G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2006
10/26/2006	US20060242524 System and method for system-on-chip interconnect verification
10/26/2006	US20060242523 IC with protocol selection memory coupled to serial scan path
10/26/2006	US20060242522 Test vehicle data analysis
10/26/2006	US20060242521 Built-in self-test arrangement for integrated circuit memory devices
10/26/2006	US20060242520 Adapting scan-BIST architectures for low power operation
10/26/2006	US20060242519 Multiple uses for bist test latches
10/26/2006	US20060242518 Method for verification of electronic circuit units, and an apparatus for carrying out the method
10/26/2006	US20060242517 Monitoring a data processor to detect abnormal operation
10/26/2006	US20060242516 Methods and systems for generating an accurate adaptive clock
10/26/2006	US20060242515 Systematic scan reconfiguration
10/26/2006	US20060242514 Method and apparatus for generating expect data from a captured bit pattern, and memory device using same
10/26/2006	US20060242513 Enhancements to data integrity verification mechanism
10/26/2006	US20060242512 IP core design supporting user-added scan register option
10/26/2006	US20060242511 High speed interconnect circuit test method and apparatus
10/26/2006	US20060242510 Apparatus and method for programmable fuse repair to support dynamic relocate and improved cache testing
10/26/2006	US20060242509 Method and system for an on-chip AC self-test controller
10/26/2006	US20060242508 Simultaneous scan testing for identical modules
10/26/2006	US20060242507 Achieving Desired Synchronization at Sequential Elements While Testing Integrated Circuits Using Sequential Scan Techniques
10/26/2006	US20060242506 High-speed level sensitive scan design test scheme with pipelined test clocks
10/26/2006	US20060242505 Apparatus for performing stuck fault testings within an integrated circuit
10/26/2006	US20060242504 Configurable automatic-test-equipment system
10/26/2006	US20060242503 Integrated circuit test system
10/26/2006	US20060242502 Method and apparatus for broadcasting scan patterns in a random access scan based integrated circuit
10/26/2006	US20060242501 Communication interface for diagnostic circuits of an integrated circuit
10/26/2006	US20060242500 1149.1TAP linking modules
10/26/2006	US20060242499 Remote integrated circuit testing method and apparatus
10/26/2006	US20060242498 Digital system and method for testing analogue and mixed-signal circuits or systems
10/26/2006	US20060242487 Test buffer design and interface mechanism for differential receiver AC/DC boundary scan test
10/26/2006	US20060242486 Error correction coding method for a high-density storage media
10/26/2006	US20060242485 Error detection, documentation, and correction in a flash memory device
10/26/2006	US20060242484 Memory block quality identification in a memory device
10/26/2006	US20060242483 Built-in self-testing of multilevel signal interfaces
10/26/2006	US20060242469 Software-hardware welding system
10/26/2006	US20060241930 Simulation of a pci device's memory-mapped i/o registers
10/26/2006	US20060241885 Test apparatus and program therefor
10/26/2006	US20060241877 Semiconductor integrated circuit and method of testing delay thereof
10/26/2006	US20060240582 Methods relating to the reconstruction of semiconductor wafers for wafer-level processing
10/26/2006	US20060240581 Method for assembling testing equipment for semiconductor substrate
10/26/2006	US20060240580 Method for evaluating reproduced images of wafers
10/26/2006	US20060239202 Method and apparatus for determining the location of a node in a wireless system
10/26/2006	US20060239200 Network presence status from network activity
10/26/2006	US20060239199 Active probe path management
10/26/2006	US20060239055 DRAM stacked package, DIMM, and semiconductor manufacturing method
10/26/2006	US20060238972 Circuit having a long device configured for testing
10/26/2006	US20060238363 Apparatus and method for simultaneously detecting the power state of a plurality of circuit breaker switches
10/26/2006	US20060238214 Semiconductor circuit, semiconductor device, and method for testing same semiconductor circuit
10/26/2006	US20060238213 Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured
10/26/2006	US20060238212 Integrated circuit temperature sensing device and method
10/26/2006	US20060238211 Method And System For Compensating Thermally Induced Motion Of Probe Cards
10/26/2006	US20060238210 Interface and semiconductor testing apparatus using same
10/26/2006	US20060238209 Vertical microprobes for contacting electronic components and method for making such probes
10/26/2006	US20060238208 Arcuate blade probe
10/26/2006	US20060238207 Interposer for use with test apparatus
10/26/2006	US20060238206 Measuring system for the combined scanning and analysis of microtechnical components comprising electrical contacts
10/26/2006	US20060238204 Fault detection system
10/26/2006	US20060238188 Burn-in apparatus
10/26/2006	US20060238168 Method and device for monitoring deterioration of battery
10/26/2006	US20060238167 Method and device for estimating battery's dischargeable capacity
10/26/2006	US20060237755 Method for automated testing of the modulation transfer function in image sensors
10/26/2006	DE202005020817U1 Kontaktiervorrichung Kontaktiervorrichung
10/26/2006	DE112004002615T5 Verfahren zur Kalibrierung eines Zeitsteuertakts A method for calibrating a timing clock
10/26/2006	DE112004001417T5 Prüfvorrichtung Tester
10/26/2006	DE112004001124T5 Prüfvorrichtung Tester
10/26/2006	DE10248982B4 Vorrichtung und Verfahren zur Überwachung der Stromaufnahme einer Schaltungsanordnung Apparatus and method for monitoring the current consumption of a circuit arrangement
10/26/2006	DE102006017183A1 Kalibrierungsvorrichtung und Verfahren, wobei ein Impuls für Frequenz-, Phase- und Verzögerungs-Eigenschaften verwendet wird Calibration apparatus and method in which a pulse for frequency, phase and delay characteristics is used
10/26/2006	DE102006001915A1 Operating sizes determination method e.g. for electronically commutated motor, involves measuring operating auxiliary variable at pre-determined time tSample within pre-determined operating condition of EC-engine
10/26/2006	DE102005030550B3 Apparatus for testing circuits boards with or without components mounted thereon having contact pins acted on by spring elements
10/26/2006	DE102005019156A1 Electrical machine`s phase current determination method for motor vehicle, involves transferring operational switching operation at switching arrangement for time period of operation at time interval for determining phase current
10/26/2006	DE102005018339A1 Anordnung mit einem Kondensatormodul und Verfahren zu dessen Betrieb Arrangement with a capacitor module and method for its operation
10/26/2006	DE10158029B4 Verfahren zum Berechnen des dynamischen Ladezustandes in einer Batterie A method for calculating the dynamic state of charge in a battery
10/26/2006	DE10124109B4 Verfahren zur Driftüberwachung von Magnetventilschaltkreisen A method for drift monitoring of solenoid valve circuits
10/26/2006	CA2605266A1 Crowd federate architecture and api design
10/25/2006	EP1715576A1 Method for estimating the sum of stator and rotor resistances
10/25/2006	EP1715459A2 Device for the diagnosis of a central unit of an air conditioning system of a vehicle
10/25/2006	EP1715355A1 Testing a device under test by sampling its clock and data signal
10/25/2006	EP1715354A2 Control system, method of protectively controlling electric power system and storage medium storing program code
10/25/2006	EP1714366A1 High impedance fault detection
10/25/2006	EP1523820A4 A fault-tolerant broadcast router
10/25/2006	EP1509796B1 Laser production and product qualification via accelerated life testing based on statistical modeling
10/25/2006	EP1312932B1 Method for measuring motor constant of induction motor
10/25/2006	EP1195021B1 Phy control module for a multi-pair gigabit transceiver
10/25/2006	EP1173811B8 A system for monitoring connection pattern of data ports
10/25/2006	EP0805978B1 Condition tester for a battery
10/25/2006	CN2831286Y Remote transmitting warning system for fortuitous cut-off
10/25/2006	CN2831154Y Switching power feeder detector
10/25/2006	CN2831153Y Battery tester
10/25/2006	CN2831152Y Capacity equalizing end anticorona device of high voltage stator bar
10/25/2006	CN2831151Y High voltage control valve of insulating oil dielectric strength tester
10/25/2006	CN2831150Y Intelligent displaying earthing short trouble indicator
10/25/2006	CN2831149Y Fault auto analyzer for test circuit
10/25/2006	CN2831148Y Wire tester
10/25/2006	CN2831147Y Transient electromagnetic pulse tester
10/25/2006	CN2831145Y Device of testing permanent magnet reactance parameter based on voltage integrating process
10/25/2006	CN2831142Y RF induction voltage tester for metal objects
10/25/2006	CN2831128Y Clamp probe inhibition structure of PCB board testing machine
10/25/2006	CN2831127Y Converting board correcting aid of PCB board testing machine
10/25/2006	CN2831126Y Modular type needle bar of PCB board testing machine
10/25/2006	CN2831125Y Host panel testing machine
10/25/2006	CN2831124Y Testing tools
10/25/2006	CN2831123Y Soft panel testing gripper of PCB board general testing machine

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