G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2006
10/25/2006	CN1853241A Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance
10/25/2006	CN1853133A Inspection method semiconductor device and display device
10/25/2006	CN1853112A Electronic switching circuit, switching circuit test arrangement and method for determining the operativeness of an electronic switching circuit
10/25/2006	CN1853111A Temperature control device and temperature control method
10/25/2006	CN1851721A Reliability estimating method for gallium arsenide one-chip microwave integrated circuit
10/25/2006	CN1851492A Signal regulating device for navigation light quality measurement
10/25/2006	CN1851491A Fault positioning method
10/25/2006	CN1851490A Method for realizing single-end fault range finding by utilizing long-line equation
10/25/2006	CN1851489A Variable frequency high-voltage motor insulated local discharge measuring method and its special measuring instrument
10/25/2006	CN1851488A Method and apparatus for detecting shorts on inaccessible pins using capacitive measurements
10/25/2006	CN1851487A Semiconductor circuit, semiconductor device, and method for testing same semiconductor circuit
10/25/2006	CN1851484A Method for detecting shell drain voltage of working appliance (power) equipment and two-step anti-electric-shock scheme
10/25/2006	CN1851477A Measuring system and its data interface converting device
10/25/2006	CN1851476A Interface and semiconductor testing apparatus using same
10/25/2006	CN1851432A Inflation cell evacuation helium test and insulated medium filling technical method
10/25/2006	CN1282280C Base of hand operated cam for final test of liquid crystal module (LCM)
10/25/2006	CN1281968C Electronic component characteristic measuring device
10/25/2006	CN1281966C Probe sheet, probe card, semiconductor detector device
10/25/2006	CN1281965C Socket and contact of semiconductor package
10/25/2006	CN1281929C Modular self-diagnostic detector
10/24/2006	US7127708 Concurrent in-system programming of programmable devices
10/24/2006	US7127695 Timing based scan chain implementation in an IC design
10/24/2006	US7127690 Method and system for defect evaluation using quiescent power plane current (IDDQ) voltage linearity
10/24/2006	US7127652 X-tree test method and apparatus in a multiplexed digital system
10/24/2006	US7127651 Sampling rate converter for both oversampling and undersampling operation
10/24/2006	US7127649 Smartcard test system and related methods
10/24/2006	US7127648 System and method for performing on-chip self-testing
10/24/2006	US7127385 Delay time estimation method and recording medium storing estimation program
10/24/2006	US7127099 Image searching defect detector
10/24/2006	US7127018 Apparatus for and method of measuring clock skew
10/24/2006	US7126970 Communication system with balanced transmission bandwidth
10/24/2006	US7126964 Method and apparatus for network analysis, such as analyzing and correlating identifiers of frame relay circuits in a network
10/24/2006	US7126922 Dynamic radio link adaptation for interference in cellular systems
10/24/2006	US7126921 Packet network providing fast distribution of node related information and a method therefor
10/24/2006	US7126917 Method for dynamically adjusting the number of retransmissions and NAKs in a communications system implementing TCP/IP
10/24/2006	US7126914 Digital subscriber line user capacity estimation
10/24/2006	US7126911 Timer rollover handling mechanism for traffic policing
10/24/2006	US7126908 Method of protecting as against span failures in a communication network
10/24/2006	US7126568 Method and system for precharging OLED/PLED displays with a precharge latency
10/24/2006	US7126368 System and method for detecting motor coil-to-coil faults
10/24/2006	US7126367 Test apparatus, test method, electronic device, and electronic device manufacturing method
10/24/2006	US7126366 Semiconductor test apparatus
10/24/2006	US7126365 System and method for measuring negative bias thermal instability with a ring oscillator
10/24/2006	US7126364 Interface comprising a thin PCB with protrusions for testing an integrated circuit
10/24/2006	US7126363 Die carrier
10/24/2006	US7126362 Inspection unit
10/24/2006	US7126361 Vertical probe card and air cooled probe head system
10/24/2006	US7126360 Differential signal acquisition probe having retractable double cushioned probing tips with EOS/ESD protection capabilities
10/24/2006	US7126359 Device monitor for RF and DC measurement
10/24/2006	US7126358 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies
10/24/2006	US7126357 Method for inspecting a wafer and apparatus for inspecting a wafer
10/24/2006	US7126356 Radiation detector for electrostatic discharge
10/24/2006	US7126355 Physical quantity sensing device with bridge circuit and temperature compensating method
10/24/2006	US7126346 Method, apparatus, and article of manufacture for manufacturing high frequency balanced circuits
10/24/2006	US7126344 Diagnostic device for an antenna
10/24/2006	US7126342 Voltage measurement device
10/24/2006	US7126341 Automotive vehicle electrical system diagnostic device
10/24/2006	US7126326 Semiconductor device testing apparatus, semiconductor device testing system, and semiconductor device testing method for measuring and trimming the output impedance of driver devices
10/24/2006	US7126323 Systems and methods for synchronous detection of signals
10/24/2006	US7126320 Evaluation of the characteristics of electric pulses
10/24/2006	US7126145 Frame transfer prober
10/24/2006	US7125730 Power supply, a semiconductor making apparatus and a semiconductor wafer fabricating method using the same
10/19/2006	WO2006110857A1 Self-test circuit for high-definition multimedia interface integrated circuits
10/19/2006	WO2006110834A1 Brown out detection circuit and method
10/19/2006	WO2006110763A1 Pyrimidine derivatives and their use for the treatment of cancer
10/19/2006	WO2006110414A2 Rfid device test thresholds systems and methods
10/19/2006	WO2006109960A1 Test tray insert
10/19/2006	WO2006109463A1 Diagnosis program, switching program, test device, and diagnosis method
10/19/2006	WO2006109382A1 Magnetic impedance measuring device
10/19/2006	WO2006109358A1 Electronic component handling apparatus
10/19/2006	WO2006109050A2 Monitoring system
10/19/2006	WO2006108890A1 Voltage sag generator device
10/19/2006	WO2006108439A1 Ic chip package, test equipment and interface for performing a functional test of a chip contained within said chip package
10/19/2006	WO2006096327A3 Boundary scan testing system
10/19/2006	WO2006090923A3 Fuel cell state monitor apparatus and method
10/19/2006	WO2006062674A3 Method and system for providing packet data services
10/19/2006	WO2006014512B1 System and method for selecting stable routes in wireless networks
10/19/2006	WO2005112483A3 Data rate shifting methods and techniques
10/19/2006	WO2005084172A3 Carbon nanostructures and methods of making and using the same
10/19/2006	US20060236201 High reliability memory module with a fault tolerant address and command bus
10/19/2006	US20060236186 Test Output Compaction with Improved Blocking of Unknown Values
10/19/2006	US20060236185 Multiple function results using single pattern and method
10/19/2006	US20060236184 Fault detecting method and layout method for semiconductor integrated circuit
10/19/2006	US20060236183 Method and apparatus for evaluating and optimizing a signaling system
10/19/2006	US20060236182 Scan-based self-test structure and method using weighted scan-enable signals
10/19/2006	US20060236181 Systems and methods for LBIST testing using multiple functional subphases
10/19/2006	US20060236180 Integrated circuit testing module including command driver
10/19/2006	US20060236179 Delay test method for large-scale integrated circuits
10/19/2006	US20060236178 RAM testing apparatus and method
10/19/2006	US20060236177 Method for eliminating hold error in scan chain
10/19/2006	US20060236176 Segmented addressable scan architecture and method for implementing scan-based testing of integrated circuits
10/19/2006	US20060236175 Semiconductor integrated circuit device and I/O cell for the same
10/19/2006	US20060236174 Optimized JTAG interface
10/19/2006	US20060236173 Method and system for configuring registers in microcontrollers, and corresponding computer-program product
10/19/2006	US20060236172 Semiconductor device and method for testing the same
10/19/2006	US20060236171 Method for detecting and correcting errors of electronic apparatus
10/19/2006	US20060236170 On-chip sampling circuit and method
10/19/2006	US20060236169 Method and circuit for parametric testing of integrated circuits with an exclusive-or logic tree
10/19/2006	US20060236168 System and method for dynamically optimizing performance and reliability of redundant processing systems
10/19/2006	US20060236167 Compilation of calibration information for plural testflows

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