Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2006
10/11/2006EP1710594A1 Method of measuring semiconductor wafers with an oxide enhanced probe
10/11/2006EP1710593A2 Process for the preparation and automatic performance of sequence of measurements and tests on an electrical installation
10/11/2006EP1710592A2 Device for detecting an arc
10/11/2006EP1710590A1 Method for testing and test system for energy installations
10/11/2006EP1710129A2 Method of testing collision load sensor for vehicle
10/11/2006EP1709455A1 Testing of circuits with multiple clock domains
10/11/2006EP1709454A1 Test architecture and method
10/11/2006EP1709453A1 System and method to forecast the electrical conductivity of anodes for aluminum production before baking
10/11/2006EP1075655B1 Electronic battery tester
10/11/2006CN2826666Y Time measure instrument of vacuum circuit breaker
10/11/2006CN2826453Y Multifunctional microcomputer protection and converting station integrated automation experiment training system
10/11/2006CN2826452Y Portable decimeter-wave antenna feeder fault examining and repairing instrument
10/11/2006CN2826451Y Portable meter-wave antenna feeder fault examining and repairing instrument
10/11/2006CN2826450Y Quadric, tertiary loop abnormity warning device for voltage transformer
10/11/2006CN2826449Y Dry-type cable test terminal
10/11/2006CN2826448Y Insulated monitor for capacitance type insulator
10/11/2006CN2826447Y Power supply alarm device for vehicle
10/11/2006CN2826446Y Device for online detecting input/output interface anti-interference status of numerical control system
10/11/2006CN2826445Y Intelligent line-checking machine
10/11/2006CN2826444Y Automatized testing device of electronic assembly
10/11/2006CN2826440Y IC testing module
10/11/2006CN1846198A Inherently fail safe processing or control apparatus
10/11/2006CN1846143A Battery remaining power calculating method, battery remaining power calculating device, and battery remaining power calculating program
10/11/2006CN1846142A Method for monitoring contact consumption in multiple contact switches
10/11/2006CN1846141A Calibration comparator circuit
10/11/2006CN1846140A Test apparatus
10/11/2006CN1845458A Auto-compensative alternative type integrator and its controlling method
10/11/2006CN1845457A Auto-compensative low drift integrator and its controlling method
10/11/2006CN1845275A Low voltage heavy current tank loop with arc-striking branch
10/11/2006CN1845250A DRAM stacked package, DIMM, and semiconductor manufacturing method
10/11/2006CN1845232A Automatic measurement and correction method and system for LCD GAMMA curve and color temperature
10/11/2006CN1844947A X diffraction in-situ testing device for electrode charge and discharge process
10/11/2006CN1844946A Semiconductor integrated circuit and method of testing delay thereof
10/11/2006CN1844945A Tuner local oscillation tracking method used in high-frequency electronic tuner tester
10/11/2006CN1844944A Quality statistics method used in high-frequency electronic tuner tester
10/11/2006CN1844943A Manufacture defect analysis system and detection method thereof
10/11/2006CN1844905A Method and system for detection of circuit board contamination
10/11/2006CN1844875A Quick connection method for displacement sensor on switch characteristic tester
10/11/2006CN1844845A Alignment detection structure and alignment offset detection method
10/11/2006CN1279697C Testing data compression coding, decoding method and special decoding element of slice system
10/11/2006CN1279614C Semiconductor device
10/11/2006CN1279445C Enhanced loopback testing of serial devices
10/11/2006CN1279365C Satellite connection earthing method and apparatus for monitoring stators
10/11/2006CN1279364C Inspection plate of printed circuit and inspection equipment by using said inspection plate
10/11/2006CN1279363C Method and device for the diagnosis of an electric system in a motor vehicle electric system
10/11/2006CN1279329C Checking device and method for integrated circuit pattern
10/10/2006US7120890 Apparatus for delay fault testing of integrated circuits
10/10/2006US7120844 System and method for performing scan test with single scan clock
10/10/2006US7120843 IC with scan distributor and scan collector circuitry
10/10/2006US7120842 Mechanism to enhance observability of integrated circuit failures during burn-in tests
10/10/2006US7120841 Data generator for generating test data for word-oriented semiconductor memories
10/10/2006US7120840 Method and system for improved ATE timing calibration at a device under test
10/10/2006US7120829 Failure propagation path estimate system
10/10/2006US7120772 Micro-system for burn-in system program from a plug-able subsystem into main memory and method thereof
10/10/2006US7120563 Wire fault detection
10/10/2006US7120552 Method for activating the functions of an electrical apparatus
10/10/2006US7120551 Method for estimating EMI in a semiconductor device
10/10/2006US7120546 Integrated spectrum analyzer for tuners
10/10/2006US7120506 Method, system, converter and switch for asynchronous transmission-mode (ATM) communication
10/10/2006US7120125 Communication capability measuring equipment
10/10/2006US7120124 Load-distribution method and apparatus based on the method
10/10/2006US7120119 Management of protocol information in PNNI hierarchical networks
10/10/2006US7120118 Multi-path analysis for managing machine communications in a network
10/10/2006US7120086 Semiconductor circuit
10/10/2006US7120071 Test method for a semiconductor memory
10/10/2006US7120042 Ferroelectric memory device having test memory cell
10/10/2006US7119707 Circuit for providing electrical current to a bicycle device
10/10/2006US7119587 High frequency divider state correction circuit
10/10/2006US7119571 Test structure design for reliability test
10/10/2006US7119570 Method of measuring performance of a semiconductor device and circuit for the same
10/10/2006US7119569 Real-time in-line testing of semiconductor wafers
10/10/2006US7119568 Methods for wafer level burn-in
10/10/2006US7119567 System and method for testing one or more dies on a semiconductor wafer
10/10/2006US7119566 Test probe alignment apparatus
10/10/2006US7119565 Chip carrier and method for testing electrical performance of passive component
10/10/2006US7119564 Method and system for compensating thermally induced motion of probe cards
10/10/2006US7119563 Integrated circuit characterization printed circuit board
10/10/2006US7119562 Contact-type film probe
10/10/2006US7119561 Electrical connecting apparatus
10/10/2006US7119560 Probe apparatus
10/10/2006US7119559 Vacuum-actuated test fixture for testing printed circuit boards
10/10/2006US7119558 Test probe for finger tester and corresponding finger tester
10/10/2006US7119557 Hollow microprobe using a MEMS technique and a method of manufacturing the same
10/10/2006US7119548 Current transformer test device and method
10/10/2006US7119547 Testing apparatus
10/10/2006US7119546 Method for single ended line testing and single ended line testing device
10/10/2006US7119545 Capacitive monitors for detecting metal extrusion during electromigration
10/10/2006US7119531 Pusher in an autohandler for pressing a semiconductor device
10/10/2006US7119362 Method of manufacturing semiconductor apparatus
10/10/2006US7119347 Ion implantation apparatus and method
10/10/2006US7119339 Transmission mode terahertz computed tomography
10/10/2006US7119299 Work inspection system
10/10/2006US7118386 Socket for semiconductor device
10/10/2006US7117744 Apparatus and method for detecting vibrations of the shaft assembly in an electrical machine
10/10/2006US7117592 Method of manufacturing a connector
10/10/2006CA2262778C Conformationally constrained backbone cyclized somatostatin analogs
10/07/2006CA2542213A1 System and method for manufacturing fuel cell stacks
10/05/2006WO2006105321A1 Undervoltage detection circuit
10/05/2006WO2006104947A1 Apparatus and method for managing battery performance of a wireless device
10/05/2006WO2006104879A2 Apparatus, system and method for testing electronic elements