based probes for testing integrated circuits
10/12/2006	WO2006039581A3 Electrical safety cord
10/12/2006	WO2005032030A3 Tristate requests for flexible packet retransmission
10/12/2006	US20060230369 Interface configurable for use with target/initiator signals
10/12/2006	US20060230326 Method for re-using test cases through standardization and modularity
10/12/2006	US20060229832 Method and system for charging management
10/12/2006	US20060229829 Method and system for the validating fault symptoms
10/12/2006	US20060229795 Method for the diagnosis of driver outputs and diagnosis pulse manager
10/12/2006	US20060228926 Socket for semiconductor device
10/12/2006	US20060228916 Socket for semiconductor device
10/12/2006	US20060228915 Socket for semiconductor device
10/12/2006	US20060228818 Edge temperature compensation in thermal processing particularly useful for SOI wafers
10/12/2006	US20060228817 Dispensable capacitor manufacturing process
10/12/2006	US20060227734 Using receive diversity to extend standby time in QPCH mode
10/12/2006	US20060226866 Display apparatus and inspection method
10/12/2006	US20060226865 Automatic defect repair system
10/12/2006	US20060226864 Expeditious and low cost testing of RFID ICs
10/12/2006	US20060226863 Method and apparatus to adjust die frequency
10/12/2006	US20060226862 Method of increasing reliability of packaged semiconductor integrated circuit dice
10/12/2006	US20060226861 Flexible circuit board
10/12/2006	US20060226860 Compensation board for measurement using prober, program and recording media therefor
10/12/2006	US20060226853 Test converting card and test apparatus thereof
10/12/2006	US20060226852 Arc fault detector
10/12/2006	US20060226851 Conductor inspection apparatus and conductor inspection method
10/12/2006	US20060226850 Ground circuit impedance measurement
10/12/2006	US20060226849 Method and device for detecting a current
10/12/2006	US20060226848 Mass-production LED test device for mass production
10/12/2006	US20060226847 Defect analysis using a yield vehicle
10/12/2006	US20060226846 Trouble sensing device
10/12/2006	US20060226843 Methods and apparatus for battery monitoring, characterisation and reserve time estimation
10/12/2006	US20060226829 Shield for tester load boards
10/12/2006	US20060226828 Automated tray transfer device for prevention of mixing post and pre-test dies, and method of using same
10/12/2006	DE202006009618U1 Probe for e.g. integrated circuit, has contact tips located within periphery of coaxial cable and shielded by ground conductor of coaxial cable, where coaxial cable terminates in oblique terminal section
10/12/2006	DE19639515B4 Anordnung zum Kalibrieren eines Netzwerkanalysators für die On-Wafer-Messung an integrierten Mikrowellenschaltungen Arrangement for calibrating a network analyzer for on-wafer measurement of integrated microwave circuits
10/12/2006	DE19525747B4 Verfahren und Konstruktion zur Erkennung von Fehlern in Lanzen The method and structure for detecting defects in lances
10/12/2006	DE112004002308T5 Sicherheitssystem für Differentialschaltung auf der Basis eines Strommessschemas Safety system for differential circuit on the basis of a current measuring scheme
10/12/2006	DE10349368B4 Verfahren zum Bestimmen eines Frequenzverhaltens eines elektrischen Bauelements und Anordnung zur Durchführung des Verfahrens A method of determining a frequency response of an electrical component and device for carrying out the method
10/12/2006	DE102005016065A1 Test control unit for test body, has electrode filled with electrolyte connecting isolation section with electrode and measuring device detecting current flowing through electrode, a voltage that drops between electrode and body and power
10/12/2006	DE102005015620A1 Electrical energy storage unit e.g. accumulator unit, for e.g. mobile cordless equipment, has voltage generator circuit providing supply voltage based on internal supply voltage in contacts of load, where supply voltage is required by load
10/12/2006	CA2602505A1 Method of monitoring a power distribution unit
10/11/2006	EP1710895A2 Method and device for providing the air coolant temperature of an air cooled vehicle alternator

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