Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2006
12/13/2006CN2847308Y Circuit device of leakage current detector of lightning arrestor
12/13/2006CN2847304Y Three phase electronic leakage and electricity stealing detecting electric energy meter
12/13/2006CN2847280Y Automatic safety monitor for underground pipeline
12/13/2006CN1879354A Network message processing using inverse pattern matching
12/13/2006CN1879030A Method and circuit arrangement for determining a charge used during a specific period of time in mobile devices
12/13/2006CN1879029A Synchronization of modules for analog and mixed signal testing
12/13/2006CN1879028A IC with leakage control and method for leakage control
12/13/2006CN1879027A Test apparatus and testing method
12/13/2006CN1879026A Ionization test for electrical verification
12/13/2006CN1879025A Die design with integrated assembly aid
12/13/2006CN1879024A Magnetic-field-measuring device
12/13/2006CN1879023A Electric utility storm outage management
12/13/2006CN1877804A Manufacturing method of semiconductor integrated circuit device
12/13/2006CN1877666A Display substrate and device and method for testing display panel with the display substrate
12/13/2006CN1877355A Insulated on-line monitoring system checker of high-voltage electric equipment
12/13/2006CN1877353A Shipping power station integrated test system
12/13/2006CN1877352A Method and device for searching fault point of electric wire and cable
12/13/2006CN1877351A 电缆故障检测装置 Cable fault detection device
12/13/2006CN1877350A Testing method and device for abnormal power-on and power-off of electronic product
12/13/2006CN1877348A Transient strong electromagnetic pulse testing device
12/13/2006CN1877347A Method for measuring contact impedance and structure thereof
12/13/2006CN1877345A Traction battery voltage monitoring and alarming system
12/13/2006CN1877343A Voltage supply system for uninterrupted-power-supply detection of electronic product performance used in production line
12/13/2006CN1877342A Test apparatus capable of accurately connecting a test object to a substrate
12/13/2006CN1877341A Test equipment of semiconductor devices
12/13/2006CN1876256A Battery screening system and method
12/13/2006CN1290379C Single lamp monitor-control system for road lamp
12/13/2006CN1290170C Method for testing probe board and semiconductor chip, capacitor and mfg. method thereof
12/13/2006CN1290169C Contactor having contact electrode formed by laser
12/13/2006CN1290128C Method for deciding capacitor good or not
12/13/2006CN1289915C System having a screen and an external power supply unit
12/13/2006CN1289914C Coupling semiconductor testing device and interface circuit of the semiconductor device to be tested
12/13/2006CN1289913C Accurate trouble-locating method for electricity transmission lines with SC
12/13/2006CN1289901C Reduction of error alarm in PCB detection
12/12/2006US7149944 Semiconductor integrated circuit device equipped with read sequencer and write sequencer
12/12/2006US7149943 System for flexible embedded Boundary Scan testing
12/12/2006US7149942 Semiconductor integrated circuit with test circuit
12/12/2006US7149927 Use of SMBus to provide JTAG support
12/12/2006US7149641 System and method for controlling a fuel cell testing device
12/12/2006US7149343 Methods for analyzing defect artifacts to precisely locate corresponding defects
12/12/2006US7149342 Device and method for investigating predetermined areas of printed circuit boards
12/12/2006US7149286 Electrical system like a system for testing the channels of a communication system
12/12/2006US7149188 Distributed processing for optimal QOS in a broadband access system
12/12/2006US7149182 System and method for providing lifeline telecommunication service
12/12/2006US7149136 Memory circuit with redundant memory cell array allowing simplified shipment tests and reduced power consumptions
12/12/2006US7148787 Remote keyless entry circuit having transient pulse suppression
12/12/2006US7148719 Method for analyzing organic light-emitting device
12/12/2006US7148718 Articles of manufacture and wafer processing apparatuses
12/12/2006US7148717 Methods and apparatus for testing electronic circuits
12/12/2006US7148716 System and method for the probing of a wafer
12/12/2006US7148715 Systems and methods for testing microelectronic imagers and microfeature devices
12/12/2006US7148714 POGO probe card for low current measurements
12/12/2006US7148713 Algoristic spring as probe
12/12/2006US7148712 Probe for use in determining an attribute of a coating on a substrate
12/12/2006US7148711 Membrane probing system
12/12/2006US7148710 Probe tile for probing semiconductor wafer
12/12/2006US7148709 Freely deflecting knee probe with controlled scrub motion
12/12/2006US7148705 Charging voltage measuring device for substrate and ion beam irradiating device
12/12/2006US7148698 Fuse saving tester for fused circuit
12/12/2006US7148697 System and method for measuring electrical characteristics of a capacitor
12/12/2006US7148696 Electrical switching apparatus and method including fault detection employing acoustic signature
12/12/2006US7148695 Fault detection system
12/12/2006US7148694 Contact impedance test circuit and method
12/12/2006US7148679 Transformer probe
12/12/2006US7148677 Vacuum circuit interrupter including circuit monitoring leakage or loss of vacuum and method of monitoring a vacuum interrupter for leakage or loss of vacuum
12/12/2006US7148676 Ancillary equipment for testing semiconductor integrated circuit
12/12/2006US7148674 Apparatus for automatically measuring a relatively wide range of leakage currents
12/12/2006US7148655 Electronic equipment, display control method, recording medium and program
12/12/2006US7148654 Method and apparatus for monitoring fuel cell voltages
12/12/2006US7148653 Method of diagnosing a motor vehicle battery based on parameters related to an electric quantity supplied by the battery
12/12/2006US7148505 Method for using a chip carrier substrate with a land grid array and external bond terminals
12/12/2006US7148503 Semiconductor device, function setting method thereof, and evaluation method thereof
12/12/2006US7148478 Electrical measurements in samples
12/12/2006US7148074 Method and apparatus for using a capacitor array to measure alignment between system components
12/12/2006CA2201593C Method and apparatus for detecting fault conditions in a vehicle data recording device
12/07/2006WO2006130185A1 A method for testing the sensitive input range of byzantine filters
12/07/2006WO2006129999A1 Network bus diagnosis system
12/07/2006WO2006129802A1 Charge ratio/remaining capacity estimation method, battery state sensor, and battery power source system
12/07/2006WO2006129372A1 Semiconductor testing apparatus
12/07/2006WO2006129347A1 Semiconductor inspecting/manufacturing apparatus
12/07/2006WO2006128788A1 Method for the model-based diagnosis of a mechatronic system
12/07/2006WO2006128233A1 An apparatus and method for testing circuit breakers
12/07/2006WO2006091051A3 Test handler having size-changeable test site
12/07/2006WO2006062941A3 Amplifier system with current-mode servo feedback
12/07/2006US20060277506 System and method for product yield prediction
12/07/2006US20060276981 Calculation device calculating available capacity of secondary battery and method of calculating the same
12/07/2006US20060276980 Method and apparatus for detecting charged state of secondary battery based on neural network calculation
12/07/2006US20060275932 Semiconductor device, function setting method thereof, and evaluation method thereof
12/07/2006US20060274648 Methods, systems, and computer program products for implementing a standardized interpretive engine
12/07/2006US20060274501 Electronic package with direct cooling of active electronic components
12/07/2006US20060274456 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system
12/07/2006US20060273956 Antenna connection detecting device and vehicle navigation device
12/07/2006US20060273832 Buffer circuit, driver circuit, and semiconductor testing apparatus
12/07/2006US20060273822 Semiconductor circuit
12/07/2006US20060273820 Input and output circuit an integrated circuit and method for testing the same
12/07/2006US20060273818 Test apparatus
12/07/2006US20060273817 Wireless transmission device with a built-in antenna and a connector
12/07/2006US20060273816 Circuit board having a reverse build-up structure
12/07/2006US20060273815 Substrate support with integrated prober drive
12/07/2006US20060273814 3 dimensional layered flex circuit electronic assembly designed to maximize the cooling of electronics that are contained within the assembly such that the component density within said electronic assembly can be maximized