G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2006
11/01/2006	CN2833870Y Analog electron gun
11/01/2006	CN2833790Y Mobile hard disk clamp
11/01/2006	CN2833624Y Fuel cell stack testing device with power generation function
11/01/2006	CN2833623Y Main breaker testing bench
11/01/2006	CN2833622Y Grounding line real hanging information transmission apparatus
11/01/2006	CN2833621Y Wire bundle testing apparatus
11/01/2006	CN2833620Y Grading ring for displaying flashover fault
11/01/2006	CN2833619Y High frequency interactive switch
11/01/2006	CN2833602Y Probe measuring card
11/01/2006	CN2833600Y Probe structure improvement of testing jig
11/01/2006	CN1856917A Arc monitoring system
11/01/2006	CN1856842A Memory device
11/01/2006	CN1856713A Method and system for selectively masking test responses
11/01/2006	CN1856712A System and method for optimized test and configuration throughput of electronic circuits
11/01/2006	CN1855664A Portable electronic equipment and battery
11/01/2006	CN1855607A Portable electronic equipment and battery
11/01/2006	CN1855594A Fuel cell unit and power generating system using the fuel cell unit
11/01/2006	CN1855412A Method and apparatus for semiconductor testing utilizing dies with integrated circuit
11/01/2006	CN1855361A Method for controlling temperature and device
11/01/2006	CN1855116A Portable electronic equipment and battery
11/01/2006	CN1854747A Parameter inspector of DC brushless motor
11/01/2006	CN1854746A Substrate inspector of DC brushless electric motor
11/01/2006	CN1854745A On-wafer method and apparatus for pre-processing measurements of process and environment-dependent circuit performance variables for statistical analysis
11/01/2006	CN1854744A Inspection jig and inspection equipment
11/01/2006	CN1854743A In-line electron beam test system
11/01/2006	CN1854742A System and method for testing light-emitting diodes light and its tie wire of computer panel
11/01/2006	CN1283109C Image quality tester of electronic display device
11/01/2006	CN1282878C Interference elimination in antenna testing
10/2006
10/31/2006	US7131081 Scalable scan-path test point insertion technique
10/31/2006	US7131047 Test system including a test circuit board including resistive devices
10/31/2006	US7131046 System and method for testing circuitry using an externally generated signature
10/31/2006	US7131045 Systems and methods for scan test access using bond pad test access circuits
10/31/2006	US7131044 Means scanning scan path parts sequentially and capturing response simultaneously
10/31/2006	US7131043 Automatic testing for programmable networks of control signals
10/31/2006	US7131042 Semiconductor device and method for testing the same
10/31/2006	US7131041 Semiconductor integrated circuit device and device for testing same
10/31/2006	US7131040 Manifold-Distributed Air Flow Over Removable Test Boards in a Memory-Module Burn-In System With Heat Chamber Isolated by Backplane
10/31/2006	US7131034 On-chip measurement of signal state duration
10/31/2006	US7131013 Power supply control system and storage device for holding data just prior to the occurence of an error
10/31/2006	US7130923 Method and apparatus for guessing correct URLs using tree matching
10/31/2006	US7130749 Wavelet analysis of signals to determine characteristics of anomalies in a wire
10/31/2006	US7130723 Control unit for vehicle and total control system therefor
10/31/2006	US7130274 Method for detecting connection polarity of network transmission lines and associated detection circuit
10/31/2006	US7130263 Heterogeneous connections on a bi-directional line switched ring
10/31/2006	US7130055 Use of coefficient of a power curve to evaluate a semiconductor wafer
10/31/2006	US7129936 Display unit and electronic device including the same
10/31/2006	US7129923 Active matrix display device
10/31/2006	US7129800 Compensation technique to mitigate aging effects in integrated circuit components
10/31/2006	US7129760 Timing vernier using a delay locked loop
10/31/2006	US7129736 Element substrate
10/31/2006	US7129735 Method for test data-driven statistical detection of outlier semiconductor devices
10/31/2006	US7129734 Method for testing analog and mixed-signal circuits using functionally related excitations and functionally related measurements
10/31/2006	US7129733 Dynamic overdrive compensation test system and method
10/31/2006	US7129732 Substrate test apparatus and method of testing substrates
10/31/2006	US7129731 Heat pipe with chilled liquid condenser system for burn-in testing
10/31/2006	US7129730 Probe card assembly
10/31/2006	US7129729 Socket connection test modules and methods of using the same
10/31/2006	US7129728 LSI test socket for BGA
10/31/2006	US7129727 Defect inspecting apparatus
10/31/2006	US7129726 Testing device and testing method of a semiconductor device
10/31/2006	US7129725 Semiconductor test interconnect with variable flexure contacts having polymer material
10/31/2006	US7129724 Plasma probe
10/31/2006	US7129723 Test device for electrical testing of a unit under test
10/31/2006	US7129722 Methods of improving reliability of an electro-optical module
10/31/2006	US7129721 Method and apparatus for processing semiconductor devices in a singulated form
10/31/2006	US7129720 Method and device for testing the operativeness of printed circuit boards
10/31/2006	US7129719 Apparatus for detecting defect in circuit pattern and defect detecting system having the same
10/31/2006	US7129718 Method and structure for measuring a bonding resistance
10/31/2006	US7129711 Device for detecting interferences or interruptions of the inner fields smoothing layer of medium or high voltage cables
10/31/2006	US7129710 Printed circuit card
10/31/2006	US7129709 Method of testing documents provided with optico-diffractively effective markings
10/31/2006	US7129707 Apparatus for judging state of assembled battery
10/31/2006	US7129706 Part tester and method
10/31/2006	US7129697 Dynamic register with IDDQ testing capability
10/31/2006	US7129696 Method for capacitance measurement in silicon
10/31/2006	US7129695 Electrical test circuit with an active-load and an output sampling capability
10/31/2006	US7129694 Large substrate test system
10/31/2006	US7129693 Modular voltage sensor
10/31/2006	US7129692 Current detection equipment and semiconductor device
10/31/2006	US7129688 Method for on-line calibration of low accuracy voltage sensor through communication bus
10/31/2006	US7129507 Chip mis-position detection method
10/31/2006	US7129484 Method for pattern recognition in energized charge particle beam wafer/slider inspection/measurement systems in presence of electrical charge
10/31/2006	US7129163 Device package and method for the fabrication and testing thereof
10/31/2006	US7129101 Failure analysis vehicle for yield enhancement with self test at speed burnin capability for reliability testing
10/31/2006	US7129099 Method for manufacturing semiconductor device
10/31/2006	US7128587 Probe card covering system and method
10/26/2006	WO2006113788A2 Crowd federate architecture and api design
10/26/2006	WO2006113708A2 Apparatus and method for managing thermally induced motion of a probe card assembly
10/26/2006	WO2006113460A1 Wireless embedded test signal generation
10/26/2006	WO2006113012A2 Determining quality of lubricating oils in use
10/26/2006	WO2006112543A1 Inspection device and conductive pattern inspection method
10/26/2006	WO2006026733A3 A method of designing a probe card apparatus with desired compliance characteristics
10/26/2006	WO2005116671A3 Increase productivity at wafer test using probe retest data analysis
10/26/2006	WO2005101717A3 Forward error correction in packet networks
10/26/2006	WO2005098460A3 Double side probing of semiconductor devices
10/26/2006	WO2005082106A3 Built-in self test method and apparatus for jitter transfer, jitter tolerance, and fifo data buffer
10/26/2006	WO2005076428A9 High impedance fault detection
10/26/2006	US20060242612 A crosstalk checking method using paralled line length extraction
10/26/2006	US20060242541 High reliability memory module with a fault tolerant address and command bus
10/26/2006	US20060242525 Method and apparatus for functionally verifying a physical device under test

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