Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2006
12/07/2006US20060273813 Electronic circuit protection device
12/07/2006US20060273812 Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured
12/07/2006US20060273811 Using an active load as a high current output stage of a precision pin measurement unit in automatic test equipment systems
12/07/2006US20060273810 Silicon wafer with solderable coating on its wafer rear side, and process for producing it
12/07/2006US20060273809 Method of designing an application specific probe card test system
12/07/2006US20060273808 Automated position control of a surface array relative to a liquid microjunction surface sampler
12/07/2006US20060273802 Secondary battery voltage correcting method and unit and battery residual capacity estimating method and unit
12/07/2006US20060273782 Method of, and apparatus for, measuring the quality of a printed image
12/07/2006US20060273781 Compensating for loss in a transmission path
12/07/2006US20060273780 Statistical method for identifying microcracks in insulators
12/07/2006US20060273763 Battery status monitoring apparatus and method
12/07/2006US20060273761 Apparatus and method for detecting fully charged condition, apparatus and method for detecting charged condition, and apparatus and method for determining degree of degradation
12/07/2006DE19836557B4 Haltevorrichtung eines Handlers für IC-Module Holding device of a handler for IC modules
12/07/2006DE112004002703T5 Treiberschaltkreis Driver circuit
12/07/2006DE10236958B4 Verfahren zur Ermittlung der entnehmbaren Ladungsmenge einer Speicherbatterie und Überwachungseinrichtung für eine Speicherbatterie Method for determining the amount of charge of a storage battery monitoring device and for a storage battery
12/07/2006DE102006026209A1 Überwachungseinrichtung und Verfahren für eine bordseitige Batterie zur Korrektur des Offset-Werts von deren Stromsensor Monitoring device and method for an onboard battery to correct the offset value of the current sensor
12/07/2006DE102006004213A1 Verfahren und Struktur für wechselstromgekoppelten Insitu-ESD-Schutz Method and structure for AC-coupled situ ESD protection
12/07/2006DE102005025616A1 Energy store`s fuel cell voltage monitoring/controlling method for motor vehicle on-board supply system, involves charging/discharging cells based on difference between determined voltage of group of cells and regulated reference voltage
12/07/2006DE102005025449A1 Verfahren und Vorrichtung zur Messung einer dielektrischen Antwort eines elektrischen Isoliersystems Method and apparatus for measuring a dielectric response of an electrical insulating
12/07/2006DE102005024030A1 Semiconductor structure e.g. conducting path, testing circuit arrangement, has impulse generator with transmission lines whose impedances form system impedance, and absorption branch with resistance having same value as system impedance
12/07/2006DE102004063488A1 Printed circuit board soldering errors detection and correction system, has wave soldering devices to repair soldering errors, where board and devices are positioned relative to each other, such that errors are repaired by devices
12/07/2006DE10048962B4 Tragbare Prüfeinrichtung zum Prüfen von mit hohen Spannungen und/oder hohen Strömen zu betreibenden Prüflingen und Prüfsystem A portable test device for testing at high voltages and / or high currents to be operated test specimens and testing system
12/06/2006EP1729335A1 Turning device for heavy object
12/06/2006EP1729190A2 Device and method for testing, parameterising and flashing of ECU controlled vehicle components
12/06/2006EP1729141A1 Method for estimating the rotor time constant of an induction machine
12/06/2006EP1729140A2 Semiconductor testing apparatus and interface board
12/06/2006EP1729139A2 Method and device for measuring a dielectric response of an electrical insulation system
12/06/2006EP1729138A2 Method and device for determining the location of a short circuit in a line of an energy supply network
12/06/2006EP1728303A2 Power supply loading indicators and methods
12/06/2006EP1728296A1 Method of and device for determining at least one characteristic parameter of a resonant structure
12/06/2006EP1728086A1 Test station for a fuel cell power module
12/06/2006EP1728085A1 Testing integrated circuits
12/06/2006EP1728084A1 Measuring circuit for the output of a power amplifier and a power amplifier comprising the measuring circuit
12/06/2006EP1728083A2 Electronic circuit
12/06/2006EP1649299A4 System and method for optimized test and configuration throughput of electronic circuits
12/06/2006EP1502123B1 Device and method for testing printed circuit boards, and testing probe for said device and method
12/06/2006EP1220350B1 Electric device with timer means
12/06/2006CN2845101Y Memory tester and memory testing apparatus therewith
12/06/2006CN2844938Y 6kV switch actuation characteristics tester
12/06/2006CN2844937Y Electric switch and power socket tester
12/06/2006CN2844936Y IC testing circuits
12/06/2006CN2844935Y Device for inspecting arc tube performance of gold halogen lamp
12/06/2006CN2844934Y Electric network transient inspecting device
12/06/2006CN2844933Y Multi-channel and high speed transformer online monitoring device
12/06/2006CN2844932Y System for monitoring external insulation of transformer
12/06/2006CN2844931Y Device for measuring leakage current value of capacitor
12/06/2006CN2844930Y Portable electric power malfunction monitor
12/06/2006CN2844929Y Voltage tester for intellectual battery package
12/06/2006CN2844926Y Flexible PCB inspecting clamp
12/06/2006CN1875474A 半导体集成电路及其设计方法 Semiconductor integrated circuit and design method
12/06/2006CN1875283A 测试装置 Test device
12/06/2006CN1875282A Test equipment and cable guide unit
12/06/2006CN1875281A Conductive contact holder and conductive contact unit
12/06/2006CN1874647A Printing routing basal lamina and semiconductor testing device
12/06/2006CN1874108A Simplex electric motor coach, mechanism and system for running bus team
12/06/2006CN1873941A Manufacturing method for semiconductor device
12/06/2006CN1873823A Electronic equipment and structure of port
12/06/2006CN1873744A Rotation-type display panel testing device and display panel testing method using the same
12/06/2006CN1873436A Antenna connection detecting device and vehicle navigation device
12/06/2006CN1873433A Method and device for measuring insertion loss of digital subscriber line
12/06/2006CN1873432A 测试装置及其测试方法 Test equipment and test methods
12/06/2006CN1873431A Method for determining abnormity of open circuit test in high voltage DC circuit by using voltage difference
12/06/2006CN1873430A Structure of testing electrical property, and liquid crystal faceplate of possessing the structure
12/06/2006CN1873429A Method and circuit for measuring voltage, insulation resistance, and capacitance in communication line
12/06/2006CN1873428A Device for inspecting pieces of card
12/06/2006CN1873426A Signal probe and probe assembly
12/06/2006CN1873425A Semiconductor testing apparatus and interface board
12/06/2006CN1873424A Electronic element automatic moving loader
12/06/2006CN1873423A Electronic element automatic moving loader
12/06/2006CN1873422A Method and equipment for active injecting pinhead of fly needle
12/06/2006CN1288738C Apparatus for compensatnig deviation of test temperature is semiconductor device processing machine
12/06/2006CN1288737C Detection device, testing device of semiconductor device and testing method
12/06/2006CN1288736C Method for manufacturing semiconductor device
12/06/2006CN1288735C Semiconductor device test system
12/06/2006CN1288734C Measurement, check, manufacturing method and check device for semiconductor device
12/06/2006CN1288452C Disc chip testing board and phase-shift radio-frequency signal generating circuit thereof
12/06/2006CN1288450C Method of manufacturing a probe card
12/06/2006CN1288449C Method and apparatus for retaining a spring probe
12/05/2006USRE39418 Mounting apparatus for ball grid array device
12/05/2006US7146598 Method and apparatus for configuring a programmable logic device
12/05/2006US7146587 Scalable logic self-test configuration for multiple chips
12/05/2006US7146584 Scan diagnosis system and method
12/05/2006US7146551 Method and system of modifying data in functional latches of a logic unit during scan chain testing thereof
12/05/2006US7146550 Isolation testing circuit and testing circuit optimization method
12/05/2006US7146549 Scan-path flip-flop circuit for integrated circuit memory
12/05/2006US7146548 Fixing functional errors in integrated circuits
12/05/2006US7146547 Semiconductor device
12/05/2006US7146546 Semiconductor device
12/05/2006US7146543 Semiconductor device mounting chip having tracing function
12/05/2006US7146539 Systems and methods for testing a device-under-test
12/05/2006US7146538 Bus interface module
12/05/2006US7146432 Methods, systems and computer program products for providing failure recovery of network secure communications in a cluster computing environment
12/05/2006US7146292 Method and a system for evaluating aging of components, and computer program product therefor
12/05/2006US7146284 Method of testing phase lock loop status during a Serializer/Deserializer internal loopback built-in self-test
12/05/2006US7146111 Office information system having a device which provides an operational message of the system when a specific event occurs
12/05/2006US7145879 Network load testing method
12/05/2006US7145877 Apparatus and method for distance extension of fibre-channel over transport
12/05/2006US7145866 Virtual network devices
12/05/2006US7145864 Redundant link management switch for use in a stack of switches and method thereof
12/05/2006US7145818 Semiconductor integrated circuit device having test circuit