| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/21/2006 | US20060285486 Multiple endpoint protection using SPVCs |
| 12/21/2006 | US20060284647 Sensor apparatus |
| 12/21/2006 | US20060284646 Liquid-crystal display device, defective pixel examination method, defective pixel examination program, and storage medium |
| 12/21/2006 | US20060284645 Liquid crystal display panel test apparatus |
| 12/21/2006 | US20060284644 Collecting information to identify defective locations of a display monitor |
| 12/21/2006 | US20060284643 Method for inspecting array substrates |
| 12/21/2006 | US20060284642 Method of inspecting array substrate and method of manufacturing array substrate |
| 12/21/2006 | US20060284641 Multi-signal input testing apparatus |
| 12/21/2006 | US20060284640 Structure of circuit board and method for fabricating the same |
| 12/21/2006 | US20060284639 Methods and systems for guarding a charge transfer capacitance sensor for proximity detection |
| 12/21/2006 | US20060284638 Continuity tester adaptors |
| 12/21/2006 | US20060284637 Circuit for compression and storage of circuit diagnosis data |
| 12/21/2006 | US20060284636 Adjustment and display of stored parameters |
| 12/21/2006 | US20060284635 Re-routing method and the circuit thereof |
| 12/21/2006 | US20060284634 Testing assembly for electrical test of electronic package and testing socket thereof |
| 12/21/2006 | US20060284633 Thin film transistor array panel with improved connection to test lines |
| 12/21/2006 | US20060284632 Portable multi-purpose toolkit for testing computing device hardware and software |
| 12/21/2006 | US20060284631 Imaging test socket, system, and method of testing an image sensor device |
| 12/21/2006 | US20060284630 Membrane probing system |
| 12/21/2006 | US20060284629 Wafer-level tester with magnet to test latching micro-magnetic switches |
| 12/21/2006 | US20060284621 Method for calibrating timing clock |
| 12/21/2006 | US20060284620 Simultaneous measurement of contact potential and slider body clearance in a magnetic disk drive |
| 12/21/2006 | US20060284564 Method and device for ballast management in particular for a motor vehicle headlamp |
| 12/21/2006 | US20060284174 Arrangement for testing semiconductor chips while incorporated on a semiconductor wafer |
| 12/21/2006 | US20060284087 Defect inspection and changed particle beam apparatus |
| 12/21/2006 | DE112004001739T5 Halbleiterschalter-Schaltung Semiconductor switch circuit |
| 12/21/2006 | DE102005051494A1 Integrated interface circuitry for use in analog-digital circuits has data input provided before each of two separate, clock-controlled signal paths leading to corresponding outputs |
| 12/21/2006 | DE102005028184A1 Drive and monitoring circuit for bridge circuit load e.g. for vehicle technology, has self-diagnosis circuit with store for electrical charge and self-diagnosis program |
| 12/21/2006 | DE102005026597A1 Rechargeable battery charge state determination method for vehicle, entails carrying out mathematical inversion of Preisach model after defining off-load voltage of battery, and from this calculating actual charge state of battery |
| 12/20/2006 | EP1734392A2 Laser production and product qualification via accelerated life testing based on statistical modeling |
| 12/20/2006 | EP1734375A1 Circuit for compacting and storing circuit test responses |
| 12/20/2006 | EP1734374A1 Method for testing a wafer, in particular hall-magnetic field sensor and wafer or hall sensor, respectively |
| 12/20/2006 | EP1734373A2 Measurement method using solar simulator |
| 12/20/2006 | EP1734372A1 Drive for actuating a moveable wing, particularly for a door |
| 12/20/2006 | EP1733337A2 Radio frequency identification tag inlay sortation and assembly |
| 12/20/2006 | EP1733335A2 Radio frequency identification of a connector by a patch panel or other similar structure |
| 12/20/2006 | EP1733244A1 Battery state of charge estimator |
| 12/20/2006 | EP1697805A4 Controlled process gas pressure decay at shut down |
| 12/20/2006 | EP1362391B1 Terminal connector |
| 12/20/2006 | EP1218887B1 Method and apparatus for supplying regulated power to memory device components |
| 12/20/2006 | CN2849862Y Windage yaw angle monitor for isolator string |
| 12/20/2006 | CN2849740Y Power testing adapter |
| 12/20/2006 | CN2849739Y 电池测试器 Battery tester |
| 12/20/2006 | CN2849738Y Number quantity detecting circuitboard capable of warning connecting cable damage |
| 12/20/2006 | CN2849737Y Monitor for fair wind vibration of power transmission line of high-voltage power extraction supply |
| 12/20/2006 | CN2849736Y System for detecting large grounding network of power plant and transformer substation |
| 12/20/2006 | CN2849735Y Transformer operating wave induction withstand voltage tester |
| 12/20/2006 | CN2849734Y Microwave chip tester |
| 12/20/2006 | CN2849733Y Microwave signal detector |
| 12/20/2006 | CN2849732Y Circuit for testing matching character of energy storage element |
| 12/20/2006 | CN2849731Y Apparatus for testing reactance parameter of permanent-magnetic electric machine based on small DC attenuation method |
| 12/20/2006 | CN2849716Y Checking appliance for miss packing of metal mosaic |
| 12/20/2006 | CN2849663Y Testing controlling box |
| 12/20/2006 | CN1883153A Clock recovery circuit and communication device |
| 12/20/2006 | CN1883116A 可变延迟电路 The variable delay circuit |
| 12/20/2006 | CN1883097A Method for calculating power capability of battery packs using advanced cell model predictive techniques |
| 12/20/2006 | CN1883016A Jig for installation inspection |
| 12/20/2006 | CN1882844A Inspection signal supply device and inspection signal application method |
| 12/20/2006 | CN1882137A Mobile communication terminal capable of displaying charging state and method of displaying charging state |
| 12/20/2006 | CN1881389A Liquid-crystal display device, defective pixel examination method, defective pixel examination program, and storage medium |
| 12/20/2006 | CN1880967A Apparatus and method for detecting voltage of assembled battery |
| 12/20/2006 | CN1880966A Wireless electromagnetic induction system and method for indicating battery level |
| 12/20/2006 | CN1880965A Power transmission line break monitoring and alarming device |
| 12/20/2006 | CN1880964A Detector and detection method employing the same |
| 12/20/2006 | CN1880962A Compensation coil device for high temperature superconductive magnet test |
| 12/20/2006 | CN1291621C Mobile communication terminal and method of nitifying clinent when its low voltage state |
| 12/20/2006 | CN1291471C Device test apparatus and test method |
| 12/20/2006 | CN1291365C Active matrix substrate, making method and image displaying device |
| 12/20/2006 | CN1291316C Method and processor for managing state information in processor |
| 12/20/2006 | CN1291236C Battery management circuit and electronic machine |
| 12/20/2006 | CN1291235C Socket for electronic component test and electronic component test apparatus using the socket |
| 12/20/2006 | CN1291234C Printed board checking apparatus |
| 12/20/2006 | CN1291233C Fault diagnosis method for transformer winding |
| 12/19/2006 | US7152195 Scan test circuit |
| 12/19/2006 | US7152194 Method and circuit for scan testing latch based random access memory |
| 12/19/2006 | US7152193 Embedded sequence checking |
| 12/19/2006 | US7152176 Dynamic resynchronization of clocked interfaces |
| 12/19/2006 | US7152115 Virtual private networks |
| 12/19/2006 | US7152012 Four point measurement technique for programmable impedance drivers RapidChip and ASIC devices |
| 12/19/2006 | US7151781 System and method for providing session admission control |
| 12/19/2006 | US7151751 Traffic generation apparatus suitable for use in communication experiments |
| 12/19/2006 | US7151744 Multi-service queuing method and apparatus that provides exhaustive arbitration, load balancing, and support for rapid port failover |
| 12/19/2006 | US7151742 Flow control for communication ring access control |
| 12/19/2006 | US7151713 Semiconductor memory device |
| 12/19/2006 | US7151655 Electrostatic discharge (ESD) detector |
| 12/19/2006 | US7151389 Dual channel source measurement unit for semiconductor device testing |
| 12/19/2006 | US7151388 Method for testing semiconductor devices and an apparatus therefor |
| 12/19/2006 | US7151387 Analysis module, integrated circuit, system and method for testing an integrated circuit |
| 12/19/2006 | US7151386 Apparatus for testing integrated circuit chips |
| 12/19/2006 | US7151385 Contact probe, method of manufacturing the contact probe, and device and method for inspection |
| 12/19/2006 | US7151384 Probe device and display substrate testing apparatus using same |
| 12/19/2006 | US7151367 Method of measuring duty cycle |
| 12/19/2006 | US7151366 Integrated process condition sensing wafer and data analysis system |
| 12/19/2006 | US7151003 Semiconductor wafer test system |
| 12/19/2006 | US7150203 Manipulator for positioning a test head |
| 12/14/2006 | WO2006133106A2 System and methods for functional testing of embedded processor-based systems |
| 12/14/2006 | WO2006132734A2 Compensating for loss in a transmission path |
| 12/14/2006 | WO2006132490A1 In-tray inspection apparatus and method of semiconductor package |
| 12/14/2006 | WO2006132329A1 Microcomputer and method for testing the same |
| 12/14/2006 | WO2006132243A1 Inspection device |