G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2006
11/29/2006	EP1104145B1 Mobile communication unit with bone conduction speaker
11/29/2006	CN2843017Y Fixing device
11/29/2006	CN2842445Y Power supply parameter testing system
11/29/2006	CN2842444Y Electricity leakage detection acting mechanism of current breaker
11/29/2006	CN2842443Y High-voltage-resisting detecting apparatus
11/29/2006	CN2842442Y Automatic detecting apparatus for oil charged-degree of trans former
11/29/2006	CN2842441Y Earth-line detecting and converting apparatus
11/29/2006	CN2842440Y Electromagnet performance testing device for electromagnetic valve
11/29/2006	CN2842439Y High-voltage output circuit for voltage-resisting detecting instrument
11/29/2006	CN2842438Y Circuid polarity detecting pen
11/29/2006	CN2842437Y Real-time emulational liquid-crystal module detecting apparatus
11/29/2006	CN2842436Y Automatic detecting apparatus for focusing potentiometer ceramic substrate
11/29/2006	CN2842429Y Direct-measuring type apparatus
11/29/2006	CN2842428Y Winding beard-needling detachable PCB tester converting board
11/29/2006	CN2842367Y Device for measuring thickness of cell
11/29/2006	CN1871801A Enhanced uplink operation in soft handover
11/29/2006	CN1871523A Insulation degradation diagnosis apparatus
11/29/2006	CN1871522A Method for forming photo-defined micro electrical contacts
11/29/2006	CN1871521A Isolation buffers with controlled equal time delays
11/29/2006	CN1871429A Method for diagnosis in a fuel injection device comprising a piezoactuator
11/29/2006	CN1870798A 通信终端 Communication terminal
11/29/2006	CN1870378A Travelling wave identification method of superhigh voltage DC line fault
11/29/2006	CN1870093A Albinism detecting and handling method of mobile communication terminal display
11/29/2006	CN1869728A Aging testing method and device for power-supply device
11/29/2006	CN1869727A Method for testing voltage of stand-by battery
11/29/2006	CN1869726A AC dynamo position contact testing circuit and method
11/29/2006	CN1869725A Relay correction method and its device
11/29/2006	CN1869724A Method of inspecting electronic circuit
11/29/2006	CN1869723A Vector generating method for testing plate sequence circuit
11/29/2006	CN1869722A Channel switching circuit
11/29/2006	CN1869721A Chip information managing method, chip information managing system, and chip information managing program
11/29/2006	CN1869720A Testing method and circuit of current voltage property
11/29/2006	CN1869719A On-line monitoring method for winding turn-to-turn short-circuit of distribution generator stator based on multi-criterion mixing
11/29/2006	CN1869718A System and method for testing electric property of fan
11/29/2006	CN1869713A Differential measurement probe having retractable double cushioned variable spacing probing tips with EOS/ESD protection capabilities
11/29/2006	CN1869712A Differential measurement probe having a ground clip system for the probing tips
11/29/2006	CN1869711A Probe assembly with multi-directional freedom of motion and mounting assembly therefor
11/29/2006	CN1287527C Method and apparatus for adjusting the phase of input/ output circuitry
11/29/2006	CN1287461C Screen read-only memory testing element and method
11/29/2006	CN1287436C Test tray with carrier assembly for semiconductor device processing machine
11/29/2006	CN1287157C Method for determining load of contact device
11/29/2006	CN1287149C Tester and testing method for cement-base material cracking and contracting characteristics
11/28/2006	US7143372 Apparatus measuring system-on-a-chip efficiency and method thereof
11/28/2006	US7143371 Critical area computation of composite fault mechanisms using voronoi diagrams
11/28/2006	US7143327 Method and system for compressing repetitive data, in particular data used in memory device testing
11/28/2006	US7143326 Test system algorithmic program generators
11/28/2006	US7143325 Method for testing circuit units to be tested by means of majority decisions and test device for performing the method
11/28/2006	US7143324 System and method for automatic masking of compressed scan chains with unbalanced lengths
11/28/2006	US7143323 High speed capture and averaging of serial data by asynchronous periodic sampling
11/28/2006	US7143322 Arrangement and method of testing an integrated circuit
11/28/2006	US7143229 Single-chip microcomputer with dynamic burn-in test function and dynamic burn-in testing method therefor
11/28/2006	US7143222 Adaptive message delivery system
11/28/2006	US7143019 Maintaining data integrity within a distributed simulation environment
11/28/2006	US7143018 Non-redundant collection of harvest events within a batch simulation farm network
11/28/2006	US7142998 Clock skew measurement circuit on a microprocessor die
11/28/2006	US7142996 Operating voltage determination for an integrated circuit
11/28/2006	US7142995 Method for reading battery status by operation system of portable computer
11/28/2006	US7142992 Flexible hybrid defect classification for semiconductor manufacturing
11/28/2006	US7142640 Method and system of remotely restoring communication lines
11/28/2006	US7142623 On-chip system and method for measuring jitter tolerance of a clock and data recovery circuit
11/28/2006	US7142508 System and method for controlling data transfer rates on a network
11/28/2006	US7142504 Fault tolerant network traffic management
11/28/2006	US7142472 Semiconductor memory device and method for testing same
11/28/2006	US7142403 Method for detection of a ground fault, which occurs in the vicinity of a neutral point in an electrical device, as well as an apparatus for carrying out the method
11/28/2006	US7142291 Detection of partial discharge or arcing in wiring via fiber optics
11/28/2006	US7142064 SRAM ring oscillator
11/28/2006	US7142031 Delay device, semiconductor testing device, semiconductor device, and oscilloscope
11/28/2006	US7142023 Voltage detection circuit
11/28/2006	US7142010 Programmable logic device including multipliers and configurations thereof to reduce resource utilization
11/28/2006	US7142003 Test apparatus
11/28/2006	US7142002 Test handler emulation
11/28/2006	US7142001 Packaged circuit module for improved installation and operation
11/28/2006	US7142000 Mounting spring elements on semiconductor devices, and wafer-level testing methodology
11/28/2006	US7141999 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe
11/28/2006	US7141998 Method and apparatus for burn-in optimization
11/28/2006	US7141997 Method for testing using a universal wafer carrier for wafer level die burn-in
11/28/2006	US7141996 Flip chip test structure
11/28/2006	US7141995 Semiconductor manufacturing device and semiconductor manufacturing method
11/28/2006	US7141993 Interface apparatus for integrated circuit testing
11/28/2006	US7141992 Method for measuring impurity metal concentration
11/28/2006	US7141986 Using time domain reflectometry to detect mismatched cable/connector interface
11/28/2006	US7141984 Switching circuit for current measurement range resistor and current measurement apparatus including switching circuit
11/28/2006	US7141960 Method and device system for testing electrical components
11/28/2006	US7141440 Apparatus and method for measuring a property of a layer in a multilayered structure
11/28/2006	US7140883 Contact carriers (tiles) for populating larger substrates with spring contacts
11/23/2006	WO2006124878A2 Method for achieving virtual resolution enhancement of a diagnostic imaging modality by using coupled fea analyses
11/23/2006	WO2006124563A2 Compliant pad wafer chuck
11/23/2006	WO2006124486A1 Self-test circuitry to determine minimum operating voltage
11/23/2006	WO2006124415A2 Porcelain enamel having a metallic appearance
11/23/2006	WO2006124282A1 Method and apparatus for testing rfid devices
11/23/2006	WO2006123553A1 Liquid crystal display device test circuit, liquid crystal display device incorporating this, and liquid crystal display device test method
11/23/2006	WO2006123404A1 Electronic part test device and method for controlling temperature in electronic part test device
11/23/2006	WO2006123281A1 Test structure for combined electrical testing and voltage-contrast inspection
11/23/2006	WO2006123204A1 Method and device for high speed testing of an integrated circuit
11/23/2006	WO2006122897A1 Method for inspecting a strip conductor structure
11/23/2006	WO2006122415A1 Detection, localization and interpretation of partial discharge
11/23/2006	WO2006047109A3 Ethernet extension for the data center
11/23/2006	WO2006015157A3 Electron beam test system stage
11/23/2006	WO2006012358A3 Systems and methods for testing radio frequency identification tags
11/23/2006	WO2005044887A9 Telecommunications device and method

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