Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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11/29/2006 | EP1104145B1 Mobile communication unit with bone conduction speaker |
11/29/2006 | CN2843017Y Fixing device |
11/29/2006 | CN2842445Y Power supply parameter testing system |
11/29/2006 | CN2842444Y Electricity leakage detection acting mechanism of current breaker |
11/29/2006 | CN2842443Y High-voltage-resisting detecting apparatus |
11/29/2006 | CN2842442Y Automatic detecting apparatus for oil charged-degree of trans former |
11/29/2006 | CN2842441Y Earth-line detecting and converting apparatus |
11/29/2006 | CN2842440Y Electromagnet performance testing device for electromagnetic valve |
11/29/2006 | CN2842439Y High-voltage output circuit for voltage-resisting detecting instrument |
11/29/2006 | CN2842438Y Circuid polarity detecting pen |
11/29/2006 | CN2842437Y Real-time emulational liquid-crystal module detecting apparatus |
11/29/2006 | CN2842436Y Automatic detecting apparatus for focusing potentiometer ceramic substrate |
11/29/2006 | CN2842429Y Direct-measuring type apparatus |
11/29/2006 | CN2842428Y Winding beard-needling detachable PCB tester converting board |
11/29/2006 | CN2842367Y Device for measuring thickness of cell |
11/29/2006 | CN1871801A Enhanced uplink operation in soft handover |
11/29/2006 | CN1871523A Insulation degradation diagnosis apparatus |
11/29/2006 | CN1871522A Method for forming photo-defined micro electrical contacts |
11/29/2006 | CN1871521A Isolation buffers with controlled equal time delays |
11/29/2006 | CN1871429A Method for diagnosis in a fuel injection device comprising a piezoactuator |
11/29/2006 | CN1870798A 通信终端 Communication terminal |
11/29/2006 | CN1870378A Travelling wave identification method of superhigh voltage DC line fault |
11/29/2006 | CN1870093A Albinism detecting and handling method of mobile communication terminal display |
11/29/2006 | CN1869728A Aging testing method and device for power-supply device |
11/29/2006 | CN1869727A Method for testing voltage of stand-by battery |
11/29/2006 | CN1869726A AC dynamo position contact testing circuit and method |
11/29/2006 | CN1869725A Relay correction method and its device |
11/29/2006 | CN1869724A Method of inspecting electronic circuit |
11/29/2006 | CN1869723A Vector generating method for testing plate sequence circuit |
11/29/2006 | CN1869722A Channel switching circuit |
11/29/2006 | CN1869721A Chip information managing method, chip information managing system, and chip information managing program |
11/29/2006 | CN1869720A Testing method and circuit of current voltage property |
11/29/2006 | CN1869719A On-line monitoring method for winding turn-to-turn short-circuit of distribution generator stator based on multi-criterion mixing |
11/29/2006 | CN1869718A System and method for testing electric property of fan |
11/29/2006 | CN1869713A Differential measurement probe having retractable double cushioned variable spacing probing tips with EOS/ESD protection capabilities |
11/29/2006 | CN1869712A Differential measurement probe having a ground clip system for the probing tips |
11/29/2006 | CN1869711A Probe assembly with multi-directional freedom of motion and mounting assembly therefor |
11/29/2006 | CN1287527C Method and apparatus for adjusting the phase of input/ output circuitry |
11/29/2006 | CN1287461C Screen read-only memory testing element and method |
11/29/2006 | CN1287436C Test tray with carrier assembly for semiconductor device processing machine |
11/29/2006 | CN1287157C Method for determining load of contact device |
11/29/2006 | CN1287149C Tester and testing method for cement-base material cracking and contracting characteristics |
11/28/2006 | US7143372 Apparatus measuring system-on-a-chip efficiency and method thereof |
11/28/2006 | US7143371 Critical area computation of composite fault mechanisms using voronoi diagrams |
11/28/2006 | US7143327 Method and system for compressing repetitive data, in particular data used in memory device testing |
11/28/2006 | US7143326 Test system algorithmic program generators |
11/28/2006 | US7143325 Method for testing circuit units to be tested by means of majority decisions and test device for performing the method |
11/28/2006 | US7143324 System and method for automatic masking of compressed scan chains with unbalanced lengths |
11/28/2006 | US7143323 High speed capture and averaging of serial data by asynchronous periodic sampling |
11/28/2006 | US7143322 Arrangement and method of testing an integrated circuit |
11/28/2006 | US7143229 Single-chip microcomputer with dynamic burn-in test function and dynamic burn-in testing method therefor |
11/28/2006 | US7143222 Adaptive message delivery system |
11/28/2006 | US7143019 Maintaining data integrity within a distributed simulation environment |
11/28/2006 | US7143018 Non-redundant collection of harvest events within a batch simulation farm network |
11/28/2006 | US7142998 Clock skew measurement circuit on a microprocessor die |
11/28/2006 | US7142996 Operating voltage determination for an integrated circuit |
11/28/2006 | US7142995 Method for reading battery status by operation system of portable computer |
11/28/2006 | US7142992 Flexible hybrid defect classification for semiconductor manufacturing |
11/28/2006 | US7142640 Method and system of remotely restoring communication lines |
11/28/2006 | US7142623 On-chip system and method for measuring jitter tolerance of a clock and data recovery circuit |
11/28/2006 | US7142508 System and method for controlling data transfer rates on a network |
11/28/2006 | US7142504 Fault tolerant network traffic management |
11/28/2006 | US7142472 Semiconductor memory device and method for testing same |
11/28/2006 | US7142403 Method for detection of a ground fault, which occurs in the vicinity of a neutral point in an electrical device, as well as an apparatus for carrying out the method |
11/28/2006 | US7142291 Detection of partial discharge or arcing in wiring via fiber optics |
11/28/2006 | US7142064 SRAM ring oscillator |
11/28/2006 | US7142031 Delay device, semiconductor testing device, semiconductor device, and oscilloscope |
11/28/2006 | US7142023 Voltage detection circuit |
11/28/2006 | US7142010 Programmable logic device including multipliers and configurations thereof to reduce resource utilization |
11/28/2006 | US7142003 Test apparatus |
11/28/2006 | US7142002 Test handler emulation |
11/28/2006 | US7142001 Packaged circuit module for improved installation and operation |
11/28/2006 | US7142000 Mounting spring elements on semiconductor devices, and wafer-level testing methodology |
11/28/2006 | US7141999 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe |
11/28/2006 | US7141998 Method and apparatus for burn-in optimization |
11/28/2006 | US7141997 Method for testing using a universal wafer carrier for wafer level die burn-in |
11/28/2006 | US7141996 Flip chip test structure |
11/28/2006 | US7141995 Semiconductor manufacturing device and semiconductor manufacturing method |
11/28/2006 | US7141993 Interface apparatus for integrated circuit testing |
11/28/2006 | US7141992 Method for measuring impurity metal concentration |
11/28/2006 | US7141986 Using time domain reflectometry to detect mismatched cable/connector interface |
11/28/2006 | US7141984 Switching circuit for current measurement range resistor and current measurement apparatus including switching circuit |
11/28/2006 | US7141960 Method and device system for testing electrical components |
11/28/2006 | US7141440 Apparatus and method for measuring a property of a layer in a multilayered structure |
11/28/2006 | US7140883 Contact carriers (tiles) for populating larger substrates with spring contacts |
11/23/2006 | WO2006124878A2 Method for achieving virtual resolution enhancement of a diagnostic imaging modality by using coupled fea analyses |
11/23/2006 | WO2006124563A2 Compliant pad wafer chuck |
11/23/2006 | WO2006124486A1 Self-test circuitry to determine minimum operating voltage |
11/23/2006 | WO2006124415A2 Porcelain enamel having a metallic appearance |
11/23/2006 | WO2006124282A1 Method and apparatus for testing rfid devices |
11/23/2006 | WO2006123553A1 Liquid crystal display device test circuit, liquid crystal display device incorporating this, and liquid crystal display device test method |
11/23/2006 | WO2006123404A1 Electronic part test device and method for controlling temperature in electronic part test device |
11/23/2006 | WO2006123281A1 Test structure for combined electrical testing and voltage-contrast inspection |
11/23/2006 | WO2006123204A1 Method and device for high speed testing of an integrated circuit |
11/23/2006 | WO2006122897A1 Method for inspecting a strip conductor structure |
11/23/2006 | WO2006122415A1 Detection, localization and interpretation of partial discharge |
11/23/2006 | WO2006047109A3 Ethernet extension for the data center |
11/23/2006 | WO2006015157A3 Electron beam test system stage |
11/23/2006 | WO2006012358A3 Systems and methods for testing radio frequency identification tags |
11/23/2006 | WO2005044887A9 Telecommunications device and method |