Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2006
10/19/2006US20060236154 Failure detection improvement apparatus, failure detection improvement program, failure detection improvement method
10/19/2006US20060236146 Digital system, clock signal adjusting method for digital system, recording medium recording processing program executed in the adjusting method
10/19/2006US20060235637 Simulator cart
10/19/2006US20060234634 Integrated circuit comprising a transmission channel with an integrated independent tester
10/19/2006US20060234405 Semiconductor device with self-aligning contactless interface
10/19/2006US20060234404 Method for predicting and optimizing chip performance in cured thermoset coatings
10/19/2006US20060234402 Method of recipe control operation
10/19/2006US20060234400 Method of judging quality of semiconductor epitaxial crystal wafer and wafer manufacturing method using the same
10/19/2006US20060233431 Image Signal Processor and Deficient Pixel Detection Method
10/19/2006US20060233103 Methods, systems, and computer program products for implementing logical and physical data models
10/19/2006US20060233102 System and method of avoiding cell disposal in buffer
10/19/2006US20060233100 Application aware traffic shaping service node positioned between the access and core networks
10/19/2006US20060232894 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system
10/19/2006US20060232770 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool
10/19/2006US20060232768 Evaluating a multi-layered structure for voids
10/19/2006US20060232691 Image Signal Processor and Deficient Pixel Detection Method
10/19/2006US20060232293 LSI testing apparatus
10/19/2006US20060232292 Semiconductor integrated circuit and method for testing connection state between semiconductor integrated circuits
10/19/2006US20060232291 Carrier unit for a semiconductor device and semiconductor socket using the same
10/19/2006US20060232290 Voltage monitoring circuit
10/19/2006US20060232289 Testable cascode circuit and method for testing the same
10/19/2006US20060232288 Semiconductor device and manufacturing method thereof
10/19/2006US20060232287 Measurement device with measurement data buffer
10/19/2006US20060232286 Probe card and method for producing the same
10/19/2006US20060232285 Ultrasonic probe and ultrasonic diagnostic system
10/19/2006US20060232284 Sensor differentiated fault isolation
10/19/2006US20060232277 Method and device for estimating charge/discharge electricity amount of secondary cell
10/19/2006US20060232267 Determining quality of lubricating oils in use
10/19/2006US20060232266 Undercurrent sense arrangement and method
10/19/2006US20060232261 Device for inspecting element substrates and method of inspection using this device
10/19/2006US20060232260 Compensation of simple fibre optic faraday effect sensors
10/19/2006US20060232254 Charging unit with a transmission unit
10/19/2006DE60026093T2 Halbleitervorrichtung mit Makros und Prüfverfahren dafür Semiconductor device with macros and test methods for
10/19/2006DE60025631T2 Vorrichtung und verfahren zur vermeidung von buskonflikten Apparatus and method for avoiding bus contention
10/19/2006DE202006012867U1 Isolation testing device for use in motor vehicle e.g. lorry, has measuring amplifier, driver circuit, light emitter diodes and display with multiple display areas that cover isolation value of preset value
10/19/2006DE19780321B4 Selbstabstimmender und kompensierender Detektor für Wicklungsfehler Self-tuning and compensating winding fault detector
10/19/2006DE112004002341T5 Hochfrequenz-Verzögerungsschaltung und Prüfvorrichtung High frequency delay circuit and Tester
10/19/2006DE112004002222T5 Taktwiedergewinnungsschaltung und Kommunikationsvorrichtung Clock recovery circuit and communication apparatus
10/19/2006DE112004000601T5 Ereignisbasiertes Prüfverfahren zur Beseitigung taktbezogener Fehler in integrierten Schaltkreisen Event-based test methods to eliminate timing related errors in integrated circuits
10/19/2006DE102006017260A1 Verfahren zur Schaltkreisüberprüfung A method for circuit verification
10/19/2006DE102005017135A1 Verfahren und Vorrichtung zur Erkennung einer an ein Relais angeschlossenen Last Method and device for detecting a relay connected to a load
10/19/2006CA2604890A1 Pyrimidine derivatives and their use for the treatment of cancer
10/18/2006EP1712925A1 Power line monitoring device
10/18/2006EP1712924A1 Battery pure resistance measuring method and apparatus
10/18/2006EP1712923A2 Apparatus and method for balancing and for providing a compliant range to a test head
10/18/2006EP1712898A1 Method to inspect a wafer
10/18/2006EP1711894A2 A test system
10/18/2006EP1711837A1 Quick attachment fixture and power card for diode-based light devices
10/18/2006EP1661278A4 Enhanced uplink operation in soft handover
10/18/2006EP1314240B1 Method for regulating the current in a direct current machine for a fan
10/18/2006EP1311825B1 Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages
10/18/2006EP1166136B1 Simulator cart
10/18/2006EP0984289B1 Partial discharge detector of gas-insulated apparatus
10/18/2006CN2829296Y Circuit board with testing structure
10/18/2006CN2829179Y Battery uninterrupted power supply device
10/18/2006CN2829061Y Light gas relay tester
10/18/2006CN2829017Y Circuit for preventing FIB assaulting blovo-out fuse
10/18/2006CN2828963Y Radio battery monitoring system
10/18/2006CN2828836Y Safety and correction voltage monitoring device for fuel cell
10/18/2006CN2828835Y Testing system for fuel cell with self-support and power output function
10/18/2006CN2828834Y Device for testing thermal relaxation time of semiconductor laser
10/18/2006CN2828833Y Power-on detector of liquid crystal panel detector
10/18/2006CN2828832Y Card detection device
10/18/2006CN2828831Y Automatic size regulator of liquid crystal panel detector
10/18/2006CN2828830Y Automatic testing device of electronic assembly
10/18/2006CN2828829Y Safety protection current-limitting alarm device
10/18/2006CN2828825Y Hand operated detector of electric execution mechanism
10/18/2006CN2828824Y Testing unit of photoelectric transfer used in on-line monitoring system of converting station high-voltage equipment
10/18/2006CN2828822Y Compressor electric machine testing fixture
10/18/2006CN2828768Y Automatic detection system of LED
10/18/2006CN1849735A Method and circuit arrangement for the detection of ground faults on electronic trips for low-voltage circuit breakers comprising serially connected measuring amplifiers
10/18/2006CN1849734A Method for controlling an electronic overcurrent trip for low-voltage circuit breakers
10/18/2006CN1849588A A system and method for testing and configuring semiconductor functional circuits
10/18/2006CN1849520A Method and apparatus for performing testing of interconnections
10/18/2006CN1849519A Test apparatus and write control circuit
10/18/2006CN1849518A Test apparatus and test method
10/18/2006CN1849517A Method and apparatus for measuring impedance of electrical component under high interference conditions
10/18/2006CN1849497A A system and method for determining a cross sectional feature of a structural element using a reference structural element
10/18/2006CN1848594A Portable electronic equipment and battery
10/18/2006CN1848592A Sense amplifier, method for wake-up charging current and electronic device
10/18/2006CN1848588A Apparatus and method for multi function products effectively utilizing battery electricity quantity
10/18/2006CN1848515A Charging and diagnosing method with battery energy barrier
10/18/2006CN1847871A Method for calibrating semiconductor test instruments
10/18/2006CN1847870A Method for circuit inspection
10/18/2006CN1847869A Semiconductor integrated circuit and method for testing connection state between semiconductor integrated circuits
10/18/2006CN1847868A Delay test method for large-scale integrated circuits
10/18/2006CN1847867A Post-wavelet analysis treating method and device for electric power transient signal
10/18/2006CN1847866A False pin soldering test device and method
10/18/2006CN1847865A Energy feedback type AC/DC electronic load simulator
10/18/2006CN1847864A Lightning stroke test source with composite fiber overhead earth wire
10/18/2006CN1847863A Automatic test instrument for function of photography flash
10/18/2006CN1847862A Acoustooptically prompting multifunctional test pencil circuit
10/18/2006CN1847859A Semiconductor carrier tray, and burn-in board, burn-in test method, and semiconductor manufacturing method
10/18/2006CN1847858A Test adaptor card and test equipment
10/18/2006CN1847054A Driving circuit for light emitting device in vehicle
10/18/2006CN1280979C Apparatus for measuring magnetic flux of synchronous reluctance motor and sensorless control system for the same motor
10/18/2006CN1280949C Board-to-board connector and its testing method
10/18/2006CN1280635C Test head docking system and method
10/18/2006CN1280634C Conductive contact unit
10/18/2006CN1280319C Anionic polymers composed of dicarboxylic acids and uses thereof