| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/04/2006 | CN1841076A Remote integrated circuit testing method and apparatus |
| 10/04/2006 | CN1841075A Semiconductor device and method for testing semiconductor device |
| 10/04/2006 | CN1841074A Fault arc detection method and protection circuit thereof |
| 10/04/2006 | CN1841038A Apparatus and method for autotest of key |
| 10/04/2006 | CN1840402A Pallet for liquid crystal module |
| 10/04/2006 | CN1278421C Semiconductor devices |
| 10/04/2006 | CN1278352C Three-phase operating box |
| 10/04/2006 | CN1278275C Runcard management system and method for semiconductor manufacture |
| 10/04/2006 | CN1278131C Checking device for display unit, driving signal supply device and checking system for display unit |
| 10/04/2006 | CN1278130C Pusher and electronic part-testing apparatus with the same |
| 10/04/2006 | CN1278129C Boundary scanning method and device |
| 10/04/2006 | CN1278128C Method for checking linewidth of power wire in wiring overall arrangement |
| 10/04/2006 | CA2504779A1 Control of manufacturing processes for chemically cross linked polethylene insulated electric cables and for other products using chemically cross linked polyethylene |
| 10/03/2006 | US7117463 Verification of digital circuitry using range generators |
| 10/03/2006 | US7117416 Method and apparatus to facilitate self-testing of a system on chip |
| 10/03/2006 | US7117415 Automated BIST test pattern sequence generator software system and method |
| 10/03/2006 | US7117414 Method for identifying an integrated circuit |
| 10/03/2006 | US7117413 Wrapped core linking module for accessing system on chip test |
| 10/03/2006 | US7117412 Flip-flop circuit for capturing input signals in priority order |
| 10/03/2006 | US7117411 Methods and systems for testing communications network components |
| 10/03/2006 | US7117410 Distributed failure analysis memory for automatic test equipment |
| 10/03/2006 | US7117406 Semiconductor memory device and method of testing same |
| 10/03/2006 | US7117404 Test circuit for testing a synchronous memory circuit |
| 10/03/2006 | US7117403 Method and device for generating digital signal patterns |
| 10/03/2006 | US7117402 Background block erase check for flash memories |
| 10/03/2006 | US7117394 Built-in self-test circuit |
| 10/03/2006 | US7117319 Managing processor architected state upon an interrupt |
| 10/03/2006 | US7117274 Graphical user interface and approach therefor |
| 10/03/2006 | US7117106 System and method for alarm recovery for an electrolyzer cell module |
| 10/03/2006 | US7117105 Method and apparatus for ground fault protection |
| 10/03/2006 | US7117063 Sorting a group of integrated circuit devices for those devices requiring special testing |
| 10/03/2006 | US7116817 Method and apparatus for inspecting a semiconductor device |
| 10/03/2006 | US7116774 Method and device for routing messages in SS7 networks |
| 10/03/2006 | US7116742 Timing recovery system for a multi-pair gigabit transceiver |
| 10/03/2006 | US7116638 Method for identifying mis-optioned data communications circuits |
| 10/03/2006 | US7116637 System and method for diagnosing a POTS port |
| 10/03/2006 | US7116604 Semiconductor memory device and method for selecting multiple word lines in a semiconductor memory device |
| 10/03/2006 | US7116592 Semiconductor device and test method thereof |
| 10/03/2006 | US7116125 Semiconductor test device using leakage current and compensation system of leakage current |
| 10/03/2006 | US7116124 Apparatus to prevent damage to probe card |
| 10/03/2006 | US7116123 Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured |
| 10/03/2006 | US7116122 Method for ball grid array chip packages having improved testing and stacking characteristics |
| 10/03/2006 | US7116121 Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts |
| 10/03/2006 | US7116120 Clamping test fixture for a high frequency miniature probe assembly |
| 10/03/2006 | US7116119 Probe card with coplanar daughter card |
| 10/03/2006 | US7116118 Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability |
| 10/03/2006 | US7116115 Micromachined probe apparatus and methods for making and using same to characterize liquid in a fluidic channel and map embedded charge in a sample on a substrate |
| 10/03/2006 | US7116114 Power supply noise measuring device |
| 10/03/2006 | US7116112 Apparatus for testing electric cables |
| 10/03/2006 | US7116111 System and method for providing a time varying gain TDR to display abnormalities of a communication cable or the like |
| 10/03/2006 | US7116110 Sensorless protection for electronic device |
| 10/03/2006 | US7116109 Apparatus and method for simulating a battery tester with a fixed resistance load |
| 10/03/2006 | US7115838 Unit for varying a temperature of a test piece and testing instrument incorporating same |
| 10/03/2006 | US7115210 Measurement to determine plasma leakage |
| 10/03/2006 | US7114556 Burn-in oven heat exchanger having improved thermal conduction |
| 10/03/2006 | US7114249 Substrate inspecting method and substrate inspecting apparatus using the method |
| 10/03/2006 | CA2273888C Sealless pump rotor position and bearing monitor |
| 09/29/2006 | CA2541023A1 Method of detecting the position of a wave front in a signal received by a detector |
| 09/28/2006 | WO2006102419A2 Automated electrical wiring inspection system |
| 09/28/2006 | WO2006102358A1 Method and system for detecting faults in an electronic engine control module |
| 09/28/2006 | WO2006102325A1 Simultaneous core testing in multi-core integrated circuits |
| 09/28/2006 | WO2006102284A2 Optimized jtag interface |
| 09/28/2006 | WO2006102241A1 Integrated circuit testing module |
| 09/28/2006 | WO2006101984A2 Internally generating patterns for testing in an integrated circuit device |
| 09/28/2006 | WO2006101836A2 Fpga emulation system |
| 09/28/2006 | WO2006100992A1 Power supply apparatus with function of detecting abnormality of current sensor |
| 09/28/2006 | WO2006100959A1 Test device, test method, and test control program |
| 09/28/2006 | WO2006100533A1 Method for race prevention and a device having race prevention capabilities |
| 09/28/2006 | WO2006100270A1 A method and device for battery capacity calculation using shift of measurement range |
| 09/28/2006 | WO2006100216A1 Method for controlling a portable electronic device comprising a power storage device |
| 09/28/2006 | WO2006069309A3 Contactless wafer level burn-in |
| 09/28/2006 | WO2006039395A3 Method for testing semiconductor devices and an apparatus therefor |
| 09/28/2006 | WO2005072156A3 Patch panel system |
| 09/28/2006 | US20060218456 Automatic test equipment operating architecture |
| 09/28/2006 | US20060218455 Integrated circuit margin stress test system |
| 09/28/2006 | US20060218454 Circuit automatic generation apparatus and method |
| 09/28/2006 | US20060218452 Area efficient BIST system for memories |
| 09/28/2006 | US20060217914 Battery testers with secondary functionality |
| 09/28/2006 | US20060216962 Small contactor pin |
| 09/28/2006 | US20060216857 Chip-scale package for integrated circuits |
| 09/28/2006 | US20060216841 Method, system and computer-readable code for testing of flash memory |
| 09/28/2006 | US20060216839 Method for monitoring chamber cleanliness |
| 09/28/2006 | US20060216838 Substrate, micro structure, method of making reference scale, and method of measuring length of micro structure |
| 09/28/2006 | US20060215973 Detector detecting transmission performance of optical composite cable |
| 09/28/2006 | US20060215563 Method and apparatus for delayed recovery for block acknowledgement bursting in a wireless network |
| 09/28/2006 | US20060214724 Semiconductor integrated circuit device, and adjustment method of semiconductor integrated circuit device |
| 09/28/2006 | US20060214680 Method and apparatus for determining the thickness of a dielectric layer |
| 09/28/2006 | US20060214679 Active diagnostic interface for wafer probe applications |
| 09/28/2006 | US20060214678 Front-wing cantilever for the conductive probe of electrical scanning probe microscopes |
| 09/28/2006 | US20060214677 Probe for combined signals |
| 09/28/2006 | US20060214676 Membrane probing system with local contact scrub |
| 09/28/2006 | US20060214675 Resilient probes for electrical testing |
| 09/28/2006 | US20060214674 Apparatus, system and method for testing electronic elements |
| 09/28/2006 | US20060214673 Intrument for testing solid-state imaging device |
| 09/28/2006 | US20060214670 Arc fault detector and method |
| 09/28/2006 | US20060214669 Method of testing documents provided with optico-diffractively effective markings |
| 09/28/2006 | US20060214668 Arc fault detector |
| 09/28/2006 | US20060214667 Power supply system |
| 09/28/2006 | US20060214655 Handler for testing semiconductor devices |
| 09/28/2006 | US20060214276 Systems and methods for testing packaged dies |